| Class / Patent application number | Description | Number of patent applications / Date published |
|---|
| 714725000 | Programmable logic array (PLA) testing | 11 |
| 20090055696 | MICROCONTROLLER FOR LOGIC BUILT-IN SELF TEST (LBIST) - Built-in self-test (BIST) microcontroller integrated circuit adapted for logic verification. Microcontroller includes a plurality of hardware description language files representing a hierarchical description of the microcontroller, the plurality of hardware description language files including a library of circuit design elements, a plurality of library design circuit elements adapted to store a uniquely defined set of input and output signals to enable a logic BIST, and a plurality of latches adapted to store a plurality of values corresponding to a behavioral profile of a test clock. | 02-26-2009 |
| 20090100304 | Hardware and Software Co-test Method for FPGA - A hardware and software co-test method for FPGA comprises the following steps of: setting up a HW/SW co-test system comprising a PC, a software part, HW/SW communication modules, a hardware accelerator for testing a DUT FPGA which is mapped with a configuration file of DUT; predefining a table of test vectors for FPGA by software part in PC; generating configuration files based on the tables of test vector for I/O module, CLB and routing matrix, and then sending the configuration file into DUT FPGA to configure the FPGA; testing DUT FPGA in terms of the tables of test vector for lo I/O module, CLB and routing matrix, and returning results to the software part; and comparing the test results with expected data in the software part, generating a test report, and during the above steps, the error cells in the FPGA are capable of being automatically positioned. | 04-16-2009 |
| 20090138770 | TEST SYSTEM OF RECONFIGURABLE DEVICE AND ITS METHOD AND RECONFIGURABLE DEVICE FOR USE THEREIN - A reconfigurable device test scheme is provided for making a test of a reconfigurable device with configuration data which is loaded a smaller number of times. A reconfigurable device used herein holds a plurality of configuration data and is capable of instantaneously switching which configuration is implemented thereby. Specifically, one transfer configuration data and one or more test configuration data are previously loaded in a configuration memory of the reconfigurable device, and a test is made while sequentially switching the transfer configuration data and the test configuration data. In this way, the same configuration data need not be reloaded over and over, so that the test can be made with a smaller number of times of loading as compared with before. | 05-28-2009 |
| 20100023819 | Programmable Device Testing - According to some embodiments, characterization data can be loaded onto a programmable device. The characterization data can be configured to cause the programmable device to perform one or more functions if executed on the programmable device. It can then be determined whether or not loading the characterization data onto the programmable device caused the programmable device to be successfully programmed. An indication can be transmitted for receipt by an external device, the indication indicating whether or not the programmable device was successfully programmed. | 01-28-2010 |
| 20100064189 | System and Method for Power Reduction Through Power Aware Latch Weighting - A system comprises a circuit analysis module configured to analyze a device under test (DUT), the DUT comprising a plurality of latches coupled together in a scan chain. A don't-care analysis module identifies absolute don't-care latches within the DUT, assigns a weighted value to the bit positions of identified don't-care latches, and identifies absolute don't-care bits within a general test pattern. The circuit analysis module replaces identified absolute don't-care bits in the general test pattern according to the weighted value of the associated bit position, generating a weighted test pattern. A test vector module generates a test vector based on the weighted test pattern and an input module applies the test vector to the DUT. | 03-11-2010 |
| 20100293421 | LOW DEPTH PROGRAMMABLE PRIORITY ENCODERS - An apparatus having a plurality of first circuits, second circuits, third circuits and fourth circuits is disclosed. The first circuits may be configured to generate a plurality of first signals in response to (i) a priority signal and (ii) a request signal. The second circuits may be configured to generate a plurality of second signals in response to the first signals. The third circuits may be configured to generate a plurality of enable signals in response to the second signals. The fourth circuits may be configured to generate collectively an output signal in response to (i) the enable signals and (ii) the request signal. A combination of the first circuits, the second circuits, the third circuits and the fourth circuits generally establishes a programmable priority encoder. The second signals may be generated independent of the enable signals. | 11-18-2010 |
| 20110022907 | FPGA Test Configuration Minimization - A method for automatically generating test patterns using a close-to-minimum number of configurations for a Field Programmable Gate Array (FPGA) to reduce test data volume and test application time. The FPGA can be a standalone programmable device or a circuit embedded in an Application Specific Integrated Circuit (ASIC). | 01-27-2011 |
| 20110047424 | INTEGRATED CIRCUIT INCLUDING A PROGRAMMABLE LOGIC ANALYZER WITH ENHANCED ANALYZING AND DEBUGGING CAPABILITES AND A METHOD THEREFOR - An integrated circuit including a logic analyzer with enhanced analyzing and debugging capabilities and a method therefor. In one embodiment of the present invention, an embedded logic analyzer (ELA) receives a plurality of signals from a plurality of buses within an integrated circuit (IC). The ELA includes an interconnect module to select a trigger signal and/or a sampled signal from the plurality of received signals. A trigger module sets at least one trigger condition and detects if the trigger signal satisfies the at least one trigger condition. When the trigger condition is satisfied, an output module performs at least one task based upon the satisfied at least one trigger condition. If a sampling process is initiated by the output module, the plurality of sampled signals is sampled and may be stored in a memory. The capability of the output module to perform multiple user-defined tasks enhances the debugging capability of the ELA and makes it more versatile. | 02-24-2011 |
| 20140201581 | DEVICE AND METHOD FOR PERFORMING TIMING ANALYSIS - A device for performing timing analysis used in a programmable logic array system is provided. The device comprises first and second basic I/O terminals, a channel multiplexer, high-speed I/O terminals, a sampling module and a timing analysis module. The first basic I/O terminals receive under-test signals from an under-test unit. The channel multiplexer receives the under-test signals from the first basic I/O terminals to select at least a group of the under-test signals to be outputted to the second basic I/O terminals. The high-speed I/O terminals has a logic level analyzing speed higher than that of the first and second basic I/O terminals. The sampling module receives the group of under-test signals from the high-speed I/O terminals and samples the group of under-test signals to generate a sample result. The timing analysis module performs timing analysis and measurement according to the sample result. | 07-17-2014 |
| 20150323602 | MONITORING METHOD, MONITORING APPARATUS, AND ELECTRONIC DEVICE - Embodiments of the present invention, which relate to the field of electronic technologies, provide a monitoring method, a monitoring apparatus, and an electronic device, which can accurately locate an error point in MPI information delivered by a system chip. The apparatus may include: an address filter, a read/write controller connected to the address filter, and a memory connected to the read/write controller, where the address filter is configured to acquire multiple pieces of MPI information, and obtain, by filtering the multiple pieces of MPI information, first MPI information corresponding to a first service that is preset; the read/write controller is configured to write, into the memory according to a time sequence of receiving the first MPI information, the first MPI information that is obtained by the address filter by filtering; and the memory is configured to store the first MPI information written by the read/write controller. | 11-12-2015 |
| 20160097808 | Implementing Fixed-Point Polynomials in Hardware Logic - A method implements fixed-point polynomials in hardware logic. In an embodiment the method comprises distributing a defined error bound for the whole polynomial between operators in a data-flow graph for the polynomial and optimizing each operator to satisfy the part of the error bound allocated to that operator. The distribution of errors between operators is updated in an iterative process until a stop condition (such as a maximum number of iterations) is reached. | 04-07-2016 |
