| Entries |
| Document | Title | Date |
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| 20080205591 | X-RAY DIAGNOSTIC APPARATUS, IMAGE PROCESSING APPARATUS, AND IMAGE PROCESSING METHOD - A storage unit stores data of a blood vessel image, a first mask image, and a second mask image of an object, an imaging unit which images a fluoroscopic image for the object. A subtraction unit subtracts the first mask image from the fluoroscopic image and generates data of a subtraction image. A calculating unit calculates anatomical displacement amount between the first mask image and the second mask image. A display unit displays the blood vessel image and the subtraction image so as to be superimposed each other by positioning the blood vessel image and the subtraction image to be fitted together on the basis of the calculated displacement amount. | 08-28-2008 |
| 20080226025 | Device and Method for Mapping the Distribution of an X-ray Fluorescence Marker - The invention relates to a method and a device for determining the distribution of an X-ray fluorescence (XRF) marker ( | 09-18-2008 |
| 20080267348 | Filter for x-ray radiation, and an arrangement for using filtered x-ray radiation for excitation - An X-ray fluorescence measurement device comprises an X-ray source and a sample window for allowing X-rays from said X-ray source reach a sample. A filter arrangement between said X-ray source and said sample window comprises a first filter layer comprising a first filtering element and a second filter layer comprising a second filtering element. The atomic number of the second filtering element is greater than the atomic number of the first filtering element. Said first filter layer is between said X-ray source and said second filter layer. | 10-30-2008 |
| 20080267349 | Particle Therapy - A particle therapy facility has a particle accelerator, a therapy control system and at least one treatment room, where the particle accelerator accelerates particles and supplies them to the treatment room via an adaptation unit in order to irradiate a volume which is to be irradiated in a patient, and where the treatment room has a patient positioning device for positioning the patient relative to a scan area of the adaptation unit and at least one fluoroscopy system for continuously obtaining fluoroscopic image data from the patient in an area around the scan area, and where the therapy control system is designed for online evaluation of the fluoroscopic image data for movement of the volume which is to be irradiated and/or of the adjoining tissue and/or organs arranged around it and/or markers implanted in the patient which are depicted in the fluoroscopic images, and for output of a control signal for the adaptation unit which (control signal) adapts a particle beam direction and/or a particle energy to the movement, and/or for output of the control signal for a beam interruption unit for irradiating the volume which is to be irradiated on the basis of movement states. | 10-30-2008 |
| 20080310587 | X-ray fluorescence apparatus - An X-ray fluourescence (XRF) apparatus uses both an analyzer crystal ( | 12-18-2008 |
| 20090086892 | Proximity-based X-ray fluorescence visualizer, imager, or information provider - One aspect relates to detecting at least one induced X-ray fluorescing photon fluoresced from substantially within an at least some matter of an at least a portion of an at least one individual at least partially as a result of receiving at least one induced X-ray fluorescing photon generated at least partially within at least one X-ray fluorescence event within the at least some matter of the at least the portion of the at least one individual which has been generated responsive to an at least some input energy resulting from a single input energy event, wherein the at least one induced X-ray fluorescing photon that has passed through the at least some matter of the at least the portion of the at least one individual is at a level to substantially limit interference between the at least one induced X-ray fluorescing photon with an at least one other induced X-ray fluorescing photon that travel for distances greater than a prescribed limit through the at least some matter of the at least the portion of the at least one individual, wherein the at least one other induced X-ray fluorescing photon attenuates by a prescribed percentage after passing through the prescribed distance through the at least some matter of the at least the portion of the at least one individual. | 04-02-2009 |
| 20090086893 | Combining X-Ray fluorescence visualizer, imager, or information provider - One aspect relates to deriving at least one first X-ray fluorescence visualization, image, or provided information substantially within an at least some matter of an at least a portion of an at least one individual at least partially as a result of directing an at least one first applied high energy photon and/or particle having an at least one first input energy towards the at least some matter of the at least the portion of the at least one individual. The aspect comprises deriving at least one second X-ray fluorescence visualization, image, or provided information substantially within the at least some matter of the at least the portion of the at least one individual at least partially as a result of directing an at least one second applied high energy photon and/or particle having an at least one second input energy toward the at least some matter of the at least the portion of the at least one individual. The aspect comprises deriving an at least one combined X-ray fluorescence visualization, combined image, or combined provided information at least partially by combining the at least one first X-ray fluorescence visualization, image, or provided information with the at least one second X-ray fluorescence visualization, image, or provided information. | 04-02-2009 |
| 20090086894 | Time of flight aspects for X-Ray fluorescence visualizer, imager, or information provider - One aspect can relate to determining a total time of flight that indicates an at least one applied duration and an at least one induced duration, wherein the at least one applied duration describes the time for an at least some pulse-type input energy to be applied from a transmission location to an at least one X-ray fluorescing event in the at least some matter of the at least the portion of the at least one individual, and wherein the at least one induced duration describes the time for an at least one induced X-ray fluorescing photon, to travel from the at least one X-ray fluorescing event in the at least some matter of the at least the portion of the at least one individual to a location where the at least one induced X-ray fluorescing photon is received at least partially by a detecting the at least one induced X-ray fluorescing photon. The aspect can relate to determining a location information of the at least one X-ray fluorescing event in the at least some matter of the at least the portion of the at least one individual based at least partially on the total time of flight. | 04-02-2009 |
| 20090086895 | Geometric X-Ray fluorescence visualizer, imager, or information provider - One aspect relates to determining a location of an at least one X-ray fluorescing event occurring within an at least some matter of at least a portion of an individual, wherein the determining the location of the at least one X-ray fluorescing event is based at least in part on determining a relative angle at which an at least one applied high energy photon and/or particle is being applied to the at least some matter of the at least the portion of the individual, a relative position from which an at least one applied high energy photon and/or particle is being applied to the at least some matter of the at least the portion of the individual, a detected location of an at least one induced fluorescing X-ray photon fluoresced during the at least one X-ray fluorescing event, and a received angle at which the at least one induced fluorescing X-ray photon is received. | 04-02-2009 |
| 20090086896 | Tool based X-ray fluorescence visualizing, imaging, or information providing - Certain embodiments of one aspect relates to inducing at least one induced X-ray fluorescing photon within an at least some matter of an at least a portion of an at least one individual responsive to an at least some input energy being applied to the at least some matter of the least the portion of the at least one individual. The aspect can include X-ray fluorescence visualizing, imaging, or information providing within the at least some matter of the least the portion of the at least one individual at least partially in response to the inducing at least one induced X-ray fluorescing photon within the at least some matter of the least the portion of the at least one individual. Certain embodiments of the aspect can include providing a substantial real time tool-based operation to the at least some matter of the least the portion of the at least one individual at least partially relying on the X-ray fluorescence visualizing, imaging, or information providing within the at least some matter of the least the portion of the at least one individual. | 04-02-2009 |
| 20090086897 | X-RAY IMAGING APPARATUS AND X-RAY CONTROLLING METHOD - The present invention provides an X-ray imaging apparatus and X-ray controlling method which allows appropriate X-ray control irrespective of the type and position of a subject. The X-ray controller device for controlling the X-ray emission condition of the X-ray emitter device based on the image information of a fluoroscopic image sets within one frame of the fluoroscopic image a plurality of narrow regions and one single wide region encompassing these narrow regions, selects as the formal region, from within the plurality of narrow regions and the wide region, the region in which the subject is assumed to be present, or selects as the formal region the wide region if there is no region in which the subject is assumed to be present, then control the X-ray emission condition of the X-ray emitter device based on the image information in the formal region. | 04-02-2009 |
| 20090129541 | IN SITU INDICATOR DETECTION AND QUANTITATION TO CORRELATE WITH AN ADDITIVE - An additive formulation includes a carrier material, a first additive present in the carrier material at a first additive concentration, and a tracer present in the carrier material at a first tracer concentration. The tracer is a metal amenable to detection by X-ray fluorescence analysis. Further embodiments include a manufactured article having incorporated therein the additive formulation. A method is also disclosed for detecting an additive in a manufactured article, the method involving application of X-ray fluorescence analysis of the tracer element. | 05-21-2009 |
| 20090147912 | MICROCHIP AND ANALYZING METHOD AND DEVICE EMPLOYING IT - A plurality of elements can be analyzed simultaneously with high sensitivity using a microchip. The microchip ( | 06-11-2009 |
| 20090168956 | X-RAY IMAGING APPARATUS AND FLUOROSCOPIC IMAGE DISPLAY APPARATUS - An X-ray imaging apparatus and a fluoroscopic image display apparatus are provided for displaying postural information of a subject on a fluoroscopic image. The X-ray imaging apparatus detects an X-ray irradiated from an X-ray irradiator and passing through a subject and takes a fluoroscopic image. The X-ray detector includes a visible indicator at a corner of an X-ray incidence plane, a display device that displays a fluoroscopic image based on a detection signal from the X-ray detector together with an orient mark corresponding to the indicator, and a writing device that enables a mark indicating the posture of a subject on the displayed fluoroscopic image. | 07-02-2009 |
| 20090180587 | METHOD OF DETECTING FINE SURFACE DEFECTS - Disclosed herein is a method of detecting fine surface defects, including: applying nano phosphor paste on a surface of a subject; squeegeeing the surface of the subject such that the nano phosphor paste remains only in defects in the subject; and detecting the fine defects in the subject by placing the subject over a light detection plate, irradiating the subject with a light source, and then determining that light-emitting portions detected using the light detection plate are defects in the subject. The method of detecting fine surface defects is advantageous in that the problems with the conventional methods, such as surface contamination, the difficulty in realizing uniform application of a penetrant on a subject, the limitations on the dwelling time of the penetrant and the testing temperature (surface temperature of the subject: 16˜50° C.) thereof, and the contamination of the penetrant, can be overcome, and in that the incidence of inspection errors is decreased, and the time and cost of inspection are reduced, thus improving the production yield of the subject. | 07-16-2009 |
| 20090257554 | METHOD OF MEASURING AND DISPLAYING THE POSITION OF RADIOGRAPHICALLY CONTRASTED MATERIAL WITHIN LUMINAL BODY ORGANS - A system and method for obtaining a quantitative measurement of the location and size of a contrast material within a bodily organ, such as the GI tract of a person. A contrast material is introduced into the organ and a plurality of images is obtained. A curve representing the bodily organ is formed based on the images. Local image fields are defined along the curve and a field intensity is found for each by integrating the intensity of the image in the field. An intensity profile along the length of the curve is thus obtained for each image and provides a quantitative representation of contrast material along the bodily organ. The profiles are displayed in any suitable way. In some embodiments, identification of the curve may be aided by introduction of targets are into the organ. The target locations can be identified in each image. In some embodiments, an image obtained without the contrast material is subtracted from each of the plurality of images to cancel the background radiopacity and isolate the contrast material in each profile. | 10-15-2009 |
| 20090268868 | DEVICE AND METHOD FOR DETECTING DEPOSITS ON AN INNER SURFACE OF A PASSAGE - A method and device for detecting mercury or other material deposits on an inner surface of an enclosed passage are provided. The device includes a detection unit that is adapted to be transported through the passage, and the detection unit includes a radiation source and an x-ray fluorescence detector. The radiation source is configured to emit a radiation emission toward the inner surface of the passage to excite a portion of the inner surface, and the x-ray fluorescence detector is configured to detect a resulting x-ray emission from the portion of the inner surface to identify a material deposit on the inner surface. The detection unit can identify material deposits at successive positions along a length of the passage and thereby generate a plurality of data points, each data point providing an indication of a material deposit existence for a corresponding position along the length of the passage. | 10-29-2009 |
| 20100002833 | X-RAY ANALYSIS APPARATUS AND X-RAY ANALYSIS METHOD - Provided is an X-ray analysis apparatus including: an X-ray tubular bulb for irradiating a sample with a radiation beam; an X-ray detector for detecting a characteristic X-ray and a scattered X-ray and outputting a signal containing energy information on the characteristic X-ray and the scattered X-ray; an analyzer for analyzing the signal; a sample stage capable of moving an irradiation point relatively with respect to the sample within a mapping area set in advance; and an X-ray mapping processing section for discriminating an X-ray intensity corresponding to a specific element, determining an intensity contrast in which a color or lightness is changed in accordance with the X-ray intensity, and for performing image display at a position corresponding to the irradiation point, in which the X-ray mapping processing section determines the intensity contrast of the X-ray intensity at the irradiation point by setting in advance the X-ray intensity discriminated as to a reference material in which a component element and a concentration thereof are known as a reference. | 01-07-2010 |
| 20100020926 | METHOD FOR REPRESENTING INTERVENTIONAL INSTRUMENTS IN A 3D DATA SET OF AN ANATOMY TO BE EXAMINED AS WELL AS A REPRODUCTION SYSTEM FOR PERFORMING THE METHOD - The invention relates to a method for presenting interventional instruments in a 3D data set of an anatomy to be treated. A 3D data set of the anatomy is recorded before introduction of an interventional instrument. Once the interventional instrument has been applied, the spatial position of the instrument is determined by x-ray fluoroscopy from images created at two different angulations. A 3D model of the instrument is formed from the x-ray images. The 3D model of the instrument is fused with the 3D data set of the anatomy. A 3D hologram is reproduced from the fused 3D data set. The 3D hologram is repeatedly reproduced in real time to follow the application of the instrument in the presentation. | 01-28-2010 |
| 20100046700 | X-RAY ANALYZER AND X-RAY ANALYSIS METHOD - An X-ray tube which irradiates a primary X-ray to an irradiation point on a sample, an X-ray detector which detects a characteristic X-ray and a scattered X-ray emitted from the sample and outputs a signal including energy information on the characteristic X-ray and scattered X-ray, an analyzer which analyzes the signal, a sample stage on which the sample is placed, a moving mechanism which moves the sample on the sample stage, the X-ray tube, and the X-ray detector relative to each other, a height measuring mechanism which measures a maximum height of the sample, and a control unit which adjusts the distance between the sample and the X-ray tube and the distance between the sample and the X-ray detector by controlling the moving mechanism on the basis of the measured maximum height of the sample, are included. | 02-25-2010 |
| 20100046701 | X-RAY ANALYZER AND X-RAY ANALYSIS METHOD - An X-ray tube which irradiates a primary X-ray to an irradiation point on a sample, an X-ray detector which detects a characteristic X-ray and a scattered X-ray emitted from the sample and outputs a signal including energy information of the characteristic X-ray and scattered X-ray, an analyzer which analyzes the signal, a first observation system which optically observes a surface of the sample in order to determine the irradiation point, and a second observation system which has a smaller depth of field than the first observation system, optically observes a narrow region, and measures the distance from the determined irradiation point by focus adjustment are included. | 02-25-2010 |
| 20100074405 | Test Method - To provide a method and device for testing the size and conductivity of a foreign material adhered to a substrate for a liquid crystal display device, there is provided a method of testing whether a foreign material including a metal element is adhered to a substrate for a liquid crystal display device, the method including a first test step of detecting the size and position of the foreign material adhered to the substrate and a second test step of testing whether the foreign material includes the metal element at the position detected in the first test step. | 03-25-2010 |
| 20100111251 | X-Ray Analysis Instrument - An apparatus for carrying out both x-ray diffraction (XRD) and x-ray fluorescence (XRF) analysis of a crystalline sample. A sample holder is located within an evacuable chamber. An x-ray fluorescence source and separate x-ray diffraction source are mounted within the evacuable chamber. An XRF detection arrangement is also provided, for detecting secondary x-rays emitted from the surface of the crystalline sample as a result of illumination by x-rays from the said x-ray fluorescence source. An XRD detection arrangement is then provided for detecting x-rays of a characteristic wavelength which have been diffracted by the crystalline sample. A moveable XRD support assembly is provided, comprising a first part configured to mount the XRD source for relative movement between the XRD source and the sample holder, and a second part configured to mount the XRD detection arrangement for relative movement between the XRD detection arrangement and the sample holder. | 05-06-2010 |
| 20100135457 | DEVICE FOR THE X-RAY ANALYSIS OF A SPECIMEN, COMPRISING AN ENERGY/ANGLE-FILTERING DIFFRACTION ANALYSER SYSTEM - A device for X-ray analysis of a sample ( | 06-03-2010 |
| 20100226476 | Low-Profile X-Ray Fluorescence (XRF) Analyzer - A low-profile, hand-holdable, self-contained x-ray fluorescence (XRF) analyzer includes an articulated head. Orientation of the head, relative to a body of the analyzer, may be user adjusted, manually and/or via remote control. A primary x-ray source and an x-ray detector are disposed within the head for articulation therewith. The analyzer may be inserted into a small diameter pipe or other hollow structure, and then the orientation of the head may be adjusted, so a business end of the head is oriented toward a portion of the interior of the pipe or other structure that is to be analyzed. Alternatively, a primary x-ray source and an x-ray detector are disposed within a fixed-orientation head, such that the business end axis of the analyzer is oriented approximately perpendicular to the main axis of the body. Optionally, one or more light sources and cameras may be used to generate images of regions near either of the analyzers to facilitate positioning the analyzer adjacent the sample and, in the case of the articulated head analyzer, orienting the head toward the sample. | 09-09-2010 |
| 20100284512 | PROCESS TO DETERMINE LIGHT ELEMENTS CONTENT OF STEEL AND ALLOYS - The present invention refers to the process of determination of light elements, i.e., molar mass lower than 23, within inorganic materials, by means of spectra analysis between 5 keV and 22 keV, obtained from these materials when exposed to X radiation. Particularly, the invention refers to the direct determination of carbon content in steel and alloys. According to the invention process, the inorganic materials are exposed to X radiation and the spectra are organized as a matrix and mathematically processed using chemometric tools properly selected. | 11-11-2010 |
| 20100290586 | RADIATION THERAPY DEVICE - A radiation therapy device having a therapeutic radiation source and an imaging unit is provided. The imaging unit includes a plurality of diagnostic radiation sources, from which diagnostic X-ray radiation are directed onto an object to be examined, and a diagnostic radiation detector, with which the diagnostic X-ray radiation is detected after passing through the object to be examined. The plurality of diagnostic radiation sources are X-ray radiation sources that are based on carbon nanotubes. A radiation therapy device having a housing, in which a diagnostic radiation source, a diagnostic radiation detector, and a therapeutic radiation source that is rotated in one plane are arranged, is also provided. The diagnostic radiation source and the diagnostic radiation detector are arranged in the housing such that diagnostic X-ray radiation, which is directed by the diagnostic radiation source onto the diagnostic radiation detector, travels at an angle through the plane. | 11-18-2010 |
| 20100296626 | X-RAY FLUOROSCOPE TABLE AND X-RAY FLUOROSCOPE SYSTEM - An X-ray fluoroscope table and an X-ray fluoroscope system using this fluoroscope table with simple structure and easily ensuring an area where a person stands near the top board. | 11-25-2010 |
| 20100303200 | INTRA-LUMEN POLYP DETECTION - An apparatus and a method for detecting clinically-relevant features of the gastrointestinal (GI) tract of a subject are disclosed. The apparatus includes a capsule to be swallowed by a subject and passing through the GI tract of the subject, a capsule housing, a radiation source emitting radiation, a rotatable collimator configured to rotate with respect to the housing and to collimate the radiation emitted by the radiation source, and a radiation detector configured to detect particles, such as photons, gamma radiation, beta radiation and electrons photons generated responsive to the emitted radiation. The apparatus also includes a control unit configured to analyze data regarding the photons. Movement of the capsule in the GI tract can be detected. The radiation source, radiation detector and control unit may advantageously be integrated inside a single housing. | 12-02-2010 |
| 20110058648 | DEVICE AND METHOD FOR PERFORMING X-RAY ANALYSIS - The invention relates to a device for performing X-ray analysis. Device | 03-10-2011 |
| 20110064190 | X RAY IMAGING SYSTEM WITH SCATTER RADIATION CORRECTION AND METHOD OF USING SAME - A CT scanner with scatter correction device and a method for scatter correction are provided. The method comprises positioning shields for shielding some of the CT detector elements from direct X ray radiation, while allowing scattered radiation to arrive at said shielded elements; measuring scatter signals from said shielded elements, indicative of scattered radiation intensity; and correcting for scatter by subtracting scatter intensity values estimated from said measured scatter signals from signals measured by unshielded detector elements. | 03-17-2011 |
| 20110091012 | METHOD FOR THE SAMPLE PREPARATION OF LIQUID OR PASTE-LIKE SUBSTANCES FOR MEASUREMENTS WITH X-RAY FLUORESCENCE AND SAMPLE BODIES SUITED THEREFOR - The invention relates to a process for preparing liquid or pasty substances ( | 04-21-2011 |
| 20110096898 | X-RAY DIFFRACTION AND FLUORESCENCE - An instrument capable of both X-ray diffraction, XRD, and X-ray fluorescence measurements, XRF, arranges an X-ray source | 04-28-2011 |
| 20110158385 | RADIOGRAPHIC IMAGE CAPTURING SYSTEM - A radiographic image capturing system includes a radiographic image capturing device, a radiation irradiating device, and a control device. The radiographic image capturing device is capable of performing fluoroscopic imaging, and carries out capturing of radiographic images continuously. The radiation irradiating device performs continuous irradiation or pulse irradiation with respect to the radiographic image capturing device at a time of fluoroscopic imaging. The control device has a controller that effects control such that, in a case in which a frame rate of fluoroscopic imaging is low, the radiation irradiating device performs fluoroscopic imaging by the continuous irradiation with respect to the radiographic image capturing device. | 06-30-2011 |
| 20110194671 | SAMPLE MODULE WITH SAMPLE STREAM SUPPORTED AND SPACED FROM WINDOW, FOR X-RAY ANALYSIS SYSTEM - An x-ray analysis system with an x-ray source for producing an x-ray excitation beam directed toward an x-ray analysis focal area; and a sample chamber for presenting a fluid sample to the x-ray analysis focal area. The x-ray excitation beam is generated by an x-ray engine and passes through an x-ray transparent barrier on a wall of the chamber, to define an analysis focal area within space defined by the chamber. The fluid sample is presented as a stream supported in the space and streaming through the focal area, using a support structure to guide the sample stream. The chamber's barrier is therefore separated from both the focal area and the sample, resulting in lower corruption of the barrier. | 08-11-2011 |
| 20110255662 | COMPACT COLLIMATING DEVICE - A collimating device is described. The collimating device includes a housing defining an interior surface and an exterior surface of the collimating device. The housing includes an inlet and an outlet and a cavity extending between the inlet and the outlet. The collimating device also includes a plurality of ridges extending from the interior surface of the housing toward a center of the cavity. The plurality of ridges form a plurality of slits within the cavity configured to collimate radiation entering the inlet and exiting the outlet. | 10-20-2011 |
| 20120099699 | Sample cup holding device - Sample cup holding devices including a base member with a top side, a bottom side, and one or more apertures extending from the top side to the bottom side, each of the one or more apertures for receiving a sample cup and maintaining the sample cup in a substantially vertical position, and a method for using same are provided. | 04-26-2012 |
| 20120163534 | X-RAY IMAGING APPARATUS - An X-ray imaging apparatus according to one embodiment captures an X-ray image by irradiating a subject with X-rays from an X-ray generating means, and detecting X-rays that have penetrated the subject with an X-ray detecting means, and includes a working-state detecting means and an X-ray dosage control means. The working-state detecting means detects a plurality of types of working-state information related to the working state of the operator performing surgery on the subject. The X-ray dosage control means, based on the plurality of types of detection results detected by the working-state detecting means, controls the X-ray dosage irradiated from the X-ray generating means. | 06-28-2012 |
| 20120219113 | AN X-RAY DETECTOR SYSTEM FOR ASSESSING THE INTEGRITY AND PERFORMANCE OF RADIATION PROTECTIVE GARMENTS - A method for quantitatively testing a radiation shielding garment to determine its radiation shielding integrity, utilizing a fluoroscopic system, the method comprising measuring the amount of radiation passing through the garment at a particular location believed to be possibly damaged; measuring the amount of radiation at one or more locations of the garment believed to be intact; determining the average undamaged transmission if more than one location is tested; and comparing the two values of transmitted radiation to determine whether the first location was damaged beyond an acceptable degree. | 08-30-2012 |
| 20120230468 | X-RAY ANALYZER - Provided is an X-ray analyzer that is capable of reducing measurement time necessary for mapping analysis by measuring only regions on a sample targeted by a measurer with minimal action. A superimposition process of a mapping image and image data of the sample is performed, and a position corresponding to an irradiation point is determined. Based on the result, the image is displayed, and measurement execution regions are designated on the displayed image and hence a sample moving mechanism moves at high speed in regions excluding the designated regions. | 09-13-2012 |
| 20120294418 | METHOD AND APPARATUS FOR PERFORMING X-RAY ANALYSIS OF A SAMPLE - The invention provides a method of performing X-ray diffraction (XRD) and/or X-ray fluorescence (XRF) analysis of a sample, comprising: irradiating a sample with X-rays from an X-ray source; providing a combined XRD and XRF detection arrangement comprising a scanning wavelength selector and at least one X-ray detector for detecting X-rays selected by the wavelength selector; and performing XRD analysis of the sample by selecting at least one fixed wavelength of X-rays diffracted by the sample using the scanning wavelength selector and detecting X-rays of the selected fixed wavelength(s) at one or more values of the diffraction angle cp at the sample using the X-ray detector(s); and/or performing XRF analysis of the sample by scanning wavelengths of X-rays emitted by the sample using the scanning wavelength selector and detecting X-rays of the scanned wavelengths using the X-ray detector(s). Also provided is an apparatus for performing both X-ray diffraction (XRD) and X-ray fluorescence (XRF) analysis of a sample comprising a combined XRD and XRF detection arrangement comprising a scanning wavelength selector and at least one X-ray detector for detecting X-rays selected by the wavelength selector. | 11-22-2012 |
| 20120321038 | X-RAY TUBE AND X-RAY FLUORESCENCE ANALYSER UTILIZING SELECTIVE EXCITATION RADIATION - An X-ray tube includes a cathode, an anode with an electron receiving surface, and a window facing the electron receiving surface of the anode. On the electron receiving surface of the anode it includes a layer of anode material. Deeper in the anode than the layer of anode material, there is a block of attenuator material. The atomic number of the attenuator material is less than one third of the atomic number of the anode material. | 12-20-2012 |
| 20130003923 | X-ray analysis apparatus with radiation monitoring feature - An XRF analysis apparatus includes a housing with a source of penetrating radiation to be directed at a sample and a detector for detecting fluoresced radiation from the sample. A shield is attachable to the housing to protect the user from radiation and a safety interlock is configured to detect whether or not the shield is attached to the housing. A controller is responsive to the safety interlock, and configured to monitor usage of the source of radiation at or above a predetermined power level when the shield is not attached to the housing and provide an output signal when the monitored usage of the source of penetrating radiation at or above the predetermined power level without the shield attached to the housing exceeds one or more predetermined thresholds. | 01-03-2013 |
| 20130022166 | X-RAY ANALYSIS APPARATUS WITH DETECTOR WINDOW PROTECTION FEATURE - An X-ray fluorescence (XRF) instrument comprises a hand-held device housing which holds a radiation emitter configured to emit radiation directed at a test object and a radiation detector housed inside a chamber closed by a sealing window and configured to detect radiation of the test object, caused by the test object being exposed to the emitted radiation. A protective cover mechanism is affixed to the testing device and is configured to have a closed position which covers or blocks access to the sealing window to protect it from being broken or damaged by debris or other obstructions, and an open position which exposes the sealing window to allow the un-obstructed passage of radiation therethrough. The cover mechanism can be implemented variously, including by a pivotally mounted cover plate, an iris mechanism, a fan-like cover and the like. Debris can be detected variously, including by strain sensors, optical detectors and proximity sensors. | 01-24-2013 |
| 20130034204 | X-RAY ANALYZER AND X-RAY ANALYSIS METHOD - An X-ray analyzer ( | 02-07-2013 |
| 20130039460 | METHODS AND SYSTEMS FOR DETERMINING A CRITICAL DIMENSION AND OVERLAY OF A SPECIMEN - Methods and systems for monitoring semiconductor fabrication processes are provided. A system may include a stage configured to support a specimen and coupled to a measurement device. The measurement device may include an illumination system and a detection system. The illumination system and the detection system may be configured such that the system may be configured to determine multiple properties of the specimen. For example, the system may be configured to determine multiple properties of a specimen including: but not limited to, critical dimension and overlay misregistration; defects and thin film characteristics; critical dimension and defects; critical dimension and thin film characteristics; critical dimension, thin film characteristics and defects; macro defects and micro defects; flatness, thin film characteristics and defects; overlay misregistration and flatness; an implant characteristic and defects; and adhesion and thickness. In this manner, a measurement device may perform multiple optical and/or non-optical metrology and/or inspection techniques. | 02-14-2013 |
| 20130044858 | SAMPLE VISCOSITY AND FLOW CONTROL FOR HEAVY SAMPLES, AND X-RAY ANALYSIS APPLICATIONS THEREOF - An x-ray analysis system having an x-ray engine with an x-ray source for producing an x-ray excitation beam directed toward an x-ray analysis focal area; a sample chamber for presenting a sample stream to the x-ray analysis focal area, the analysis focal area disposed within a sample analysis area defined within the chamber; an x-ray detection path for collecting secondary x-rays and directing the x-rays toward a detector; an x-ray transparent barrier on a wall of the chamber through which the x-rays pass; and a blocking structure partially blocking the sample analysis area, for creating sample stream turbulence in the sample analysis area and over the barrier. The blocking structure may be disposed asymmetrically about a central axis of the x-ray analysis focal area and/or the sample analysis area; and may be a rounded pin. A heating element may be used to heat the sample stream for improving flow. | 02-21-2013 |
| 20130077742 | SYSTEM AND METHOD FOR CHARACTERIZING A FILM BY X-RAY PHOTOELECTRON AND LOW-ENERGY X-RAY FLUORESCENCE SPECTROSCOPY - Systems and methods for characterizing films by X-ray photoelectron spectroscopy (XPS) are disclosed. For example, a system for characterizing a film may include an X-ray source for generating an X-ray beam having an energy below the k-edge of silicon. A sample holder may be included for positioning a sample in a pathway of the X-ray beam. A first detector may be included for collecting an XPS signal generated by bombarding the sample with the X-ray beam. A second detector may be included for collecting an X-ray fluorescence (XRF) signal generated by bombarding the sample with the X-ray beam. Monitoring/estimation of the primary X-ray flux at the analysis site may be provided by X-ray flux detectors near and at the analysis site. Both XRF and XPS signals may be normalized to the (estimated) primary X-ray flux to enable film thickness or dose measurement without the need to employ signal intensity ratios. | 03-28-2013 |
| 20130083890 | Apparatus and Method for Detecting Marks and Semiconductor Device Processing System - The present invention discloses an apparatus and a method for detecting a mark as well as a semiconductor device processing system. In order to address the problem existing in the prior art that detection of a mark in a layer of a semiconductor device has a low accuracy, the present invention uses an X-ray emitter and an X-ray detector to image the mark contained in the layer of the semiconductor device supported on the supporting member. According to the present invention, due to the use of the X-ray, even if the mark is covered by multiple layers which are opaque to visible light, the mark may be clearly imaged. | 04-04-2013 |
| 20130089178 | X-ray inspection of bumps on a semiconductor substrate - A method for inspection includes irradiating, with a focused beam, a feature formed on a semiconductor wafer, the feature including a volume containing a first material and a cap made of a second material, different from the first material, that is formed over the volume. One or more detectors positioned at different angles relative to the feature are used to detect X-ray fluorescent photons that are emitted by the first material in response to the irradiating beam and pass through the cap before striking the detectors. Signals output by the one or more detectors at the different angles in response to the detected photons are processed in order to assess a quality of the cap. | 04-11-2013 |
| 20130101085 | X-RAY FLUORESCENCE SPECTROMETER AND X-RAY FLUORESCENCE ANALYZING METHOD - The X-ray fluorescence spectrometer of the present invention includes a sample table ( | 04-25-2013 |
| 20130121460 | X-RAY INTENSITY CORRECTION METHOD AND X-RAY DIFFRACTOMETER - An X-ray intensity correction method makes the background uniform by adjusting a raster element and an X-ray diffractometer. An X-ray intensity correction method for correcting the intensity of diffracted X-rays includes the steps of focusing X-rays on a sample for correction placed at a gonio center, entering fluorescent X-rays excited by the focused X-rays into a raster element formed by polycapillaries and having a unique focal point, detecting the fluorescent X-rays having passed through the raster element; and adjusting the arrangement of the raster element so that the fluorescent X-rays can uniformly be detected regardless of the detecting position. Since fluorescent X-rays are used, it is possible to adjust the position of the raster element because if the focal point of the raster element coincides with the gonio center, the intensity becomes uniform regardless of the detected position. | 05-16-2013 |
| 20130272496 | System and Method for Step Coverage Measurement - Determining an unknown step coverage of a thin film deposited on a 3D wafer includes exposing a planar wafer comprising a first film deposited thereon to X-ray radiation to create first fluorescent radiation; detecting the first fluorescent radiation; measuring a number of XRF counts on the planar wafer; creating an XRF model of the planar wafer; providing a portion of the 3D wafer comprising troughs and a second film deposited thereon; determining a multiplier factor between the portion of the 3D wafer and the planar wafer; exposing the portion of the 3D wafer to X-ray radiation to create second fluorescent radiation; detecting the second fluorescent radiation; measuring a number of XRF counts on the portion of the 3D wafer; calculating a step coverage of the portion of the 3D wafer; and determining a uniformity of the 3D wafer based on the step coverage of the portion of the 3D wafer. | 10-17-2013 |
| 20130294576 | MONOCHROMATIC X-RAY DEVICES AND METHODS OF USE - Described herein are devices for converting a broadband x-ray beam to at least one substantially monochromatic x-ray beam. The devices may be an adaptor for existing x-ray machines or for use with a standalone machine. The device | 11-07-2013 |
| 20130294577 | WAVELENGTH DISPERSIVE X-RAY FLUORESCENCE SPECTROMETER - In the wavelength dispersive X-ray fluorescence spectrometer of the present invention, a counting loss correcting unit ( | 11-07-2013 |
| 20140126692 | ELECTRON EXCITED X-RAY FLUORESCENCE DEVICE - A device for providing for electron excited x-ray fluorescence may include means for driving two contacting surfaces against each other in a low fluid pressure environment, such that high energy electrons strike a sample under test and provide for x-ray fluorescence of the sample. The sample under test may be in or on a sample holder, whose position with respect to the contacting surfaces is adjustable. For example, the sample holder may be positionable to be a different distances from the contacting surfaces. | 05-08-2014 |
| 20140146940 | SAMPLE HOLDER - A two or three part sample holder for X-ray apparatus has a sample ring | 05-29-2014 |
| 20140205062 | System and Method For Imaging Defects - The invention is directed to a defect imaging device that has an energy beam that is directed at a device under test. The energy beam creates positrons deep within the material of the device under test. When the positrons combine with electrons in the material they produce a pair of annihilation photons. The annihilation photons are detected. The Doppler broadening of the annihilation photons is used to determine if a defect is present in the material. Three dimensional images of the device under test are created by directing the energy beam at different portions of the device under test. | 07-24-2014 |
| 20140254751 | RADIOGRAPHIC EXAMINATION APPARATUS AND METHOD FOR THE SAME - A radiographic examination apparatus improves response to fluoroscopy or continuous shooting by changing promptly the power-output of an X-ray tube. The apparatus and method, when an absolute value of variation C per fixed time interval between the filament electric current of current pulse-output calculated by the filament electric current variation calculation element is more than a setup value, a flash control between pulse conducts increases or decreases temporarily the filament electric current between pulses to become the filament electric current on flash control between pulses calculated by a filament electric current calculation element based on a radiation condition of a current pulse-output and the radiation condition of following pulse-output. | 09-11-2014 |
| 20140254752 | LUMINESCENCE BASED SPECTROMETERS - Various embodiments of systems, components, modules, routines, and processes for luminescence based spectral measurement are described herein. In one embodiment, a method for measuring a scintillation property of a sample includes directing an ionizing radiation toward the sample, thereby inducing the sample to produce an emission. The method also includes acquiring a spectral luminescence of the produced emission by the sample, the spectral luminescence including a plurality of luminescence intensities at corresponding emission wavelengths or frequencies. The scintillation property of the sample may then be determined based on the acquired spectral luminescence. | 09-11-2014 |
| 20140286474 | X-Ray Fluorescence Analyzer - An X-ray fluorescence analyzer includes a sample stage having an opening at an X-ray irradiation position, an X-ray source which irradiates a sample placed on the opening with a primary X-ray from below, a detector which detects an X-ray fluorescence generated from the sample, a transparent drop prevention plate supported to be advanced and retracted immediately below the opening, a drive mechanism which advances and retracts the drop prevention plate, an observation camera which observes the drop prevention plate positioned immediately below the opening, and an operation unit which processes an image of the drop prevention plate which is captured by the observation camera. The operation unit detects a foreign matter on the drop prevention plate based on an image difference between images before and after the drive mechanism moves or vibrates the drop prevention plate within an observation range of the observation camera. | 09-25-2014 |
| 20140294143 | X-Ray Fluorescence Spectrometer - An X-ray fluorescence spectrometer includes: a sample stage configured to place a sample thereon; an X-ray source configured to irradiate the sample with primary X-rays; a detector, which is configured to detect fluorescent X-rays produced from the sample irradiated with the primary X-rays, and which includes an X-ray incident window formed by a window material through which fluorescent X-rays is transmittable; and a gas blowing mechanism configured to blow a gas to at least one of an outer surface of the X-ray incident window and the sample stage. | 10-02-2014 |
| 20140294144 | Foreign Matter Detector - A foreign matter detector includes an X-ray source which irradiates a sample moving in a constant direction with primary X-rays, a parallel two-dimensional slit which includes a plurality of slits arranged in at least a moving direction of the sample and emits parallel secondary X-rays by extracting a parallel component of secondary X-rays generated from the sample, a dispersing element which disperses the parallel secondary X-rays to obtain a specific X-ray fluorescence, a TDI sensor which receives the X-ray fluorescence, and a control unit which controls the TDI sensor to detect a foreign matter corresponding to the X-ray fluorescence. The control unit integrates a luminance value of the X-ray fluorescence received by the TDI sensor while matching a direction and a speed of charge transfer of the TDI sensor to a direction and a speed of movement of the sample. | 10-02-2014 |
| 20150078517 | SYSTEM AND METHOD FOR TESTING CERAMIC COATINGS - A method of testing for impurities includes directing an x-ray source toward a surface at an angle α relative to the plane of the surface, the surface defined by a ceramic coating over a crystalline substrate; detecting electromagnetic radiation emitted from the ceramic coating at an angle θ different from the angle α and its supplementary angle; and comparing characteristics of the detected electromagnetic radiation to characteristics associated with impurities. | 03-19-2015 |
| 20150085976 | X-ray Fluorescence Analyzer With Safety Features - A portable X-ray fluorescence analyzer comprises a detector of ionizing radiation that is configured to detect radiation from spontaneous radioactive decay within an environment of the portable X-ray fluorescence analyzer and or ionizing radiation that propagates past a front end of the portable X-ray fluorescence analyzer towards its user. | 03-26-2015 |
| 20150085977 | Portable Analyzer with Radiation Safety Features - A portable analyzer comprises a detector of ionizing radiation that is configured to detect radiation from spontaneous radioactive decay within an environment of the portable analyzer and or ionizing radiation that propagates past a front end of the portable analyzer towards its user. | 03-26-2015 |
| 20150103973 | X-RAY SYSTEM WITH MULTIPLE DYNAMIC RANGE SELECTIONS - An x-ray system with multiple dynamic range selections. The system including an x-ray source and a detector, wherein the detector includes a scintillator and a pixel. The pixel includes a photodiode and first and second capacitors connectable to the photodiode. The pixel is configured to be switched between a first state where only the first capacitor is connected to the photodiode and a second state where both capacitors are connected to the photodiode. The x-ray source directs x-rays to the detector and a region of interest positioned between the source and detector, the scintillator converts the x-rays to light, and the pixel photodiode converts the light to an electrical charge. The charge is stored in the first capacitor when the pixel is in the first state and in the first and second capacitors when the pixel is in the second state. | 04-16-2015 |
| 20150357069 | HIGH BRIGHTNESS X-RAY ABSORPTION SPECTROSCOPY SYSTEM - This disclosure presents systems for x-ray absorption fine structure (XAFS) measurements that have x-ray flux and flux density several orders of magnitude greater than existing compact systems. These are useful for laboratory or field applications of x-ray absorption near-edge spectroscopy (XANES) or extended x-ray fine absorption structure (EXFAS) spectroscopy. | 12-10-2015 |
| 20150362445 | X-RAY FLUORESCENCE ANALYZER - An X-ray fluorescence analyzer includes: a measurement device having: an X-ray source that emits an X-ray; an irradiation area restricting member that restricts an area of a measurement sample to be irradiated with the X-ray as a primary X-ray; and a detector that detects a secondary X-ray generated from the measurement sample. The analyzer further includes: a sample stage that holds and moves the measurement sample between a measurement position at which the measurement sample is irradiated with the primary X-ray to detect the secondary X-ray by the detector and a first retracted position at which the measurement sample is retracted from the measurement position; and a calibration sample moving mechanism that holds a calibration sample for calibrating the measurement device and moves the calibration sample between the measurement position and a second retracted position at which the calibration sample is retracted from the measurement position. | 12-17-2015 |
| 20150377805 | COMBINED HANDHELD XRF AND OES SYSTEMS AND METHODS - A combined handheld XRF and LIBS system and method includes an XRF subsystem with an X-ray source operated at a fixed medium voltage and configured to deliver X-rays to a sample without passing through a mechanized filter and a detector for detecting fluoresced radiation from the sample. The LIBS subsystem includes a low power laser source for delivering a laser beam to the sample and a narrow wavelength range spectrometer subsystem for analyzing optical emissions from the sample. The X-ray source is operated at the fixed medium voltage to analyze the sample for a first group of elements, namely, transition and/or heavy metals. The low power laser source is operated to analyze the sample for a second group of elements the XRF subsystem cannot reliably detect, namely, C, Be, Li, Na, and/or B, and to analyze the sample for a third group of elements the XRF subsystem cannot reliably detect at the fixed voltage, namely, Al, Si, and/or Mg, or where the XRF subsystem would require higher tube voltage, namely Cd, Ag, In, Sn, Sb, and/or Ba; and/or rare earth elements. | 12-31-2015 |
| 20160010920 | Preparation of samples for XRF using flux and platinum crucible | 01-14-2016 |
| 20160025658 | VISIBLE X-RAY INDICATION AND DETECTION SYSTEM FOR X-RAY BACKSCATTER APPLICATIONS - An X-ray backscatter indication and detection system, including an object disposed with respect to a target area targeted by X-rays, such that X-rays that backscatter from the target area strike the surface of the object. The surface of the object includes an X-ray sensitive indicator substance that fluoresces with a visible light when contacted by backscattered X-rays. | 01-28-2016 |
| 20160033428 | SAMPLE VISCOSITY AND FLOW CONTROL FOR HEAVY SAMPLES, AND X-RAY ANALYSIS APPLICATIONS THEREOF - An x-ray analysis system having an x-ray engine with an x-ray source for producing an x-ray excitation beam directed toward an x-ray analysis focal area; a sample chamber for presenting a sample stream to the x-ray analysis focal area, the analysis focal area disposed within a sample analysis area defined within the chamber; an x-ray detection path for collecting secondary x-rays and directing the x-rays toward a detector; an x-ray transparent barrier on a wall of the chamber through which the x-rays pass; and a blocking structure partially blocking the sample analysis area, for creating sample stream turbulence in the sample analysis area and over the barrier. The blocking structure may be disposed asymmetrically about a central axis of the x-ray analysis focal area and/or the sample analysis area; and may be a rounded pin. A heating element may be used to heat the sample stream for improving flow. | 02-04-2016 |
| 20160054241 | PREPARATION OF SAMPLE-PELLETS BY PRESSING - A sample may be prepared for measurement by pressing, for example for XRF. In some cases, the sample may include a component that may mobilise on pressing. Such samples may be prepared by adding a binder to the sample. The binder includes an additive for binding the component that may mobilise and may include an additional component or components such as wax. The binder may be activated carbon, graphite or a mixture. The sample may be mixed using a mill, for example, and pressed into a pellet. Measurements may then be made on the pressed sample. | 02-25-2016 |
| 20160054242 | XRF Analyzer Communication - An x-ray fluorescence (XRF) analysis system | 02-25-2016 |
| 20160054243 | XRF Analyzer Activation Switch - The invention includes various electronic devices for avoiding or minimizing XRF analyzer user fatigue. In one embodiment, the XRF analyzer can include a finger sensor for activating an XRF analysis. In another embodiment, the XRF analyzer can include a finger tap switch for activating the XRF analysis. In another embodiment, the XRF analyzer can include a microphone for activating the XRF analysis by receipt of a verbal command. Additional benefits of some embodiments include improving XRF analysis safety and avoiding XRF analyzer theft. | 02-25-2016 |
| 20160061730 | FLUORESCENCE DETECTION APPARATUS, TEST SUBSTANCE DETECTION APPARATUS, AND FLUORESCENCE DETECTION METHOD - Disclosed is an embodiment of a fluorescence detection apparatus comprises a photodetector that detects a plurality of colors of light; a light filter member on or above the photodetector that transmits light at or above a predefined wavelength and that cuts off light with a wavelength included in a wavelength band below the predefined wavelength, the predefined wavelength being included in a wavelength band being a sensitivity range of the photodetector; an irradiator that irradiates a fluorescent substance on the light filter member, with excitation light with a peak wavelength included in the wavelength band below the predefined wavelength; and a first correction unit that compensates for a signal of light cut off by the light filter member out of fluorescence emitted from the fluorescent substance in response to irradiation from the excitation light. | 03-03-2016 |
| 20160061753 | X-RAY FLUORESCENCE ANALYZER AND METHOD OF DISPLAYING SAMPLE THEREOF - An X-ray fluorescence analyzer includes a sample stage, a sample moving mechanism, an X-ray source, a detector detecting a fluorescent X-ray generated from the sample irradiated with a primary X-ray, an imaging device imaging the sample, a display device displaying the image on a screen, a pointing device designating a specific position on the screen for allowing an input at the specific position, an image processing device displaying a mark at the input position on the screen by the pointing device and a control device controlling the sample moving mechanism and the image processing device and, when the sample stage is moved, controlling the image processing device to display the mark on the screen with moving the mark in the same moving direction as that of the sample stage by the same moving distance. | 03-03-2016 |
| 20160091442 | VISUAL INDICATOR OF AN EXPOSED GAMMA SOURCE - A device for indicating a presence of X-rays or gamma rays may include a visual indicator. The visual indicator may include a material and a plurality of quantum dots adhering to the material or disposed in the material. The quantum dots may be exposed on a surface of the material opposite an object when the material is attached to the object. The quantum dots fluoresce in response to the quantum dots being exposed to X-rays or gamma rays. | 03-31-2016 |
| 20160116424 | X-RAY FLUORESCENCE SPECTROMETER - The present invention has an object to provide an X-ray fluorescence spectrometer capable of preventing a decrease in analysis precision of light elements whose atomic number is less than 23 and making helium gas replacement for the inside of an analysis chamber more efficient. An X-ray fluorescence spectrometer of the present invention includes: an X-ray tube | 04-28-2016 |
| 20160146745 | X-RAY FLUORESCENCE ANALYZER AND X-RAY FLUORESCENCE ANALYZING METHOD - An X-ray fluorescence analyzer includes: a sample stage; an X-ray source; a detector; an X stage; a Y stage; a θ stage; and a shielding container, wherein the irradiation position with primary X-rays is set at an offset position from a movement center of the X stage and the Y stage, wherein an irradiation area that is irradiatable with the primary X-rays is set to a selected segmented area from among segmented areas that are defined by segmenting the surface of the sample into four parts with a virtual segment lines in the X direction and the Y direction passing through the movement center, and wherein the θ stage is configured to switch the selected segmented area into any one of the segmented areas by rotating the sample stage by every 90 degrees. | 05-26-2016 |
| 20160161428 | X-RAY FLUORESCENCE ANALYZER - An X-ray fluorescence analyzer includes: a sample stage having a mounting surface on which a sample on which a sample is mounted is mounted; an X-ray source configured to irradiate the sample with primary X-rays and disposed immediately above an irradiation position of the sample; a detector configured to detect fluorescent X-rays emitted from the sample irradiated with the primary X-rays; and a shielding container configured to accommodate the sample stage, the X-ray source, and the detector and includes: a sample chamber configured to accommodate the sample stage; and a door provided at a top of the sample chamber and configured to open and close at least a front half of the sample chamber, wherein the X-ray source and the detector are disposed at a rear half of the sample chamber. | 06-09-2016 |
| 20170234814 | X-RAY THIN FILM INSPECTION DEVICE | 08-17-2017 |
| 20170234815 | XRF Analyzer Communication | 08-17-2017 |
| 20170238406 | XRF Analyzer Activation Switch | 08-17-2017 |
