Class / Patent application number | Description | Number of patent applications / Date published |
714742000 | Testing specific device | 8 |
20080244348 | DETERMINING DIE PERFORMANCE BY INCORPORATING NEIGHBORING DIE PERFORMANCE METRICS - A method includes receiving a first set of parameters associated with a plurality of die. A first die performance metric associated with a selected die is determined based on the first set of parameters. At least one neighborhood die performance metric associated with a set comprised of a plurality of die that neighbor the selected die is determined based on the first set of parameters. A second die performance metric is determined for the selected die based on the first die performance metric and the neighborhood die performance metric. | 10-02-2008 |
20080307283 | Complex Pattern Generator for Analysis of High Speed Serial Streams - The present invention provides systems, devices and methods for generating user-defined test patterns within serial controller to facilitate signal testing and verification. These user-defined test patterns may be generated to more accurately reflect the actual traffic of a device-under-test or system, as well as allow a test engineer to more accurately test the boundaries of the device or system. In various embodiments of the invention, a programmable patterns generator is provided for generating user-defined test patterns that may be used during a testing procedure. This programmable pattern generator allows a user to define a particular test pattern by providing bit-by-bit test values, by defining a combination of canned sequences, or by supplementing one or more canned sequences with additional test bits. | 12-11-2008 |
20090113266 | COMPRESSION AND DECOMPRESSION OF STIMULUS AND RESPONSE WAVEFORMS IN AUTOMATED TEST SYSTEMS - An automated test system for a device under test (DUT) compresses the stimulus waveform before transferring it to a storage device or over a data transfer interface. The compressed stimulus waveform data are decompressed, and if required converted to analog form, then applied as a stimulus to the DUT. In response, the DUT produces a response waveform. The response waveform is compressed before transferring it to a storage device or over a data transfer interface. If the response waveform is analog, it is converted to digital before compression. The compressed waveform is decompressed for further analysis or display by a host computer. Features of the response waveform can be calculated from the compressed or uncompressed waveform data. Several configurations that include compression and decompression of stimulus and/or response waveforms in test systems are described. | 04-30-2009 |
20090249147 | FAULT DIAGNOSIS OF COMPRESSED TEST RESPONSES - Methods, apparatus, and systems for diagnosing failing scan cells from compressed test responses are disclosed herein. For example, in one nonlimiting exemplary embodiment, at least one error signature comprising multiple bits (including one or more error bits) is received. Plural potential-error-bit-explaining scan cell candidates are evaluated using a search tree. A determination is made as to whether one or more of the evaluated scan cell candidates explain the error bits in the error signature and thereby constitute one or more failing scan cells. An output is provided of any such one or more failing scan cells determined. Tangible computer-readable media comprising computer-executable instructions for causing a computer to perform any of the disclosed methods are also provided. Tangible computer-readable media comprising lists of failing scan cells identified by any of the disclosed methods are also provided. | 10-01-2009 |
20090259904 | Testing Mobile Wireless Devices During Device Production - A system and method of testing a wireless communication device during device production comprises designating as a data log buffer when the device is being produced, at least part of random access memory (RAM) of the device that is allocated for virtual machine and/or application usage when the device is operational; and testing the device and storing test log data in the buffer. After testing, the data can be obtained from the buffer and processed using a debugging and log analysis tool. | 10-15-2009 |
20110302472 | CONFIGURABLE TEST SUITE - A system and method for testing a control module includes a microprocessor, where the microprocessor has a programming environment. The programming environment has a test data structure, a configuration data structure, and a monitor data structure each containing data. At least one test data instance is associated with the test data structure and at least one configuration data instance is associated with the configuration data structure. The configuration data instance is a diagnostic test that monitors a parameter of the microprocessor, and the monitor data structure creates the test data instance such that each test data instance corresponds to one of the configuration data instances. The program includes a first control logic for associating the test data structure, the configuration data structure and the monitor data structure as part of a core infrastructure portion of the programming environment, where the core infrastructure portion of the program is static. | 12-08-2011 |
20120304033 | CLOCK DOMAIN CHECK METHOD, CLOCK DOMAIN CHECK PROGRAM, AND RECORDING MEDIUM - To reduce pseudo errors. | 11-29-2012 |
20140380111 | TESTING SYSTEM FOR SERIAL INTERFACE - A testing system includes a circuit board, and an inserting unit. The circuit board includes a first serial interface and a serial chip connected to the first serial interface. The first serial interface connects a second serial interface of a motherboard to receive a first signal of the second serial interface. The inserting unit includes a first plug connected to a pin Transmit Data of the first serial interface. The first plug connects a testing device. When the first signal is transmitted to the first serial interface by the second serial interface, the serial chip receives the first signal and sends the first signal back to the first serial interface. The first plug sends a second signal of the pin Transmit Data to the testing device to be tested. | 12-25-2014 |