| Class / Patent application number | Description | Number of patent applications / Date published |
|---|
| 324414000 |
Electric lamp
| 123 |
| 324405000 |
Vacuum tube | 3 |
| 20150042345 | Thermionic Valve Tester - The thermionic valve tester ( | 02-12-2015 |
| 20150309124 | Method and apparatus for revealing errors in the case of a light signal - A method for revealing a light signal error, in particular for railway safety systems, and a device for carrying out the method includes an electronic signal generator, which can be disconnected in a reversible manner in the event of an error, and a control part which is designed for incandescent lamps for controlling and monitoring the signal generator. In order to be able to evaluate the operation of said type of control part with an incandescent lamp interface also when the signal is flashing, it is provided that when the signal generator is activated in the flashing mode, in which no signal voltage is supplied during the flashing intervals, a timer which is connected to a voltage source measures the duration of the pauses between the flashes, and in the event of an error, maintains the disconnection for at least one flashing cycle and signals to the control part. | 10-29-2015 |
| 20150355264 | Predicting the End of Service Life for a Vacuum Electron Device - The subject matter described herein generally relates to apparatus, systems, methods and associated computer instructions for predicting the end of service life of a space charge limited vacuum electron device. The device produces an electron beam current and has a cathode and a filament powered by an adjustable voltage power supply providing a voltage between a first low voltage and a second higher voltage to heat the cathode to an electron emitting temperature. The process includes periodically, while the device is in operation, adjusting the voltage provided by the power supply while monitoring the beam current, determining a knee-point in the voltage where the beam current begins to decrease as the voltage is decreased, and calculating, based on the determined knee-point and a predetermined voltage vs service life remaining relationship, the amount of service life left in the device. | 12-10-2015 |
| Entries |
| Document | Title | Date |
|---|
| 20090322339 | APPARATUS AND METHOD OF USE OF A HIGH-VOLTAGE DIAGNOSTIC TOOL FOR X-RAY SYSTEMS - A diagnostic tool for an x-ray imaging system includes a first test device configured to simulate a first load condition of an x-ray tube, and a first connector electrically coupled to the first test device and configured to couple the first test device to a high-voltage generator in the x-ray imaging system. | 12-31-2009 |
| 20100045297 | DEVICE FOR MEASURING THE CURRENT OF A DISCHARGE LAMP - A device for measuring the current of a discharge lamp, includes a first current measuring device, which converts the current flowing through the lamp into a signal; a second current measuring device, through which a current flows which has the same amplitude response and phase response as the displacement current which flows through the first current measuring device; wherein the signals of the first current measuring device and the second current measuring device are interconnected in such a way that the content of the displacement current in the resultant signal vanishes. | 02-25-2010 |
| 20100097069 | EVALUATION SYSTEM, LIGHTING DEVICE, AND IMAGE DISPLAY DEVICE - An image display device accurately evaluates the possibility of problems occurring due to the state of impure gas inside a discharge envelope in a high pressure discharge lamp. The image display device includes the high voltage discharge lamp and an evaluation unit ( | 04-22-2010 |
| 20110080173 | MOTHER SUBSTRATE OF ORGANIC LIGHT EMITTING DISPLAYS CAPABLE OF SHEET UNIT TESTING AND METHOD OF SHEET UNIT TESTING - A mother substrate including a plurality of organic light emitting display panels that include pixel circuits having a simple structure, is designed so that a sheet unit test may be performed while preventing or reducing brightness variation during sheet unit test, and a sheet unit test method for the mother substrate. The mother substrate also includes first and second wiring line groups and a compensating unit. The compensating unit is coupled to a coupling line for coupling a wiring line from among the first and second wiring line groups for transmitting a sheet unit test signal to the panels. The compensating unit is also for subtracting a voltage corresponding to a threshold voltage of a driving transistor included in a pixel of the panels from the sheet unit test signal before transmitting the sheet unit test signal to the panels. | 04-07-2011 |
| 20110084700 | ONE-SHEET TEST DEVICE AND TEST METHOD THEREOF - A one-sheet test device for testing panels on a one-sheet substrate and a test method thereof, wherein the test device and method are capable of performing a one-sheet test regardless of the number of panels formed on the one-sheet substrate. The one-sheet test device includes a signal supplier and a connection board. The signal supplier is for generating a plurality of signal groups and a plurality of dummy signals for testing the panels. The connection board is for transmitting a first signal group of the signal groups to a first panel of the panels corresponding to the first signal group, and for transmitting a signal of at least one signal group of the plurality of signal groups to at least two of the panels when the number of panels is larger than the number signal groups. The one-sheet test device may include a connection controller for controlling the connection board. | 04-14-2011 |
| 20110095764 | METHOD OF CALCULATING A USED TIME OF A LIGHT SOURCE, METHOD OF DISPLAYING LIFETIME OF A LIGHT SOURCE USING THE METHOD AND DISPLAY APPARATUS FOR PERFORMING THE METHOD - A display apparatus includes a display panel, a light source part, a light source driving part and a used time calculation part. The light source part includes a light source providing the display panel with lights. The light source driving part includes a boost part outputting a light source driving voltage and a light source driving chip controlling the boost part. The used time calculation part detects an initial drive time during which an initial driving voltage is supplied to the light source driving chip and a normal drive time during which a normal driving voltage is supplied to the light source driving chip, and calculates a used time of the light source by using the initial drive time and the normal drive time. Thus, a real used time of a light source may be provided to correctly estimate lifetime of a light source. | 04-28-2011 |
| 20110169493 | Identification of a Defective Filament in a Fluorescent Lamp - Control of delivery of current through one or more discharge lamps. Methods include alternately switching on and off switching elements that control a fluorescent lamp, in response to receiving input, until the brightness of the lamp decreases to a threshold. Further, methods include providing control signals at complementary duty cycles to further decrease the brightness and alternating the duty cycles of the signals applied to the filaments of the fluorescent lamp. | 07-14-2011 |
| 20110279121 | Method of Detecting Arc Discharge in a Plasma Process - An arc discharge detection device is used for detecting arc discharges in a plasma process. The arc discharge detection device includes a comparator configured to emit an arc discharge detection signal and receive an instantaneous value of the signal or a signal proportional thereto, a minimum or maximum value detection device configured to receive the signal and to determine a minimum or maximum value of the signal within a predetermined time period, a setting means configured to receive the minimum or maximum value and to generate a reference signal from the minimum or maximum value, such that the reference signal is supplied to the comparator, and such that the comparator changes the signal level of the arc discharge detection signal when the comparator detects that the instantaneous value has reached the reference signal. | 11-17-2011 |
| 20130049758 | STUN DEVICE TESTING APPARATUS AND METHODS - A method of testing an electric discharge stun device includes the steps of identifying a stun device to be tested and absorbing a discharge from the stun device into a tester. The discharge is characterized by a discharge characteristic that is then compared automatically to information such as (a) a previous corresponding characteristic associated with a previous discharge of the stun device or (b) a corresponding characteristic associated with a prior discharge of at least one other stun device. The characteristic can be a waveform, a peak voltage, duration, current, joule, and temperature. | 02-28-2013 |
| 20140117993 | TEST METHOD AND TEST APPARATUS FOR TRANSPARENT DISPLAY DEVICE - Embodiments of the invention provide a test method and a test apparatus for a transparent display device. The test apparatus for the transparent display device comprises: an optical measuring device disposed on one side of the transparent display device to be tested, and a reference object disposed on the other side of the transparent display device to be tested. A brightness of the transparent display device to be tested is adjustable, and the optical measuring device measures a display effect of the reference object through the transparent display device to be tested which is set to different brightness. | 05-01-2014 |
| 20160124026 | ASSESSMENT AND CALIBRATION OF A HIGH ENERGY BEAM - A high energy beam verification, calibration, and profiling system includes a conductive base plate, supports extending from the base plate, a plurality of conductors, a data logger electrically connected to the conductors, and a computer electrically connected to the data logger. Each conductor is supported by some of the supports such that each conductor is insulated from the conductive base plate. Each conductor has a profile intersecting with profiles of at least some of the other conductors to define a multidirectional and two-dimensional array of conductors. The data logger receives and records data associated with electrical charges flowing through the conductors. The computer is adapted to receive, manipulate, and display the data recorded by the data logger for comparison of beam characteristics at different locations across a high energy beam build area. | 05-05-2016 |
