| Entries |
| Document | Title | Date |
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| 20080204029 | LED CHAIN FAILURE DETECTION - The system consists of an LED failure detection circuit to provide protection against individual LED catastrophic failure. When LED clusters are arranged in a series-parallel configuration, it is important to detect individual LED failure in order to avoid uncontrolled luminous intensity reduction and/or light uniformity degradation. The circuit compares the voltage levels on LEDs with similar position but situated in different chains. In normal conditions, the voltage levels are substantially similar to one another. In case of individual or multiple LED failure, open or shortcircuit, the circuit sends a signal to the automatic turn off circuit that initiates the lamp forced turn off sequence. | 08-28-2008 |
| 20080218171 | Electronic Ballast with Lamp Type Determination - The electronic ballast with lamp type determination for an electronic ballast providing power to a lamp filament | 09-11-2008 |
| 20080224708 | Method and a Device for Detecting Signal Lamps in a Vehicle - Provided are a device and a method of detecting signal lamps in a vehicle, in particular in a large vehicle, being provided with a plurality of signal lamps each being capable of switching between an OFF-phase and an ON-phase. The method includes the steps of during the OFF-phase of a vehicle signal lamp to be probed inducing a probing current by connecting an electric current generator to said vehicle signal lamp circuit, where the probing current is lower than the nominal current for the lamp in question. The next step is to detect the electric voltage level over the lamp circuit and determining vehicle signal lamp characteristics such as type and condition based on said electric voltage level detection. The result of the determination is that the signal lamp is a LED lamp being connected, when the detected voltage level is within a predetermined interval between a first voltage level and a second voltage level. | 09-18-2008 |
| 20080265900 | Method and Apparatus for Monitoring the Operation of a Gas Discharge Lamp - For monitoring the operation of a gas discharge lamp operated with an AC voltage, a lamp voltage signal is generated which is dependent on the voltage dropped across the gas discharge lamp during operation. Said lamp voltage signal is filtered with an attenuation that is different for a DC component and for a component having the frequency of the AC voltage, whereupon a positive and negative peak value of the filtered lamp voltage signal are determined. For monitoring the gas discharge lamp, an average value of the two peak values is determined and compared with a limit value, and a difference value between the two peak values is determined and compared with a limit value. | 10-30-2008 |
| 20080284442 | Control of Delivery of Current Through One or More Discharge Lamps - Control of delivery of current through one or more discharge lamps. Methods include alternately switching on and off switching elements that control a fluorescent lamp, in response to receiving input, until the brightness of the lamp decreases to a threshold. Further, methods include providing control signals at complementary duty cycles to further decrease the brightness and alternating the duty cycles of the signals applied to the filaments of the fluorescent lamp. | 11-20-2008 |
| 20080315885 | Testing device for lighting means - A testing device ( | 12-25-2008 |
| 20090001990 | DETECTOR FOR AN ULTRAVIOLET LAMP SYSTEM AND A CORRESPONDING METHOD FOR MONITORING MICROWAVE ENERGY - A detector for an ultraviolet lamp system of the type having a microwave generator includes a first circuit that is configured to detect the microwave energy generated from the microwave generator. The first circuit includes at least one radiation sensitive component capable of failing upon exposure to an excessive amount of microwave energy. A second circuit is coupled to the first circuit and configured to intermittently test whether the radiation sensitive component has failed. An ultraviolet lamp system includes the detector. An associated method includes monitoring the microwave energy through the first circuit including at least one radiation sensitive component capable of failing upon exposure to an excessive amount of microwave energy and testing the radiation sensitive component to determine whether the radiation sensitive component has failed. | 01-01-2009 |
| 20090001991 | PROJECTION LAMP TEST DEVICE - A projector lamp electronic test circuit is provided. The test circuit includes an electrical connector configured to be operatively coupled to a lamp of a projection unit under test, a converter configured to receive a test charge to be sent to the lamp from an alternating current power source, the converter configured to convert the test charge from alternating current to direct current, and an autotransformer operatively coupled to the converter, the autotransformer configured to regulate a voltage of the test charge, the voltage being suitably high enough to cause failure of the lamp. | 01-01-2009 |
| 20090134878 | METHOD AND SYSTEM FOR OPERATING A DISCHARGE LAMP SUCH AS TO DETECT DEFECTIVE OPERATION OF THE LAMP - A method is described for detecting defective operation of a discharge lamp ( | 05-28-2009 |
| 20090261834 | TEST SYSTEM - A test system includes a front bezel of an electronic device and a test device. The front bezel includes a plurality of positions defined in the front bezel, a plurality of light emitting diodes (LEDs) located in the plurality of positions, and a female LED connector connected to the plurality of LEDs. The test device includes a male LED connector electrically connected to the female LED connector, and a programmable logic device (PLD) electrically connected to the male LED connector, and configured to control the LEDs to emit light in a sequence to determine if the plurality of LEDs are correctly located in the correct plurality of positions. | 10-22-2009 |
| 20090284261 | Lamp With Metering Device - A lamp includes a generator that generates electricity. A battery stores the generated electricity. A light source produces light from the stored electricity. A metering device tallies an operating parameter indicative of the amount of electrical energy consumed by the lamp. | 11-19-2009 |
| 20100066375 | METHOD FOR DETERMINING A STATUS AND/OR CONDITION OF A LED/OLED DEVICE AND DIAGNOTIC DEVICE - The present invention relates to a method for determining a status and/or condition of an LED/OLED device | 03-18-2010 |
| 20100117656 | LED OUTAGE DETECTION CIRCUIT - In order to detect a defective light source, such as a LED coupled to a DC-DC converter circuit for receiving a power signal, an outage detection circuit comprises a top voltage detector coupled to the LED for detecting a voltage across the LED. The top voltage detector has an top voltage terminal for supplying a top voltage signal. The detection circuit further comprises a differential amplifier coupled to the top voltage terminal for receiving the top voltage signal as a first input signal and coupled to a reference voltage terminal. The reference voltage terminal is configured to supply a reference voltage as a second input signal. The differential amplifier comprises an output terminal for supplying an outage detection signal. | 05-13-2010 |
| 20100213944 | Diagnosis Device, Diagnosis Method, And Lamp Ballast Circuit Using The Same - The present invention relates a diagnosis device for detecting an end of lamp life of a lamp, a diagnosis method, and a lamp ballast circuit using the same. The diagnosis device generates a reference lamp voltage by adding a predetermined reference voltage to a distributed voltage corresponding to a lamp voltage applied to a lamp and generates an integrated lamp voltage by integrating the reference lamp voltage. The diagnosis device compares the integrated lamp voltage with a normal range that an integrated lamp voltage has when the lamp is in a normal state. | 08-26-2010 |
| 20100213945 | System and Method of Monitoring an Electronic Discharge Device in an Air Purification System - A method and system of remotely monitoring an operational status of electronic discharge devices in an air purification system senses emitted radiation at a location proximate the air purification system, alone or in combination with a determination of an amount of time remaining in an operational lifetime of the electronic discharge device, or an amount of power delivered to at least one of the electronic discharge devices. A determination of the operational status of at least one of the electronic discharge devices is made based on at least emitted radiation, and the status information is transmitted to a remote monitoring unit that receives the status information and displays an indicator of operational status. In one embodiment, the operational status of a UV-C germicidal lamp may be monitored using optically sensitive devices located within a purification system. | 08-26-2010 |
| 20100244844 | DEVICE AND METHOD FOR DETECTING A STREET LAMP FAULT - A device for detecting a fault of at least one street lamp of a plurality of street lamps which are connectable in common to an AC power supply is proposed. The proposed device allows detecting whether a fault has occurred based on obtaining measures representative of the total active and reactive power supplied by the AC power supply to the plurality of street lamps, and detecting variations in these measures. Optionally, also the type of fault can be determined based on detected variations in the power measures. | 09-30-2010 |
| 20100277178 | METHOD FOR ASCERTAINING A TYPE OF A GAS DISCHARGE LAMP AND ELECTRONIC BALLAST FOR OPERATING AT LEAST TWO DIFFERENT TYPES OF GAS DISCHARGE LAMPS - Various embodiments provide a method for ascertaining a type of a gas discharge lamp using an electronic ballast for operating different types of gas discharge lamps, wherein the different types of gas discharge lamps differ in at least one operating parameter, wherein the method may include: a) preheating at least one filament in the gas discharge lamp for a predetermined preheating time; b) measuring a physical variable which is characteristic for the type of the gas discharge lamp at the end of the preheating time and providing the measurement value of said variable; and c) ascertaining the lamp type on the basis of the measurement value which is provided, wherein the preheating time is increased by a predetermined time period and the b) and c) are repeated if the lamp type in c) cannot be ascertained uniquely. Moreover, various embodiments provide an electronic ballast for operating at least two different types of gas discharge lamps which have at least one different operating parameter. | 11-04-2010 |
| 20100308833 | LIGHTING UNIT WITH COMPENSATION FOR OUTPUT FREQUENCY, AND METHOD FOR DETERMINING OUTPUT FREQUENCY - A method of determining the dominant output wavelength of an LED, comprises determining an electrical characteristic of the LED which is dependent on the voltage-capacitance characteristics, and analysing the characteristic to determine the dominant output wavelength. | 12-09-2010 |
| 20100327872 | Devices And Methods For LED Life Test - A life test device comprises an oven, a current source, a voltage meter, a control module, and a process module. A light-emitting diode (LED) is disposed in the oven. The temperature of the oven is gradually changed in a first period and remains at a set temperature in a second period. The current source provides a first current and a second current to the LED. The voltage meter measures forward voltages of the LED. The control module controls the current source to output the first or second current to the LED and controls the voltage meter to measure the forward voltages of the LED. The process module calculates a junction temperature of the LED according to the forward voltages and a variation relationship formula between the forward voltages and the temperature of the oven. | 12-30-2010 |
| 20110025337 | SYSTEM AND METHOD OF TESTING HIGH BRIGHTNESS LED (HBLED) - A system and method of testing High Brightness LED (HBLED) is provided, and more particularly, a system and method of Controlled Energy Testing of HBLED with improved accuracy and repeatability is provided. In one embodiment, the system includes a programmable constant power source for providing a constant power to a Device Under Test (DUT), in this case, an HBLED, wherein the programmable constant power source adjusts an output voltage or an output current to ensure that a given amount of power is supplied to the HBLED for a predetermined amount of time and to provide precise control of a junction temperature of the HBLED for the duration of the test sequences; a Parametric Measurement Unit (PMU) including a processor for executing a plurality of HBLED test sequences, and a spectrometer for measuring a set of HBLED parameters including power and color (wavelength) of an optical output of the HBLED; and a controller for coordinating timing of acquiring the set of measured HBLED parameters. In another embodiment, a photodetector is implemented to measure the integrated power of the optical output of the HBLED. | 02-03-2011 |
| 20110074429 | DEFECTIVE EMITTER DETECTION FOR ELECTROLUMINESCENT DISPLAY - Inoperative or defective electroluminescent (EL) emitters in an EL display having a plurality of subpixels are detected. Current flow through a drive transistor in a subpixel is turned off, a selected test current is provided through the EL emitter in the subpixel using a current source, and the voltage at a second electrode of a readout transistor in the subpixel is measured to provide a status signal representative or characteristics of the selected EL emitter. The status signal for the subpixel is compared to the respective status signals of neighboring subpixels to determine whether the EL emitter in the subpixel is defective. | 03-31-2011 |
| 20110084701 | TESTING OF LEDS - A method of determining the ageing characteristics of an LED comprises applying a current stress pulse to the LED. The LED is monitored to determine when the thermal heating induced by the current stress pulse has been dissipated to a desired level. The operational characteristics of the LED are then measured before applying the next stressing pulse. | 04-14-2011 |
| 20110128004 | APPARATUS FOR INSPECTING LIGHT EMITTING DIODE PACKAGE AND INSPECTING METHOD USING THE SAME - An apparatus for inspecting a light emitting diode (LED) package is provided to inspect an LED to determine whether or not it is defective, and discard the LED when the LED is defective. The apparatus for inspecting an LED package includes: an inspection unit inspecting an LED through a visual inspection to determine whether or not the LED is defective; and a defective product rejection unit discarding the LED when the LED is determined to be defective on the basis of inspection results from the inspection unit among LEDs supplied from the inspection unit. Because the operation of inspecting LEDs and discarding a defective LED are automated and can be rapidly processed as a sequential process, productivity can be improved. | 06-02-2011 |
| 20110133742 | LAMP FAILURE DETECTOR - An apparatus and method for detecting lamp failure is described for an array of lamps used in a rapid thermal processing system. The lamp failure detection system enables identification of a failed lamp among a plurality of lamps, and also provides identification of the failure type. The apparatus applies a lamp failure detection method to the voltage drop values measured across each lamp to determine if a lamp is in a failure state. In one embodiment, a field programmable gate array is used to apply a failure detection method to the lamp voltage values. | 06-09-2011 |
| 20110148422 | Lamp With Metering Device - A generator generates electricity by non-combustion means. A battery stores the generated electricity. An electrical appliance is powered by the stored electricity. A metering device tallies an operating parameter indicative of the amount of electrical energy consumed by the appliance. A housing supports the generator, the battery, the appliance and the metering device. A device, including the generator, the battery, the metering device and the housing, is manually portable. | 06-23-2011 |
| 20110169494 | Method for the Operation of Illuminants - The invention relates to the operation of illuminants, in particular OLEDs. The invention relates to a method and a measuring instrument for determining the electrical properties of an OLED, the equivalent circuit diagram of which is composed of the parallel connection of an equivalent diode D | 07-14-2011 |
| 20110241691 | TESTING DEVICE AND TESTING METHOD EMPLOYING THE SAME - An exemplary testing device for testing quality of indicator lights includes a light intensity tester and a control unit electrically connected to the light intensity tester. The light intensity tester includes a testing circuit, and the testing circuit is capable of generating testing parameters of corresponding indicator lights. The control unit is capable of providing electric energy to the indicator lights. The testing parameters from the testing circuit are changed according to light intensity of the indicator lights and are then transmitted to the control unit. Thus, the control unit is capable of comparing the testing parameters with predetermined parameters to detect the quality of the indicator lights. | 10-06-2011 |
| 20110254554 | LED-BASED ILLUMINATION MODULE ON-BOARD DIAGNOSTICS - A light emitting diode (LED) based illumination module performs on-board diagnostics. For example, diagnostics may include estimating elapsed lifetime, degradation of phosphor, thermal failure, failure of LEDs, or LED current adjustment based on measured flux or temperature. The elapsed lifetime may be estimated by scaling accumulated elapsed time of operation by an acceleration factor derived from actual operating conditions, such as temperature, current and relative humidity. The degradation of phosphor may be estimated based on a measured response of the phosphor to pulsed light from the LEDs. A thermal failure may be diagnosed using a transient response of the module from a start up condition. The failure of LEDs may be diagnosed based on measured forward voltage. The current for LEDs may adjusted using measured flux values and current values and a desired ratio of flux values. Additionally, the LED current may be scaled based on a measured temperature. | 10-20-2011 |
| 20110254555 | ELECTRO-OPTICAL DEVICE - An electro-optical device includes a substrate, a plurality of unit circuits that includes a plurality of scanning lines, a plurality of data lines and electro-optical elements provided corresponding to intersecting regions of the scanning lines and the data lines and is formed in a display region of the substrate, a plurality of pixel circuits that includes electro-optical elements and is formed in the display region and a sealing member that seals the electro-optical elements of the plurality of pixel circuits formed in the display region and is attached to the substrate, wherein a test circuit is formed between an attaching region at which the sealing member is attach to the substrate and the display region. | 10-20-2011 |
| 20110316543 | METHOD AND CIRCUITS FOR SHORT-CIRCUIT PROTECTION OF LED SYSTEMS - An embodiment of the present invention relates to a method for detection of short circuit conditions in an LED array having one or more LED strings, each of which includes one or more LED devices. The method includes determining a minimum voltage that is the lowest of voltages associated with cathode terminals of the one or more LED strings. The method also includes determining if said minimum voltage is between a lower limit voltage and an upper voltage limit. If said minimum voltage is between the lower limit voltage and the upper voltage limit, then a result of a short circuit testing can be considered valid. Here, the short circuit testing includes comparing a sampled voltage associated with a cathode voltage of one of the LED strings with a short-circuit reference voltage. | 12-29-2011 |
| 20120007602 | LIGHTING TESTER - A combination lighting tester tool. The combination lighting tester tool includes at least three independent testing tools for identifying and diagnosing a problem in a lighting system. For example, the tester includes a lamp testing function in which a high voltage test signal is generated and transmitted using an antenna. When the test signal is in proximity to a gas filled lamp, the voltage is of sufficient magnitude to ionize the gas inside the lamp, causing the lamp to illuminate. The tester also includes a ballast testing function in which the power lines or wires connecting a ballast to a lamp or lighting fixture are tested, and a filament tester for testing the filaments in a lamp for continuity or resistance. The tester also includes a worklight for illuminating an area under test and one or more display devices (e.g., LEDs, an LCD display, or the like) which provide an indication of, for example, a test being performed or a result of a test. | 01-12-2012 |
| 20120038363 | System and Method of Quantifying Color and Intensity of Light Sources - A system and method of quantifying color and intensity of light sources including LEDs, HBLEDs (High Brightness LEDs), and other Solid State Lights (SSLs) using C-parameters to model a Spectral Power Distribution (SPD) to improve precision, accuracy, repeatability and usefulness of measurement of optical properties of wavelength and radiant flux in manufacturing of an object, designing products and processes that use the object, and describing/defining the object, is provided. In one embodiment, a method of characterizing a Solid State Light (SSL) source includes a SSL source under test (DUT), a Spectral Power Distribution (SPD) of light emission of the SSL source, a curve-fitting function, a set of configuration data comprising the order of the curve-fitting function, the number of nodes, wavelength boundary limits, saturation threshold, and noise floor threshold, a computing device for curve-fitting, node detection, iteration and program control and inputting and outputting data; and a set of C-Parameters, noise parameters, and confidence values. | 02-16-2012 |
| 20120062236 | ORGANIC EL PANEL INSPECTION METHOD, ORGANIC EL PANEL INSPECTION DEVICE, AND ORGANIC EL PANEL - In an organic EL panel inspection method, to determine whether an organic EL panel is good or bad, a plurality of voltages having different values are sequentially applied to the organic EL panel, thereby measuring the respective currents. According to the currents, the following three criteria are checked: criterion (1), whether or not a spike current is present in the measured currents, criterion (2), between when the plurality of voltages are sequentially applied from one direction to the other direction of the voltage and when the plurality of voltages are sequentially applied from the other direction to the one direction, whether or not currents having different current densities occur at the same voltage, and criterion (3), the absolute value of the current density of current flowing when a predetermined voltage in the reverse direction is applied to the organic EL panel. | 03-15-2012 |
| 20120068714 | Short Detection Circuit, Light-Emitting Diode Chip, Light-Emitting Diode Device and Short Detection Method - A short detection circuit includes a voltage divider circuit, for generating, according to a bottom voltage of one or more light-emitting diode strings, a divided voltage less than the bottom voltage. Additionally, the short detection circuit includes a voltage clamp circuit, coupled to the voltage divider circuit, for clamping the divided voltage, and a comparator, coupled to the voltage divider circuit, for comparing the divided voltage and a reference voltage, to decide whether a short circuit occurs in the one or more light-emitting diode strings according to a result of the comparison. | 03-22-2012 |
| 20120074947 | Failure Detection for Series of Electrical Loads - A device can be used for detecting failures in an illumination device having a plurality of light emitting diodes connected in series. A first circuit node, a second circuit node, and a third circuit node interface the illumination device such that a voltage supplying the plurality of light emitting diodes is applied between the first and the second circuit node and a first fraction of the supply voltage drop is provided between the third and the second circuit node. An evaluation unit is coupled to the first circuit node, the second circuit node, and the third circuit node and configured to assess whether a voltage present at the third circuit node is within a pre-defined range of tolerance about a nominal value that is defined as a second fraction of the supply voltage present between the first and the second circuit node. | 03-29-2012 |
| 20120092017 | ORGANIC ELECTROLUMINESCENCE DEVICE AND TESTING METHOD THEREOF - An organic electroluminescence device is provided, which comprises: a lighting region, a wiring region, a bonding region and a wiring extending region ( | 04-19-2012 |
| 20120139544 | System And Method For Recording The Characteristic Curves Of Light-Emitting Diodes (LEDs) - The invention relates to a system for recording characteristic curves for a light-emitting diode arrangement ( | 06-07-2012 |
| 20120161775 | INSPECTION METHOD FOR AN ACTIVE MATRIX SUBSTRATE - An active matrix substrate including a substrate, a plurality of scan lines, a plurality of data lines, a plurality of independent common line patterns, and a plurality of pixels is provided. The scan lines, data lines, and common line patterns are disposed on the substrate. The pixels are arranged in array on the substrate, wherein each pixel is electrically connected to corresponding scan line and data line, and the common line patterns are distributed under each pixel. Each pixel includes a plurality of active components and a plurality of pixel electrodes. Each of the pixel electrodes is electrically connected to corresponding scan line and data line through different active components. The capacitance coupling effect between each of the pixel electrodes and common line patterns are different. Additionally, an inspection method for the active matrix substrate and a liquid crystal display having the active matrix substrate are further provided. | 06-28-2012 |
| 20120169345 | INSPECTION METHOD - An inspection system is provided, which applies a forward or reverse voltage on a light-emitting device and measures a current thereof respectively before and after temperature rise, and determines whether the device fails according to the fact whether a current difference before and after the temperature rise is larger than a failure current determination value. Alternatively, the inspection system adopts a current applying device to apply a forward and reverse current on a light-emitting device and measures a voltage difference thereof respectively before and after temperature rise, and determines whether the device fails according to the fact whether a difference of the voltage differences before and after the temperature rise is larger than a failure voltage determination value. Alternatively, the inspection system adopts a predetermined inspecting step and a rapid inspecting step respectively to determine whether a light-emitting device fails. An inspection method for the inspection system is also provided. | 07-05-2012 |
| 20120169346 | TEST DEVICE FOR LIQUID CRYSTAL DISPLAY DEVICE AND TEST METHOD THEREOF - A test device for a liquid crystal display device includes a first shorting bar, a first, a second and a third control line, transmission lines and thin film transistor switch elements; in which the gate electrodes of thin film transistor switch element are respectively arranged on the first, the second and the third control line; the data lines are respectively connected to the first, the second and the third control line via the drain electrodes of thin film transistor switch elements, in which data lines for controlling the blue pixel units are connected to the first control line, data lines for controlling the red pixel units are connected to the second control line, data lines for controlling the green pixel units are connected to the third control line; and the source electrodes of multiple thin film transistor switch elements are connected to the first shorting bar via multiple transmission lines. | 07-05-2012 |
| 20120182018 | APPARATUS AND METHOD FOR SENSING FAILURE - Provided is an apparatus for sensing a failure that may apply, using a current control unit, a current to at least one first light emitting diode (LED) string and at least one second LED string that may be connected in parallel with each other, and as a result of sensing whether a failure occurs with respect to each of the at least one first LED string and the at least one second LED string, when a failure is sensed with respect to at least one of the at least one first LED string and the at least one second LED string, may transmit failure information to the current control unit, thereby blocking the entire current that may be applied to the at least one first LED string and the at least one second LED string, using the current control unit. | 07-19-2012 |
| 20120200296 | TECHNIQUE FOR IDENTIFYING AT LEAST ONE FAULTY LIGHT EMITTING DIODE IN MULTIPLE STRINGS OF LIGHT EMITTING DIODES - A method includes receiving a first voltage from a first node associated with a first string of multiple light emitting diodes (LEDs). The method also includes receiving a second voltage from a second node associated with a second string of multiple LEDs. The method further includes identifying whether at least one of the LEDs has a fault using the first and second voltages. Identifying whether at least one of the LEDs has a fault could include comparing a difference between the first and second voltages to a threshold. Identifying whether at least one of the LEDs has a fault could also include determining whether a difference between the first and second voltages falls within a voltage range defined by higher and lower voltage limits. | 08-09-2012 |
| 20120206145 | Array test method for organic light emitting display device and method for manufacturing the organic light emitting display device - A test method of a pixel circuit array in an organic light emitting diode (OLED) display, the pixel circuit including a first capacitor connected to a first transistor, the first transistor transmitting a data signal and controlling a light emitting amount of an organic light emitting element according to a scan signal, the method including irradiating an electron beam to a first electrode terminal of the first capacitor before completing formation of the organic light emitting element, the first electrode terminal being exposed during the irradiation, and testing operation of the first transistor based on emitted secondary electrons. | 08-16-2012 |
| 20120206146 | TECHNIQUE FOR IDENTIFYING AT LEAST ONE FAULTY LIGHT EMITTING DIODE IN A STRING OF LIGHT EMITTING DIODES - A method includes receiving a first voltage from an intermediate node in a string of multiple light emitting diodes (LEDs). The method also includes receiving at least one second voltage based on a string voltage (V | 08-16-2012 |
| 20120217969 | LED PROBE - A probe includes a main body and a sensor circuit board. The main body includes a through hole capable of accommodating an LED under test and an accommodation space capable of accommodating the sensor circuit board. The main body is made of opaque material. The sensor circuit board includes a light sensor, a body and a connector. The light sensor is opposite to the through hole. The probe separates the light sensor and the LED under test from ambient light, thereby enhancing the precision of test results. | 08-30-2012 |
| 20120306502 | Circuit for Controlling Current to Light-Emitting Diode (LED) - The present invention discloses a current controlling circuit wherein the circuit ( | 12-06-2012 |
| 20130015859 | TESTING APPARATUS FOR LIGHT EMITTING DIODESAANM Tseng; I-ShihAACI Taoyuan HsienAACO TWAAGP Tseng; I-Shih Taoyuan Hsien TWAANM Chang; Tien-TengAACI Taoyuan HsienAACO TWAAGP Chang; Tien-Teng Taoyuan Hsien TWAANM Lee; JeffAACI Taoyuan HsienAACO TWAAGP Lee; Jeff Taoyuan Hsien TWAANM Cheng; Chih-YuAACI Taoyuan HsienAACO TWAAGP Cheng; Chih-Yu Taoyuan Hsien TWAANM Cheng; Hsu-TingAACI Taoyuan HsienAACO TWAAGP Cheng; Hsu-Ting Taoyuan Hsien TW - A testing apparatus for flip chip LEDs includes a transparent substrate, a spacing member, a flexible transparent carrier, and a vacuum generator. The spacing member is configured on a first surface of the transparent substrate. The flexible transparent carrier is removably assembled to the spacing member so that a closed space is formed by the flexible transparent carrier, the spacing member, and the first surface of the transparent substrate. The vacuum generator is connected to the closed space for pumping air out of the closed space, and then a part of the transparent substrate clings to the first surface to form a testing area for loading the flip chip LED. | 01-17-2013 |
| 20130043875 | TESTING OF ELECTROLUMINESCENT SEMICONDUCTOR WAFERS - Forward voltage drift in a probe system for the characterization of a light-emitting wafer is virtually eliminated by directing compressed air to the probe so as to ensure that the exact same temperature conditions exist during repeated measurements of the wafer. In one embodiment of the invention, an air flow at room temperature is used, either continuously or intermittently. In another embodiment, the temperature of the probe is controlled by flowing a liquid or a gas through micro-channels built into the probe. In yet another embodiment, the probe is connected to a solid-state Peltier cell that is computer-controlled to maintain the probe's temperature at a predetermined set-point. A temperature-controlled chamber or a thermal reservoir enclosing the probe could be used as well. The results obtained showed remarkable repeatability. | 02-21-2013 |
| 20130127472 | ORGANIC LIGHT EMITTING DISPLAY APPARATUS AND METHOD OF INSPECTING PATTERNS OF THE ORGANIC LIGHT EMITTING DISPLAY APPARATUS - An organic light emitting display apparatus includes: a substrate on which a display area and a non-display area are defined; a first electrode disposed over the display area; an intermediate layer that is disposed over the first electrode and includes an organic emissive layer; a second electrode disposed over the intermediate layer; and a plurality of detection patterns displaced over the non-display area, each of which includes a first electrically conductive pattern layer formed of the same material as the first electrode and a second electrically conductive pattern layer that is formed over the first electrically conductive pattern layer. | 05-23-2013 |
| 20130176031 | APPARATUS FOR DETECTING ABNORMALITY IN AN LED VEHICLE LAMP - An apparatus for detecting abnormality in an LED (light-emitting diode) vehicle lamp includes a detecting module and a warning module . The LED vehicle lamp includes a plurality of LEDs. The detecting module is to be electrically coupled to the LED vehicle lamp for acquiring voltage information that represents an operating voltage level of the LED vehicle lamp, and determines based on the voltage information thus acquired whether the LED vehicle lamp may have functioned abnormally. The warning module is electrically coupled to the detecting module to be driven thereby to generate a warning message when the result of determination by the detecting module indicates that the LED vehicle lamp may have functioned abnormally. | 07-11-2013 |
| 20130207662 | METHOD FOR TESTING LED LIGHT BAR - A method for testing LED light bar includes steps: providing a jig with a pair of aligning plates, and a testing device with an electrical clamp and a sensor; adjusting alignment of LEDs via the pair of aligning plates when soldering the LEDs; clamping one of the LEDs by the electrical clamp and supplying a current of microampere to the LED via the electrical clamp when soldering the LEDs; and detecting whether there is light emitted from the LED via the sensor when supplying the current of microampere to the LED. | 08-15-2013 |
| 20130221970 | TRAILER CONNECTION CHECKING DEVICE AND METHOD - Disclosed herein is a trailer light checking system for a vehicle for checking an electrical connection between the vehicle and a trailer comprising a plurality of exterior vehicle lights, the exterior vehicle lights including a left turn indicator light, a right turn indicator light and a brake indicator light, and further comprises a terminal connection configured to electrically connect each of the plurality of exterior vehicle lights to a respective trailer light. The trailer light checking system also comprises a vehicle controller having a trailer connection checking mode configured to check the terminal connection by simulating manual operation of each of the plurality of exterior vehicle lights according to a timed sequence, such that a respective trailer light will actuate in combination with the simulated manual operation of each of the plurality of exterior vehicle lights if the terminal connection and the respective trailer light are functioning correctly. | 08-29-2013 |
| 20130229185 | TRAILER LIGHT TESTER - The present invention is a trailer light tester that includes a 7-way plug that is inserted into and connected to a trailer to check a plurality of various trailer lights of the trailer, an elongated casing and a turning and stop light switch that is disposed on the elongated casing. The trailer light tester also includes a taillight and marker light switch that is disposed on the elongated casing, a rechargeable battery that powers the elongated casing and a plurality of circuit breakers that are housed in the interior of the elongated casing and protect the trailer light tester against a short or damage from an excessive amount of current. | 09-05-2013 |
| 20130241562 | ARRAY TEST DEVICE, METHOD FOR TESTING AN ORGANIC LIGHT EMITTING DISPLAY DEVICE, AND METHOD FOR MANUFACTURING THE ORGANIC LIGHT EMITTING DISPLAY DEVICE - A method for testing an array for a pixel circuit of an organic light emitting diode display, which includes a first transistor that transmits a driving current corresponding to a data signal to an organic light emitting diode according to a scan signal and at least one capacitor, uses an array test device having a control device and a driver. The method includes performing a first irradiation of electron beams to an exposed portion of a first electrode of the at least one capacitor before manufacturing of the organic light emitting diode is completed, calibrating the control device of the array test device based on secondary electrons output by the at least one capacitor, performing a second irradiation of electron beams to an anode of the pixel circuit, and detecting whether the first transistor is normally operated based on an output amount of secondary electrons output by the anode. | 09-19-2013 |
| 20130257437 | PIXEL AND ARRAY TEST METHOD FOR THE SAME - A pixel includes an organic light emitting diode, a first transistor that is connected to a first power source and that supplies a driving current according to a corresponding data voltage to the organic light emitting diode, a second transistor that is connected to a scan line and that transmits the corresponding data voltage from a data line to a driving transistor according to a scan signal transmitted from the scan line, and a first capacitor including one electrode connected to a gate electrode of the first transistor. The first capacitor stores the corresponding data voltage as a first voltage and a size of the first capacitor is in a range of about 2 times to about 4 times a size of a gate insulating layer of the first transistor. | 10-03-2013 |
| 20130265056 | APPARATUS AND METHOD OF LED SHORT DETECTION - An apparatus and method for detecting a status of at least one of a plurality of light emitting diodes (LEDs), is disclosed in embodiments of the invention. The apparatus includes a first node, a second node, a voltage generator, a current source and a first comparator. The voltage generator generates an output voltage to the first external circuit via the second node. The current source provides a current to the first external circuit via the first node to generate a first node voltage. The first comparator generates a first comparison result according to the first node voltage and a reference voltage, wherein the first comparison result indicates whether the status of at least one of the LEDs is short or not. | 10-10-2013 |
| 20130293236 | ORGANIC LIGHT EMITTING DIODE DISPLAY APPARATUS AND METHOD AND APPARATUS FOR INSPECTING THE SAME - An organic light emitting diode display apparatus and a method and apparatus for easily inspecting the organic light emitting diode display apparatus to determine whether an electrical failure occurs. The organic light emitting diode display apparatus comprises a plurality of pixels each comprising a pixel electrode, an intermediate layer including an organic emission layer, and an opposite electrode; scan lines and data lines corresponding to the plurality of pixels; first power supply lines connected to the plurality of pixels and extending in a first direction; second power supply lines connected to the first power supply lines; and a control line unit for simultaneously supplying control signals to the plurality of pixels, the control line unit including a plurality of control lines extending in one direction and two common lines being respectively connected to both ends of each of the plurality of control lines. | 11-07-2013 |
| 20130307548 | DISPLAY APPARATUS AND METHOD OF DETECTING SHORT-CIRCUIT FAILURE OF THE DISPLAY APPARATUS - A display apparatus is disclosed. The apparatus includes a plurality of unit pixels each comprising a plurality of sub pixels, a plurality of scan wires, and a plurality of scan lines branching off from each of the scan wires and extending in a first direction. The number of scan lines from each scan wire equals the number of sub pixels for each pixel, and each scan line connects one of the scan wires with one of the sub pixels of each of a plurality of unit pixels. The apparatus also includes a plurality of data lines extending in a second direction orthogonal to the first direction and which are connected to the plurality of sub pixels. The apparatus also includes a first power supply line extending in the second direction and connected to the sub pixels, and a plurality of test pads, each connected to the scan lines of one of the scan wires. | 11-21-2013 |
| 20130307549 | INSTRUMENT FOR MEASURING LED LIGHT SOURCE - A LED light source measuring instrument includes a shell portion and a test portion. The shell portion supports the test portion. The test portion includes a carrier plate for placing a LED light source to be tested. A conductive structure is set on the carrier plate for electrically connecting with an underside surface of the LED light source; a cooling chip is set on the carrier plate; a vacuum suction device is provided for generating a vacuum force on the test portion for securely attaching the LED light source to the carrier plate. The cooling chip is used for controlling the temperature of the LED light source within a limited range. A fan is provided for generating a cooling airflow to the LED light source. A heat sink fin extends from the carrier plate toward the fan. | 11-21-2013 |
| 20130335093 | METHOD FOR MEASURING THE LIGHT PROPERTIES OF LIGHT-EMITTING DIODES - The invention relates to a method for measuring the light properties of light-emitting diodes (LEDs) in an arrangement of a plurality of channels connected in parallel, each having at least one LED per channel and a driver for driving the channels by means of pulse width modulation (PWM), in such a way that at least one pulse of predetermined width can be generated for each channel within a PWM period, wherein the LED of a selected channel is measured during a measurement interval, the measurement interval overlapping a pulse, lying within the PWM period, of a selected channel. | 12-19-2013 |
| 20140002090 | TEST STRUCTURE OF DISPLAY PANEL AND TESTING METHOD THEREOF AND TEST STRUCTURE OF TESTED DISPLAY PANEL | 01-02-2014 |
| 20140009161 | TEST MACHINE AND THE TEST METHOD FOR LIGHT EMITTING DIODE BACKLIGHT DRIVER, AND, MANUFACTURING METHOD FOR MONITOR POWER BOARD - A test machine and a test method for a Light Emitting Diode (LED) backlight driver and a manufacturing method for a monitor power board are disclosed. A switch-controlled LED-light-bar load is coupled to an LED backlight driver on a monitor power board. The switch-controlled LED-light-bar load includes a plurality of light bars and a plurality of switches. Each light bar has a plurality of the LEDs which are connected in series. Each switch is connected in parallel to a portion of the LEDs of one light bar such that an effective amount of the LEDs of each light bar is adjustable. The switches are controlled according to a monitor specification that the monitor power board is adapted to. | 01-09-2014 |
| 20140015531 | TESTING APPARATUS - The disclosure discloses a light emitting diode testing apparatus, which includes a power supply module, a probe, a control unit and a data acquisition unit. The power supply module provides a first current or a second current to a testing item. The probe measures characteristics of the testing item. The control unit controls the power supply module to provide the first current or the second current. The data acquisition unit acquires the characteristics of the testing item from the probe. The power supply module includes a first current source, at least one second current source and at least one protector. The first current source provides the first current to the testing item. The at least one second current source provides at least one additional current. The at least one protector prevents the first current from feeding back to the at least one second current source. | 01-16-2014 |
| 20140021957 | APPARATUS AND METHOD FOR DETECTING FLUORESCENT LIGHTING - The present invention suggests an apparatus for detecting the operation status of a fluorescent light source. The apparatus comprises an antenna for receiving and sending electromagnetic waves. The apparatus further comprises a modulation frequency correlator and a signal generator for generating an indication signal. According to a second aspect the present invention proposes a method for detecting the operation status of a fluorescent light source. The method comprises the steps of: receiving an electromagnetic wave; detecting a modulation of the received electromagnetic wave; correlating the modulation frequency of the received electromagnetic wave with a predetermined frequency; generating an indication signal if a correlation between the modulation frequency and the predetermined frequency is detected. | 01-23-2014 |
| 20140049260 | METHOD OF MEASURING THERMAL ELECTRIC CHARACTERISTICS OF SEMICONDUCTOR DEVICE - The present disclosure relates to a method for measuring thermal electric characteristics of a semiconductor device, including the steps of: providing at least one current to the LED device over a time interval; recording a voltage transient response of the LED device, wherein the voltage transient response has a plurality of time segments different in gradient; computing a voltage difference from one of the plurality of time segments in the voltage transient response; and determining whether the LED device is defective based on the voltage difference, wherein the voltage difference is thermal dependent. The present disclosure also provides a testing method for defining a plurality of time segments. | 02-20-2014 |
| 20140062491 | SUPERVISION FOR A LIGHT DISPLAY DEVICE - A device and method may include, in a display device, emitting visible light in a humanly imperceptible manner and sensing said light to verify operation of the display device. | 03-06-2014 |
| 20140084931 | DETECTION APPARATUS FOR LIGHT-EMITTING DIODE CHIPS - A detection apparatus for light-emitting diode chips comprises a transparent chuck with the light-concentration capability, a probing device and a light-sensing device. The transparent chuck comprises a light-incident plane and a light-emitting plane. The light-incident plane is used to bear a plurality of light-emitting diode chips under detection. The probing device comprises two probe pins and a power supply. The two ends of each probe pin is electrically connected to one of the light-emitting diode chips and the power supply, respectively, to make the light-emitting diode chip emit a plurality of light beams. The light beams penetrate through the transparent chuck by emitting into the incident plane of the transparent chuck. The light-sensing device is disposed on one side of the light-emitting plane of the transparent chuck to receive the light beams which penetrate through the transparent chuck. | 03-27-2014 |
| 20140084932 | SYSTEM AND METHODS FOR EXTRACTION OF THRESHOLD AND MOBILITY PARAMETERS IN AMOLED DISPLAYS - A system reads a desired circuit parameter from a pixel circuit that includes a light emitting device, a drive device to provide a programmable drive current to the light emitting device, a programming input, and a storage device to store a programming signal. One embodiment of the extraction system turns off the drive device and supplies a predetermined voltage from an external source to the light emitting device, discharges the light emitting device until the light emitting device turns off, and then reads the voltage on the light emitting device while that device is turned off. The voltages on the light emitting devices in a plurality of pixel circuits may be read via the same external line, at different times. | 03-27-2014 |
| 20140091804 | METHOD AND DEVICE FOR DETECTING LEAKAGE BRIGHT SPOT - A method for detecting a leakage bright spot includes: providing a driving circuit of data lines and a gate drive of a gate side and connecting a terminal area of the gate side by conductive adhesive; dividing the terminal area of the gate side into a first area and a second area, turning on switches of pixel electrodes, and transmitting a driving signal to the data side; and detecting the leakage bright spot by optionally driving conductive terminals on the first area or the second area of the gate side. The present disclosure further provides a device for detecting a leakage bright spot. | 04-03-2014 |
| 20140097849 | METHOD OF DETECTING A LED FAILURE, A CONTROLLER THEREFOR, A LIGHTING UNIT AND LIGHTING SYSTEM - Disclosed herein is a method of detecting an LED failure in a series-connected string of LEDs using a parameter indicative of a voltage difference between a voltage across the string at a predetermined relatively high current and a voltage across the string at a predetermined relatively low current. The disclosure extends to controllers configured to detect an LED failure in a string of LEDs, to LED lighting units comprising such controllers, and to lighting subsystems, for instance automobile lighting subsystems. | 04-10-2014 |
| 20140103932 | SYSTEM AND METHOD FOR LIGHT INTENSITY MONITORING - A system is provided. The system includes a light emitting diode and a monitoring module. The monitoring module is communicably coupled to the light emitting diode. The monitoring module is configured to receive one or more signals indicative of power consumption of the light emitting diode. Further, the monitoring module is configured to determine a condition of the light emitting diode based, at least in part, on the received signals. | 04-17-2014 |
| 20140117994 | CALIBRATING A LIGHTING DEVICE COMPRISING A SEMICONDUCTOR LIGHT SOURCE - In various embodiments, a method for calibrating a lighting device is provided. The lighting device may include at least one semiconductor light source. The method may include: determining a thermal power loss of the at least one semiconductor light source; determining an electrical power of the at least one semiconductor light source; and determining a light power of the at least one semiconductor light source from the electrical power and the thermal power loss. | 05-01-2014 |
| 20140125343 | INSTRUMENT FOR MEASURING LED LIGHT SOURCE - A LED light source measuring instrument includes a shell portion and a test portion. The shell portion supports the test portion. The test portion includes an electrode seat, the electrode seat includes a first surface and a second surface opposite to the first surface. The first surface of the electrode seat provides two electrodes which electrically connect to the electrode plates of the LED light source for supplying power to the LED light source. The second surface of the electrode seat has a cooling device attached thereto for taking heat generated by the LED light source. A hole passing through the first surface and the second surface of the electrode seat is subjected to a vacuum, for automatically securing the electrode plates of the LED light source to the electrodes on the first surface of the electrode seat. | 05-08-2014 |
| 20140132273 | LIGHT-EMITTING ELEMENT FAILURE DETECTOR AND METHOD FOR DETECTING LIGHT-EMITTING ELEMENT FAILURE - A light emitting element failure detector ( | 05-15-2014 |
| 20140139227 | Light-Emitting Element Failure Detector and Method for Detecting Light-Emitting Element Failure - A light emitting element circuit includes a light emitting element ( | 05-22-2014 |
| 20140159732 | DETECTION APPARATUS FOR LIGHT-EMITTING DIODE CHIP - A detection apparatus for light-emitting diode chip comprising a substrate with the function of photoelectric conversion and a probing device is disclosed. The substrate is designed to bear at least one light-emitting diode chip. The probing device comprises a power supply and at least two conductive elements. The two ends of the conductive elements are respectively electrically connected to the light-emitting diode chip and the power supply to enable the light-emitting diode chip to emit light beams. Some of the light beams are emitted from the light-emitting diode chip toward the substrate such that the light beams emitted by the light-emitting diode chip are converted into an electric signal by the substrate. | 06-12-2014 |
| 20140159733 | DETECTION APPARATUS FOR LIGHT-EMITTING DIODE CHIP - A detection apparatus for light-emitting diode chip comprising a light-collecting apparatus having an opening, a bracing component and a probing device is disclosed. The bracing component is designed to bear at least one light-emitting diode chip. The probing device comprises a power supply and at least two flexible current-transporting elements. The two ends of the current-transporting elements are respectively electrically connected to the light-emitting diode chip and the power supply to enable the light-emitting diode chip to emit light beams. Besides, the detection apparatus for light-emitting diode chip of the present invention further comprises a thimble to push the light-emitting diode chip into the inside of the light-collecting apparatus via the opening such that the light beams emitted by the light-emitting diode chip are collected by the light-collecting apparatus. | 06-12-2014 |
| 20140167769 | ORGANIC LIGHT EMITTING DISPLAY DEVICE INCLUDING A REDUNDANT ELEMENT FOR A TEST GATE LINE - An organic light emitting display device according to example embodiments includes a display unit, a test data line to which a test data voltage is applied during a sheet unit test, a test gate line to which a first voltage is applied during the sheet unit test and to which a second voltage is applied during a normal operation of the organic light emitting display device, a plurality of test transistors configured to selectively couple the test data line to a plurality of data lines in the display unit in accordance with a voltage provided by the test gate line, and at least one redundant element configured to maintain the test gate line at the second voltage during the normal operation even if the test gate line is damaged. | 06-19-2014 |
| 20140167770 | Lighting Jig - The present invention discloses a lighting jig for testing a backlight module, comprising a switch unit and a delay unit; wherein the switch unit is connected to a power supply, and when the switch unit is in closed position, a power output terminal of the lighting jig is electrically connected to a power input terminal of the backlight module, a closing signal is generated at the same time, and the closing signal is output to the delay unit; and the delay unit is connected to the power supply, and outputs a delayed power signal to the power input terminal of the backlight module upon receipt of the closing signal output from the switch unit so as to delay the lighting up of the backlight module. | 06-19-2014 |
| 20140167771 | METHOD AND APPARATUS FOR TESTING LIGHT-EMITTING DEVICE - Disclosed is a method for testing a light-emitting device comprising the steps of: providing a light-emitting device comprising a plurality of light-emitting diodes; driving the plurality of the light-emitting diodes with a current; generating an image of the light-emitting device; and determining a luminous intensity of each of the light-emitting diodes; wherein the magnitude of the current is determined such that the current density driving each of the light-emitting diodes is smaller than or equal to 300 mA/mm | 06-19-2014 |
| 20140218039 | LED LIGHTING DEVICE AND A METHOD TO VERIFY ITS LIFESPAN - The present invention provides an LED lighting device and a method for verifying the device's lifespan. The LED lighting device includes multiple LED light sources, a controller configured to keep time for the LED lighting device's lifespan; a low voltage DC power source configured to supply power; a light intensity sensor configured to capture illuminance data; and a display terminal configured to display received data. Further, the controller records time keeping data based on the illuminance data captured by the light intensity sensor and sends the time keeping data to be displayed on the display terminal. | 08-07-2014 |
| 20140232409 | ORGANIC LIGHT EMITTING DISPLAY AND DRIVING METHOD THEREOF - An organic light emitting display and a driving method thereof, which can effectively detect degradation information of pixels in a display. An organic light emitting display includes a pixel unit and a degradation detector. The pixel unit has a plurality of pixels positioned at intersection portions of scan lines and data lines. The degradation detector divides the pixel unit into a plurality of first blocks each including a plurality of pixels, and detects degradation information for each second block including a plurality of first blocks. In the degradation detector, the second blocks are divided so that each second block shares one or more first blocks with another second block adjacent thereto. | 08-21-2014 |
| 20140239961 | PIXEL CIRCUIT, DISPLAY DEVICE, AND INSPECTION METHOD - Checking failures in transistors including driving transistors, switching transistors, and sampling transistors before light emitting elements are formed in a display device. I-V characteristics including threshold voltage of the driving transistor | 08-28-2014 |
| 20140253133 | METHOD FOR MANUFACTURING EL DISPLAY APPARATUS - The present disclosure relates to a method for manufacturing an EL display apparatus including a light-emitting portion in which a light emitting layer is disposed between a pair of electrodes, a thin film transistor array device for controlling light emission of the light-emitting portion, and an EL display panel in which a plurality of pixels of colors of R, G, and B are disposed. After production of the EL display panel, an inspection step is performed to apply, to each of the pixels, a voltage which is preset for each of the colors of R, G, and B of the pixels, the voltage applied in the inspection step is a potential difference that is a reverse bias voltage opposite to an anode voltage and a cathode voltage during lighting, and the potential difference allows a faulty pixel to turn to a dead dot. | 09-11-2014 |
| 20140266217 | METHOD AND SYSTEM FOR DETECTING LED SHORT CIRCUIT IN LED STRINGS OR DETECTING MATCHING AMONG LED STRINGS - This specification relates to a method and a system for detecting light emitting diode (LED) short circuit in a plurality of LED strings or detecting matching among the plurality of LED strings, wherein one end of each of the plurality of LED strings is connected to a same output end of a power supply, and the other end is respectively connected to a corresponding switch. According to the present invention, first current of each of LED strings is obtained when the output end of the power supply outputs a first voltage; differences between the minimum of the first currents of LED strings and other first currents are calculated; the differences are compared with a comparing threshold; it is determined that the LED strings corresponding to the other currents for which differences are larger than the comparing threshold include short circuit or mismatch with the LED string corresponding to the minimum current. Accordingly, it is possible to reduce the number of pins and area of a control chip. | 09-18-2014 |
| 20140266218 | CIRCUIT ARRANGEMENT FOR SHORT-CIRCUIT DETECTION IN DIODES, LIGHTING ARRANGEMENT AND METHOD THEREFOR - In one embodiment, a circuit arrangement for short-circuit detection in diodes comprises a first terminal ( | 09-18-2014 |
| 20140292342 | System And Method For Extracting Correlation Curves For An Organic Light Emitting Device - A system for determining the efficiency degradation of an organic light emitting device (OLED) in an array-based semiconductor device having an array of pixels that include OLEDs. The system determines the relationship between changes in an electrical operating parameter of the OLEDs and the efficiency degradation of said OLEDs, for at least one stress condition; measures a change in the electrical operating parameter of the OLEDs; determines the stress condition of at least one pixel or group of pixels in the semiconductor device; and uses the determined relationship and the determined stress condition to determine the efficiency degradation of the OLEDs corresponding to the measured change in the electrical operating parameter of the OLEDs. | 10-02-2014 |
| 20140312908 | LCD SOURCE DRIVER FEEDBACK SYSTEM AND METHOD - An electrical assembly and method for detecting failures in an LCD source driver is disclosed herein. A plurality of active channels are placed on the source driver which communicate electronically with an LCD. At least one dummy channel may be placed on the source driver which is driven with an original signal. A microprocessor may then receive the dummy channel and compare the received dummy channel signal to the original signal. An error message may be transmitted when the received dummy channel signal does not match the original signal. Alternatively, the source driver may be provided with a split active channel which is provided with an original signal that is split into an active split channel and a dummy split channel. While the active split channel is sent to the LCD, the dummy split channel is sent to the microprocessor for comparison with the original signal. | 10-23-2014 |
| 20140320136 | METHOD OF TESTING ORGANIC LIGHT-EMITTING DISPLAY PANEL, MOTHER SUBSTRATE TESTING APPARATUS, AND METHOD OF TESTING MOTHER SUBSTRATE - A method of testing an organic light-emitting display panel, a mother substrate testing apparatus, and a method of testing a mother substrate are provided. The method of testing an organic light-emitting display panel includes operations of applying an electric field to an encapsulation layer of the organic light-emitting display panel and determining a defect of the organic light-emitting display panel. | 10-30-2014 |
| 20140320137 | INSPECTION METHOD AND INSPECTION APPARATUS - An inspection method including following steps is provided. A pixel array substrate including a plurality of pixel units is in contact with a photoelectric inspection device. A plurality of electrical signals is inputted to the pixel units of the pixel array substrate and the photoelectric inspection device. Based on an optical property of the photoelectric inspection device, the pixel units of the pixel array substrate are being examined on whether they are normal or not. Moreover, an inspection apparatus realizing the inspection method is also provided. | 10-30-2014 |
| 20140354285 | ORGANIC LIGHT EMITTING DISPLAY PANEL - Provided is an organic light emitting display panel. The organic light emitting display panel includes a pixel unit including a plurality of pixels I displaying mutually different colors, a plurality of data pads electrically connected to wirings extending from the data lines, each of the plurality of data pads being connected to corresponding data lines, respectively, and an array test unit applying an array test signal to the plurality of pixels of the pixel unit, and sensing a current outputted from the plurality of pixels. The array test unit includes an array test pad electrically connected to a plurality of data pads through a plurality of array test switches. | 12-04-2014 |
| 20140354286 | ORGANIC LIGHT-EMITTING DISPLAY PANEL - An organic light-emitting display panel includes a pixel unit connected to a plurality of scanning lines and a plurality of data lines, and including a plurality of pixels, a panel test unit connected to first ends of the plurality of data lines, and configured to output a panel test signal for testing the plurality of pixels, a plurality of data pads connected to second ends of the plurality of data lines, and an array test unit configured to selectively apply a plurality of array test signals to a pixel column of the pixel unit according to a plurality of array test control signals, and detect a signal output from the pixel column to which the plurality of array test signals are applied. | 12-04-2014 |
| 20140368204 | TECHNIQUES FOR ASSESSING CONDITION OF LEDS AND POWER SUPPLY - Techniques are disclosed for assessing the conditions of LEDs and power supplies of solid state lighting systems. The techniques can be used, for example, to measure the capacitance of an output capacitor C in a switch-mode power supply (SMPS), and to measure the condition of the LEDs being driven by that power supply. In some cases, this assessment can be implemented in a lighting controller that controls the lighting system, which may be configured to simultaneously determine C and the conditions of LEDs. In one example case, the techniques can be implemented, for instance, in a micro-controller operating the lighting system. A lighting system implementing the techniques can be periodically assessed so as to provide real-time diagnostic capability. Numerous example embodiments of SMPS LED lighting systems will be apparent in light of this disclosure. | 12-18-2014 |
| 20140375322 | TEST SYSTEM AND METHOD FOR TESTING BACKLIGHT UNIT OF ELECTRONIC DEVICE - A test system and a method for testing a backlight unit of an electronic device are provided. The test system includes a selection unit, a backlight control unit, a display control unit, a determination unit and a count unit. The selection unit selects one mode of a number of modes and issues a command. The backlight control unit controls the backlight unit to adjust a luminous intensity. The display control unit controls the display unit to display a selection dialog window showing a number of options corresponding to the number of modes, and the options are displayed in random order. When an option is chosen, the determination unit determines whether the actual change of the luminous intensity of the backlight unit matches the command. The count unit counts a first counting value and a second counting value and determines whether the backlight unit is qualified. | 12-25-2014 |
| 20140375323 | NEST FOR TESTING ELECTRICAL COMPONENTS | 12-25-2014 |
| 20150015266 | MULTI-FUNCTIONAL ONLINE TESTING SYSTEM FOR SEMICONDUCTOR LIGHT-EMITTING DEVICES OR MODULES AND METHOD THEREOF - The disclosure provides a system and method for multi-functional online testing of semiconductor light-emitting devices or modules. The system comprises an electrical characteristic generating and testing equipment, one or more optical characteristic detecting and controlling equipments, an optical signal processing and analyzing equipment, one or more thermal characteristic detecting equipments, a central monitoring and processing computer, a multi-channel integrated drive controlling equipment, one or more multi-stress accelerated degradation controlling equipments, and one or more load boards. The present disclosure enables in-situ online monitoring and testing under accelerated degradation in a multi-stress accelerated degradation environment. | 01-15-2015 |
| 20150022211 | DETECTION CIRCUIT FOR DISPLAY PANEL - The present disclosure provides a detection circuit for a display panel, comprising: a shorting bar, with connection lines for introducing a test signal or a control signal arranged thereon; a transistor array, the gates of which are connected to the connection lines for introducing the control signal, wherein the connection lines for introducing the test signal are connected with the data lines or the scanning lines of the display panel via the sources and the drains of transistors, under the control signal, and a component, arranged between the gates of the transistor array and the shorting bar, for further reducing or increasing a voltage or current of the gates so that the transistor array can be cut off reliably when the control signal is a signal enabling the transistor array to be cut off. The detection circuit can further reduce the channel length of the thus being advantageous for the design of the narrow frame. | 01-22-2015 |
| 20150028876 | METHOD AND APPARATUS FOR TESTING A LIGHTING DEVICE UNDER TEMPERATURE - An apparatus to measure and collect data relating to properties of light for a plurality of light-producing devices comprises a rail having a longitudinal axis along which the plurality of light-producing devices is aligned. A measurement tool is mounted on the rail and moved under motor control to measure the data for each of the plurality of light-producing devices. | 01-29-2015 |
| 20150042346 | DISPLAY APPARATUS INCLUDING ENCAPSULATION FILM AND METHOD OF INSPECTING THE ENCAPSULATION FILM - A display apparatus is provided. The display apparatus includes a substrate, a display panel on the substrate, and an encapsulation film sealing the display panel. The encapsulation film includes at least one organic layer and/or at least one inorganic layer and at least one pair of conductive layers. | 02-12-2015 |
| 20150042347 | System, Apparatus and Method for Light Diffusion and Testing for Fixtures - A system, apparatus and method for light diffusion and testing fixtures. The system includes remote derangement controls to test the operation of a battery backup system associated with a fixture. The light fixture may incorporate light diffusion features including back mounted light sources, channeled corners in a translucent material and/or pitted surfaces of a translucent material. The system may further include remote monitoring elements and/or sensors to evaluate proper operation of the light diffusion characteristics of a fixture during operation of the battery backup system. | 02-12-2015 |
| 20150048835 | APPARATUS AND METHOD FOR INSPECTING AN ORGANIC LIGHT-EMITTING DISPLAYAPPARATUS - A device for inspecting an organic light-emitting display apparatus includes a power supply unit, a power receiving unit, a wiring location sensing unit, and a control unit. The power supply unit applies an AC signal to each of wirings arranged in the organic light-emitting display apparatus. The power receiving unit senses an electrical signal from each of the wirings. The wiring location sensing unit senses a location of each of the wirings. The control unit determines whether each of the wirings has a defect based on the sensed electrical signal and information pertaining to each wiring type of the wirings. | 02-19-2015 |
| 20150054515 | PRINTED CIRCUIT BOARD ASSEMBLY AND DISPLAY DEVICE HAVING THE SAME - A printed circuit board assembly includes a printed circuit board, a connector mounted on the printed circuit board and including at least one terminal electrically connected to an external device, and at least one electronic component mounted on the printed circuit board and electrically connected to the at least one terminal of the connector. The connector includes at least one test point electrically connected to the terminal and configured to make contact with a test probe. | 02-26-2015 |
| 20150084637 | ASSEMBLY AND METHOD FOR EVALUATING THE STATE OF AN ELECTRONIC UNIT USED FOR ILLUMINATION PURPOSES - An assembly for evaluating the state of an electronic unit used for illumination purposes which is designed to detect a plurality of physical parameters that represent the current state of the electronic unit, to compare the detected physical parameters according to possibly mathematical evaluation or analysis alone or in combination with predefined reference values or reference spaces (I, II), and to create information describing the state of the electronic unit to be evaluated on the basis of the comparisons. | 03-26-2015 |
| 20150102814 | Lighting Maintenance, Testing and Repair Kit and Method of Use Thereof - The present invention is directed, in part, to an apparatus and methods thereof that effectively allow the testing, detection and identification of non-functioning light bulbs used in typical string lighting assemblies set up in series. The invention creates a circuit that determines whether there is a damaged bulb in holiday or occasion lighting assemblies by employing use of a power source, such as for example, a 9-volt battery, two wire leads and two terminals that create an electrical circuit when the terminals are attached to the lighting assembly wiring by means of the terminals. When the test kit is attached and the bulbs fail to illuminate, a user is thereby informed that a bulb within that series is damaged or otherwise non-functional. By further narrowing the number of bulbs tested, the kit allows the user to identify the damaged bulb and replace the bulb quickly and easily. | 04-16-2015 |
| 20150108986 | CLOSED LOOP DYNAMIC CAPACITANCE MEASUREMENT - This disclosure provides systems, methods and apparatus for measuring capacitance of a display unit, such as an interferometric modulator (IMOD). In one example, a circuit may include an operational amplifier (op-amp), a voltage controlled current source, and feedback from an output of the op-amp as an input to the voltage controlled current source. An output of the voltage controlled current source may be provided to a display unit as well as an input of the op-amp. A second input of the op-amp may be provided a ramping reference voltage. | 04-23-2015 |
| 20150108987 | APPARATUS, METHOD AND SYSTEM FOR CHECKING REAR LAMP - An apparatus for checking a rear lamp includes a sensor and a controller. The sensor is disposed in at least one rear lamp and configured to obtain a first signal generated from the outside. The controller is configured to turn on the at least one rear lamp according to the first signal. | 04-23-2015 |
| 20150108988 | LIGHT-EMITTING DEVICE DIAGNOSTIC CIRCUIT - A diagnostic circuit for inspecting a light-emitting device having light-emitting elements. The diagnostic circuit includes a power source module, a buffer module, and an abnormality detection module. The buffer module includes a plurality of buffers. Each buffer has a buffer input terminal and a buffer output terminal. The buffer input terminal receives a first power source signal from the power source module, and the buffer output terminal outputs a second power source signal to one of the light-emitting elements. The abnormality detection module includes a plurality of comparators. Each comparator has a pair of detection input terminals and a detection output terminal. The detection input terminals is configured to receive the first and second power source signals. The detection output terminal outputs a comparison signal to generate a diagnostic result. | 04-23-2015 |
| 20150123667 | High Throughput Hot Testing Method And System For High-Brightness Light-Emitting Diodes - A method of performing a hot test of a packaged phosphor converted light-emitting diode (pc-LED) includes selectively heating portions of the phosphor layer using a laser to provide a predetermined temperature gradient in the phosphor layer. The selective heating can directly heat the silicone in a silicone-based phosphor layer, or directly heat the active ion(s) of the phosphor in a Lumiramic™-based phosphor or even the active ion(s) of a silicone-based phosphor layer. A current is applied to the InGaN film to establish a predetermined temperature at the InGaN film junction, the film junction being adjacent to the phosphor layer. Photometric measurements are performed on the LED after the selective heating and during the applied electroluminescent current. This method quickly establishes the temperatures and temperature gradients in the LED consistent with those of an operating, product-level LED, thereby ensuring accurate binning of the LED. | 05-07-2015 |
| 20150294608 | METHOD FOR DETECTING BRIGHT SPOT OF LIQUID CRYSTAL DISPLAY PANEL - Embodiments of the present invention disclose a method for detecting a bright spot of a liquid crystal display panel, which belongs to the field of display. The method can solve a technical problem of miss detecting by the bright spot detection method in the prior art which o can not detect a bright spot caused by the short circuit between a data line and a pixel electrode. The method for detecting a bright spot of a liquid crystal display panel comprises: scanning gate lines of the liquid crystal display panel, and simultaneously outputting low level signals by data lines of the liquid crystal display panel; and, stopping the scanning of the gate lines of the liquid crystal display panel, and simultaneously outputting high level signals by the data lines. The method may be used for detecting liquid crystal display panels of ADS type. | 10-15-2015 |
| 20150301128 | Method and apparatus for the diagnosis of a faulty light-emitting means - A method and a device for the diagnosis of faulty light emitting diodes in a string ( | 10-22-2015 |
| 20150317927 | TEST STRUCTURE OF DISPLAY PANEL AND TEST STRUCTURE OF TESTED DISPLAY PANEL - A test structure of a display panel is provided. The test structure is within a buffer display region which is between a display region and a non-display region of the display panel and includes a substrate, at least one signal line on the substrate, an insulation layer covering the signal line, a planar layer on the insulation layer, and an electrode layer on the planar layer. The planar layer has at least one opening exposing a portion of the insulation layer. The electrode layer has a display electrode portion on the planar layer, at least one test electrode portion connecting the insulation layer via the opening and electrically insulated from the signal line, and at least one ring-shaped trench surrounding the test electrode portion and exposing a portion of the planar layer. The display electrode portion surrounds the ring-shaped trench and is electrically insulated from the test electrode portion. | 11-05-2015 |
| 20150342003 | DETECTING A PRESENCE OF AN OPERATING DIMMER - Detection circuits ( | 11-26-2015 |
| 20150355289 | ELECTRONIC DEVICE - To provide an electronic device that can detect an abnormality in an element with a simple configuration. An electronic device | 12-10-2015 |
| 20150362545 | FLUORESCENT LAMP TESTING DEVICE - A fluorescent lamp testing device | 12-17-2015 |
| 20150382429 | LED Mains Voltage Measurement Using a Current Mirror - Measurement circuits which are configured to measure wide ranges of the input voltage using a sensed input voltage of the driver circuits for solid state lighting (SSL) devices are presented. The measurement circuit comprises a first resistor which is coupled at a first side to the input voltage. The measurement circuit comprises current mirror circuitry coupled at an input to a second side of the first resistor, and which translates an input current at the input of the current mirror circuitry into an output current at an output of the current mirror circuitry, such that the output current is proportional to the input current by a current mirror ratio. The measurement circuit comprises a second resistor coupled to the output of the current mirror circuitry and to provide the sensed input voltage, when the input voltage is coupled to the first side of the first resistor. | 12-31-2015 |
| 20160001575 | IMAGE FORMING APPARATUS FOR DETERMINING DEFECTS OF LIGHT-EMITTING ELEMENT ARRAY CHIPS - An image forming apparatus includes a plurality of light-emitting element array chips including a light-emitting element array and a transfer element array, and a control driver applying a signal to the plurality of light-emitting element array chips. The control driver includes a check terminal that measures signals output from the plurality of light-emitting element array chips, and the control driver determines whether any of the plurality of light-emitting element array chips are defective by analyzing the signals measured at the check terminal. | 01-07-2016 |
| 20160057842 | DEVICE HAVING A PLURALITY OF DRIVER CIRCUITS TO PROVIDE A CURRENT TO A PLURALITY OF LOADS AND METHOD OF MANUFACTURING THE SAME - In various embodiments, a device is provided. The device includes a substrate having a first side and a second side opposite the first side. The substrate includes a plurality of driver circuits at the first side of the substrate. Each of the plurality of driver circuits is configured to drive a current from the first side of the substrate to the second side of the substrate. The device further includes at least one load interface at the second side of the substrate. The at least one load interface is configured to couple the current from the plurality of the driver circuits to a plurality of loads at the second side of the substrate. | 02-25-2016 |
| 20160081148 | LED DRIVER WITH COMPREHENSIVE FAULT PROTECTIONS - The embodiments disclosed herein describe a set of fault detection circuits for LED circuits in an LED channel. A first fault detection circuit is configured to detect a short fault across one or more LEDs. A second fault detection circuit is configured to detect an open fault across an LED. A third fault detection circuit is configured to detect a short across an LED channel transistor. A fourth fault detection circuit is configured to detect an LED channel sense resistor open fault. A fifth fault detection circuit is configured to detect if the LED channel is being intentionally unused. These fault detect circuits can be implemented in a fault detection integrated circuit coupled to the LED channel. | 03-17-2016 |
| 20160097822 | SINGLE LED FAILURE DETECTION IN A LED CHAIN - Methods and circuits are described in which an SLS driver circuit includes an SLS driver current source that may be arranged to provide an SLS current to a series SLS chain at a series SLS node. The series SLS chain may include a plurality of SLSs connected in series. The SLS driver circuit also includes a diagnostic current source that is arranged to provide a diagnostic current to a diagnostic resistor at a diagnostic resistor node. The series SLS chain also includes a comparison circuit that may be arranged to compare a series SLS voltage at the series SLS node with a diagnostic voltage at the diagnostic resistor node, and to output a status signal based on a result of the comparison such that the status signal is based, at least in part, on whether a failure condition exists in the series SLS chain. | 04-07-2016 |
| 20160104403 | METHOD FOR VERIFYING THE OPERATION OF A BILLBOARD HAVING LIGHT-EMITTING DIODES - Process for verifying the operation of a display panel ( | 04-14-2016 |
| 20160109507 | METHOD FOR PREDICTING FAILURE OF A LIGHT-EMITTING DIODE - A method for predicting failure of a light-emitting diode, includes applying a test potential difference across the terminals of the light-emitting diode lower than its minimum drive potential difference, the test potential difference having the same sign as the minimum drive potential difference; measuring the current I | 04-21-2016 |
| 20170234937 | TEST APPARATUS FOR LIGHT EMITTING DEVICES | 08-17-2017 |
| 20180024185 | Method and Device for Inspecting an Optoelectronic Component | 01-25-2018 |
