| Entries |
| Document | Title | Date |
|---|
| 20080232546 | Method for scattered radiation correction in x-ray imaging, and x-ray imaging system for this purpose - A method is disclosed for scattered radiation correction in X-ray imaging, and an X-ray imaging system is disclosed for carrying out the method. In at least one embodiment of the method, measurement signals t from an X-ray detector are digitized and converted to logarithmic form, with these measurement signals t having been obtained by radiation through an examination object by the X-ray detector. Correction values which have been obtained from a series development of a logarithm 1n(1−s/t) are subtracted from the measurement signals that have been converted to logarithmic form, with this series development being terminated at the earliest after the first order, where s denotes a previously determined scattered radiation signal from radiation passed through the examination object. At least one embodiment of the method and the associated X-ray imaging system allow scattered radiation to be corrected for with increased accuracy, on the basis of measurement signals that had been converted to logarithmic form. | 09-25-2008 |
| 20090060131 | HEAT-SENSITIVE TRANSFER SHEET - A heat-sensitive transfer sheet containing a base film, a dye layer formed over one surface of the base film and containing a heat-transferable dye and a resin, and a heat-resistant lubricating layer formed over the other surface of the base film and containing a lubricant and a resin, wherein the heat-resistant lubricating layer contains a specific phosphate ester as the lubricant, and the maximum value of the following characteristic X-ray intensities is at least 5 times the minimum value thereof: characteristic X-ray intensities obtained by radiating an electron beam which is accelerated to 20 kV and has a beam diameter of 1 μm or less onto plural positions of the heat-sensitive transfer sheet from the heat-resistant lubricating layer side of this sheet, and measuring the resultant characteristic X-rays originating from the K-line of the phosphorus element in the heat-resistant lubricating layer by an energy dispersive X-ray spectrometer. | 03-05-2009 |
| 20090060132 | HEAT-SENSITIVE TRANSFER IMAGE-RECEIVING SHEET, IMAGE-FORMED METHOD AND IMAGE PRINTS - A heat-sensitive transfer image-receiving sheet having at least one receptor layer and at least one heat insulation layer on a support, wherein a Vickers hardness of the heat insulation layer is in the range of from 2 to 20, and a moisture content of the heat-sensitive transfer image-receiving sheet is in the range of from 5% by mass to 8% by mass. | 03-05-2009 |
| 20090103679 | IMAGE GUIDED ACQUISITION OF QUANTITATIVE DUAL ENERGY DATA - A technique for establishing texture metrics and bone mineral density (BMD) within an anatomical region of interest. A digital imaging system is used to acquire a standard digital X-ray image with a wide field of view. The standard digital X-ray image is used to guide the imaging system to obtain an image of a region of interest. The standard digital X-ray image is used to calculate various texture metrics, such as a length of a fracture. A dual-energy digital X-ray image of the region of interest is acquired. The dual-energy digital X-ray image is corrected for scatter. The BMD of the region of interest may be established from the scatter-corrected dual-energy digital X-ray image. The BMD, the texture metrics, and/or the scatter-corrected dual-energy X-ray image may be displayed on the standard digital X-ray image. | 04-23-2009 |
| 20090141861 | Penetrating Radiation Measurements - The present invention describes apparatus for penetrating radiation measurements on a biological tissue sample, the apparatus comprising: a tissue sample locator; a source of penetrating radiation; a collimator to direct, in use, radiation from the source into a beam directed at the tissue sample locator; and at least two detectors for detecting radiation from the sample; the at least two detectors being configured to detect radiation from the sample at respective different angles. The present invention also describes analogous apparatus for penetrating radiation measurements on biological tissue samples. | 06-04-2009 |
| 20090168962 | System and methods for characterizing a substance - A system and methods for characterizing an unknown substance is described. One of the methods include determining an effective atomic number of the unknown substance as a first function of a first gradient of a first line. | 07-02-2009 |
| 20090220047 | Hybrid Bandgap Engineering For Super-Hetero-Epitaxial Semiconductor Materials, and Products Thereof - “Super-hetero-epitaxial” combinations comprise epitaxial growth of one material on a different material with different crystal structure. Compatible crystal structures may be identified using a “Tri-Unity” system. New bandgap engineering diagrams are provided for each class of combination, based on determination of hybrid lattice constants for the constituent materials in accordance with lattice-matching equations. Using known bandgap figures for previously tested materials, new materials with lattice constants that match desired substrates and have the desired bandgap properties may be formulated by reference to the diagrams and lattice matching equations. In one embodiment, this analysis makes it possible to formulate new super-hetero-epitaxial semiconductor systems, such as systems based on group IV alloys on c-plane LaF | 09-03-2009 |
| 20100046707 | XRD SCREENING SYSTEM AND METHOD - Method and system for distinguishing a special nuclear material from a non-threat, high-density metal using X-ray Diffraction. In one embodiment, an X-ray image of an object is examined to detect those voxels having intense XRD profiles, indicating the presence of a high-Z metal. Second, the XRD profiles of such voxels are examined to find the widths and positions of any bands of momentum that are empty of Bragg diffraction peaks. If no such bands are found, then each XRD profile is uniformly populated with Bragg peaks; and it is determined that a special nuclear material is present. If such bands are found, then at least one XRD profile is not uniformly populated with Bragg peaks; and it is determined that a non-threat, high-Z metal is present. | 02-25-2010 |
| 20100208868 | CURVATURE DISTRIBUTION CRYSTAL LENS AND X-RAY REFLECTOMETER - In one embodiment of the present invention, a curvature distribution crystal lens of the present invention is obtained via press-molding. In the case of a Ge single crystal plate, a temperature for the press-molding is in a range 1° C. to 120° C. lower than a melting point. In the case of a Si single crystal plate, a temperature for the press-molding is in a range 1° C. to 200° C. lower than a melting point. The curvature distribution crystal lens has a crystal lattice plane forming a 1D cylindrically curved surface or a 1D logarithmically curved surface whose valley is in a direction perpendicular to a direction having a maximum curvature, the direction having the maximum curvature being within 30° from a [001] or [1-10] direction in a (110) plane. As a result, it is possible to make an integrated reflection intensity uniform and to make a half-value width uniform in a wide range. Consequently, it is possible to achieve a curvature distribution crystal lens having a wide incident angle range and a high light focusing accuracy. | 08-19-2010 |
| 20100226478 | X-RAY DIFFRACTION DEVICE, OBJECT IMAGING SYSTEM, AND METHOD FOR OPERATING A SECURITY SYSTEM - An x-ray diffraction imaging device includes at least one x-ray detector and at least one scatter collimator positioned upstream of the at least one x-ray detector. The at least one collimator includes a plurality of successive plates. Each of the plurality of plates defines a plurality of rectangular holes. The plurality of successive plates are arranged such that the plurality of rectangular holes define a plurality of quadrilateral passages extending through the at least one scatter collimator. Each of the plurality of quadrilateral passages is configured to increase a rate of detection of first x-rays that define an x-ray transit path enclosed within a single such quadrilateral passage. Also, the plurality of quadrilateral passages is configured to decrease a rate of detection of second x-rays that define an x-ray transit path that intersects more than one such quadrilateral passage. | 09-09-2010 |
| 20110064197 | X-RAY DIFFRACTION DEVICES AND METHOD FOR ASSEMBLING AN OBJECT IMAGING SYSTEM - A multiple-plane X-ray diffraction imaging (XDI) device for generating an X-ray diffraction (XRD) profile of an object is described. The XDI device includes an X-ray source configured to generate X-rays and a first primary collimator configured to generate a first primary X-ray fan-beam. The XDI device also includes a second primary collimator configured to generate a second primary X-ray fan-beam. The XDI device also includes a first scatter detector array configured to detect a first set of scattered radiation generated upon intersection of the first primary X-ray fan-beam with the object, and a second scatter detector array configured to detect a second set of scattered radiation generated upon intersection of the second primary X-ray fan-beam with the object. | 03-17-2011 |
| 20110064198 | ANALYTICAL METHOD - The object of the present invention is to analyze a functional organic compound with high accuracy. In the present invention, cluster ions are accelerated so that the kinetic energy of cluster ions is less than 3.1 eV per one atom that makes up the cluster ion and the cluster ions enter a sample. Since the functional organic compound in the sample is etched without the breakdown of the chemical structure, the functional organic compound, which has not been chemically denatured, is exposed on the surface of the sample. By alternately performing the etching and the surface analysis of the sample, or performing the surface analysis of the sample while performing the etching, the sample can be accurately analyzed in the depth direction. | 03-17-2011 |
| 20110305317 | METHOD AND APPARATUS OF PRECISELY MEASURING INTENSITY PROFILE OF X-RAY NANOBEAM - Provided are a method and an apparatus of precisely measuring the intensity profile of an x-ray nanobeam, which can measure x-rays having different wavelengths with one knife edge and can perform optimal measurements corresponding to the depth of focus of an x-ray beam and the conditions of other measurement devices, using a dark field measurement method which enables precise measurements of the profile of an x-ray beam using a knife edge and using diffracted and transmitted x-rays. The knife edge ( | 12-15-2011 |
| 20120106705 | RADIOGRAPHIC APPARATUS AND RADIOGRAPHIC SYSTEM - A radiographic apparatus includes a radiation source that irradiates radiation, a first grating unit, a grating pattern unit, a radiological image detector, and a support unit. The radiation irradiated from the radiation source passes through the first grating unit. The grating pattern unit includes a periodic form that has a period which substantially coincides with a pattern period of a radiological image formed by the radiation having passed through the first grating unit. The radiological image detector detects a masked radiological image which is formed by masking the radiological image by the grating pattern unit. The support unit supports the radiation source, the first grating unit, the grating pattern unit and the radiological image detector. The radiation source is attached to the support unit via a vibration-proof member. | 05-03-2012 |
| 20120134472 | GRID FOR RADIOGRAPHY AND MANUFACTURING METHOD THEREOF, AND RADIATION IMAGING SYSTEM - In a manufacturing process of a second grid, an X-ray absorbing layer is formed on a top surface of a strip of X-ray transparent sheet during conveyance, and a buffer layer is formed on a rear surface thereof. After that, the X-ray transparent sheet is wound into a roll so as to expose the X-ray absorbing layer to outside. Thus, the X-ray transparent sheet and the X-ray absorbing layer are laminated with being bonded with the buffer layer. The roll of layer laminated structure is sliced in its radial direction into a layer laminated sheet, which has the buffer layer, the X-ray transparent sheet, and the X-ray absorbing layer laminated in layers. After polishing sliced surfaces of the layer laminated sheet, the layer laminated sheet is pressed by a pressing device, so the second grid is curved into an approximately cylindrical shape. | 05-31-2012 |
| 20120163541 | RADIOGRAPHIC APPARATUS AND RADIATION IMAGE DETECTOR - In a radiographic apparatus for obtaining a phase contrast image, and which includes a first grating and a second grating arranged with a predetermined distance therebetween, one of the first grating and the second grating is composed of plural unit gratings, each corresponding to a pixel, arranged in the direction of pixel columns. Further, the plural unit gratings are arranged in such a manner to be shifted, parallel to each other, in a direction orthogonal to a direction in which the other one of the first grating and the second grating extends by distances different from each other with respect to the other one of the first grating and the second grating. Further, image signals read out from groups of pixel rows, the groups being different from each other, are obtained, as image signals representing fringe images different from each other, based on image signals obtained by the radiation image detector by detecting radiation that has passed through the first grating and the second grating. Further, a phase contrast image is generated based on the image signals representing the plural of fringe images. | 06-28-2012 |
| 20120177180 | X-RAY SHUTTER ARRANGEMENT - A shutter arrangement for an X-ray housing includes a shutter | 07-12-2012 |
| 20120294425 | RADIATION IMAGE CONVERSION PANEL AND RADIATION IMAGE DETECTOR USING SAME - Disclosed is a radiation image conversion panel wherein luminance is improved by preventing the disorder of the structure of phosphor columnar crystals, thereby eliminating the scattering and refraction of optical elements which is emitted by an X-ray-irradiated phosphor and propagated in the direction of a photoelectric conversion element. Moreover disclosed is a radiation image detector using the same. The radiation image conversion panel is characterized in that the radiation image conversion panel comprises a phosphor layer on the substrate, that the phosphor layer is configured of the phosphor columnar crystals formed from a phosphor matrix compound and an activator by vapor deposition, and that the degree of the orientation of the surface of the phosphor columnar crystals, the degree of the orientation being based on X-ray diffraction spectrum and the surface having a fixed mirror index, is in the range of 80 to 100% without regard to the position in the direction of the thickness of the layer from the root near the substrate to the tip of the phosphor columnar crystals of the phosphor layer. | 11-22-2012 |
| 20130259199 | X-RAY MEASUREMENT APPARATUS - A portable, for example, a hand-held-type, X-ray measurement apparatus, wherein the vibration or hand-shaking of the X-ray measurement apparatus is detected by a vibration-detection sensor such as a distance sensor, a gyro sensor, or the like, and a measurement value for the X-ray intensity obtained using a two-dimensional X-ray detector is corrected on the basis of a variation quantity obtained using the vibration-detection sensor. The correction may be a correction related to an X-ray source, a correction related to an X-ray detector, a correction calculated using the CPU of a computer and a software program, or the like. | 10-03-2013 |
| 20140211920 | STRUCTURE AND METHOD FOR MANUFACTURING THE SAME - A method for manufacturing a structure by using a silicon mold, in which disturbances in arrangement due to charges are reduced, can be provided. | 07-31-2014 |
| 20140270078 | Methods of Detecting Inhomogeneity of a Layer and Apparatus for Performing the Same - In a method of detecting inhomogeneity of a layer, an incident light may be irradiated to at least two regions of the layer at a first incident angle position. First reflected lights reflected from the two regions of the layer may be sensed. The incident light may be irradiated to the at least two regions of the layer at a second incident angle position. Second reflected lights reflected from the two regions of the layer may be sensed. The first reflected lights and the second reflected lights may be compared with each other to obtain the inhomogeneity of the layer. Thus, the layer having a spot may be found. | 09-18-2014 |
| 20150055755 | Novel Objective for EUV Microscopy, EUV Lithography, and X-Ray Imaging - Disclosed is an imaging apparatus for EUV spectroscopy, EUV microscopy, EUV lithography, and x-ray imaging. This new imaging apparatus could, in particular, make significant contributions to EUV lithography at wavelengths in the range from 10 to 15 nm, which is presently being developed for the manufacturing of the next-generation integrated circuits. The disclosure provides a novel adjustable imaging apparatus that allows for the production of stigmatic images in x-ray imaging, EUV imaging, and EUVL. The imaging apparatus of the present invention incorporates additional properties compared to previously described objectives. The use of a pair of spherical reflectors containing a concave and convex arrangement has been applied to a EUV imaging system to allow for the image and optics to all be placed on the same side of a vacuum chamber. Additionally, the two spherical reflector segments previously described have been replaced by two full spheres or, more precisely, two spherical annuli, so that the total photon throughput is largely increased. Finally, the range of permissible Bragg angles and possible magnifications of the objective has been largely increased. | 02-26-2015 |
