| Class / Patent application number | Description | Number of patent applications / Date published |
|---|
| 324756040 | Pin fixture | 8 |
| 20110109339 | APPARATUS AND METHOD FOR INSPECTING CIRCUIT OF SUBSTRATE - Disclosed herein is an apparatus and method for inspecting a circuit of a substrate. The apparatus includes a pin probe coming into contact with a first end of an electrode formed on a first side of a substrate, a voltage source for applying a voltage to the pin probe, a film disposed at a second end of the electrode formed on a second side of the substrate, a dielectric fluid sealed in the film, and an electronic ink dispersed in the dielectric fluid, and charged with electricity to flow when the electrode is electrified. The present invention is advantageous in that whether an electrode has been electrified is measured using charged electronic ink, so that the use of a pin probe is limited to one side of a substrate, thus reducing cost required for the entire inspection. | 05-12-2011 |
| 20110109340 | Interface Adapter For Connecting With A Test Probe - A interface adapter comprising a connecting board having the first ports and the second ports, the first ports being electrically connected with the second ports; a pin header having the first pins and the second pins, the first pins passing through the first ports, the second pins being connected with the second ports; a female header having openings for receiving the first pins, the connecting board being located between the pin header and the female header. The second pin is designed to O-shape or U-shape for providing enough position to connecting the test probe, preventing from disengagement of the chip from the test card. | 05-12-2011 |
| 20110115516 | APPARATUS AND METHOD FOR INSPECTING DEFECTS IN CIRCUIT PATTERN OF SUBSTRATE - Disclosed herein is an apparatus and method for inspecting defects in the circuit pattern of a substrate. The apparatus for inspecting defects in a circuit pattern of a substrate includes a pin probe configured to input a voltage while coming into contact with an inspection target circuit pattern of a substrate. A capacitor sensor is provided with a membrane electrode which is opposite a connection circuit pattern to be electrically connected to the inspection target circuit pattern in a non-contact manner, and is configured to detect both capacitance and capacitance variation, generated due to displacement of the membrane electrode attributable to electrostatic attractive force acting from the connection circuit pattern on the membrane electrode. A capacitance measurement unit is connected to the capacitor sensor and is configured to measure capacitance attributable to the displacement of the membrane electrode, which is input from the capacitor sensor. | 05-19-2011 |
| 20110148450 | LOW CAPACITANCE PROBE FOR TESTING CIRCUIT ASSEMBLY - An improved system for capacitive testing electrical connections in a low signal environment. The system includes features that increase sensitivity of a capacitive probe. One feature is a spacer positioned to allow the probe to be partially inserted into the component without contacting the pins. The spacer may be a collar on the probe that contacts the housing of the component, contacts the substrate of the circuit assembly, or both. In some other embodiments, the spacer may be a riser extending beyond the surface of the sense plate that contacts the component, a riser portion of the component, or a combination of both. The spacer improves sensitivity by establishing a small gap between a sense plate of the probe and pins under test without risk of damage to the pins. | 06-23-2011 |
| 20110241717 | CONNECTING DEVICE - A connecting device for connecting pins of a DIP chip to a test device comprises two each of half frames, columns of testing pins, connecting screws, fixing screws, and four holding plates. The two columns of testing pins are arranged respectively on the two half frames parallel to the lengthways direction of the half frame. The distance between two adjacent testing pins in the same column is equal to that between the two adjacent pins in the same column of the DIP chip. The two connecting screws screw into the half frames perpendicular to the lengthways direction of the half frame. Two of the holding plates extend down from each of the half frames and are aligned with short sides of the corresponding half frame. The fixing screws fix the two holding plates on the same half frame along a direction parallel to the lengthways direction of the half frame. | 10-06-2011 |
| 20110291688 | Identifying A Signal On A Printed Circuit Board Under Test - Apparatus and methods for identifying a signal on a printed circuit board (‘PCB’) under test, including an integrated circuit mounted on the PCB, the integrated circuit having a test signal generator that transmits a test signal to an output pin of the integrated circuit, with the output pin connected to a test point on the PCB; the integrated circuit also having signal identification logic that inserts into the test signal, an identifier of the signal; a test probe in contact with the test point; and a signal-identifying controller that receives the test signal and the identifier from the test probe and displays, in dependence upon the identifier, the identity of the signal. | 12-01-2011 |
| 20110291689 | SAS INTERFACE OUTPUT SIGNAL DETECTING APPARATUS - A serial attached small computer system interface (SCSI) (SAS) interface output signal detecting apparatus includes an SAS female connector, an SAS male connector, and two subminiature version A (SMA) connectors. Each of the SAS female and male connectors includes first and second groups of data pins and a group of power pins. The power pins of the SAS female connector are connected to the power pins of the SAS male connector. The SMA connectors are connected to two data output pins of the second or first group of data pins of the SAS female connector in response to the first group of data pins of the SAS female connector being connected to the first group of data pins of the SAS male connector or the second group of data pins of the SAS female connector being connected to the second group of data pins of the SAS male connector. | 12-01-2011 |
| 20120153983 | PROBE FIXING DEVICE - A fixing device for fixing probes of an oscillograph. The fixing device includes a base, a holding member for holding the probe, and an arm connected between the base and the holding member. The arm is made of pliable metal material. Therefore, the arm may be bent and deformed easily. | 06-21-2012 |
