| Entries |
| Document | Title | Date |
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| 20080212739 | X-RAY ANALYSIS APPARATUS AND X-RAY ANALYSIS METHOD - In an X-ray analysis apparatus and an X-ray analysis method, a quantitative analysis is stably performed by stably behaving an X-ray source. There are possessed an X-ray tubular bulb irradiating a primary X-ray to a sample, a primary X-ray adjustment mechanism capable of adjusting an intensity of the primary X-ray, an X-ray detector detecting a characteristic X-ray radiated from the sample, thereby outputting a signal including energy informations of the characteristic X-ray and a scattered X-ray, an analyzer analyzing the above signal, and an incident X-ray adjustment mechanism disposed between the sample and the X-ray detector, and capable of adjusting a total intensity of the characteristic X-ray and the scattered x-ray, which are entered to the X-ray detector. | 09-04-2008 |
| 20080253520 | Compton scattered X-ray visualization, imaging, or information provider with scattering event locating - One aspect relates to determining a location of an at least one scattering event occurring within an at least some matter of at least a portion of an individual, wherein the determining the location of the the at least one scattering event is based at least in part on a combination of: a relative position and/or angle at which an at least one applied X-ray being applied to the at least some matter of the at least the portion of the individual, an applied energy level of the at least one applied X-ray being applied to the at least some matter of the at least the portion of the individual, a detected location of an at least one scattered X-ray resulting from scattering of the at least one applied X-ray scattering during the at least one scattering event, and a scattered energy level of the at least one scattered X-ray. | 10-16-2008 |
| 20080253521 | Compton scattered X-ray visualization, imaging, or information provider with time of flight computation - One aspect relates to locating an at least one scattering event at least partially within an at least some matter of an at least a portion of an individual at least partially by directing an at least one pulse-type applied X-ray at the at least some matter of the at least the portion of the individual to create an at least one corresponding pulse-type Compton scattered X-ray, wherein the locating the at least one scattering event is based at least in part on an at least one time of flight computation derived at least in part from a combination of an at least one applied duration and an at least one scattered duration, wherein the at least one applied duration corresponds to a time for the at least one pulse-type applied X-ray to reach the at least one scattering event within the at least some matter of the at least the portion of the individual, and further wherein the at least one scattered duration corresponds to a time for the at least one corresponding pulse-type Compton scattered X-ray to thereupon travel from the at least one scattering event within the at least some matter of the at least the portion of the individual to be detected. | 10-16-2008 |
| 20090034682 | ADAPTING A HIGH-PERFORMANCE PULSE PROCESSOR TO AN EXISTING SPECTROMETRY SYSTEM - A method of utilizing the output of a first pulse processor, such as processor designed for use with an SDD, to generate the input signal expected by the second pulse processor, such as an existing processor not designed for use with an SDD. In one embodiment, piled-up pulses which would not be detected as such by the second pulse processor are omitted from the generated input signal. The method generates an output (which then serves as the input signal for the second pulse processor) of the same general form as the ramp signal from a detector with a pulsed-reset preamplifier, but which does not have the same noise characteristics. In addition, the method may alter the timing between the reconstructed steps in the ramp to increase the maximum throughput of the second pulse processor beyond what is normally possible with a direct connection to the associated detector. | 02-05-2009 |
| 20090060135 | X-Ray Tomography Inspection Systems - The present invention is an X-ray scanning system with an X-ray source arranged to generate X-rays from X-ray source positions around a scanning region, a first set of detectors arranged to detect X-rays transmitted through the scanning region, a second set of detectors arranged to detect X-rays scattered within the scanning region, and a processor arranged to process outputs from the detectors to generate image data. | 03-05-2009 |
| 20090074141 | Automated selection of x-ray reflectometry measurement locations - A computer-implemented method for inspection of a sample includes defining a plurality of locations on a surface of the sample, irradiating the surface at each of the locations with a beam of X-rays, and measuring an angular distribution of the X-rays that are emitted from the surface responsively to the beam, so as to produce a respective plurality of X-ray spectra. The X-ray spectra are analyzed to produce respective figures-of-merit indicative of a measurement quality of the X-ray spectra at the respective locations. One or more locations are selected out of the plurality of locations responsively to the figures-of-merit, and a property of the sample is estimated using the X-ray spectra measured at the selected locations. | 03-19-2009 |
| 20090147919 | RADIOGRAPHING APPARATUS AND IMAGE PROCESSING PROGRAM - A radiographing apparatus according to an aspect of the present invention is characterized in that an image processing device comprises an acquisition device which acquires projection data of a first energy spectrum and projection data of a second energy spectrum, and a synthetic image generating device which synthesizes a first image on the basis of the projection data of the first energy spectrum, and a second image on the basis of the projection data of the second energy spectrum according to a predetermined synthetic condition, and generating a synthetic image, and a display device displays the generated synthetic image. | 06-11-2009 |
| 20090202041 | COMPTON CAMERA DEVICE - A Compton camera device according to the invention includes first means for reading coordinate data of a scattering point of a quantum ray detected by a pre-stage detector for each Compton scattering event, second means for reading coordinate data of a reaching point of the Compton-scattered quantum ray detected by a post-stage detector for each Compton scattering event, and third means for calculating a measurement accuracy of the scattered quantum ray by the first and second means for each Compton scattering event, calculating a statistical quantity of the quantum ray for each calculated measurement accuracy, and outputting the calculated statistical quantity to image reconstruction means. | 08-13-2009 |
| 20090213992 | VERTICAL/HORIZONTAL SMALL ANGLE X-RAY SCATTERING APPARATUS AND METHOD FOR MEASURING SMALL ANGLE X-RAY SCATTERING - A vertical/horizontal small angle X-ray scattering apparatus, for enabling plural numbers of X-ray diffraction measurements, such as, transmission small angle X-ray diffraction, reflection small angle X-ray diffraction, and in-plane X-ray diffraction, etc., comprises an X-ray generating apparatus | 08-27-2009 |
| 20090213993 | METHODS AND APPARATUS FOR THE IDENTIFICATION OF MOLECULAR AND CRYSTALLINE MATERIALS BY THE DOPPLER BROADENING OF NUCLEAR STATES BOUND IN MOLECULES, CRYSTALS AND MIXTURES USING NUCLEAR RESONANCE FLUORESCENCE - The broadening of the lines in NRF from an isotope that is part of a material may be due to several causes: the temperature of the material, the molecular structure of the material and the crystalline structure of the material. By measuring the broadening caused by the molecular structure and the crystalline structure the material itself can be identified. The exact energy of the lines in NRF may also depend on the nature of the crystalline and molecular structure of the material. By measuring the changes in the energy of the NRF lines caused by the structure of the material the material itself may be identified. These techniques provide a “fingerprint” of the molecule or crystal that is involved. The fingerprint information may be used to determine a potential threat. | 08-27-2009 |
| 20100135461 | BIOMETRIC DIAGNOSIS - The invention provides a method of detecting neoplastic or neurological disorders comprising exposing skin or nails to X-ray diffraction and detecting changes in the ultrastructure of the skin or nails, and also provides an instrument when used in the method of detection. | 06-03-2010 |
| 20100150310 | X-RAY REFLECTOMETRY SYSTEM WITH MULTIPLE SAMPLE HOLDER AND INDIVIDUAL SAMPLE LIFTING MECHANISM - An X-ray reflectometry apparatus comprises an X-ray source ( | 06-17-2010 |
| 20100254514 | DETECTION OF X-RAY SCATTERING - A radiation detecting apparatus includes a collimator and a detector, the collimator having a material for blocking radiation and a region that is a sector of an annulus or multiple regions in a configuration in the shape of a sector of an annulus for allowing transmission of the radiation. The detector is spaced a distance from the collimator such that when a radiation source and sample crystal material are positioned at suitable positions, the radiation is collimated by the collimator and contacts the sample a predetermined distance from the detector at multiple of locations corresponding to the region or regions of the collimator. The Bragg diffracted radiation from the crystal material at two or more and preferably all of the locations overlap at the detector. | 10-07-2010 |
| 20100284516 | TWO DIMENSIONAL SMALL ANGLE X-RAY SCATTERING CAMERA - A two-dimensional x-ray scattering camera includes a source, an optic, a detector, and a pair of collimating blocks. The source emits x-ray beams that are reflected by the optic towards a sample. The detector detects scattering from the sample, the pair of collimating blocks is positioned between the optic and the detector to collimate the beam. A bottom surface of one block is substantially parallel a top surface of the other block, and the blocks are rotatable relative to the beam about a pivot. The system forms a two-dimensional beam that is symmetric about the primary beam axis at the detector position, regardless how the beam is collimated by the collimating blocks. The system therefore eliminates smearing and can be used for anisotropic small angle scattering at high resolution and low Q | 11-11-2010 |
| 20110051894 | X-RAY ANALYSIS APPARATUS AND X-RAY ANALYSIS METHOD - An X-ray analysis apparatus including: a radiation source configured to irradiate an irradiation point on a sample with radiation; an X-ray detector configured to detect a characteristic X-ray emitted from the sample, and output a signal including energy information about the characteristic X-ray; an analyzer configured to analyze the signal; a sample stage configured to allow placement of the sample thereon; a shifting mechanism being capable of relatively shifting the sample on the sample stage and the radiation source and the X-ray detector with respect to each other; a height measuring mechanism being capable of measuring the height of the irradiation point on the sample; and a controller configured to control the shifting mechanism on the basis of the measured height of the irradiation point on the sample and adjust the distance of the sample with respect to the radiation source and the X-ray detector is used. | 03-03-2011 |
| 20110116599 | Scanning Systems - The invention provides a method and system for scanning an object comprising providing a first detector region having a thickness of at least 2 mm and a second detector region having a thickness of at least 5 mm wherein the second detector region is arranged to receive radiation that has passed through the first detector region. The method comprises irradiating the object with radiation having a peak energy of at least 1 MeV, and detecting the first profile radiation after it has interacted with or passed through the object in order to provide information relating to the object. Detecting the first profile radiation comprises detecting the first profile radiation at the first detector region, receiving the first profile radiation that has passed through the first detector region at the second detector region, and detecting the first profile radiation at the second detector region. The scanning method further comprises irradiating the object with radiation having a second energy profile, relatively lower than the first energy profile, and having a peak energy of at least 0.5 MeV, detecting the second profile radiation after it has interacted with or passed through the object in order to provide information relating to the object. Detecting the second profile radiation comprises detecting the second profile radiation at the first detector region, receiving the second profile radiation that has passed through the first detector region at the second detector region, and detecting the second profile radiation at the second detector region. | 05-19-2011 |
| 20110116600 | Scanning Systems - The invention provides methods, systems and detector arrangements for scanning an object moving in a first direction that includes the steps of irradiating the object with radiation having a peak energy of at least 900 keV, providing a first detector region having a thickness of at least 2 mm and a second detector region having a thickness of at least 5 mm where the second detector region is arranged to receive radiation that has passed through the first detector region, and detecting the radiation after it has interacted with or passed through the object in order to provide information relating to the object. | 05-19-2011 |
| 20110135060 | High Energy X-Ray Inspection System Using a Fan-Shaped Beam and Collimated Backscatter Detectors - This invention provides a scanning system for scanning an object in a scanning zone. The scanning system includes both a radiation source arranged to irradiate the object with radiation having a peak energy of at least 900 keV and a scatter detector arranged to detect radiation scattered from the object wherein the radiation source is arranged to irradiate the object over a plurality of regions to be scanned within a single irradiation event. The scatter detector includes a plurality of detection elements, each detection element being arranged to detect scattered radiation from a predefined part of the scanning zone and a signal processor arranged to calculate scatter intensity across the plurality of detector elements. | 06-09-2011 |
| 20110150181 | APPARATUS AND METHODS FOR DETECTOR SCATTER RECOVERY FOR NUCLEAR MEDICINE IMAGING SYSTEMS - Apparatus and methods for detector scatter recovery for positron emission tomography systems are provided. One method includes identifying detected gamma events in different detector units of a nuclear medicine (NM) imaging detector and determining whether the detected gamma events occurred within a predetermined time period and have a summed energy of at least a predetermined level to define gamma events for reconstitution. The method further includes reconstituting the defined gamma events into single valid gamma events. | 06-23-2011 |
| 20110188632 | MULTIPLE PLANE MULTI-INVERSE FAN-BEAM DETECTION SYSTEMS AND METHOD FOR USING THE SAME - A detection system includes a multi-focus radiation source configured to generate X-ray radiation and a primary collimator defining a first row of apertures and a second row of apertures. The first row of apertures forms first X-ray beams within a first plane from the X-ray radiation, and the second row of apertures forms second X-ray beams within a second plane from the X-ray radiation. The first plane is different than the second plane. The detection system further includes a scatter detector including a first row of scatter detector elements and a second row of scatter detector elements. The first row of scatter detector elements is configured to detect scattered radiation from the first X-ray beams, and the second row of scatter detector elements is configured to detect scattered radiation from the second X-ray beams. | 08-04-2011 |
| 20110249798 | Scatter Attenuation Tomography using a Monochromatic Radiation Source - A system and methods for characterizing an inspected object on the basis of attenuation between identified regions of scattering and a plurality of detectors. An incident beam of substantially monochromatic penetrating radiation is generated by a source, which may be a radioactive source. The incident beam is characterized by a propagation axis and a source energy. Radiation scattered by the object is detected by means of a plurality of detector elements disposed about the beam of penetrating radiation, each detector element generating a detector signal characterizing a detected energy of scattered radiation. The detector signal provides for determining a displacement for each scattering point of the object relative to a fiducial position on the propagation axis of the incident beam, based upon the detected energy of the scattered radiation. By calculating the attenuation of penetrating radiation between pairs of scattering voxels, a tomographic image is obtained characterizing the three-dimensional distribution of attenuation in the object of one or more energies of penetrating radiation, and thus of material characteristics. | 10-13-2011 |
| 20110286577 | Method for Obtaining a Structure Factor of an Amorphous Material, in Particular Amorphous Glass - An incident X-ray is emitted in a wide angular sector toward an amorphous material specimen which backscatters the X-rays. The method comprises:
| 11-24-2011 |
| 20120087473 | SURFACE MICROSTRUCTURE MEASUREMENT METHOD, SURFACE MICROSTRUCTURE MEASUREMENT DATA ANALYSIS METHOD AND X-RAY SCATTERING MEASUREMENT DEVICE - There is provided a surface microstructure measurement method, a surface microstructure measurement data analysis method, and an X-ray scattering measurement device which can accurately measure a microstructure on a surface and which can evaluate a three-dimensional structural feature. In the surface microstructure measurement method, the specimen surface is irradiated with X-ray at a grazing incident angle and a scattering intensity is measured; a specimen model with a microstructure on a surface in which one or more layers is formed in a direction perpendicular to the surface and unit structures are periodically arranged in a direction parallel to the surface within the layers is assumed; a scattering intensity of X-ray scattered by the microstructure is calculated in consideration of effects of refraction and reflection caused by the layer; and the scattering intensity of X-ray calculated by the specimen model is fitted to the measured scattering intensity. Then, as a result of the fitting, an optimum value of a parameter for specifying the shape of the unit structures is determined. Therefore, it is possible to accurately measure a microstructure. | 04-12-2012 |
| 20120177181 | RADIOGRAPHIC IMAGING DEVICE AND RADIOGRAPHIC IMAGING SYSTEM - There is provided a radiographic imaging device including: a radiation source that irradiates radiation generated by inverse Compton scattering; a first grating at which first members that diffract or absorb radiation are formed side by side such that pitches thereof are larger where distances from a center position of the radiation irradiated from the radiation source are larger, the first grating diffracting or absorbing radiation irradiated from the radiation source with the first members; a second grating that is disposed at a position at which Talbot interference is produced by the radiation diffracted or absorbed by the first grating, and at which second members that absorb radiation are formed side by side such that pitches thereof are larger where distances from the center position of the radiation irradiated from the radiation source are larger; and a radiation detector that detects radiation that has passed through the second grating. | 07-12-2012 |
| 20120314842 | System for Identifying Radiation Zones in X-ray Imaging - A system displays potential radiation zones in an angiography X-ray laboratory during an angiography procedure, for example, and identifies areas of potentially harmful radiation due to X-ray scatter in an imaging room. An input processor receives data identifying an emitted X-ray dose level applied to an area of a patient anatomy. An image data processor determines level of X-ray radiation dose scatter in different regions of an imaging room indicating regions of potentially harmful radiation, by calculating X-ray scatter dose at different distances from an irradiated patient area as being substantially in proportion to the size of the irradiated area and substantially inversely proportional to the square of the distance from the irradiated area. A visual alert system visually identifies areas of a room of potentially harmful radiation in response to the determination. | 12-13-2012 |
| 20120321046 | Integrated Backscatter X-Ray System - The different advantageous embodiments provide a method and apparatus for generating an x-ray beam. The x-ray beam is generated using an x-ray tube. The x-ray tube and a power supply are located inside of a housing connected to a moveable platform. A rotatable wheel connected to the moveable platform is rotated while the x-ray beam is being generated. The rotatable wheel has a number of apertures that allows at least a portion of the x-ray beam to pass through the rotatable wheel as the rotatable wheel rotates. | 12-20-2012 |
| 20130010927 | FUNCTIONAL AND PHYSICAL IMAGING USING RADIATION - An apparatus to examine a target in a patient includes an x-ray source configured to deliver a first x-ray beam towards the target, a device having an array of openings, the device located at an angle less than 180 degrees relative to a beam path of the first x-ray beam to receive a second x-ray beam resulted from an interaction between the first x-ray beam and the target, and a detector aligned with the device, the detector located at an angle less than 180 degrees relative to the beam path of the first x-ray beam to receive a part of the second x-ray beam from the device that exits through the openings at the device. | 01-10-2013 |
| 20130195248 | Hand-Held X-Ray Backscatter Imaging Device - Apparatus for imaging items behind a concealing barrier. A source of penetrating radiation is contained entirely within a housing. A spatial modulator forms the penetrating radiation into a beam and sweeps the beam to irradiate an inspected object. A detector generates a scatter signal based on penetrating radiation scattered by contents of the inspected object, and a sensor senses motion relative to a previous position of the apparatus with respect to the inspected object. A processor receives the scatter signal and generates an image of the contents of the inspected object based at least on the scatter signal. The housing may be adapted for singled-handed retention by an operator | 08-01-2013 |
| 20130202089 | Convertible Scan Panel for X-Ray Inspection - An x-ray inspection system using backscatter of an x-ray beam emitted through a scan panel contiguous with, but of a material distinct from, an enclosure that contains an x-ray source by which the x-ray beam is generated. The scan panel is contoured in such a manner as to be visibly blended with a shape characterizing the enclosure. In some embodiments, the beam traverses multiple scan panels, where one or more of the scan panels may be selected for beam filtration properties. The scan panel may be disposed interior to a sliding door, and may be structured to serve as a scatter shield. | 08-08-2013 |
| 20130259201 | Apparatus and method for supporting a liquid sample for measuring scattering of electromagnetic radiation - An apparatus for supporting a liquid sample for measuring an intensity of X-ray radiation scattered by the liquid sample is configured such as to allow the X-ray radiation to impinge along a first direction ( | 10-03-2013 |
| 20130308756 | Apparatus and Method for Nanoflow Liquid Jet and Serial Femtosecond X-ray Protein Crystallography - Techniques for nanoflow serial femtosecond x-ray protein crystallography include providing a sample fluid by mixing a plurality of a first target of interest with a carrier fluid and injecting the sample fluid into a vacuum chamber at a rate less than about 4 microliters per minute. In some embodiments, the carrier fluid has a viscosity greater than about 3 centipoise. | 11-21-2013 |
| 20140037065 | BOREHOLE POWER AMPLIFIER - Borehole tools and methods for analyzing earth formations are disclosed herein. An example borehole tool disclosed herein includes an RF particle accelerator. The particle accelerator includes an accelerator waveguide for accelerating electrons. The borehole tool also includes a power amplification circuit that is based on a wide bandgap semiconductor material, such as a combination of gallium nitride (GaN) and aluminum gallium nitride (AlGaN). The power amplification circuit amplifies an initial input RF signal and provides a driving RF output signal to drive acceleration of the electrons within the accelerator waveguide. | 02-06-2014 |
| 20140098940 | METHOD AND APPARATUS FOR INVESTIGATING THE X-RAY RADIOGRAPHIC PROPERTIES OF SAMPLES - The invention relates to a method and an apparatus for studying the X-ray properties of samples ( | 04-10-2014 |
| 20140140483 | METHOD FOR EVALUATING ENERGY LOSS, CHIPPING RESISTANCE AND ABRASION RESISTANCE OF POLYMERIC MATERIAL - The present invention provides a method for evaluating energy loss in a polymeric material, wherein the method provides sufficient evaluation of the difference in performance between samples with excellent measurement accuracy; a method for evaluating chipping resistance of a polymeric material, wherein the method provides evaluation in a short period of time and at low cost with excellent measurement accuracy; and a method for evaluating abrasion resistance of a polymeric material, wherein the method provides sufficient evaluation of the difference in performance between samples with excellent measurement accuracy. The present invention relates to methods for evaluating energy loss, chipping resistance, and abrasion resistance of a polymeric material, and the methods include irradiating the polymeric material with X-rays or neutrons to perform X-ray scattering measurement or neutron scattering measurement. | 05-22-2014 |
| 20140185769 | BACK SCATTERNING INSPECTION SYSTEMS FOR HUMAN BODY - A human body back-scattering inspection system is disclosed. The system comprises a flying-spot forming unit configured to output beams of X-rays, a plurality of discrete detectors which are arranged vertically along a human body to be inspected, and a controlling unit coupled to the flying-spot forming unit and the plurality of detectors, and configured to generate a control signal to control the flying-spot forming unit and the plurality of detectors to perform a partition synchronous scan on the human body to be inspected vertically. The present disclosure utilizes the geometry property of the human body back-scattering inspection system, and proposes a multiple-point synchronous scan mechanism which largely accelerates the inspection of human body. | 07-03-2014 |
| 20140185770 | BACK-SCATTERING INSPECTION SYSTEMS AND METHODS FOR HUMAN BODY - Human body back-scattering inspection systems and methods are disclosed. In the invention, X-rays modulated by the flying-spot forming unit having spirally distributed flying-spots have a distribution having alternating peaks and valleys on the irradiated surface. In this way, scanning starting times can be precisely controlled to cause two devices to have scanning starting times that are different by a half of a cycle. That is, the beams outputted from one device are at maximum when the beams outputted from the other device are at minimum. In other words, even if the ray source of one device emits rays, it will not significantly affect imaging result of the other device. In such way, the two devices may emit rays and perform scanning at the same time, and thus the total scanning time is reduced. | 07-03-2014 |
| 20140185771 | Scanning Systems - The present application discloses methods and systems for scanning an object. The scanning system provides a first detector region having a thickness of at least 2 mm and a second detector region having a thickness of at least 5 mm. The second detector region is arranged to receive radiation that has passed through the first detector region. The method includes irradiating the object with radiation having having a peak energy of at least 1 MeV, and detecting the first profile radiation after it has interacted with or passed through the object in order to provide information relating to the object. | 07-03-2014 |
| 20140205068 | METHOD FOR EVALUATING MODULUS OF REPULSION ELASTICITY, HARDNESS AND ENERGY LOSS OF POLYMER MATERIAL - The present invention provides a method for evaluating the rebound resilience, hardness, or energy loss of polymer materials, capable of sufficiently evaluating the difference in performance between samples with excellent measurement accuracy. The present invention relates to a method for evaluating the rebound resilience, hardness, or energy loss of a polymer material, including irradiating the polymer material with X-rays or neutrons to perform X-ray scattering measurement or neutron scattering measurement. | 07-24-2014 |
| 20140270080 | Electrochemical Test Cell For Enabling In-Situ X-Ray Diffraction and Scattering Studies of Scale Formation and Microstructural Changes in Materials with Flow Through Solution - An electrochemical test cell apparatus is disclosed for enabling in-situ X-ray transmission of a flowing fluid using a small angle X-ray scattering technique. A base has a recessed portion that partially defines a volume for containing a test sample. The base may have a fluid supply passage for providing a flowing fluid into the volume, a fluid return passage for allowing the flowing fluid to exit the volume and flow out of the test cell, and a first hole for allowing an X-ray beam to pass through the volume. A clamp member is coupled to the base to help define the volume and may have a second hole aligned with the first hole that allows the X-ray beam to pass through the clamp member. A pair of material portions may be clamped between the base and the clamp member to retain the fluid within the volume while allowing passage of the X-ray beam through first and second holes. A pair of electrodes may be used to supply a potential difference to the flowing fluid. | 09-18-2014 |
| 20140341354 | METHOD OF EVALUATING NEUTRON SCATTERING LENGTH DENSITY - The present invention provides a method of evaluating the neutron scattering length density, capable of accurately determining the neutron scattering length density. The present invention relates to a method of evaluating the neutron scattering length density of scatterers in a material, including determining the neutron scattering length density based on a scattering intensity curve obtained by neutron scattering measurement, with use of a scattering intensity curve obtained by X-ray scattering measurement. | 11-20-2014 |
| 20140355741 | MODULATED X-RAY HARMONIC DETECTION - The presently disclosed technique provides a method and apparatus for use in modulated X-ray harmonic detection and identification. More specifically, it specifies a X-ray backscatter imaging system using radio frequency modulation of the incident X-ray beam at two frequencies and detection patterns in the backscattered signal corresponding to harmonics of the modulation frequencies. | 12-04-2014 |
| 20150300965 | Scatterometry-Based Imaging and Critical Dimension Metrology - Methods and systems for performing measurements of semiconductor structures and materials based on scatterometry measurement data are presented. Scatterometry measurement data is used to generate an image of a material property of a measured structure based on the measured intensities of the detected diffraction orders. In some examples, a value of a parameter of interest is determined directly from the map of the material property of the measurement target. In some other examples, the image is compared to structural characteristics estimated by a geometric, model-based parametric inversion of the same measurement data. Discrepancies are used to update the geometric model of the measured structure and improve measurement performance. This enables a metrology system to converge on an accurate parametric measurement model when there are significant deviations between the actual shape of a manufactured structure subject to model-based measurement and the modeled shape of the structure. | 10-22-2015 |
| 20150319832 | System and Method for Quantifying X-Ray Backscatter System Performance - A system for quantifying x-ray backscatter system performance may include a support, a plurality of rods mounted on the support, the rods of the plurality of rods arranged in parallel to each other, having generally curved outer surfaces, and being arranged in groups of varying widths, each group of the groups having at least two of the rods of a same width, and a user interface configured to be connected to receive a backscatter signal from an x-ray backscatter detector associated with an x-ray tube, and generate a display representing photon counts of x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube. | 11-05-2015 |
| 20160187267 | APPARATUS AND METHOD FOR ALIGNING TWO PLATES DURING TRANSMISSION SMALL ANGLE X-RAY SCATTERING MEASUREMENTS - The disclosure provides an apparatus for aligning first and second plates that are parallel to each other and have the same orientation. The apparatus includes a detector that detects composite small-angle X-ray scattering emitted from patterns of the first and second plates that are perpendicularly impinged by X-ray, and a moving unit that aligns the first and second plates according to a composite amplitude distribution of the composite small-angle X-ray scattering. Therefore, the first and second plates are aligned to each other accurately. | 06-30-2016 |
| 20180024081 | Sample Holder for X-ray Analysis | 01-25-2018 |
