| Class / Patent application number | Description | Number of patent applications / Date published |
|---|
| 324715000 | Including a particular probing technique (e.g., four point probe) | 21 |
| 20080197864 | RESISTANCE MEASURING METHOD - A resistance measuring method for testing a device under test electrically connected to a pair of pads, by use of a measuring apparatus having a resistance measuring function. A voltage arising in the device under test is measured to calculate a resistance of the device under test from the current and voltage. The resistance measuring method includes, forming an electric connection pattern serially connecting the plurality of sets of the devices under test, causing a pair of probes for voltage measurement of the measuring apparatus to come into contact with the pair of pads of the device under test, and causing a pair of probes for current application of the measuring apparatus to come into contact with a pair of pads electrically connected by the electric connection pattern to each of the pair of pads of the device under test. | 08-21-2008 |
| 20080265916 | METHOD OF PERFORMING SIGNAL-MEASURED CALIBRATION - This present invention discloses a method for performing an accurate calibration of signal measurement by a light-driving system including an automatic power control (APC) circuit which is pre-calibrated for a signal measurement process. By enlarging at least one measured pad of the APC circuit, multiple grounding paths are established via a plurality of probes of a test instrument. An impedance effect predicted on the contact between the probes and the pad is diminished greatly. A voltage value on the pad can be accurately measured. Thus, a reference voltage value input to a first input of a comparator of the APC circuit can be determined on a basis of a specific condition when a ramping voltage value input to a second input of the comparator is substantially equal to a sum of a predetermined reference voltage value and the voltage value of the pad. | 10-30-2008 |
| 20090058433 | METHOD OF TESTING GROUND RESISTANCE BY MAKING USE OF EXISTING TELEPHONE LINES - A fall of potential method of determining earth ground resistance which utilizes an earth ground tester and eliminates the need for utilizing removable ground stakes. Rather than utilizing a “far stake” the method provides connection of the earth ground tester to the telephone wires. Rather than utilizing a “near stake” the method provides for connection of the earth ground tester to the cable shield. | 03-05-2009 |
| 20090160464 | METHOD AND APPARATUS FOR MAKING A DETERMINATION RELATING TO RESISTANCE OF PROBES - According to some embodiments, a method of determining a resistance of probes on a contactor device is disclosed. The contactor device can include a plurality of probes disposed to contact an electronic device to be tested. The method can include electrically connecting a pair of the probes to each other, and then forcing one of a voltage onto or a current through the pair of the probes. At a location on the contactor device, the other of a voltage across or a current through the pair of the probes can be sensed. A determination relating to a resistance of the probes can be determined from the values of the forced voltage or current and sensed other of the voltage or current. | 06-25-2009 |
| 20090256581 | SOLAR PARAMETRIC TESTING MODULE AND PROCESSES - Embodiments of the present invention generally relate to a module that can test and analyze various regions of a solar cell device in an automated or manual fashion after one or more steps have been completed in the solar cell formation process. The module used to perform the automated testing and analysis processes can also be adapted to test a partially formed solar cell at various stages of the solar cell formation process within an automated solar cell production line. The automated solar cell production line is generally an arrangement of automated processing modules and automation equipment that is used to form solar cell devices. | 10-15-2009 |
| 20090302872 | Electrochemical strip for use with a multi-input meter - Strips, particularly test strips and adapters for test strips, for use in meters for the electrochemical measurement of analyte in a sample material and in particular the glucose concentration of a sample of blood. The strips comprise a plurality of working connectors, for interfacing with the meter, coupled to one or more working electrodes. The strips are of particular use in adapting multi-input meters for single input use. | 12-10-2009 |
| 20100007363 | SYSTEM AND METHOD FOR DETERMINING IN-LINE INTERFACIAL OXIDE CONTACT RESISTANCE - The present invention relates generally to semiconductor wafer fabrication and more particularly but not exclusively to advanced process control methodologies for measuring in-line contact resistance in relation to oxide formations. The present invention, in one or more implementations, include an in-line method of determining contact resistance across a semiconductor wafer and determining the contact resistance value and the number of monolayers of the wafer. | 01-14-2010 |
| 20120161799 | FOUR-WIRE MILLIOHMMETER AND PROBE ASSEMBLY THEREOF - An exemplary four-wire milliohmmeter includes a main body and two probe assemblies electrically connected with the main body. Each of the probe assemblies includes two plugs detachably inserted into the main body, a contact member, and two wires each electrically connecting one of the plugs to the contact member. The contact portion of each probe assembly has a needlelike free end for contacting an object. | 06-28-2012 |
| 20130154674 | METHOD OF HIGH VOLTAGE DETECTION AND ACCURATE PHASE ANGLE MEASUREMENT IN CORDLESS PHASING METERS - A high voltage detection device comprises a probe comprising an electrode for contacting a high voltage electrical line. The electrode is connected in series with a resistor. A meter comprises a housing enclosing an electrical circuit for measuring line voltage. The electrical circuit comprises an input circuit for connection to the probe. The input circuit is adapted to suppress high frequency noise pick up by the probe and develop a bipolar voltage representing measured line voltage. A voltage detection circuit comprises a differential amplifier circuit for converting the bipolar voltage to a proportionate voltage signal. A signal processing circuit receives the proportionate voltage signal and drives the display for displaying the measured line voltage. | 06-20-2013 |
| 20130169298 | TRANSFORMER WINDING RESISTANCE TESTER TEST PROBE AND METHOD - A test probe has a probe portion, a current source lead attachment portion and a voltage sense lead attachment portion. The test probe includes two conductive halves secured together with an electrically insulating material disposed between the halves electrically insulating them from each other. Each half has an “L” shape including a probe portion and a test lead attachment portion extending perpendicularly outwardly from the probe portion, and provides the test probe with an overall “T” shape. The conductive halves can be made of copper-beryllium. Methods of providing and using the test probe can include uncoupling a male coupling member of a power cable connector of a loadbreak bushing assembly from a female coupling member of the loadbreak bushing and inserting the rod-shaped probe portion into the female coupling member. | 07-04-2013 |
| 20140021968 | CHIP ON GLASS SUBSTRATE AND METHOD FOR MEASURING CONNECTION RESISTANCE OF THE SAME - A chip on glass substrate includes a substrate, first, second, and third pads that are arranged on the substrate and that are electrically connected to an IC device, and first to fourth conductive patterns. A first conductive pattern is arranged on the substrate, has one end electrically connected to the first pad, and has another end that is electrically floated. Second and third conductive patterns are arranged on the substrate, each have one end electrically connected to the second pad, and each have another end that is electrically floated. A fourth conductive pattern is arranged on the substrate, has one end electrically connected to the third pad, and has another end that is electrically floated. | 01-23-2014 |
| 20160047850 | UNMANNED AERIAL DEVICE AND METHOD FOR PERFORMING A LIGHTNING PROTECTION MEASUREMENT AT A WIND TURBINE - The invention relates to an unmanned aerial device for performing a resistance, current and/or voltage measurement at an object, in particular a lightning protection measurement at a wind turbine, comprising a contact element with an electrically conductive contact area, which can be brought into contact with a surface of the object, in particular with a lightning protection receptor of a rotor blade, of a nacelle or of a tower of a wind turbine, and comprising an electrically conductive measurement cable, which, with a first end, is connected in an electrically conductive manner to the contact area, and, with a second end, can be connected to a resistance, current and/or voltage measuring device and/or a grounding contact of the object. | 02-18-2016 |
| 324716000 | To determine dimension (e.g., distance or thickness) | 3 |
| 20090206855 | Conductivity measuring apparatus and conductivity measuring method - The present invention is a conductivity measuring device comprising that two terminals tweezer having two probes of a observing probe and a grasping probe arranged contiguously along the face which is parallel to a sample support face. Two terminals of a tweezer are pressed while adjusts pressing force to a sample surface, it is galvanized between two terminal tweezer, and conductivity is determined making a current between the two terminals tweezers. | 08-20-2009 |
| 20100219851 | DISTANCE MEASURING DEVICE AND METHOD FOR DETERMINING A DISTANCE, AND SUITABLE REFLECTIVE MEMBER - A distance measuring device and method for determining distance, and a suitable reflective member are provided. The distance measuring device includes analysis electronics and a sensor device, which has at least one coupling probe for feeding a transmission signal into a line structure. A reflective member is disposed in the line structure which has a base plate with an attached collar forming a cup-shaped element, and a feed block with a recess into which the collar plunges. The recess has a sealing ring which produces airtightness with the collar, wherein the attached collar is provided on the front face with a plastic plate. | 09-02-2010 |
| 20190145751 | Film thickness detection device | 05-16-2019 |
| 324717000 | To determine material composition | 2 |
| 20100237885 | LABEL-FREE SENSOR - A label-free sensor is disclosed. The label-free sensor comprises a substrate, a first electrode formed on the substrate, a second electrode formed on the substrate and spaced away from the first electrode, and a semiconductor layer formed on the substrate and is in contact with the first electrode and the second electrode, wherein the semiconductor layer has a plurality of probe groups, which are bonded to the semiconductor layer by functionalization, for sensing a coupling-specific substance, which has bonding specificity with the probe groups. The semiconductor layer of the label-free sensor of the present invention is bonded with probe groups, and the detection of detected object is performed in instant, quick, rapid, and sensitive manner by measuring variation in electric current, thereby avoiding the use of the fluorescent reading equipment for reading fluorescent signals. | 09-23-2010 |
| 20120007619 | Multi-functional precious stone testing apparatus and method thereof - A multi-functional precious stone testing apparatus includes a portable housing, a testing unit, and an indication unit. The portable housing includes a hand-held casing and a probe casing extended from a front end of the hand-held casing. The testing unit includes a conductive probe having a testing end portion extended out of a tip end of the probe casing for contacting a testing object to determine a conductivity of the testing object. The indication unit includes a LED light unit received in the hand-held casing for illuminating the testing end portion of the conductive probe during testing, wherein the LED light unit is positioned away from the tip end of the probe casing for preventing heat generated from the LED light unit being transmitted toward the conductive probe to affect an accurate measurement for the conductivity of the testing object. | 01-12-2012 |
| 324718000 | To detect a flaw or defect | 4 |
| 20090108856 | APPARATUS, SYSTEM, AND METHOD FOR DETECTING CRACKING WITHIN AN AFTERTREATMENT DEVICE - An apparatus, system, and method are disclosed for detecting cracking in a particulate filter. The method may include providing an apparatus comprising an aftertreatment device with a substrate and a substrate surface, a conductive material forming a conduction path bonded to the surface of the substrate surface, and access points configured to allow a resistance measurement of the conduction path. The method may include measuring the resistance of the conduction path, and determining if one or more cracks have occurred on the substrate surface based on the resistance measurement. The method may further include labeling the degradation level of the aftertreatment device based on the indicated amount of cracking, and replacing the aftertreatment device with an equivalent aftertreatment device, based on the degradation level, after a service event. | 04-30-2009 |
| 20100039127 | SYSTEM FOR ASSESSING PIPELINE CONDITION - A method and system for assessment of a pipe ( | 02-18-2010 |
| 20100045311 | Dual Electrical Current Sourcing-piezoresistive Material Self-Sensing (DEC-PMSS) System - In the two-probe case, a detector circuit to detect stress or damage in an object may include a first electrode to be positioned on the object, a second electrode to be positioned on the object, a current circuit to measure the current to the first electrode, a voltage circuit to generate a voltage for the first electrode, a controller circuit to determine and record the changing impedance between the first electrode and a second electrode. In the four-probe case, a detector circuit to detect stress or damage in an object may include a first electrode to be positioned on the object, a second electrode to be positioned on the object, a third electrode to be positioned on the object, a fourth electrode to be positioned on the object, a current source to generate current to the first electrode, a current circuit to measure the current to the second electrode, a voltage circuit to measure the voltage between the third and fourth electrodes, a controller circuit to determine and record the changing impedance between the third electrode and the fourth electrode. | 02-25-2010 |
| 20100225341 | APPARATUS, SYSTEM AND METHOD FOR DETECTING DEFECTS IN BUILDING STRUCTURES - An apparatus, system and method for detecting defects in building structures is provided. The apparatus includes a detector operable to determine an indication of the defect; and a transmitter operable to wirelessly transmit the indication from the apparatus to a central controller. The system includes the detection unit; a locator operable to determine the location of the detection unit; and a memory for storing the indication and the location in association with each other. The memory may be part of a central controller in wireless communication with the detection unit. The apparatus or central controller may include a processor operable to determine from a plurality of measurements performed by the detection unit a resultant measurement vector indicating a direction from the detection unit toward the defect. The detection unit may be operable to autonomously change its location. A display showing resultant measurement vectors at various locations can be produced. | 09-09-2010 |
