| Class / Patent application number | Description | Number of patent applications / Date published |
|---|
| 324754120 | Biasing means | 7 |
| 20140049279 | TEST CONTACTOR FOR ELECTRICAL TESTING OF ELECTRONIC COMPONENTS - A testing apparatus for electronic components comprises a mounting block and a plurality of contact strips arranged on the mounting block. The contact strips are configured such that electrical leads of an electronic component are operative to press against and bend the contact strips in a biasing direction to ensure good contact between the electrical leads and the contact strips during testing of the electronic component. Further, a preload block located on the mounting block is operative to contact and apply a pre-stress force onto the contact strips in the biasing direction prior to contact between the electrical leads and the contact strips. | 02-20-2014 |
| 324754130 | Mechanical | 2 |
| 20110084719 | TEST FIXTURE FOR PRINTED CIRCUIT BOARD - There is provided a printed circuit board (“PCB”) test fixture comprising a support, an electrical tester, and a pusher. The support is for supporting a PCB being tested in a PCB test position, The electrical tester is positioned with respect to the PCB test position such that, when a PCB is supported by the support in the PCB test position, the electrical tester is disposed in electrical contact with a circuit on the PCB supported by the support in the PCB test position during PCB testing. The pusher is configured for releasable coupling to a plurality of pusher members, such that each one of the plurality of pusher members is configured to co-operate with the pusher so as to become releasably coupled to and uncoupled from the pusher independently of the releasable coupling and uncoupling of at least another one of the plurality of pusher members, and such that an operative plurality of pusher members is provided when each one of the plurality of pusher members is releasably coupled to the pusher, wherein the operative plurality of pusher members is configured for translating, to a PCB which is supported by the PCB support and is disposed in the PCB test position, a force being applied by the pusher so as to effect pressing of a circuit of the PCB against the electrical tester when the PCB is supported on the PCB support and disposed in the PCB test position. | 04-14-2011 |
| 20160084881 | Detection Device, Detection Method and Detection System - The present invention provides a detection device, a detection method and a detection system, which are used for detecting damaged condition of a substrate. The detection device includes a probe unit and a judgement unit, and the probe unit includes a probe, a speed detection module and a driving force control module both provided on the probe, wherein the bottom end of the probe is used for contacting with the substrate to be detected; the speed detection module is used for obtaining a real-time speed of the probe in a process of detection and transmitting the real-time speed to the judgement unit; the driving force control module is used for applying a constant driving force to the probe; and the judgement unit is used for receiving the real-time speed of the probe and judging the damaged condition of the substrate to be detected according to the real-time speed. | 03-24-2016 |
| 324754140 | Spring | 3 |
| 20110115514 | PROBE - A probe includes a contact member brought into contact with an object to be tested. Contact particles having conductivity are uniformly distributed in the contact member. A part of the contact particles protrude from a surface of the contact member on the side of the object to be tested. A conductive member having elasticity is placed on a surface of the contact member on the opposite side to the object to be tested. The probe further includes an insulating sheet including a through hole and the contact member is so positioned as to penetrate the through hole. An upper part of the contact member is formed of a conductor which does not include the contact particles. An additional conductor is placed on a surface of the conductor on the side opposite to the object to be tested. | 05-19-2011 |
| 20110156737 | CONTACTOR - A contactor | 06-30-2011 |
| 20120092034 | Electrically Conductive Kelvin Contacts For Microcircuit Tester - Terminals ( | 04-19-2012 |
| 324754150 | Fluid pressure | 1 |
| 20140055156 | USING FLUID TO POSITION A DEVICE IN A SOCKET FOR TESTING - Provided are a method and system for using fluid to position a device in a socket for testing. The device is positioned within a socket and a body is coupled to the socket. Fluid is delivered to a chamber defined in part by the body, a first surface of the device to provide pressure onto the device to move the device within the socket. | 02-27-2014 |
