Entries |
Document | Title | Date |
20080205592 | XRF analyzer - An XRF system, preferably handheld, includes an X-ray source for directing X-rays to a sample, a detector responsive to X-rays emitted by the sample, and a filter assembly with multiple filter materials located between the X-ray source and the detector. An analyzer is responsive to detector and is configured to analyze the intensities of X-rays irradiated by the sample at one power setting and to choose a filter material which suppresses certain intensities with respect to other intensities. A device, controlled by the analyzer, automatically moves the filter assembly to the chosen filter material and then the analyzer increases the power setting to analyze certain non-suppressed intensities. | 08-28-2008 |
20080212736 | Element Analysis Device - Described is an element analysis device, which can be used to obtain precise measurements even under unfavorable environmental conditions. For this, the device is provided with a transporting means with a measuring region ( | 09-04-2008 |
20080279329 | HIGH SPEED MATERIALS SORTING USING X-RAY FLUORESCENCE - A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection. The x-ray source may irradiate the first x-rays at a high intensity, and the x-ray source may be an x-ray tube. | 11-13-2008 |
20080285714 | Process and Device for the Fast or On-Line Determination of the Components of a Two-Component or Multi-Component System - Process and device for fast or on-line determination of the components of a two-component or multiple-component system in which the elements which constitute the individual components differ by their atomic number. The following steps are carried out: the surface of the substance is irradiated with polychromatic X-ray or monochromatic gamma radiation, the X-ray radiation exhibiting in the energy range from 1 to 30 keV one or more peaks in the continuum. The spectrum of the radiation backscattered and emitted by the substance is measured in an energy range from 1 to 30 keV with a resolution of at least 250 eV. The spectrum is analysed in that at least the intensities of the elastically backscattered and inelastically backscattered peaks are separately determined and at least some K | 11-20-2008 |
20080310588 | XRF analyzer - A method of analyzing a fluid sample by XRF includes the steps of: depositing the fluid sample onto a substrate, exposing the sample and the substrate to an x-ray emission, generating a first analytical signal responsive to the x-ray emission, providing an operable first reference material having a first extended position above the substrate and in communication with the x-ray emission, periodically extending the first reference material to its first extended position, generating a first calibration signal, providing an operable second reference material having a first extended position below the substrate and in communication with the x-ray emission, and periodically extending the second reference material to its first extended position and generating at least one second calibration signal. The first and second calibration signals are compared with predetermined values. The first and second reference materials also have second retracted positions. | 12-18-2008 |
20090041184 | X-RAY FLUORESCENCE SPECTROMETER AND PROGRAM USED THEREIN - An X-ray fluorescence spectrometer which includes a calculating device ( | 02-12-2009 |
20090046832 | Well Plate - The present invention includes an apparatus for preparing samples for measurement by x-ray fluorescence spectrometry. The apparatus comprises a plate having one or more holes passing through the plate. The holes are covered by a film on one side of the plate. The holes are less than 500 micrometers across in one dimension where the film covers the holes. The film is translucent to x-rays. The present invention also includes an apparatus for preparing samples for measurement by x-ray fluorescence spectrometry. The apparatus comprises a plate having one or more holes passing through the plate. The holes are covered on one side of the plate by a detachable cover forming a water-tight seal against the plate. The cover is substantially free of the elements osmium, yttrium, iridium, phosphorus, zirconium, platinum, gold, niobium, mercury, thallium, molybdenum, sulfur, lead, bismuth, technetium, ruthenium, chlorine, rhodium, palladium, argon, silver, and thorium. The holes are less than about 500 micrometers across in one dimension where the cover covers the holes. The present invention also includes a method for preparing samples for measurement by x-ray fluorescence spectrometry. The method comprises providing a solution of with less than 10 micromolar solute and a volume of between about 2 microliters and about 2 milliliters. The solution is concentrated and analyzed using x-ray fluorescence spectrometry. | 02-19-2009 |
20090052620 | Apparatus and Method for X-Ray Analysis of Chemical State - A state analysis using characteristic X-rays of higher-order diffractions. The name of an element undergoing a state analysis, a species of characteristic X-rays, and a diffraction order are entered from an input device. A measurement control unit reads data about the wavelengths of first-order lines from a storage device in accordance with the specified species of the characteristic X-rays, and finds the actual spectral wavelength position and range of measured wavelengths based on the diffraction order. | 02-26-2009 |
20090067572 | Measurement of Lead by X-Ray Fluorescence - A method, instrument, and computer program software product for characterizing a sample with respect to the presence of a specified element, either as a constituent of a surface layer or of the bulk of the sample. Intensities of fluorescent emission at two characteristic emission lines are compared to establish whether the specified element is disposed above the bulk of the sample. In the case where the specified element is disposed above the bulk of the sample, an areal density of the specified element is determined, whereas in the case where the specified element is disposed within the bulk of the sample, a volumetric concentration of the specified element within the sample is determined. | 03-12-2009 |
20090086898 | ANALYTICAL X-RAY TUBE FOR CLOSE COUPLED SAMPLE ANALYSIS - An x-ray device and method useful in performing close coupled sample analyses. The x-ray device includes an evacuated enclosure having a window and in which is disposed a cathode assembly, control grid, insulator, and anode arranged so that the anode is interposed between the electron source and the window. The anode includes a target surface oriented toward the window and the anode defines a drift tunnel which is substantially aligned with a hollow defined by the insulator. The control grid can be used to influence the energy of the electrons emitted by the filament of the cathode assembly. A high voltage field between the anode and filament causes electrons emitted by the cathode to accelerate rapidly through the insulator. After accelerating to an energy level consistent with the high voltage field, the electrons then pass through the drift tunnel without gaining any additional appreciable energy. The potential difference between the target surface and the window causes the drifting electrons to decelerate, and eventually stop, before they can strike the window. The decelerated electrons then re-accelerate, under the influence of the potential between the window and the anode, toward the target surface, striking the target surface and producing x-rays which are directed through the window so as to impact a sample. One or more detectors proximate to the sample sense the characteristic response emitted by the sample when it is struck by the x-rays produced by the x-ray tube. A computer in communication with the detectors facilitates processing and analysis of the characteristic response sensed by the detectors. | 04-02-2009 |
20090086899 | Repositioning X-ray fluorescence visualizer, imager, or information provider - One aspect can relate to performing a first X-ray fluorescence visualizing, imaging, or information providing within a first field of view in an at least some matter of an at least a portion of an at least one individual based on at least one induced fluorescing X-ray photon. The aspect can include operationally repositioning the first X-ray fluorescence visualizing, imaging, or information providing to X-ray fluorescence visualize, image, or information provide from within the first field of view to within a second field of view. The aspect can include performing a second X-ray fluorescence visualizing, imaging, or information providing within the second field of view within the at least some matter of the at least the portion of the at least one individual. | 04-02-2009 |
20090086900 | Portable aspects for x-ray fluorescence visualizer, imager, or information provider - One aspect relates to inducing at least one induced X-ray fluorescing photon at a X-ray fluorescence event within an at least some matter of an at least a portion of an at least one individual responsive to an at least some input energy being applied to the at least some matter of the at least the portion of the at least one individual. The aspect can include detecting the at least one induced X-ray fluorescing photon, wherein the inducing at least one induced X-ray fluorescing photon and the detecting the at least one induced X-ray fluorescing photon is configured to be transported portably as a self-contained and self-powered unit. | 04-02-2009 |
20090086901 | X-ray fluorescence visualizing, imaging, or information providing of chemicals, compounds, or biological materials - One aspect can relate to detecting a presence of an at least one chemical, compound, or biological material contained in an at least some matter of an at least a portion of an at least one individual based at least partially on addition of an at least one chemical identifying additive to the at least some matter of the at least the portion of the at least one individual based at least partially on a generation of an at least one induced X-ray fluorescing photon within the at least one chemical identifying additive responsive to a single input energy event in which an at least some input energy is being applied proximal to the at least one chemical, compound, or biological material contained in the at least some matter of the at least the portion of the at least one individual. | 04-02-2009 |
20090086902 | Personal transportable X-ray fluorescence visualizing, imaging, or information providing - One aspect relates to inducing at least one induced X-ray fluorescing photon at a X-ray fluorescence event within an at least some matter of an at least a portion of an at least one individual responsive to an at least some input energy being applied to the at least some matter of the at least the portion of the at least one individual. The aspect can relate to detecting the at least one induced X-ray fluorescing photon, wherein the inducing at least one induced X-ray fluorescing photon and the detecting the at least one induced X-ray fluorescing photon is configured to be performed at least partially with at least one device which is configured to be transported portably by a person. | 04-02-2009 |
20090086903 | Selective elemental color providing for X-ray fluorescence visualization, imaging, or information providing - One aspect relates to selective X-ray fluorescence visualization, imaging, or information providing of an at least some matter of an at least a portion of an individual that at least partially indicates an at least one differentiatable element composition of the at least some matter of the at least the portion of the individual, wherein the selective X-ray fluorescence visualization, imaging, or information providing selectively displays a first at least one differentiatable element composition of the at least some matter of the at least the portion of the individual at least partially responsive to a first single input energy event based at least partially on an at least some first input energy being applied to the at least some matter of the at least the portion of the individual, and the selective X-ray fluorescence visualization, imaging, or information providing selectively displays a second at least one differentiatable element composition of the at least some matter of the at least the portion of the individual that is interpretable distinctly from the first at least one differentiatable element composition. | 04-02-2009 |
20090086904 | X-Ray fluorescence visualizing, imaging, or information providing of chemicals, compounds, or biological materials - One aspect can relate to detecting a prescence of an at least one chemical, compound, or biological material contained in an at least some matter of an at least a portion of an at least one individual based at least partially on addition of an at least one chemical identifying additive to the at least some matter of the at least the portion of the at least one individual based at least partially on a generation of an at least one induced X-ray fluorescing photon within the at least one chemical identifying additive responsive to a single input energy event in which an at least some input energy is being applied proximal to the at least one chemical, compound, or biological material contained in the at least some matter of the at least the portion of the at least one individual. | 04-02-2009 |
20090220045 | Portable X-Ray Fluorescence Instrument with Tapered Absorption Collar - An instrument and method for measuring the elemental composition of a test material. The instrument has a source of penetrating radiation for irradiating an irradiated region of the test material, a detector for detecting fluorescence emission by the test material and for generating a detector signal, and a controller for converting the detector signal into a spectrum characterizing the composition of the test material. A platen of attenuating material extends outward from adjacent to, and surrounding, the irradiated surface of the test material. In certain embodiments, the thickness of the attenuating platen is tapered such as to decrease with increasing radial distance from the central irradiated region of the test material. | 09-03-2009 |
20090262889 | Automated X-Ray Fluorescence Analysis - A method for classifying a sample based upon a complete spectral analysis. The sample is illuminated with penetrating radiation and an initial complete spectral analysis is performed based on spectral resolution of resonant fluorescence lines emitted at the surface, or within the volume, of the sample. If the initial complete spectral analysis yields the composition of the sample to within acceptable limits, analysis values are output to the user. Otherwise, further analysis, informed by the results if the initial complete spectral analysis, is performed. | 10-22-2009 |
20090274268 | In Vivo Measurement of Trace Elements in Bone by X-Ray Fluorescence - Methods for in vivo measurement of lead or other trace elements in bone by x-ray fluorescence (XRF) without independent measurement of underlying tissue thickness are disclosed. In one method, the lead concentration is calculated based on the intensity of a first characteristic fluoresced peak and a function having as an argument the intensity ratio of first and second characteristic fluoresced peaks, with at least one parameter of the function being empirically determined by measurements of calibration phantoms having differing thicknesses of tissue surrogate material. In another method, the lead concentration is measured by estimating tissue thickness based on the intensity of the Compton scattering peak, or ratio of Compton/Rayleigh intensities, and the intensity of a characteristic fluoresced x-ray peak corrected for attenuation by tissue of the estimated thickness. Also disclosed is a method for determining the calcium concentration and density of bone based on XRF spectrum data. | 11-05-2009 |
20090310743 | Test-Sensor Production Monitoring Using XRF Spectrometry - A sensor for determining the presence of an analyte in a test sample, said sensor comprising a nanoparticulate membrane comprising nanoparticles of at least one inorganic oxide of an element selected from Group IA, IIA, IIIA, IVA, IB, IIB, IIIB, IVAB, VB, VIB, VIII3 or V11113 of the Periodic Table, and wherein an oxidoreductase and an electrochemical activator are diffusibly dispersed in said nanoparticulate membrane. | 12-17-2009 |
20100027740 | HIGH-RESOLUTION, ACTIVE-OPTIC X-RAY FLUORESCENCE ANALYZER - Active optics apparatus and method for aligning active optics are provided for a high-resolution, active optic fluorescence analyzer combining a large acceptance solid angle with wide energy tunability. A plurality of rows of correctors selectively controlled to bend an elongated strip of single crystal material like Si ( | 02-04-2010 |
20100046702 | SMALL SPOT AND HIGH ENERGY RESOLUTION XRF SYSTEM FOR VALENCE STATE DETERMINATION - An x-ray fluorescence technique for determining a valence state of a sample. An x-ray excitation path is provided for exciting a sample with x-rays; and an x-ray detection path is provided for detecting fluorescence emitted from the sample, and focusing the emitted fluorescence to a focal spot. The detection path may include a monochromating detection optic for focusing the fluorescence; and also may include a detector on which the focal spot is focused. The precise positions of the focal spot are sensed, from which valence states of the sample can be determined; and/or the detection optic can be rocked across certain angles of incidence, to change the Bragg conditions, thereby sensing different valence states within the sample. | 02-25-2010 |
20100074406 | REVERSE X-RAY PHOTOELECTRON HOLOGRAPHY DEVICE AND ITS MEASURING METHOD - [Problems] To provide a reverse X-ray photoelectron holography device, in which energy control and convergence are facilitated and a hologram of good contrast is obtained; and to provide its measuring method. | 03-25-2010 |
20100080351 | HANDHELD SPECTROMETER - A handheld X-ray fluorescence spectrometer includes a pyroelectric radiation source for directing X-rays toward a sample to be analyzed and a detector for receiving secondary X-rays emitted from the sample and converting the secondary X-rays into one or more electrical signals representative of the received secondary X-rays. A module is configured to receive the one or more electrical signals and send a representation of the one or more signals over a communication channel to a computing device without performing any spectral analysis on the one or more electrical signals to characterize the sample. The computing device is configured to perform spectral analysis on the one or more electrical signals and send the spectral analysis to the spectrometer over the communications channel. | 04-01-2010 |
20100091944 | METHOD OF QUANTITATIVE ANALYSIS OF HEXAVALENT CHROMIUM IN CHROMATE COATING AND METHOD FOR CONTROLLING HAZARDOUS ELEMENT IN ENCAPSULATING RESIN OF RESIN ENCAPSULATION SEMICONDUCTOR DEVICE - A method for controlling a hazardous element in an encapsulating resin of a resin encapsulation semiconductor device includes subjecting the device to qualitative analysis with a fluorescent X-ray analyzer to judge whether the hazardous element is contained in the encapsulating resin, aligning a plurality of devices with each of upper and lower surfaces of the devices brought into a plane, setting the surfaces of the devices to cover a full X-ray irradiation plane and subjecting the devices to quantitative analysis with the fluorescent X-ray analyzer to obtain an analytical value of the hazardous element in the encapsulating resin for upper and lower surfaces of the devices, and judging whether the analytical value of the hazardous element which is less influenced by a coexistent element of the analytical values for the upper and lower surfaces of the devices exceeds a threshold value. | 04-15-2010 |
20100098211 | METHOD AND APPARATUS FOR MEASURING ENRICHMENT OF UF6 - A system and method are disclosed for determining the enrichment of | 04-22-2010 |
20100111252 | HIGH SPEED MATERIALS SORTING USING X-RAY FLUORESCENCE - A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection. The x-ray source may irradiate the first x-rays at a high intensity, and the x-ray source may be an x-ray tube. | 05-06-2010 |
20100124313 | METHODS AND APPARATUS TO PERFORM DOWNHOLE X-RAY FLUORESCENCE - Example methods and apparatus to perform downhole x-ray fluorescence to detect sulfur in formation fluids are disclosed. A disclosed example downhole x-ray fluorescence apparatus comprises a flowline comprising a flowline wall, an x-ray source, a boron carbide crystal window in the flowline wall to allow x-rays emitted by the x-ray source to pass into a formation fluid in the flowline, and a detector to measure a value representative of a fluorescence of the formation fluid in response to the emitted x-rays. | 05-20-2010 |
20100150307 | Automated Sum-Peak Suppression in an X-Ray Fluorescence Analyzer - A method of operating an x-ray fluorescence (XRF) analyzer to automatically suppress sum-peaks is disclosed. The method includes irradiating a sample to acquire an initial energy spectrum. The energy spectrum is processed to identify a sum-peak that interferes with a characteristic fluoresced peak of an element of interest. A filter is positioned in the emitted radiation path to attenuate radiation that contributes to the identified sum-peak, and a filtered energy spectrum is acquired. In certain embodiments, the filtered energy spectrum is acquired only when a limit of detection (LOD) of an element of interest calculated from the initial energy spectrum does not satisfy a targeted objective. | 06-17-2010 |
20100189215 | Measurement of Lead by X-Ray Fluorescence - A method, instrument, and computer program software product for characterizing a sample with respect to the presence of a specified element, either as a constituent of a surface layer or of the bulk of the sample. Intensities of fluorescent emission at two characteristic emission lines are compared to establish whether the specified element is disposed above the bulk of the sample. In the case where the specified element is disposed above the bulk of the sample, an areal density of the specified element is determined, whereas in the case where the specified element is disposed within the bulk of the sample, a volumetric concentration of the specified element within the sample is determined. | 07-29-2010 |
20100272232 | Rapid Screening for Lead Concentration Compliance by X-Ray Fluorescence (XRF) Analysis - A method is provided for screening lead concentration compliance of objects, particularly consumer products such as toys, using x-ray fluorescence (XRF) analysis. The measured intensity ratio of the characteristic L | 10-28-2010 |
20100278302 | Apparatus for Detecting Specific Element - An apparatus for detecting a specific element for detecting presence or content concentration of a specific element contained in a measurement target, which includes a raw material, such as soil or ore, a product in the form of powder, granule or gravel, and an intermediate product, a by-product, a waste material and the like generated during a process for producing the product, the apparatus comprising fluorescent X-ray measuring means that radiates an X-ray to the measurement target and measures a fluorescent X-ray generated thereby to detect the presence of the content concentration of the specific element, and film feeding means that inserts a resin film between a measuring window of the fluorescent X-ray measuring means and the measurement target, and feeds a fresh resin film between the measuring window and the measurement target along with repetition of detection of the specific element, whereby the intensity of the fluorescent X-ray can be prevented from being attenuated by measuring with the measuring window of the fluorescent X-ray measuring device in close contact with the measurement target through the resin film, the content concentration of the specific element in the order of several tens mg/kg can be accurately measured, and the measurement target can be prevented from being attached to the measuring window with the resin film. | 11-04-2010 |
20100278303 | Localization of an Element of Interest by XRF Analysis of Different Inspection Volumes - An apparatus and method are disclosed for localizing an element of interest in a sample by comparing XRF spectra acquired from at least two distinct but overlapping inspection volumes. The inspection volumes are varied by changing the geometry of the exciting x-ray and/or fluoresced x-ray beam(s), which may be accomplished by repositioning multi-apertured collimators. Comparison of the XRF spectra acquired from different inspection volumes provides an indication as to whether the element of interest (e.g., lead) is present in a coating layer, in the underlying bulk material, or in both. | 11-04-2010 |
20100284513 | Wavelength-dispersive X-ray spectrometer - An X-ray spectrometer which uses at least one curved analyzing crystal and which provides improved wavelength resolution of characteristic X-rays used for analysis and improved ratio of characteristic X-rays to background intensity by using only effective diffractive regions of the analyzing crystal. X-ray blocking plates upstand from an end of a crystal support member supporting the analyzing crystal in the direction of angular dispersion of the crystal toward the inside of a Rowland circle. Incident X-rays going from the point X-ray source toward the crystal and X-rays diffracted by the crystal toward an X-ray detector are partially blocked by the X-ray blocking plates. The shielded regions vary according to the incident angle θ of the incident X-rays. Optimum or nearly optimum effective regions of the surface of the crystal can be used at all times. | 11-11-2010 |
20100303201 | Method and Device for the Online Determination of the Ash Content of a Substance Conveyed on a Conveying Means, and Device for Carrying Out Such an Online Determination - A method for the online determination of the ash content of a substance conveyed on a conveying device, includes a first measurement for determining the mass per unit area of the substance and a second measurement for determining the mean atomic number of the atoms present in the substance. An additional X-ray fluorescence measurement is carried out. | 12-02-2010 |
20100310041 | X-Ray System and Methods with Detector Interior to Focusing Element - An X-ray fluorescence instrument in which x-rays are directed from a source onto a sample by a focusing element. Fluorescence from the sample is detected by an x-ray detector disposed entirely within a volume “interior” to the focusing element, as defined in the description of the invention. A second focusing element may collect emission by the sample and direct it monochromatically, over a large opening angle, onto the x-ray detector. Methods for applying the instrument, particularly for the quantification of sulfur and other contaminating elements in lubricants and fuel are also provided. | 12-09-2010 |
20110044426 | APPARATUS AND METHOD FOR X-RAY FLUORESCENCE ANALYSIS OF A MINERAL SAMPLE - An apparatus and a method for X-ray fluorescence analysis of a mineral sample is disclosed. The apparatus comprises an X-ray source ( | 02-24-2011 |
20110085638 | SAMPLE CELL FOR FLUORESCENT X-RAY ANALYSIS AND SAMPLE CELL ASSEMBLY INSTRUMENT - In a sample cell that is sealed with an X-ray transmission sheet after a sample such as a liquid fuel or the like is contained therein, when an internal pressure is increased, a cup end surface is deformed so as to increase an internal capacity of the sample cell before the X-ray transmission sheet serving as a window part is expanded. The cup end surface is formed by folding a film-like material and, when the internal pressure of the sample cell is increased, the cup end surface is unfolded outwardly of the sample cell to increase the internal capacity of the sample cell. The increase in pressure is relieved by the increase in capacity, and the expansion of the X-ray transmission sheet is thereby prevented. | 04-14-2011 |
20110103547 | CONCENTRATION MEASURING METHOD AND FLUORESCENT X-RAY SPECTROMETER - In the present invention, a fluorescent X-ray analysis is made for a sample such as a liquid fuel including an object component such as sulfur. A background related to scattered X-rays and a system peak is subtracted from a fluorescent X-ray intensity of the object component, which is obtained from a spectrum acquired by the fluorescent X-ray analysis. A correction corresponding to the composition of the sample is performed for the fluorescent X-ray intensity obtained by subtracting the background. A calibration curve representing the relation between a value, which is obtained after performing the correction for the fluorescent X-ray intensity obtained by subtracting the background, and a concentration of the object component is preset. The concentration of the object component in the sample is calculated on the basis of the calibration curve. | 05-05-2011 |
20110142200 | Small Spot X-Ray Fluorescence (XRF) Analyzer - A hand-held, self-contained x-ray fluorescence (XRF) analyzer produces a small x-ray spot on a sample to interrogate the elemental composition of a sample region of millimeter-size characteristic dimension. The analyzer includes a collimator for aiming an x-ray beam toward a desired location on the sample and for determining the size of the spot produced on the sample. The analyzer may include a digital camera oriented toward the portion of the sample that is, or would be, interrogated by the x-ray spot to facilitate aiming the analyzer. The analyzer may generate a reticule in a displayed image to indicate the portion of the sample that is, or would be, illuminated by the x-ray beam. The analyzer may automatically annotate the image of the sample with text or graphics that contain information about the analyzed sample. The image may be stored in the hand-held analyzer or provided for external storage or display. | 06-16-2011 |
20110188629 | METHOD AND APPARATUS FOR MEASURING PROPERTIES OF A COMPOUND - A system that incorporates teachings of the present disclosure may include, for example, an apparatus having a collimator having at least one aperture and a fluorescence detector. The collimator can be positioned next to a compound. The compound can emit fluorescence X-rays when impacted by an X-ray beam generated by an X-ray source. The collimator can absorb at least a first portion of the fluorescence X-rays emitted by the compound and release at least a second portion of the fluorescence X-rays at the at least one aperture. The second portion of the fluorescence X-rays released by the at least one aperture have known directional information based on a position of the collimator. The fluorescence detector can detect the second portion of the fluorescence X-rays released by the at least one aperture. A three-dimensional (3-D) rendering of an elemental distribution of the compound can be determined from the fluorescence X-rays detected and the directional information. Additional embodiments are disclosed. | 08-04-2011 |
20110211670 | Dynamic Shaping Time Modification in X-Ray Detectors - Methods and apparatus for adapting the shaping time and/or other pulse processing parameters of an x-ray detector ( | 09-01-2011 |
20110222654 | HIGH SPEED MATERIALS SORTING USING X-RAY FLUORESCENCE - A system and process for classifying a piece of material of unknown composition at high speeds, where the system connected to a power supply. The piece is irradiated with first x-rays from an x-ray source, causing the piece to fluoresce x-rays. The fluoresced x-rays are detected with an x-ray detector, and the piece of material is classified from the detected fluoresced x-rays. Detecting and classifying may be cumulatively performed in less than one second. An x-ray fluorescence spectrum of the piece of material may be determined from the detected fluoresced x-rays, and the detection of the fluoresced x-rays may be conditioned such that accurate determination of the x-ray fluorescence spectrum is not significantly compromised, slowed or complicated by extraneous x-rays. The piece of material may be classified by recognizing the spectral pattern of the determined x-ray fluorescence spectrum. The piece of material may be flattened prior to irradiation and detection. The x-ray source may irradiate the first x-rays at a high intensity, and the x-ray source may be an x-ray tube. | 09-15-2011 |
20110228903 | BACKGROUND SIGNAL REDUCTION IN NEUTRON FLUORESCENCE APPLICATIONS USING AGILE NEUTRON BEAM FLUX - Apparatus and methods for operating a neutron gamma fluorescence based system by modulating the interrogating neutron flux (φ | 09-22-2011 |
20120045031 | METHOD FOR SPECTROMETRY FOR INVESTIGATING SAMPLES CONTAINING AT LEAST TWO ELEMENTS - A sample with unknown concentrations of elements is placed in a first step into a spectrometer and the intensities I1, I2, . . . , In of the sample for the component elements are measured while the concentrations of the sample are determined, or—alternatively—a sample with known concentrations of the substances C1, C2, . . . , Cn is placed into the spectrometer and the intensities of the sample are determined. The fictive theoretical intensity values, the I | 02-23-2012 |
20120093286 | Method for analysis using x-ray fluorescence - The present invention is a method to quantify biomarkers. The method uses an X-ray fluorescence spectrometer to perform an X-ray fluorescence analysis on the sample to obtain spectral features derived from the biomarker; and quantifying the X-ray fluorescence signal of the biomarker. | 04-19-2012 |
20120236989 | Portable XRF analyzer for low atomic number elements - A portable XRF analyzer includes a pressure measurement device disposed to measure the ambient air pressure and a processing subsystem responsive to a detector subsystem and the pressure measurement device. The processing subsystem is configured to calculate the concentration of at least one low atomic number element in the sample based on the intensity of the x-rays detected by the detector subsystem at an energy level corresponding to the element. The intensity value is corrected based on the ambient air pressure. An XRF method is also disclosed wherein the concentration of an element is determined automatically by taking into account the barometric pressure. | 09-20-2012 |
20120257716 | Localization of an Element of Interest by XRF Analysis of Different Inspection Volumes - An apparatus and method are disclosed for localizing an element of interest in a sample by comparing XRF spectra acquired from at least two distinct but overlapping inspection volumes. The inspection volumes are varied by changing the geometry of the exciting x-ray and/or fluoresced x-ray beam(s), which may be accomplished by repositioning multi-apertured collimators. Comparison of the XRF spectra acquired from different inspection volumes provides an indication as to whether the element of interest (e.g., lead) is present in a coating layer, in the underlying bulk material, or in both. | 10-11-2012 |
20130034205 | Well Plate - An apparatus for preparing samples for measurement by x-ray fluorescence spectrometry. A plate has one or more holes passing through the plate. The holes are covered by a film on one side of the plate. The holes are less than 500 micrometers across in one dimension where the film covers the holes. The film is translucent to x-rays. | 02-07-2013 |
20130195242 | METHOD FOR DISASSEMBLING LIQUID CRYSTAL DISPLAY DEVICE - In the present disclosure, before disassembly of liquid crystal module ( | 08-01-2013 |
20130202083 | SYSTEM AND METHOD FOR IDENTIFICATION OF COUNTERFEIT GOLD JEWELRY USING XRF - Techniques disclosed herein include systems and methods for identifying counterfeit gold jewelry and other counterfeit gold items. Techniques include determining—using a non-destructive mechanism—whether an item of interest (such as an article represented as true gold) is solid gold or a gold-plated object. Techniques include using an X-ray fluorescence (XRF) analyzer to differentiate true gold from gold plating. The XRF analyzer can distinguish between gold plating and bulk gold material by comparing a ratio of L-alpha and L-beta x-ray lines of gold. The analyzer measures a ratio of intensities of characteristic L-lines of gold using X-ray fluorescence (XRF) spectroscopy. When implemented using an XRF analyzer, the system nondestructively determines whether a test object is made of solid gold/gold alloy or has gold plating only. | 08-08-2013 |
20130202084 | METAL AUTHENTICITY TESTING OF AN OBJECT USING RADIATION - Techniques disclosed herein include systems and methods for identifying counterfeit gold jewelry and other counterfeit gold items. Techniques include determining—using a non-destructive mechanism—whether an item of interest (such as an article represented as true gold) is solid gold or a gold-plated object. Techniques include using an X-ray fluorescence (XRF) analyzer to differentiate true gold from gold plating. The XRF analyzer can distinguish between gold plating and bulk gold material by comparing a ratio of L-alpha and L-beta x-ray lines of gold. The analyzer measures a ratio of intensities of characteristic L-lines of gold using X-ray fluorescence (XRF) spectroscopy. When implemented using an XRF analyzer, the system nondestructively determines whether a test object is made of solid gold/gold alloy or has gold plating only. | 08-08-2013 |
20130216022 | In-situ determination of thin film and multilayer structure and chemical composition using x-ray fluorescence induced by grazing incidence electron beams during thin film growth - A method utilizing characteristic x-ray emission from a single thin film or multilayer thin film when an electron beam impinges at a grazing angle with respect to the surface of the sample to capture structural and physical properties of the layers such as layer thickness, interfacial roughness, and stoichiometry of the sample. | 08-22-2013 |
20130230138 | Method and apparatus for the automated assay and valuation of precious metal objects - A method and apparatus for the metallurgical qualitative analysis (assay) and valuation of precious metals objects such as jewelry or coins. The system integrates a commercially available x-ray florescence (XRF) metals analyzer with associated peripheral devices including a personal computer and keyboard or touchpad computing device, a digitizing scale, a printer, an Internet link for obtaining current precious metals market price quotations, and software for processing the qualitative results with the current market price data and presenting the results to the system operator in real time. The system optionally includes a customer interface including a display screen for presenting the customer with the results of the analysis and valuation, and customer input means for accepting and recording a purchase transaction. | 09-05-2013 |
20130272497 | X-RAY DETECTION APPARATUS - The X-ray detection apparatus is equipped with an X-ray irradiation unit, an X-ray detector, and a movable collimator having a plurality of apertures. The collimator is provided with a window unit through which light passes, and the apertures and the window unit are aligned in one direction. The collimator moves in the direction so as to change the diameter of an aperture for narrowing X-rays from the X-ray irradiation unit to be used for irradiation of a sample and move to a position to allow an imaging unit to photograph a sample through the window unit. It becomes possible to photograph a sample even in a state where the X-ray irradiation unit, the X-ray detector and the collimator are positioned proximally to each other. | 10-17-2013 |
20130272498 | X-RAY DETECTION APPARATUS - The X-ray detection apparatus is equipped with an X-ray irradiation unit, an X-ray detector, a movable collimator and a shield for blocking X-rays. The shield blocks X-rays, which are to enter the X-ray detector directly from the X-ray irradiation unit. The shield also blocks fluorescent X-rays and scattered X-rays generated by irradiation of the collimator with X-rays. In such a manner, it is possible to prevent X-rays other than fluorescent X-rays from the sample S from being detected by the X-ray detector. The shield is joined with the collimator, so that the collimator and the shield move as a unit. It is possible to locate the shield even in a downsized X-ray detection apparatus. | 10-17-2013 |
20130279652 | MEASURING APPARATUS - Provided is a measuring apparatus which is capable of measuring the distribution of a specific element in a specimen by soft X rays in a state where there is no effect by a staining agent and the like even though the specimen is composed of living single cells or cell aggregates living as they are, extracted in vitro from an organism. A measuring apparatus using soft X rays includes a connection part which is connected with a soft X ray beam line, a mechanism which light-collects a spot size of soft X rays into a micro beam, and a low vacuum vessel having a measurement chamber in which a specimen is disposed. | 10-24-2013 |
20140016745 | METHOD OF STEEL GRADE DETERMINATION FOR STEEL MATERIAL - The method of steel grade determination for a steel material having a substantially circular cross-section comprise: a detection step in which while a measurement section | 01-16-2014 |
20140037053 | TRACE ELEMENT X-RAY FLOURESCENCE ANALYSER USING DUAL FOCUSING X-RAY MONOCHROMATORS - An X-ray fluorescence analyser is provided which comprises: (1) an X-ray source selected to produce an intense X-ray beam, (2) a first optical element that focuses the X-ray beam produced by the X-ray source onto a sample and selects X-rays of a desired energy, (3) an energy resolving detector, and (4) a second optical element that receives fluorescent X-rays emitted from elements in the sample and focuses a selected energy range of said fluorescent X-rays onto said energy resolving detector. Each of the first and second optical elements includes a crystal component. The X-ray fluorescence analyser is configured such that: (i) the X-ray source has a spot size dimensioned so that it is substantially in a field of view of the first optical element, and (ii) the first optical element focuses the X-ray beam emitted by the X-ray source onto an area of the sample that corresponds to a field-of-view of the second optical element. Furthermore, the field of view for an optical element is defined as the area in the source plane of the respective crystal component over which X-rays are able to be emitted and still efficiently be reflected by said optical element. | 02-06-2014 |
20140140473 | INSTRUMENT AND METHOD OF MEASURING THE CONCENTRATION OF A TARGET ELEMENT IN A MULTI-LAYER THIN COATING - An instrument and a method of detecting a target element in a multi-layer thin coating. Lα, Lβ and Lγ x-rays are caused to be emitted from the target element (preferably lead paint) with excitation radiation. Upon detecting the emitted x-rays, an areal concentration of the target element is calculated using Lα and Lβ intensities once, and then using the and Ly intensities once, by reference to a single layer model; By combining the two concentrations calculated using single layer model, a more accurate concentration can be calculated for the target element in the multi-layered surface coating. | 05-22-2014 |
20140161224 | METHOD AND A SYSTEM FOR RECOGNIZING VOIDS IN A BUMP - A method and a system for bump's inspection are disclosed. The inspection done by comparing the volume of the bump's outside contour and the volume the solid materials from which the bump is made and/or analyzing the bump's solid materials ratio. Principally, the inspection id done by preparing an empiric reference table of the emitted energy received from the solid materials, from which a reference proper bump with a given volume is comprised, using ED-XRF (Energy-Dispersive-X-ray-Fluorescence analysis) analyze; obtaining a first calculated volume of the bump, using a 3D image-processing method; adapting the reference table according to the difference between the given volume and the first calculated volume of the bump; performing a second volume calculation of the bump by applying ED-XRF technology. The difference between the first and second volume calculations and the solid material combination are used to inspect the bump. | 06-12-2014 |
20140270063 | NON-HOMOGENEOUS SAMPLE HANDLING APPARATUS AND X-RAY ANALYZER APPLICATIONS THEREOF - A sample handling apparatus/technique/method are provided for a material analyzer, including: a sample cell insert for carrying sample to and from a sample focal area of the analyzer; a removable sample carrying device for providing sample to the cell insert; and an actuator to flow sample from the carrying device to the sample cell insert. The removable sample carrying device may be a syringe, and the actuator pushes a plunger of the syringe to expel the sample to the sample cell insert. The sample cell insert may be mounted onto a sample cell, the sample cell being insertable into the analyzer for sample analysis. The sample handling apparatus may be used in combination with an optic-enabled x-ray analyzer, the x-ray analyzer including an x-ray engine with an x-ray excitation path and an x-ray detection path, wherein the x-ray excitation and/or the x-ray detection path define the sample focal area. | 09-18-2014 |
20140294145 | X-Ray Fluorescence Spectrometer - An X-ray fluorescence spectrometer includes: an X-ray source which irradiates a sample with primary X-rays; a light condensing device which condenses the primary X-rays to reduce an irradiation area on the sample; a detector which detects fluorescent X-rays produced from the sample irradiated with the primary X-rays; a housing which accommodates the X-ray source and the light condensing device; a temperature sensor which is disposed in at least one of the X-ray source and the periphery of the X-ray source; at least one external-air fan which is disposed on the housing, and which can exchange internal air with external air; and a control section which drives the external-air fan based on temperature information detected by the temperature sensor, to adjust the ambient temperature around the X-ray source to a constant temperature. | 10-02-2014 |
20140301530 | PROTECTIVE SHIELD FOR X-RAY FLUORESCENCE (XRF) SYSTEM - In one embodiment, a protective shield for a spectrometer is provided. The shield includes a body and an aperture that includes a protective mesh. The protective mesh includes a high-strength, low Z material, such as an arrangement of carbon fibers. A method of fabrication and a spectrometer are disclosed. | 10-09-2014 |
20140301531 | PROTECTIVE SHIELD FOR X-RAY FLUORESCENCE (XRF) SYSTEM - In one embodiment, a protective shield for a spectrometer is provided. The shield includes a body configured to substantially protect a front of the spectrometer, the body including an aperture that includes a protective mesh. The protective mesh includes a high-strength, low-Z material, such as an arrangement of carbon fibers. A method of fabrication, a spectrometer and a method of using the spectrometer are disclosed. | 10-09-2014 |
20140301532 | PROTECTIVE SHIELD FOR X-RAY FLUORESCENCE (XRF) SYSTEM - In one embodiment, a protective shield for a spectrometer is provided. The shield includes a body configured to substantially protect a front of the spectrometer, the body including an aperture that includes a protective mesh. The protective mesh includes a high-strength, low-Z material, such as an arrangement of carbon fibers. A method of fabrication, a spectrometer and a method of using the spectrometer are disclosed. | 10-09-2014 |
20140301533 | PROTECTIVE SHIELD FOR X-RAY FLUORESCENCE (XRF) SYSTEM - In one embodiment, a protective shield for a spectrometer is provided. The shield includes a body configured to substantially protect a front of the spectrometer, the body including an aperture that includes a protective mesh. The protective mesh includes a high-strength, low-Z material, such as an arrangement of carbon fibers. A method of fabrication, a spectrometer and a method of using the spectrometer are disclosed. | 10-09-2014 |
20140307849 | XRF INSTRUMENT WITH REMOVABLY ATTACHED WINDOW PROTECTING FILMS - Herein disclosed is an x-ray florescence (XRF) test system which comprises an XRF test instrument used for testing a test target's responses to X-rays, the instrument including a test window allowing the X-ray and its responsive energy to pass through, and at least one window protecting film allowing X-rays to pass through and providing protections to the window, the film being configured to be coupled with the window in a fashion to be removed from or applied or reapplied over the window. The corresponding calibration mode can be manually or automatically applied according to the specific film presently in use. | 10-16-2014 |
20150300966 | METHOD AND DEVICE FOR PERFORMING AN X-RAY FLUORESCENCE ANALYSIS - The invention relates to a method for performing an x-ray fluorescence analysis, in which method a primary radiation ( | 10-22-2015 |
20150308968 | XRF ANALYZER - A portable XRF analyzer can include a hand shield to substantially block x-rays from impinging on a hand of a user. The portable XRF analyzer can include a heat sink over an x-ray source and a heat sink over an x-ray detector. The heat sinks can be separated from each other by a thermally insulative material. | 10-29-2015 |
20150330921 | METHOD FOR ACCURATELY DETERMINING THE THICKNESS AND/OR ELEMENTAL COMPOSITION OF SMALL FEATURES ON THIN-SUBSTRATES USING MICRO-XRF - A method for X-ray Fluorescence (XRF) analysis includes directing an X-ray beam onto a sample and measuring an XRF signal excited from the sample, in a reference measurement in which the sample includes one or more first layers formed on a substrate, and in a target measurement after one or more second layers are formed on the substrate in addition to the first layers, so as to produce a reference XRF spectrum and a target XRF spectrum, respectively. A contribution of the first layers to the target XRF spectrum is reduced using the reference XRF spectrum. A parameter of at least one of the second layers is estimated using the target XRF spectrum in which the contribution of the first layers has been reduced. | 11-19-2015 |
20150338357 | ANALYZING APPARATUS AND CALIBRATION METHOD - In an analyzing apparatus for analyzing compositions using a fluorescent X-ray in the atmosphere, a calibration to eliminate influences caused by a time-dependent change is performed. The analyzing apparatus includes an emission unit, a detection unit, an environment measurement unit, and a time-dependent change calculation unit. The emission unit emits a primary X-ray. The detection unit detects an intensity of a secondary X-ray passing through the atmosphere. The environment measurement unit measures an environment parameter defining the atmosphere. The time-dependent change calculation unit calculates a time-dependent change of the intensity of the secondary X-ray between a first timing and a second timing, based on a first environment parameter, a first intensity of the secondary X-ray, a second environment parameter, and a second intensity of the secondary X-ray. | 11-26-2015 |
20150338534 | ANALYZING APPARATUS AND CALIBRATION METHOD - Calibration of an analyzing apparatus is performed using appropriate calibration data that reflects actual measurement conditions. The analyzing apparatus includes an emission unit, a collection filter, a calibration base material, a detection unit, and a composition analysis unit. The emission unit emits an exciting X-ray to generate a fluorescent X-ray by exciting particulate matter. The collection filter collects the particulate matter. The calibration base material is provided in a measurement area together with the collection filter when performing the calibration. The detection unit detects X-rays generated from the measurement area. The detection unit detects a calibration X-ray when performing the calibration. The composition analysis unit generates calibration data by using the calibration X-ray when performing the calibration. The composition analysis unit analyzes compositions of the particulate matter based on the calibration data and a measured X-ray detected by the detection unit when analyzing the compositions of the particulate matter. | 11-26-2015 |
20160011129 | Sample Plate for X-Ray Analysis and X-Ray Fluorescent Analyzer | 01-14-2016 |
20160033430 | XRF DEVICE WITH TRANSFER ASSISTANCE MODULE - A handheld x-ray fluorescence (XRF) device may include communication circuitry for communicating over a network. In some embodiments information related to sale and/or pricing of material identified by the XRF device is communicated by and/or to the XRF device. In some embodiments the XRF device communicates information regarding rental of the XRF device. In some embodiments the XRF device may be used to ascertain whether an item, for example an item of evidence or a particular item in a manufacturing environment, includes a material composition expected for the item, and in some embodiments storing or logging a result of such a determination. | 02-04-2016 |
20160078974 | XRF ANALYZER ROTATIONAL FILTER - An XRF analyzer can include a rotatable filter structure to separately position at least two different x-ray source modification regions between an x-ray source and a focal point and at least two different x-ray detector modification regions between an x-ray detector and the focal point. | 03-17-2016 |
20160084777 | SPACER ACCESSORY FOR XRF HANDHELD ANALYZERS - Disclosed is an attachable spacer applied to the front base plate of a hand-held and self-contained XRF testing device that holds the face plate at a forwards tilt towards a test sample, and ensures that only the top rim of the face plate ever touches a test sample. The resulting triangular gap minimizes contact between the front plate window and the test surface, prevents the transfer of heat to the XRF testing device's circuitry, and locks in a fixed distance between the face plate of the XRF testing device and the sample being tested. | 03-24-2016 |
20160118215 | X-RAY GENERATOR AND FLUORESCENT X-RAY ANALYZER - The present invention provides an X-ray generator including an X-ray tube | 04-28-2016 |
20160123909 | MEASUREMENT OF SMALL FEATURES USING XRF - A method for X-ray measurement includes, in a calibration phase, scanning a first X-ray beam, having a first beam profile, across a feature of interest on a calibration sample and measuring first X-ray fluorescence (XRF) emitted from the feature and from background areas of the calibration sample surrounding the feature. Responsively to the first XRF and the first beam profile, a relative emission factor is computed. In a test phase, a second X-ray beam, having a second beam profile, different from the first beam profile, is directed to impinge on the feature of interest on a test sample and second XRF emitted from the test sample is measured in response to the second X-ray beam. A property of the feature of interest on the test sample is computed by applying the relative emission factor together with the second beam profile to the measured second XRF. | 05-05-2016 |
20160252471 | NANOPARTICLE ASSISTED SCANNING FOCUSING X-RAY FLUORESCENCE IMAGING AND ENHANCED TREATMENT | 09-01-2016 |
20160377560 | METHODS OF MONITORING A PROPERTY OF DISPOSABLE DIAGNOSTIC TEST ELEMENTS AND SYSTEMS INCORPORATING THE SAME - Methods are provided for producing disposable diagnostic test elements and monitoring a property thereof, where such methods include detecting X-ray fluorescent (XRF) signals of one or more metallic components in a composite of first and second layers applied to a substrate using XRF spectrometry, determining a quantity value for each metallic component in a measured area from the XRF signals, and then calculating an areal coating quantity of the first and the second layers using the quantity values of the metallic components. Additionally or alternatively, the methods can include determining a batch specific code from the XRF signals that can be used when performing a test with a test element. Further provided are systems for monitoring a property of disposable test elements. | 12-29-2016 |
20190145918 | ANALYSIS DEVICE | 05-16-2019 |