| Entries |
| Document | Title | Date |
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| 20090008559 | Apparatus for Analyzing Cells in Real-time - The present invention relates to an apparatus for analyzing cells in real-time which incorporates a wavelength-tunable light source/infrared ray (IR) sensor and can be used to observe and analyze the IR-related characteristics of adherent cells or non-adherent cells. The Apparatus for analyzing cells in real-time in accordance with the present invention can be used to quantify specific materials in a cell and measure the metabolism of a cell. In addition, the apparatus for analyzing cells in real-time in accordance with the present invention can be configured to have a visible light microscope coupled thereto, and in this configuration, it can be used to locate a cell of interest. | 01-08-2009 |
| 20090065696 | DETECTION METHOD AND APPARATUS - In a terahertz radiation detection system, an array of harmonic transmitters/receivers can be scanned across a field of view. By using an unbalanced pair of Schottky diodes in the mixer of a heterodyne receiver, the receiver can be converted to a transmitter, generating terahertz radiation at even harmonics of the local oscillator. By using local oscillators of different frequencies in the transmitter and a receiver, the receiver can detect the generated radiation. In alternative arrangements, the local oscillator of the transmitter might have the same frequency as that of the receiver but be modulated, either directly or simply as a result of the transmitter being scanned across the field of view. If modulated directly, it might be amplitude or frequency modulation, these having different advantages. A receiver can be switched between acting as a transmitter and as a receiver by turning on and off an electrical bias to the Schottky diode pair. Embodiments of the invention have the further advantages of high signal to noise ratio in the output and the use of narrow bandwidth processing of the IF output. | 03-12-2009 |
| 20090072146 | Correlated ghost imager - A method and system for detecting concealed weapons and explosives by imaging THz scenes using conventional optics and detectors is provided. Photon fields with two different wavelengths can be sent through a chopper and towards a wavelength-selective mirror. A light beam with a wavelength in the visible or IR range is sent toward a visible photon array detector. Similarly, light beams with wavelengths in the THz range can be sent towards a target, which are reflected and/or absorbed by objects in the target. The reflected or transmitted light continues on through an optional filter to remove background light, then into a non-imaging detector. The visible photon array detector can be coupled with the non-imaging detector, which will register an image of the scene that is illuminated by the THz photons. | 03-19-2009 |
| 20090108204 | BIOLOGICAL INFORMATION MEASURING APPARATUS - A light emission section spread-spectrum modulates a base band signal at a chip frequency f to thereby generate a primary modulated signal, modulates the primary modulated signal at a frequency | 04-30-2009 |
| 20090146060 | ORBITRON BASED STAND-OFF EXPLOSIVES DETECTION - A microwave or terahertz and neutron radiation type detector, which uses an orbitron as a radiation source. The detector may have a polarity switching apparatus to enable the orbitron to selectively change from between short wave to neutron emission functions. A highly compact and lightweight identifier of explosives and other chemicals, which may be so small and light as to be hand held, and which is effective at stand-off distances, is thereby provided. | 06-11-2009 |
| 20090152468 | DETECTION APPARATUS AND METHOD - A technique and apparatus for detection of infrared radiation emitted from a taggant material sample following the excitation of the sample are described. The decay time of the radiation is a function of the particular taggant being used and so, if the decay characteristic or signature is accurately measured, the particular taggant can be accurately identified. The apparatus comprises an electronic controller ( | 06-18-2009 |
| 20090189078 | INSPECTION APPARATUS AND INSPECTION METHOD BY USING TERAHERTZ WAVE - An inspection apparatus includes a terahertz wave detection portion, a waveform shaping portion configured to shape a first answer signal with respect to a terahertz wave by using a signal acquired in the above-described terahertz wave detection portion, a measurement condition acquisition portion configured to acquire a first measurement condition, an answer signal storage portion configured to store second answer signals corresponding to measurement conditions, a selection portion configured to select the above-described second answer signal from the above-described answer signal storage portion, and a signal processing portion configured to conduct deconvolution with respect to the above-described first answer signal on the basis of the above-described second answer signal. | 07-30-2009 |
| 20100078562 | HIDDEN SENSORS IN AN ELECTRONIC DEVICE - An electronic device having one or more sensors is provided. The sensors may include any suitable type of sensor, including for example a proximity sensor, an ambient light sensor, or any other suitable type of sensor that emits or receives radiation (e.g., light waves) from the environment. The electronic device may include openings through which radiation may reach the sensors while keeping the sensors hidden from view. In some embodiments, the sensors may be placed underneath an opening used for an audio receiver such that radiation is piped to the sensors using a light path or a chamfered surface along the opening. In some embodiments, the sensors may be embedded in a screen such that the radiation emitted by the sensors exits the screen instead of being reflected on the screen (e.g., to provide content displays). In some embodiments, the sensors may be placed along the periphery of the display, such that access to the sensors is provided via discontinuities in a gasket used to couple the display to the electronic device. | 04-01-2010 |
| 20100078563 | SIMPLIFIED BEAM SPLITTER FOR IR GAS SENSOR - A non-dispersive single beam detection assembly in an infrared gas analyzer. The detection assembly comprises radiation source(s) providing infrared radiation, a measuring chamber, and a physical beam splitter for dividing said radiation beam into a reflected beam portion and a transmitted beam portion, or for combining a reflected beam portion and a transmitted beam portion into said radiation beam. A measuring detector receives one beam portions, and a reference detector receives another beam portion. Alternatively a measuring/reference detector receives both beam portions. Said transmitted beam portion has a first spectral intensity peak at shorter wavelengths with a first peak wavelength, and said reflected beam portion has a second spectral intensity peak at longer wavelengths with a second peak wavelength. There is a wavelength gap between said second peak wavelength and said first peak wavelength, which gap corresponds a wavelength shift of an optical interference filter with said second peak wavelength as tilted from its perpendicular position to an angled position. Said wavelength gap is at maximum 10% of the second peak wavelength, and at minimum 0.5% of the second peak wavelength. | 04-01-2010 |
| 20100116990 | METROLOGY FOR GST FILM THICKNESS AND PHASE - Methods of determining thickness and phase of a GST layer on a semiconductor substrate are described using intensity spectra within the infra-red range. In particular, techniques for using certain transmission at certain frequencies are disclosed for faster thickness and phase determination in an in-line or standalone metrology/monitoring system for CMP processes. | 05-13-2010 |
| 20100133436 | Infrared Power Control Supporting Multi-Use Functionality - Systems and methods for infrared power control supporting multi-use functionality are presented. In one example, the transmit power level of an infrared (IR) light source on a headset having multiple functional states is controlled based on the headset function state. Infrared power control is used to determine proximity between an infrared source device and an infrared receiver device. | 06-03-2010 |
| 20100288928 | APPARATUS AND METHOD FOR MEASURING TERAHERTZ WAVE - An apparatus for measuring a terahertz wave includes a dispersing section | 11-18-2010 |
| 20110139988 | Method And System For Evaluating The Distribution Of An Absorbent Material In An Absorbent Article - A system for imaging a distribution of an absorbent material within an absorbent article. The system includes a radiation source and a detector positioned such that the absorbent article is situated between the radiation source and the detector. The absorbent article includes an absorbent material having a spatial distribution within the absorbent article. Infrared radiation within a particular wavelength range (e.g., 3 μm to 3.2 μm) is more likely to be absorbed by the absorbent material than by other materials within the absorbent article. The radiation source is configured to generate infrared radiation incident on the absorbent article. The detector is configured to detect a quantity of the infrared radiation within the particular wavelength range that was transmitted through the absorbent article. The radiation source is further configured to generate data indicative of the spatial distribution of the absorbent material based on the detected quantity of the infrared radiation. | 06-16-2011 |
| 20110192978 | TERAHERTZ WAVE APPARATUS - Provided is a terahertz wave apparatus. The terahertz wave apparatus includes: a wavelength-fixed laser emitting a first laser light having a fixed first wavelength; a wavelength-swept laser emitting a second laser light having a tunable second wavelength; a coupler coupling the first laser light with the second laser light; and a generator converting a mixed light emitted from the coupler into a terahertz wave, wherein a frequency of the terahertz wave is continuously tunable. | 08-11-2011 |
| 20110278458 | Compact Handheld Non-Laser Detector For Greenhouse Gasses - Techniques are disclosed relating to gas leak detection. The techniques can be deployed, for example, in compact, handheld portable devices usable for detecting leaks in space-confined applications. The devices generally include a non-laser light source and thermal imaging camera that allow for detection of a target gas (or gasses) that absorbs at least some of the light source's wavelengths of operation. The light source can be implemented, for example, with an incoherent infrared (IR) light source, such as a resonance lamp configured with a gas cell containing a volume of a gas that, when excited by electric discharge, emits a wavelength that is absorbed by the target gas. | 11-17-2011 |
| 20110309248 | Optical Remote Sensing of Fugitive Releases - Disclosed is an open-path optical sensor. Typically, the optical sensor directs UV radiation from a source assembly to a detector assembly along a monitoring path. The source assembly emits UV radiation corresponding to a signal channel and to a reference channel. The detector assembly detects UV radiation corresponding to the signal channel and to the reference channel. The detector assembly is in communication with a data acquisition system, which compares the intensity of the detected UV radiation corresponding to the signal channel to the intensity of the UV radiation corresponding to the reference channel. | 12-22-2011 |
| 20120112071 | Detection Apparatus and Method - Apparatus for detection of infrared radiation emitted from a taggant following excitation of the taggant sample measures the decay time of the radiation used. If the decay characteristic is accurately measured, the particular taggant can be accurately identified. The apparatus comprises an electronic controller, light-emitting diodes, a photo-detector, a first amplifier, a three-way sampling switch, filter/stores, second amplifiers and an output display. The infrared emission is excited by repeatedly illuminating the taggant for a period of microseconds every few milliseconds. When the light source is turned off, the sample continues radiating for a few milliseconds. The emission is detected by photo-detector sensitive to the 800 to 1000 nm waveband thereby rejecting interference from visible light sources. | 05-10-2012 |
| 20120273681 | TERAHERTZ SPECTROMETER - A solution for analyzing characteristics of compounds and materials (e.g., chemical composition, specific quantity, thickness, etc.) via THz time domain spectrometry is disclosed. In one embodiment, a spectrometry system includes: a portable housing including: a portable power source; a laser source connected to the portable power source; a terahertz (THz) emitter located within the portable housing and optically connected to the laser source via an optical array including a rotary delay stage, the THz emitter configured to emit THz radiation directed to interact with a material sample; a detector optically connected to the optical array and configured to obtain waveform data from the interaction between the THz radiation and the material sample; and a computing device communicatively connected to the detector and configured to process the waveform data to determine a characteristic of the material sample. | 11-01-2012 |
| 20130228688 | Fast Switching Arbitrary Frequency Light Source for Broadband Spectroscopic Applications - A fast switching arbitrary frequency light source for broadband spectroscopic applications. The light source may operate near 1.6 um based on sideband tuning using an electro-optic modulator driven by an arbitrary waveform generator. A Fabry-Perot filter cavity selects a single sideband of the light source. The finesse (FSR/Δν | 09-05-2013 |
| 20130327943 | EGR DISTRIBUTION AND FLUCTUATION PROBE BASED ON CO2 MEASUREMENTS - A diagnostic system having a single-port EGR probe and a method for using the same. The system includes a light source, an EGR probe, a detector and a processor. The light source may provide a combined light beam composed of light from a mid-infrared signal source and a mid-infrared reference source. The signal source may be centered at 4.2 μm and the reference source may be centered at 3.8 μm. The EGR probe may be a single-port probe with internal optics and a sampling chamber with two flow cells arranged along the light path in series. The optics may include a lens for focusing the light beam and a mirror for reflecting the light beam received from a pitch optical cable to a catch optical cable. The signal and reference sources are modulated at different frequencies, thereby allowing them to be separated and the signal normalized by the processor. | 12-12-2013 |
| 20140001364 | BROADBAND OR MID-INFRARED FIBER LIGHT SOURCES | 01-02-2014 |
| 20140054463 | INSPECTION DEVICE, BONDING SYSTEM AND INSPECTION METHOD - According to an embodiment of the present disclosure, an apparatus of inspecting an overlapped substrate obtained by bonding substrates together is provided. The apparatus includes a first holding unit configured to hold and rotate the overlapped substrate, and a displacement gauge configured to measure displacements of peripheral sides of a first substrate and a second substrate constituting the overlapped substrate while rotating the overlapped substrate held by the first holding unit. | 02-27-2014 |
| 20140061475 | APPARATUS AND METHOD FOR CONTACTLESS THICKNESS MEASUREMENT - A contactless thickness measuring apparatus is provided which includes an terahertz transmitter configured to receive the first optical path signal from the coupler and to generate a terahertz continuous wave using the first optical signal and an applied bias; an optical delay line configured to delay the second optical path signal output from the coupler; and an terahertz receiver configured to receive the terahertz continuous wave penetrating a sample and to detect an optical current using the terahertz continuous wave and the second optical path signal delayed. A thickness of the sample is a value corresponding to the optical current which phase value becomes a constant regardless of a plurality of measurement frequencies. | 03-06-2014 |
| 20140097344 | Terahertz Wave Measurement Device and Method - The base plate is transmissive to terahertz waves, and a sample is disposed at the base plate. In the conductive periodic structure, plural transmission portions that transmit terahertz waves are arrayed with a predetermined period. The conductive periodic structure is disposed apart from a position at which the sample is disposed. The waveguide includes a total reflection surface provided at a boundary face with the conductive periodic structure. The total reflection surface totally reflects incident terahertz waves, and the waveguide guides incident terahertz waves toward the total reflection surface. The magnitudes of one or more of a distance between the position at which the sample is disposed and the conductive periodic structure, a property of the base plate, and the predetermined period are set such that a dip showing a characteristic absorption is formed in a predetermined frequency region of a spectrum of terahertz waves. | 04-10-2014 |
| 20140166883 | ELECTROMAGNETIC WAVE MEASUREMENT DEVICE, MEASUREMENT METHOD, AND RECORDING MEDIUM - According to the present invention, an electromagnetic wave measurement device includes: an electromagnetic wave detector, a frequency component acquisition unit, and a thickness indication quantity deriving unit. An object to be measured is disposed on a substrate and includes at least two layers, and the electromagnetic wave detector detects a substrate-surface-reflected electromagnetic wave which has been made incident to the object, has been reflected by the substrate, and has passed through the object. The frequency component acquisition unit acquires an amplitude of a frequency component of the substrate-surface-reflected electromagnetic wave. The thickness indication quantity deriving unit derives a thickness indication quantity based on the amplitude of the frequency component of the substrate-surface-reflected electromagnetic wave and a relationship between the thickness indication quantity and the amplitude of the frequency component of the substrate-surface-reflected electromagnetic wave. | 06-19-2014 |
| 20140209802 | APPARATUS FOR ACQUIRING INFORMATION FROM OBJECT TO BE MEASURED AND AQUIRING METHOD THEREFOR - An apparatus configured to acquire information on an object to be measured by an electromagnetic wave pulse, the apparatus includes: a generating unit configured to generate the electromagnetic wave pulse with which the object to be measured is irradiated; a detecting unit configured to detect the electromagnetic wave pulse from the object to be measured; a casing including at least a part of a propagation path of the electromagnetic wave pulse leading from the generating unit to the detecting unit; and a measuring window unit configured to change a propagation distance of the electromagnetic wave pulse by moving a measuring window disposed in a part of the casing. The object to be measured is disposed on an opposite side of the propagation path of the electromagnetic wave pulse inside the casing by interposing the measuring window. | 07-31-2014 |
| 20140299773 | Terahertz Wave Detection Device and Method - The present invention includes a slanted periodically poled device | 10-09-2014 |
| 20140353504 | LIGHT SOURCE ADJUSTMENT UNIT, OPTICAL MEASUREMENT DEVICE, SUBJECT INFORMATION OBTAINING SYSTEM, AND WAVELENGTH ADJUSTMENT PROGRAM - An optical measurement device includes a light source unit including a first laser light source configured to emit a laser beam having a first wavelength and a second laser light source configured to emit a laser beam having a second wavelength, a measurement wave number setting unit, and a light source adjustment unit configured to adjust at least one of the first wavelength and the second wavelength such that a difference between or a sum of a first wave number corresponding to the first wavelength and a second wave number corresponding to the second wavelength matches a measurement wave number set through the measurement wave number setting unit. | 12-04-2014 |
| 20140361172 | DETECTION OF H2S IN NATURAL GAS AND HYDROCARBON STREAMS USING A DUAL-PATH NEAR-IR SPECTROSCOPY SYSTEM - Methods and systems for real time, in situ detection of a contaminant in a fluid, and particularly the determination of hydrogen sulfide concentration in a natural gas or other hydrocarbon stream, are provided. The system may include a scanning source with wavelength scanning range of 1560-1610 nm and wavelength resolution of 0.01 nm or better. The light from the scanning source is split to two portions: reference path to reference detector with no fluid in the transmission, and sample path to sample detector with fluid in the transmission. The major noise from the light source and transmitting optics is cancelled out by applying log ratio calculation to the two detector signals. The spectroscopic optical data, however obtained, must then be combined into an analytical processing module containing models that analyze the contaminant quantitative data. | 12-11-2014 |
| 20150028210 | TUNING-FORK BASED NEAR FIELD PROBE FOR SPECTRAL MEASUREMENT, NEAR-FIELD MICROSCOPE USING THE SAME, AND SPECTRAL ANALYSIS METHOD USING NEAR-FIELD MICROSCOPE - The present invention is provided to remove scattering from other parts, except for an end part of a nano-probe, in a near-field microscope, and to enable a spectral analysis by delaying the generation of multiple reflections caused through the shaft of the nano-probe. A first characteristic of the present invention is to temporally delay generation of multiple reflections by manufacturing a probe portion to have a predetermined length or more in a tuning-fork based near-field probe. A second characteristic of the present invention is to provide a near-field microscope which includes a tuning-fork based near-field probe having a structure as above, and can measure a time-domain transient reaction of a scattered wave. A third characteristic of the present invention is to provide a method for performing a spectral analysis on a time-domain signal measured by the near-field microscope. | 01-29-2015 |
| 20150028211 | TIME-DOMAIN SPECTROSCOPY AND TIME-DOMAIN SPECTROSCOPIC ANALYSIS SYSTEM - The time-domain spectroscopy analysis system includes a splitter for splitting pulsed light entered, a variable delayer for delaying timing of a first part of the pulsed light split by the splitter, an electromagnetic wave generator for converting a second part of the pulsed light split by the splitter into an electromagnetic wave, a detector for detecting measurement data from a pulse having passed through a measurement object subjected to the electromagnetic wave emitted from the electromagnetic wave generator, and the pulse outputted from the variable delayer, and a comparator for detecting a phase difference between the pulsed light before being entered into the electromagnetic wave generator and the pulsed light outputted from the variable delayer, wherein a result obtained by the comparator is fed back to the variable delayer. | 01-29-2015 |
| 20150136986 | PRISM MEMBER, TERAHERTZ-WAVE SPECTROSCOPIC MEASUREMENT DEVICE, AND TERAHERTZ-WAVE SPECTROSCOPIC MEASUREMENT METHOD - A prism member having an entrance surface for arranging a terahertz-wave generator for generating a terahertz wave in response to pump light incident thereon, an arrangement part for arranging an object to be measured, an exit surface for arranging a terahertz-wave detector for detecting a correlation between the terahertz wave transmitted through the object in the arrangement part and probe light, a first optical surface for collimating or condensing the terahertz wave incident thereon from the entrance surface toward the arrangement part, and a second optical surface for condensing the terahertz wave transmitted through the arrangement part toward the exit surface, the arrangement part forms a depression adapted to be filled with a liquid incapable of dissolving the object therein. | 05-21-2015 |
| 20150323384 | SPECTRAL IMAGING OF A SAMPLE USING A PLURALITY OF DISCRETE MID-INFRARED WAVELENGTHS - Spectrally analyzing an unknown sample ( | 11-12-2015 |
| 20150355085 | TERAHERTZ-WAVE GENERATING ELEMENT, TERAHERTZ-WAVE DETECTING ELEMENT, AND TERAHERTZ TIME-DOMAIN SPECTROSCOPY DEVICE - A terahertz-wave generating element includes a waveguide including an electro-optic crystal; an optical coupling member that extracts a terahertz wave, which is generated from the electro-optic crystal as a result of light propagating through the waveguide, to a space; and at least two electrodes that cause a first-order electro-optic effect in the electro-optic crystal by applying an electric field to the waveguide so as to change a propagation state of the light propagating through the waveguide. A crystal axis of the electro-optic crystal of the waveguide is set such that the terahertz wave generated by a second-order nonlinear optical process and the light propagating through the waveguide are phase-matched. | 12-10-2015 |
| 20150377773 | Motorized Variable Path Length Cell for Spectroscopy - The present invention is thus directed to an automated system of varying the optical path length in a sample that a light from a spectrophotometer must travel through. Such arrangements allow a user to easily vary the optical path length while also providing the user with an easy way to clean and prepare a transmission cell for optical interrogation. Such path length control can be automatically controlled by a programmable control system to quickly collect and stores data from different path lengths as needed for different spectrographic analysis. Moreover, the system utilizes configured wedge shaped windows to best minimize the reflections of light which cause periodic variation in transmission at different wave lengths (commonly described as “channel spectra”). Such a system, as presented herein, is able to return best-match spectra with far fewer computational steps and greater speed than if all possible combinations of reference spectra are considered. | 12-31-2015 |
| 20160167861 | WRAPPER FOR TERAHERTZ, DETECTION SENSOR, DETECTION APPARATUS USING TERAHERTZ WAVE, OPTICAL IDENTIFICATION DEVICE FOR TERAHERTZ, APPARATUS FOR RECOGNIZING OPTICAL IDENTIFICATION DEVICE FOR TERAHERTZ WAVE, AND WRITING APPARATUS FOR IDENTIFICATION UNIT | 06-16-2016 |
| 20180024041 | MOTION MODULATION FLUIDIC ANALYZER SYSTEM | 01-25-2018 |
