| Class / Patent application number | Description | Number of patent applications / Date published |
|---|
| 378046000 | Plural diverse X-ray analyses | 10 |
| 20080205593 | INSTRUMENT HAVING X-RAY FLUORESCENCE AND SPARK EMISSION SPECTROSCOPY ANALYSIS CAPABILITIES - An analytical instrument is disclosed having both XRF and spark emission spectroscopy capabilities. In a particularly advantageous embodiment, a field portable XRF device is removably coupled to the instrument by means of a docking station. A first surface of the sample is irradiated with an X-ray beam, and the X-ray radiation fluorescently emitted from the sample is detected and analyzed to acquire elemental composition data. The instrument is further provided with a spark source located proximal a second surface of the sample and a detector for sensing the radiation emitted from the spark-excited material. The combined instrument enables the acquisition of complementary elemental composition data by XRF and spark emission spectroscopy without having to transport a sample between separate instruments. | 08-28-2008 |
| 20090067573 | X-ray measurement of properties of nano-particles - A method for analyzing a sample includes directing one or more beams of X-rays to impinge on an area of a surface of the sample on which a layer of nano-particles of a selected element has been formed. Secondary X-ray radiation from the area is detected responsively to the one or more beams. A distribution of the nano-particles on the surface is characterized based on the detected radiation. | 03-12-2009 |
| 20090086905 | X-ray fluorescence visualizer, imager, or information provider - One aspect relates to inducing at least one induced X-ray fluorescing photon within an at least some matter of an at least a portion of an at least one individual responsive to a substantial single input energy event based at least partially on an at least some input energy being applied to the at least some matter of the at least the portion of the at least one individual; and detecting the at least one induced X-ray fluorescing photon; and X-ray fluorescence visualizing, imaging, or information providing within the at least some matter of the at least the portion of the at least one individual responsive to the detecting the at least one induced X-ray fluorescing photon. | 04-02-2009 |
| 20110007869 | INSTRUMENT AND METHOD FOR X-RAY DIFFRACTION, FLUORESCENCE, AND CRYSTAL TEXTURE ANALYSIS WITHOUT SAMPLE PREPARATION - An X-ray diffraction and X-ray fluorescence instrument for analyzing samples having no sample preparation includes a X-ray source configured to output a collimated X-ray beam comprising a continuum spectrum of X-rays to a predetermined coordinate and a photon-counting X-ray imaging spectrometer disposed to receive X-rays output from an unprepared sample disposed at the predetermined coordinate upon exposure of the unprepared sample to the collimated X-ray beam. The X-ray source and the photon-counting X-ray imaging spectrometer are arranged in a reflection geometry relative to the predetermined coordinate. | 01-13-2011 |
| 20110243301 | X-RAY FLUORESCENCE ANALYZING METHOD - An X-ray fluorescence analyzing method includes irradiating a liquid sample ( | 10-06-2011 |
| 20120288058 | X-RAY MULTIPLE SPECTROSCOPIC ANALYZER - An X-ray multiple spectroscopic analyzer includes an X-ray source, an optical system inputting X-rays to a single-crystal sample, a sample stage supporting the single-crystal sample, an X-ray diffraction detector, a rotation driving system that changes the angle of the X-ray diffraction detector, an X-ray diffraction measurement data storage unit, a structural analysis data analyzing unit, an energy-dispersive X-ray fluorescence detector, an X-ray fluorescence measurement data storage unit, an X-ray fluorescence analyzing unit, an X-ray fluorescence analysis data storage unit, and X-ray fluorescence analysis data acquiring unit. The structural analysis data analyzing unit analyzes the data of the crystal structure further on the basis of the analysis data of the fluorescent X-rays output from the X-ray fluorescence analysis data acquiring unit. | 11-15-2012 |
| 20130022167 | High Speed, Non-Destructive, Reel-to-Reel Chip/Device Inspection System and Method Utilizing Low Power X-rays/X-ray Fluorescence - A reel-like format for transporting devices under test (DUT) into low power x-ray inspection system allows for high speed transportation and inspection that is several orders of magnitude faster than conventional systems. The system can be configured with a conveyor belt for handling of non-reel suitable DUTs. A stabilizing control mechanism precisely and accurately brings the tape (with components) into the x-raying window, that allows spatial displacement of a portion of the to-be-viewed tape. | 01-24-2013 |
| 20130170613 | X-Ray Fluorescence Spectrometer and X-Ray Fluorescence Analyzer - An X-ray fluorescence spectrometer irradiates a measurement sample | 07-04-2013 |
| 20130279653 | METHODS AND APPARATUS FOR X-RAY DIFFRACTION - Methods and apparatus are provided for performing back-reflection energy-dispersive X-ray diffraction (XRD). This exhibits extremely low sensitivity to the morphology of the sample under investigation. As a consequence of this insensitivity, unprepared samples can be analyzed using this method. For example, in a geological context, whole rock samples become amenable to analysis. Modifications of the technique are described to suppress fluorescence signals that would otherwise obscure the diffraction signals. | 10-24-2013 |
| 20150308969 | SILICON GERMANIUM THICKNESS AND COMPOSITION DETERMINATION USING COMBINED XPS AND XRF TECHNOLOGIES - Systems and approaches for silicon germanium thickness and composition determination using combined XPS and XRF technologies are described. In an example, a method for characterizing a silicon germanium film includes generating an X-ray beam. A sample is positioned in a pathway of said X-ray beam. An X-ray photoelectron spectroscopy (XPS) signal generated by bombarding said sample with said X-ray beam is collected. An X-ray fluorescence (XRF) signal generated by bombarding said sample with said X-ray beam is also collected. Thickness or composition, or both, of the silicon germanium film is determined from the XRF signal or the XPS signal, or both. | 10-29-2015 |
