| Class / Patent application number | Description | Number of patent applications / Date published |
|---|
| 378050000 | Thickness or density analysis | 7 |
| 20090074137 | ACCURATE MEASUREMENT OF LAYER DIMENSIONS USING XRF - A method for inspection of a sample includes directing an excitation beam to impinge on an area of a planar sample that includes a feature having sidewalls perpendicular to a plane of the sample, the sidewalls having a thin film thereon. An intensity of X-ray fluorescence (XRF) emitted from the sample responsively to the excitation beam is measured, and a thickness of the thin film on the sidewalls is assessed based on the intensity. In another method, the width of recesses in a surface layer of a sample and the thickness of a material deposited in the recesses after polishing are assessed using XRF. | 03-19-2009 |
| 20110080998 | Test Method and Test Device - To provide a method and device for testing the size and conductivity of a foreign material adhered to a substrate for a liquid crystal display device, there is provided a method of testing whether a foreign material including a metal element is adhered to a substrate for a liquid crystal display device, the method including a first test step of detecting the size and position of the foreign material adhered to the substrate and a next step of testing whether the foreign material includes the metal element at the position detected in the first test step. | 04-07-2011 |
| 20110170659 | Method for detecting fine particles in fluid with X-ray - An object of the present invention is to provide a method and an apparatus which solve problems such as a measurement error due to air bubbles in a scattering method and a light-shielding method, count loss due to different elements and impossible measurement due to emulsification, and can easily and accurately measure the number, the particle size and the like of fine particles in a fluid at a low cost. A detection apparatus for fine particles in a fluid includes: a flow cell | 07-14-2011 |
| 20120328075 | System and method for measuring the thickness of a zinc layer on steel and for measuring the iron concentration in a zinc layer - A Compton radiation detection device for determining of Compton radiation of iron, includes a sensor and a filter arrangement. The filter arrangement is adapted such that the radiation emitted by a test object due to Compton scattering passes a nickel layer and an iron layer before being detected by the sensor. A dispersive ionization chamber includes an ionization chamber having a plurality off ionization volumes and a window. Each ionization volume includes an electrode. Radiation can enter through the window. The ionization volumes are arranged in a beam propagation direction behind each other. Radiation having lower energy is statistically absorbed in ionization volumes located more proximal to the window. Radiation having higher energy is statistically absorbed in the ionization volumes located more distal from the window. | 12-27-2012 |
| 20150316369 | FILM THICKNESS MEASUREMENT DEVICE - Substrate aluminum detection means ( | 11-05-2015 |
| 20150362639 | OPTICAL MIRROR, X-RAY FLUORESCENCE ANALYSIS DEVICE, AND METHOD FOR X-RAY FLUORESCENCE ANALYSIS - The invention relates to an x-ray fluorescence analysis device, comprising an x-ray source ( | 12-17-2015 |
| 20160033429 | HANDHELD INSTRUMENT AS WELL AS MOBILE DEVICE FOR X-RAY FLUORESCENCE ANALYSIS - The invention relates to a handheld instrument and a mobile device for x-ray fluorescence analysis, having a housing ( | 02-04-2016 |
