| Class / Patent application number | Description | Number of patent applications / Date published |
|---|
| 324750220 | Testing device mounted for multi-directional movement | 9 |
| 20120119770 | AUTOMATED MULTI-POINT PROBE MANIPULATION - A multi-point probe particularly suitable for automated handling is disclosed. An automated multi-point measuring system including the multi-point probe and a probe manipulator head is also disclosed In addition, an automated multi-point probe gripping system including a probe holder and the probe manipulator head is revealed. Further, a loaded probe loader comprising a probe loader and a probe cassette for handling the multi-point probe is also revealed, where the probe cassette is provided with the probe holder for securing the multi-point probe. | 05-17-2012 |
| 20130169300 | MULTI-CHIP PROBER, CONTACT POSITION CORRECTION METHOD THEREOF, AND READABLE RECORDING MEDIUM - Three axial coordinate positions and the rotational position of electrode pads of chips to be inspected on a moving platform are controlled in such a manner that the electrode pads will correspond to the tip position of a plurality of probes, a large number of probes of a probe card, and electrode pads of a large number of chips, whose positional accuracy after being cut is uneven, can be positioned with accuracy, thus largely increasing the number of chips for simultaneous contact, and thus increasing the efficiency for the test. | 07-04-2013 |
| 20130249581 | PROBE APPARATUS - A probe apparatus is provided, comprising a card clamp mechanism configured to detachably clamp a probe card equipped with a plurality of probes; a wafer chuck configured to mount a semiconductor wafer thereon and configured to provide contact between electrodes formed in the semiconductor wafer with the probes of the probe card clamped by the card clamp mechanism with an operation of a drive mechanism; and a card movement mechanism configured to move the card clamp mechanism and the probe card clamped by the card clamp mechanism to at least two positions spaced at a predetermined distance. | 09-26-2013 |
| 20140077831 | LINEAR MOTOR FOR A DEVICE FOR TESTING PRINTED CIRCUIT BOARDS AND DEVICE FOR TESTING PRINTED CIRCUIT BOARDS - The invention relates to a linear motor for a device for testing a printed circuit board. The linear motor comprises a stator and a rotor, wherein the stator comprises a row of permanent magnets arranged side by side and alternating in their polarity, and wherein the rotor is formed from a printed circuit board on which conductor paths form magnet coils arranged side by side and each having several windings, which magnet coils, when carrying a current, apply a linear acceleration force to the rotor, so that the rotor is moved relative to the stator, wherein the printed circuit board is folded, so that the several windings of each magnet coil are distributed among several layers of the printed circuit board, which are placed on top of one another by folding the printed circuit board. | 03-20-2014 |
| 20140306729 | POSITION ADJUSTABLE PROBING DEVICE AND PROBE CARD ASSEMBLY USING THE SAME - A position adjustable probing device adapted for being mounted to a circuit board includes a frame, a probe head, a space transformer module and an elevation adjusting structure. The frame has a first surface, a second surface opposite to the first surface, and a first opening penetrating through the first and second surfaces. The probe head is coupled to the frame. The space transformer module is disposed in the first opening. The elevation adjusting structure is provided at the frame and has a plurality of spacers for adjusting a position of the frame relative to a reference surface in a vertical direction. | 10-16-2014 |
| 20150048856 | PROBE CARD FOR AN APPARATUS FOR TESTING ELECTRONIC DEVICES - A probe card for an apparatus for testing electronic devices comprises at least one probe head, a plurality of contact probes housed within the probe head, each contact probe having at least one contact tip suitable to abut against contact pads of a device to be tested, a supporting plate of the probe head, an interface plate, a stiffener associating the supporting plate and the interface plate, a plurality of connecting elements with clearance disposed between the supporting plate and the interface plate and housed in a floating manner in a plurality of respective seats made in the supporting plate, and a plurality of connecting elements without clearance disposed between the interface plate and the stiffener. | 02-19-2015 |
| 20150115987 | APPARATUS AND METHOD FOR TESTING PORTABLE DEVICES - An apparatus is disclosed for testing portable devices. The apparatus includes a base upon which the portable device is mounted, and a top mold which fits over the base to immobilize the portable device. Templates can also be formed on the top mold or base. The templates contain test patterns that are defined by a plurality of apertures. A stylus is used to test the portable device by engaging or contacting different locations through the apertures in the test pattern. | 04-30-2015 |
| 20150145542 | INSPECTION APPARATUS - An inspection apparatus includes a first tester and a second tester each of which tests a substrate loaded therein, a first stage on which the first tester is mounted, the first stage being movable to a first loading and unloading position and a first test position, the first test position being provided above the first loading and unloading position, a second stage on which the second tester is mounted, the second stage being provided below the first stage and being movable to a second loading and unloading position and a second test position, the second test position being provided below the second loading and unloading position, and a lift mechanism that moves the first stage up and down to the first loading and unloading position and the first test position and moves the second stage up and down to the second loading and unloading position and the second test position. | 05-28-2015 |
| 20160047857 | SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE AND APPARATUS FOR TESTING A SEMICONDUCTOR DEVICE - Provided is a semiconductor device including a substrate, insulating layers on the substrate, interconnection lines in or between the insulating layers, and pads on the insulating layers. The pads may include signal pads connected to the interconnection lines, and measurement pads disposed spaced apart from the signal pads and electrically connected to corresponding ones of the signal pads by the interconnection lines. Misalignment of probes contacting the semiconductor device may be detected by detecting a signal communicated between one or more of the measurement pads and the signal pads. | 02-18-2016 |
