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SPECIFIC APPLICATION

Subclass of:

378 - X-ray or gamma ray systems or devices

Patent class list (only not empty are listed)

Deeper subclasses:

Class / Patent application numberDescriptionNumber of patent applications / Date published
378051000 Absorption 1759
378004000 Computerized tomography 1608
378070000 Diffraction, reflection, or scattering analysis 365
378037000 Mammography 213
378044000 Fluorescence 201
378041000 Stereoscopy 99
378021000 Tomography 91
378036000 Holography or interferometry 75
378038000 Dental panoramic 52
378034000 Lithography 16
378043000 Telescope or microscope 9
378028000 Xeroradiography 8
378002000 Radiation coding 6
378003000 Mossbauer effect 1
20100158189MOSSBAUER SPECTROMETER - A Mossbauer spectrometer 06-24-2010
Entries
DocumentTitleDate
20080198962Device for measuring size of steel bar in structure and method thereof - A gamma ray, an X-ray or an ionizing irradiation penetrates through a steel bar in a reinforced concrete structure. An image of the steel bar is thus projected on a film. Through geometric relationships between the image and the steel bar itself, the size of the steel bar is calculated. The size of the steel bar obtained according to the present invention is reliable and accurate. And the data obtained can be used for structure safety.08-21-2008
20090046828Radiation detecting cassette and radiation image capturing system - A radiation detecting cassette and a radiation image capturing system are provided. A radiation detecting cassette has a radiation detector for detecting a radiation having passed through a patient and converting the detected radiation into radiation image data, a transceiver for transmitting the radiation image data by way of wireless communications, a cassette controller for controlling the radiation detector and the transceiver, a power supply for energizing the radiation detector and the transceiver, and a remaining power supply power level detector for detecting a remaining power level RC [%] of the power supply. The cassette controller includes a data transmission and reception controller. The cassette controller stops transmitting the radiation image data by way of wireless communications and prioritizes the capturing of a radiation image when the detected remaining power level of the power supply is smaller than a predetermined threshold.02-19-2009
20090147907Downhole Imaging Tool Utilizing X-Ray Generator - An X-ray downhole imaging tool is provided and includes an X-ray tube capable of operating at least at 50 KeV and emitting at least one hundred micro-amperes of continuous electron current and a radiation detector axially displaced from the X-ray tube, at least partially shielded therefrom and radially directed. In certain embodiments, the radiation detector includes a microchannel plate and a resistive anode. In certain embodiments, a second detector which is axially directed is also provided.06-11-2009
20100111246X-Ray Beam Processor - An x-ray beam processor and system that includes an x-ray beam generator for generating x-ray beams; a mirror shield for shielding the x-ray beams from select areas; a cylindrical waveguide for guiding x-ray beams traveling through the waveguide, which includes a plurality of entry ports and exit ports; a plurality of ring-shaped mirrors disposed adjacent to and generally parallel with the entry ports and the exit ports and sharing a common axis “X” with the waveguide; and mountings for mounting the mirrors to the waveguide.05-06-2010
20100290582X-RAY TESTING METHOD AND X-RAY TESTING DEVICE - A first x-ray image of the circuit board that is equipped with components only on a first side with a first x-ray device (11-18-2010
20110129053SYSTEM AND METHOD FOR DETERMINING IONIZATION SUSCEPTIBILITY USING X-RAYS - A system for determining ionization susceptibility including a sample, an x-ray generator configured to generate a pulsed x-ray beam, and focusing optics disposed between the sample and the x-ray generator, the focusing optics being configured to focus the pulsed x-ray beam into a spot on the sample.06-02-2011
20150146841METROLOGY DEVICE AND METROLOGY METHOD THEREOF - A metrology device includes a light source and an image sensor. The light source is configured for providing an X-ray illuminating a wafer. The image sensor is configured for detecting a spatial domain pattern produced when the X-ray illuminating the wafer.05-28-2015

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