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Electricity: measuring and testing

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Class / Patent application numberDescriptionNumber of patent applications / Date published
324500000 FAULT DETECTING IN ELECTRIC CIRCUITS AND OF ELECTRIC COMPONENTS 5632
324200000 MAGNETIC 3491
324300000 PARTICLE PRECESSION RESONANCE 3429
324600000 IMPEDANCE, ADMITTANCE OR OTHER QUANTITIES REPRESENTATIVE OF ELECTRICAL STIMULUS/RESPONSE RELATIONSHIPS 3332
324760110 MEASURING, TESTING, OR SENSING ELECTRICITY, PER SE 1917
324425000 ELECTROLYTE PROPERTIES 925
324323000 OF GEOPHYSICAL SURFACE OR SUBSURFACE IN SITU 888
324710100 DETERMINING NONELECTRIC PROPERTIES BY MEASURING ELECTRIC PROPERTIES 183
324403000 ELECTRIC LAMP OR DISCHARGE DEVICE 137
324415000 ELECTROMECHANICAL SWITCHING DEVICE 136
324459000 USING IONIZATION EFFECTS 118
324160000 ELECTRICAL SPEED MEASURING 102
324072000 TESTING POTENTIAL IN SPECIFIC ENVIRONMENT (E.G., LIGHTNING STROKE) 88
324066000 CONDUCTOR IDENTIFICATION OR LOCATION (E.G., PHASE IDENTIFICATION) 75
324457000 ELECTROSTATIC FIELD 62
324158100 MISCELLANEOUS 28
324378000 INTERNAL-COMBUSTION ENGINE IGNITION SYSTEM OR DEVICE 22
324452000 A MATERIAL PROPERTY USING ELECTROSTATIC PHENOMENON 22
324074000 TESTING AND CALIBRATING ELECTRIC METERS (E.G., WATT-HOUR METERS) 21
324557000 FOR INSULATION FAULT OF NONCIRCUIT ELEMENTS 12
324376000 OF SUBSURFACE CORE SAMPLE 8
324451000 A MATERIAL PROPERTY USING THERMOELECTRIC PHENOMENON 4
20080211510METHOD AND APPARATUS FOR MEASURING THE TEMPERATURE OF A GAS IN A MASS FLOW CONTROLLER - A method and apparatus for measuring the temperature of a gas in a mass flow controller is described. One embodiment derives gas-temperature information from a mass flow sensor of the mass flow controller without relying on a separate temperature sensor. This embodiment supplies a substantially constant electrical current to a thermal mass flow sensor of the mass flow controller, the thermal mass flow sensor being designed to measure a mass flow rate of the gas; measures an input voltage of the thermal mass flow sensor to obtain a present input voltage, the input voltage varying with a temperature differential between a pair of sensing elements of the thermal mass flow sensor; calculates an adjusted input voltage by accounting for a component of the present input voltage that is dependent on the mass flow rate of the gas; and calculates the temperature of the gas based on the adjusted input voltage. In some embodiments, the calculated gas temperature is used to compensate for the variation, with temperature, of an output voltage of the thermal mass flow sensor under a zero-flow condition.09-04-2008
20080252298BROADBAND MICRO-MACHINED THERMAL POWER SENSOR - A power sensor comprises a substrate, an insulating membrane associated with the substrate, and an electro-thermal transducer partially supported by the insulating membrane. The electro-thermal transducer includes an impedance matched load spaced from the substrate by the insulating membrane, and a thermopile partially spaced from the substrate by the insulating membrane and partially arranged on the substrate, the thermopile being adapted to generate, a voltage in response to heat generated in the impedance matched load. An electrically conductive member connected with the impedance matched load to guide electromagnetic signals to the electro-thermal transducer.10-16-2008
20080252299Cell or stack for evaluating performance of fuel cell and method of evaluating performance of fuel cell using the same - The present invention provides a cell or stack for evaluating the performance of a fuel cell and a method of evaluating the performance of the fuel cell using the cell or stack, in which a semiconductor thermoelectric device, attached to the side surface of the unit cell or stack of the fuel cell, is provided so as to evaluate the performance of the fuel cell in an environment in which temperature is maintained at a uniform temperature.10-16-2008
20150130472THERMOELECTRIC CONDUCTIVITY MEASUREMENT INSTRUMENT OF THERMOELECTRIC DEVICE AND MEASURING METHOD OF THE SAME - Provided are a thermoelectric conductivity measurement instrument of a thermoelectric device and a measuring method of the same. The thermoelectric conductivity measurement instrument of the thermoelectric device includes a sample piece fixing module configured to provide an environment for measuring physical properties of the thermoelectric device as a sample piece and comprising an electrode part configured to provide contact points which are respectively in contact with both ends of the sample piece, and a measuring circuit module configured to provide a source AC voltage of a first frequency heating the sample piece to the electrode part, detect a first thermoelectric AC voltage of a second frequency greater than the first frequency and a second thermoelectric AC voltage of a third frequency greater than the second frequency, which are generated by a temperature change occurring at the contact points, and then obtain the thermoelectric conductivity.05-14-2015
324730100 PLURAL, AUTOMATICALLY SEQUENTIAL TESTS 3
20080315862SMART PARALLEL CONTROLLER FOR SEMICONDUCTOR EXPERIMENTS - An instrument is configured to coordinate execution of a plurality of experiments employing a plurality of source measurement units (SMU's) to characterize a plurality of devices under test (DUT's). Each experiment controller, of a plurality of experiment controllers, is configured to manage one of the plurality of experiments by, at least in part, controlling the SMU's allocated to that experiment. A main controller is configured to interoperate with a host to manage the experiment controllers. For example, the instrument may be configured to provide experiment parameters to the SMU's prior to execution of the experiments. In one aspect, the main controller is configured to receive experiment parameters from a host controller external to the instrument. At least in part based on the received experiment parameters, the main controller configure which experiment controllers are to manage which experiment. The main controller is also configured to cause each experiment controller to provide appropriate ones of the received experiment parameters to the SMU's allocated to the experiment which that experiment controller is configured to manage.12-25-2008
20090015235METHOD AND APPARATUS FOR TESTING A SYSTEM MODULE - A method for testing a system module assembled by integrated circuits during mass production. The integrated circuits and the assembled system modules are manufactured by the same manufacturer. The method includes the steps of apply a plurality of system level tests to the system module to determine the performance of the system module. Next, verify the performance of the integrated circuits based on the results of the system level tests. Finally, perform integrated circuit level tests, wherein the integrated circuit level tests include test items unverifiable by the system level tests. The present invention also includes a testing apparatus for testing a system module.01-15-2009
20130300399SIGNAL SWITCHING DEVICE AND ELECTRONIC APPRATUS USING THE SAME - A signal switching device connected between at least one electronic device and a testing device includes a switching module and a control unit connected to the switching module. Each electronic device is capable of outputting a first signal and a second signal. The switching module is connected to each electronic device. When the switching device is in a first state, the switching module receives the first signal, and the control unit controls the switching module to transmit the first signal to the testing device. When the switching module is in a second state, the switching module receives the second signal, and the control unit controls the switching module to transmit the second signal to the testing device.11-14-2013
324800000 DIVINING RODS 1
20080315910INDICATOR ROD - An indicator rod responsive to environmental variations is disclosed. A handle defines an elongated cavity having a linear axis. A pin is received within the cavity substantially along the linear axis, and is adapted to rotate about the linear axis. An indicator member is secured to the pin such that the pin extends in a substantially non-parallel orientation from the indicator member.12-25-2008

Patent applications in class Electricity: measuring and testing

Patent applications in all subclasses Electricity: measuring and testing

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