Class / Patent application number | Description | Number of patent applications / Date published |
250339110 | Measuring infrared radiation reflected from sample | 27 |
20080230700 | METHOD AND DEVICE FOR THE QUANTITATIVE ANALYSIS OF SOLUTIONS AND DISPERSIONS BY MEANS OF NEAR INFRARED SPECTROSCOPY - The present invention relates to a method for quantifying the composition of a product, including: irradiating the product with a radiation source in the near infrared range; receiving radiation which is reflected by or transmitted through the product; providing an output signal corresponding to the intensity of the radiation received at a number of different wavelengths; and determining whether or not the product lies within predetermined integrity criteria on the basis of the output signal using a mathematical method. The moving product contains a solution or homogeneous dispersion and the content of at least one substance contained in the dispersion or solution is quantitatively determined on the basis of the output signal. The invention also relates to a device for carrying out this method. | 09-25-2008 |
20080283756 | Development of Disposable Tips for Spectroscopic Probes - The present invention relates to a sealable cell for obtaining a reflectance spectrum of a liquid sample using a spectroscopic probe having a removable cap characterised in that the internal wall of the cap comprises at least one groove that allows air to escape from between the head of the probe and a liquid sample held within the cap so that accurate spectra can be obtained. | 11-20-2008 |
20090065697 | Sub-millimeter wave frequency heterodyne detector system - The present invention relates to sub-millimeter wave frequency heterodyne imaging systems. More specifically, the present invention relates to a sub-millimeter wave frequency heterodyne detector system for imaging the magnitude and phase of transmitted power through or reflected power off of mechanically scanned samples at sub-millimeter wave frequencies. | 03-12-2009 |
20090078873 | Image acquisition apparatus, conversion apparatus and image acquisition method - An image acquisition apparatus acquires an image indicating an intensity distribution of infrared light. The image acquisition apparatus includes a conductive thin film, a dielectric layer placed on the thin film, a base to support the thin film and the dielectric layer in this order on a principal surface, a light source to emit light to an interface between the thin film and the base, and an image pickup device to receive light reflected on the interface between the thin film and the base. | 03-26-2009 |
20090184247 | METHOD OF INSPECTING FOOD AND INSPECTION APPARATUS IMPLEMENTING THE SAME - A method of inspecting food which can evaluate quality of the food with improved precision includes steps of irradiating probing light having near infrared wavelengths on the food; detecting light diffusively reflected by the food to obtain a reflectance spectrum; obtaining an absorbance spectrum based on the reflectance spectrum; and evaluating the food using the reflectance spectrum and the absorbance spectrum. An apparatus for implementing the method includes: a light source unit to generate probing light which has near infrared wavelengths and illuminates the food; a detector unit to detect light diffusively reflected by the food to obtain a reflectance spectrum of the food; and a processing unit to evaluate the food based on the reflectance spectrum and an absorbance spectrum calculated from the reflectance spectrum. | 07-23-2009 |
20090321648 | Sample Preparation and Methods for Portable IR Spectroscopy Measurements of UV and Thermal Effect - A method of non-destructively determining the physical property of a material surface, the method including irradiating a surface with infrared energy over a spectrum of wavelengths; detecting said infrared energy reflected from said surface over said spectrum of wavelengths; performing multivariate calibration of said reflected infrared energy at a plurality of selected wavelengths including said spectrum of wavelengths; using results of said multivariate calibration to predict one or more physical properties of said model material; and, determining said one or more physical properties of said surface. Details are included for the case where uni-directional fiber CFRP materials are to be calibrated and predicted because special care must be taken for that material to insure the incident light from the spectrometer is at the proper orientation for calibration and for prediction of samples in question. | 12-31-2009 |
20100084558 | SYSTEMS AND METHODS FOR DETERMINING A CONCENTRATION OF UREA IN AN AQUEOUS SOLUTION - System and methods for determining a concentration of urea in an aqueous solution disposed in a container are provided. The system includes an infrared light source and an infrared light detector. The system further includes a window disposed proximate to an aperture of the container, such that the infrared light at a first light intensity level from the infrared light source passes through a first portion of the window toward the aqueous solution. A portion of the infrared light is absorbed by the aqueous solution, and a second portion of the infrared light is reflected from the aqueous solution and through a second portion of the window. The infrared light detector system generates a first signal indicative of a second light intensity level based on the second portion of infrared light. The system further includes a microprocessor that determines the second light intensity level based on the first signal, and further determines a urea concentration based on the first and second light intensity levels. | 04-08-2010 |
20110248168 | 3D Scanner - The present invention relates to a 3D scanner ( | 10-13-2011 |
20120228507 | TERAHERTZ SCANNING REFLECTOMETER - A terahertz scanning reflectometer is described herein. A high sensitivity terahertz scanning reflectometer is used to measure dynamic surface deformation and delamination characteristics in real-time. A number of crucial parameters can be extracted from the reflectance measurements such as dynamic deformation, propagation velocity, and final relaxation position. A terahertz reflectometer and spectrometer are used to determine the permeation kinetics and concentration profile of active ingredients in stratum corneum. | 09-13-2012 |
20120241621 | Standoff explosives detection - The present invention may include methods and apparatus for the detection of explosives using near infrared or infrared spectroscopy to detect nitro or even carbonyl groups. Embodiments may include, at least one radiation emitter may emit at least one wavelength towards a target. At least one reflected wavelength may be generated after the wavelength collides with the target. A reflected wavelength may then be detected by at least one detector and analyzed with an analyzer. | 09-27-2012 |
20120318982 | METHOD FOR DETERMINING POLYCYCLIC AROMATIC HYDROCARBON CONTAMINANT CONCENTRATION - The invention refers to the use of a device for determining PAH concentration in a solid state sample, which device comprises a) means for exposing the sample to diffuse reflectance infrared spectroscopy, b) detecting means for recording at least one spectroscopic parameter of infrared diffuse reflection of said sample, which is a signal obtained at one or more frequencies within a range of frequencies (+/−10 cm | 12-20-2012 |
20120318983 | TERAHERTZ-WAVE GENERATING ELEMENT, TERAHERTZ-WAVE DETECTING ELEMENT, AND TERAHERTZ TIME-DOMAIN SPECTROSCOPY DEVICE - A terahertz-wave generating element includes a waveguide including an electro-optic crystal; an optical coupling member that extracts a terahertz wave, which is generated from the electro-optic crystal as a result of light propagating through the waveguide, to a space; and at least two electrodes that cause a first-order electro-optic effect in the electro-optic crystal by applying an electric field to the waveguide so as to change a propagation state of the light propagating through the waveguide. A crystal axis of the electro-optic crystal of the waveguide is set such that the terahertz wave generated by a second-order nonlinear optical process and the light propagating through the waveguide are phase-matched. | 12-20-2012 |
20130187050 | DRUG EVALUATION METHOD AND DRUG EVALUATION DEVICE - The drug evaluation device obtains, by an attenuated reflection method using a terahertz wave, an evaluation absorption spectrum for a frequency with respect to a liquid to be evaluated. When crystalline particles are suspended in a liquid, an absorption peak having a peak area corresponding to the amount of suspension appears in its absorption spectrum. Therefore, whether or not and by what ratio crystalline particles are suspended in the liquid can be determined according to whether or not the absorption peak exists and the peak area. When amorphous particles are suspended in the liquid, the baseline of its absorption spectrum lowers according to the ratio of amorphous particles suspended in the liquid. Therefore, whether or not and by what ratio amorphous particles are suspended in the liquid can be determined according to the lowering amount of the baseline. | 07-25-2013 |
20130206992 | DEVICE AND METHOD FOR MEASURING VIA HOLE OF SILICON WAFER - The present invention pertains to a device and a method for measuring a via hole of a silicon wafer, wherein it is possible to precisely measure the depth of the via hole without damaging the wafer. Broadband infrared light is radiated to a silicon wafer which has a superior light transmission property, so that the depth of the via hole may be measured from the light which is reflected from each boundary surface of the wafer and the interference signal of reference light. The via hole measuring device according to the present invention includes: a light source unit for generating broadband infrared light; and an interferometer for radiating the light generated from the light source unit to a silicon wafer, so as to measure the depth of a via hole formed on the wafer according to the spectrum period of the interference signal of the light, which is reflected from the silicon wafer. | 08-15-2013 |
20130240734 | APPARATUS AND METHOD FOR PERFORMING SURFACE PLASMON RESONANCE (SPR) SPECTROSCOPY WITH AN INFRARED (IR) SPECTROMETER - Methods of measuring a sample characteristic and accessories for infrared (IR) spectrometers are provided. An accessory includes an input port and an output port having an optical path therebetween, a surface plasmon resonance (SPR) structure for contacting a sample, a mirror system, and an optical element for producing collimated light. The SPR structure produces internally reflected light responsive to broadband IR light, modified by a SPR between the SPR structure and the sample. The mirror system directs the broadband IR light from the input port to the SPR structure and directs the internally reflected light from the SPR structure to the output port, producing output light indicative of a characteristic of the sample associated with the SPR. The optical element is disposed along the optical path between the input port and the output port. | 09-19-2013 |
20130292571 | OPTICALLY MULTIPLEXED MID-INFRARED LASER SYSTEMS AND USES THEREOF - Optically multiplexed mid-infrared laser systems and the use of such systems for detection and measurement of target materials using multispectral image analysis are disclosed. The systems and methods disclosed herein are useful for detecting and measuring materials in applications such as trace detection, medical diagnostics, medical monitoring, quality control, and high-throughput molecular recognition. | 11-07-2013 |
20140008541 | TOTAL REFLECTION SPECTROSCOPIC MEASUREMENT METHOD - A total reflection measurement method using a total reflection spectrometer | 01-09-2014 |
20140197316 | MEASUREMENT AND CONTROL OF BITUMEN-CONTAINING PROCESS STREAMS - A method and apparatus for analyzing a bitumen-containing process stream and controlling a process. The method including directing a beam of infrared light at the bitumen-containing process stream, capturing light corresponding to the infrared light after interaction with the bitumen-containing process stream, and analyzing the captured light to obtain a spectrum. A composition estimate can be generated based on the spectrum and a calibrated model. A controller is operative to adjust a setpoint of the process in response to the composition estimate. | 07-17-2014 |
20140203177 | RESIN TYPE IDENTIFICATION METHOD AND RESIN TYPE IDENTIFICATION APPARATUS - To obtain a resin type identification method and a resin type identification apparatus with which an optimum infrared reflection spectrum for identifying a resin piece can be selected and accurate identification processing can be performed successively on individual resin pieces even when the resin pieces are identified using a single optical detector, at least one identifying signal power is selected by executing signal processing on the basis of signal powers corresponding to infrared reflection intensities obtained by emitting infrared light onto the resin piece, and the resin type of the resin piece is identified on the basis of an infrared reflection spectrum corresponding to the selected identifying signal power. | 07-24-2014 |
20140231649 | CONCEALED DANGEROUS ARTICLES DETECTION METHOD AND DEVICE - A method and an apparatus for detecting hidden hazardous substance including the steps of: performing terahertz imaging for a detected object; judging whether there is a suspicious area containing the hidden hazardous substance in a terahertz image of the detected object obtained by the terahertz imaging; performing a multi-wavelength spectroscopy measurement to the suspicious area, determining whether the hazardous substance is contained in the suspicious area according to results of multi-wavelength spectroscopy measurement; and outputting the image of the detected object and hazardous substance detecting result. Also disclosed is an apparatus for implementing the method for detecting the hidden hazardous substance according to the present invention. Determination of the hidden hazardous substance can be performed from the perspectives of shape features and substance composition, thus the accuracy of detection is greatly increased. | 08-21-2014 |
20140291522 | ESTIMATION APPARATUS, ESTIMATION METHOD, INTEGRATED CIRCUIT, AND RECORDING MEDIUM - An estimation apparatus using reflected light of infrared light reflected on an object, the estimation apparatus including: a single input unit including a first pixel having first spectral sensitivity characteristics in a wavelength range of the infrared light and a second pixel having second spectral sensitivity characteristics different from the first spectral sensitivity characteristics in the wavelength range of the infrared light; and an estimator that estimates at least either one of a color or a material of the object based on a first output value that is an output value of the reflected light from the first pixel and based on a second output value that is an output value of the reflected light from the second pixel. | 10-02-2014 |
20140306114 | METHOD FOR NONDESTRUCTIVE TESTING OF OPTICAL DISCONTINUITIES IN MONOLITHIC TRANSPARENT POLYCRYSTALLINE CERAMIC ARTICLES - A method of non-destructive detection of solid inclusions with varying sensitivities but highly congruent positional identification by both short-wavelength and long-wavelength methods. The short-wavelength method consists of lateral scatter (LS) and the long-wavelength method consists of THz imaging. The LS method was able to detect all agglomerated inclusions, transparency variations, voids, and localized phase differences. The THz imaging was able to routinely detect solid inclusions and index inhomogeneity. In combination, the LS and THz imaging methods were able to detect all relevant types of material variation, so that the combination of the two non-destructive testing methods provides a synergistic solution capable of detecting the full array of critical material variations in transparent polycrystalline ceramic materials. | 10-16-2014 |
20140346358 | QUANTUM CASCADE LASER SUITABLE FOR PORTABLE APPLICATIONS - A highly portable, high-powered infrared laser source is produced by intermittent operation of a quantum cascade laser power regulated to a predetermined operating range that permits passive cooling. The regulation process may boost battery voltage allowing the use of a more compact, low-voltage batteries. | 11-27-2014 |
20150090881 | METHODS, SAMPLING DEVICE AND APPARATUS FOR TERAHERTZ IMAGING AND SPECTROSCOPY OF COATED BEADS, PARTICLES AND/OR MICROPARTICLES - A holder and apparatus for terahertz imaging and/or spectroscopy of beads, particles or microparticles, and methods for terahertz imaging and/or spectroscopy of beads, particles or microparticles and making the holder are disclosed. The holder includes a tray having a substantially planar upper surface, and one or more offsets above or below the substantially planar upper surface. Each offset is configured to hold one of the beads, particles or microparticles, and has a height or depth configured to minimize or eliminate interference between reflections of the terahertz radiation from the tray and reflections of the terahertz radiation from the bead, particle or microparticle in or on the offset. | 04-02-2015 |
20150311401 | THERMO-ELECTRICALLY PUMPED LIGHT-EMITTING DIODES - Contrary to conventional wisdom, which holds that light-emitting diodes (LEDs) should be cooled to increase efficiency, the LEDs disclosed herein are heated to increase efficiency. Heating an LED operating at low forward bias voltage (e.g., V10-29-2015 | |
20160069673 | FILM THICKNESS MEASURING DEVICE AND FILM THICKNESS MEASURING METHOD - A film thickness measuring device including: a terahertz wave generator; a prism that has an entrance surface, an abutment surface capable of abutting a surface of a sample including a first film on a side where the first film is formed, and an emission surface; a terahertz wave detector that detects an S-polarization component and a P-polarization component of a reflected wave from the sample, emitted from the emission surface of the prism; and a control section configured to determine a thickness of the first film formed in the sample, based on a difference between a time waveform of the S-polarization component of the reflected wave and a time waveform of the P-polarization component of the reflected wave. | 03-10-2016 |
20160139047 | IMAGING BY ATTENUATED TOTAL REFLECTANCE (ATR) - An arrangement for attenuated total reflectance (ATR) infrared spectroscopy uses a reflection matrix for location-resolved spectroscopy of aqueous and/or powdery samples with a high signal-to-noise ratio and without previous complex preparation of the samples. The method of using the reflection matrix produces imaging of the sample with a high signal strength. | 05-19-2016 |