Class / Patent application number | Description | Number of patent applications / Date published |
250341300 | Including polarizing means | 10 |
20100219343 | METHODS AND APPARATUS FOR DETERMINING FIBRE ORIENTATION - Fibre distribution characteristics such as the bulk average orientation of fibres in composite fibrous materials can be evaluated based on the variation in the speed with which polarized electromagnetic signals propagate through the material as a function of angle. The electromagnetic radiation may comprise terahertz radiation. The composite fibrous materials may be wood-containing materials such as oriented strand board or particle board. | 09-02-2010 |
20120097851 | Method and Device for Measuring the Thickness of a Fountain Solution Layer or Ink Emulsion Layer in Offset Printing - A method and a device for measuring the thickness of a fountain solution layer or ink emulsion layer on the surface of a cylinder bearing the print image of an offset printing machine is proposed, in which the absorption of reflected near infrared radiation is measured by the dampening water that is applied during print production. Interferences due to optical reflection are eliminated by means of a gloss trap. A position-controlled regulation of the dampening water allocation is reliably maintained by means of machine synchronization of the measuring unit and receiving unit. | 04-26-2012 |
20120153159 | Method of Measuring Characteristics of Specimen and Flat-Plate Periodic Structure - A measuring method that includes holding a specimen to be measured on a flat-plate periodic structure, applying a linearly-polarized electromagnetic wave to the flat-plate periodic structure, detecting the electromagnetic wave scattered forward or backward by the flat-plate periodic structure, and measuring characteristics of the specimen on the basis of a phenomenon that a dip waveform appearing in a frequency characteristic of the forward-scattered electromagnetic wave or a peak waveform appearing in a frequency characteristic of the backward-scattered electromagnetic wave is changed with the presence of the specimen. The flat-plate periodic structure is a flat-plate structure in which at least two voids penetrating through the structure in a direction perpendicular to a principal surface thereof are periodically arrayed in at least one direction on the principal surface, and the electromagnetic wave is applied to the principal surface of the flat-plate periodic structure from the direction perpendicular to the principal surface. | 06-21-2012 |
20120248314 | SYSTEMS AND METHODS FOR DETECTING AND/OR IDENTIFYING MATERIALS BASED ON ELECTROMAGNETIC RADIATION - One embodiment of the invention includes a material detection and/or identification system. The system includes an electromagnetic (EM) sensor system configured to collect EM radiation from a region of interest. The collected EM radiation could comprise orthogonally-polarized EM radiation. The system also includes a processing unit configured to detect and identify a material of interest in the region of interest. As an example, the processing unit could measure reflectivity data associated with a material of interest based on the collected EM radiation and calculate a refractive index of a material of interest based on the measured reflectivity data, such that the material of interest is identified based on the refractive index. The processing unit can also be configured to calculate a surface roughness associated with the material, such that the refractive index can be calculated based on the surface roughness associated with the material. | 10-04-2012 |
20130026368 | Terahertz ellipsometer system, and method of use - A terahertz ellipsometer, the basic preferred embodiment being a sequential system having a backward wave oscillator (BWO); a first rotatable polarizer that includes a wire grid (WGP | 01-31-2013 |
20150041657 | MULTIPLE BEAM TRANSMISSION INTERFEROMETRIC TESTING METHODS FOR THE DEVELOPMENT AND EVALUATION OF SUBWAVELENGTH SIZED FEATURES WITHIN SEMICONDUCTOR AND ANISOTROPIC DEVICES - Improved methods and systems for inspection imaging for holographic or interferometric semiconductor test and evaluation through all phases of device development and manufacture. Specifically, systems and methods are disclosed for extending the range of optical holographic interferometric inspection for testing and evaluating microelectronic devices and determining the interplay of electromagnetic signals and dynamic stresses to the semiconductor material are provided in which an enhanced imaging method provides continuous and varying the magnification of the optical holographic interferometric images over a plurality of interleaved optical pathways and imaging devices. Analysis of one or more holographic interference patterns displays internal and external stresses and the various effects of such stresses upon the operating characteristics of features within the features, interior structures or within the internal surfaces of the semiconductor device at any stage of development or manufacture. | 02-12-2015 |
20150069247 | METHOD AND SYSTEM FOR REAL TIME INSPECTION OF A SILICON WAFER - There is provided a method and system for real time inspection of a silicon wafer. The method includes using an infrared plane polariscope to obtain an image of a bonded interface of the silicon wafer, the image showing stress patterns; and assessment of the stress patterns. The stress patterns in a form of at least one butterfly pattern indicates a presence of at least one of: at least one trapped particle, trapped gases and at least one de-bonding region. No computer/algorithm processing is carried out to locate defects/de-bondings at the bonded interface. Furthermore, the stress fields being generated can be used to approximate the size of the de-bonding region/trapped particle. The system employs the infrared plane polariscope to obtain an image of a bonded interface of the silicon wafer. | 03-12-2015 |
20160146666 | ELECTRIC FIELD VECTOR DETECTION METHOD AND ELECTRIC FIELD VECTOR DETECTION DEVICE - In this electric field vector detection method, an electro-optic crystal, where a (111) surface of an optical isotropic medium is cut out, is used as a terahertz wave detection element. The method includes: causing polarization of probe light of ultrashort pulsed light to be circular polarization; allowing the probe light having circular polarization to enter the terahertz wave detection element and probing the terahertz wave; modulating the probe light, having probed the terahertz wave, by a rotating analyzer and detecting the modulated probe light by a photodetector; performing lock-in detection of a detection signal from the photodetector by a lock-in detector using a frequency based on a rotational frequency of the rotating analyzer as a reference signal; and detecting an electric field vector of the terahertz wave based on a detection signal from the lock-in detector. | 05-26-2016 |
20160169748 | METHOD AND APPARATUS FOR OPTICAL AND TERAHERTZ ASYNCHRONOUS SAMPLING SIGNAL MEASUREMENT | 06-16-2016 |
20170234791 | SIMPLE SUGAR CONCENTRATION SENSOR AND METHOD | 08-17-2017 |