| Class / Patent application number | Description | Number of patent applications / Date published |
|---|
| 324706000 | Including a bridge circuit | 16 |
| 20080204053 | CONTROL CIRCUIT FOR CLOCKED CONTROL OF AT LEAST ONE LIGHT EMITTING DIODE - A control circuit includes a clock pulse generator operable to output a pulse-frequency ratio to a constant voltage source in order to control the power output of the constant voltage source. The control circuit further includes a driver circuit for the clocked control of at least one light emitting diode (LED) to which a measurement resistor is connected in parallel. The LED is supplied with power by the constant voltage source. The LED is turned on when the power is greater than a forward power level and is turned off when the power is less than the forward power level. The driver circuit taps a measurement voltage of the measurement resistor while the LED is supplied with power less than the forward power level. The clock pulse generator varies the pulse-frequency ratio as a function of the measurement voltage of the measurement resistor. | 08-28-2008 |
| 20090085587 | HIGH CURRENT PRECISION RESISTANCE MEASUREMENT SYSTEM - A resistance testing apparatus makes use of a modular design for cascaded, parallel, bipolar current sources to obviate the need for electromechanical or pneumatic switching systems. | 04-02-2009 |
| 20100244865 | VOLTAGE MEASUREMENTS OF ELECTRICALLY CONDUCTING ELEMENTS IN SYSTEMS FOR CONTROLLING ELECTRICAL PROCESSES - A voltage measurement device for connection to a primary voltage dividing element provided between ground and an electrically conducting element in a system for controlling an electrical process and such a system. The device includes at least one first branch of secondary voltage dividing elements, where the branch is adapted to be connected in parallel with the primary voltage dividing element, and a first measuring unit connected to one of the secondary voltage dividing elements of the first branch and arranged to measure the voltage across this secondary voltage dividing element and provide a first voltage signal corresponding to a voltage of the electrically conducting element. | 09-30-2010 |
| 20100253373 | DETECTION APPARATUS AND METHOD FOR SUPERCONDUCTING COIL QUENCH - The quench of the superconducting coil is desired to be detected early while suppressing the influences of the noise generated in charge and discharge of the superconducting coil. A superconducting coil quench detection apparatus detects the balance voltage of a bridge circuit formed by the superconducting coil and a resistor to output it as a quench detection signal for detecting the quench thereof. A signal indicating the hold period where the energy accumulated in the superconducting coil is held is generated. A signal included in the hold period is extracted from the quench detection signal. The quench of the superconducting coil is detected based on the extracted signal. | 10-07-2010 |
| 20100264944 | Branch current monitoring system - A power monitoring system that reduces the need for transient voltage suppressors while using current transformers on an associated support operating using a current mode. | 10-21-2010 |
| 20100315108 | DEVICE FOR DETECTING THE THINNING DOWN OF THE SUBSTRATE OF AN INTEGRATED CIRCUIT CHIP - A device for detecting the thinning down of the substrate of an integrated circuit chip, including, in the active area of the substrate, bar-shaped diffused resistors connected as a Wheatstone bridge, wherein: first opposite resistors of the bridge are oriented along a first direction; the second opposite resistors of the bridge are oriented along a second direction; and the first and second directions are such that a thinning down of the substrate causes a variation of the imbalance value of the bridge. | 12-16-2010 |
| 20100321049 | INTEGRATED CIRCUIT CHIP IDENTIFICATION ELEMENT - A element for identifying an integrated circuit chip having identical diffused resistors connected as a Wheatstone bridge. | 12-23-2010 |
| 20110001501 | INTERNAL SELF-CHECK RESISTANCE BRIDGE AND METHOD - One or more embodiments are directed to a resistance bridge measurement circuit configured to perform an internal self-check. The resistance bridge measurement circuit may include two or more internal resistors. In one embodiment, the resistance bridge measurement circuit may be configured to measure a first voltage across one of the resistors and a second voltage across a combination of the two resistors. The measured voltages may be converted to a resistance ratio and compared to an expected value. In another embodiment, the resistance bridge measurement circuit may be configured to measure a third voltage across the other of the two resistors and a fourth voltage across a combination of the two resistors. The measured voltages may be converted to corresponding resistance ratios, summed and compared to an expected value. | 01-06-2011 |
| 20110001502 | RESISTANCE BRIDGE ARCHITECTURE AND METHOD - One or more embodiments are directed to a resistance bridge having two voltage measurements circuits that function in tandem. In one embodiment, a constant current source may be applied to two resistors coupled in series, in which the first resistor has a known resistance and the second resistor has a resistance to be determined or verified. A first measurement circuit may measure a first voltage across the first resistor and at substantially the same time a second measurement circuit measures a second voltage across the second resistor. The voltage of each resistor is converted to a ratio. Based on the ratio and the resistance of the first resistance, the resistance of the second resistor may be calculated. | 01-06-2011 |
| 20120092032 | DEVICE FOR CHARACTERISING ELECTRIC OR ELECTRONIC COMPONENTS - The invention relates to an integrated device (PM) for characterising electric or electronic components (DUT), in particular nanometric ones, comprising a substantially insulating substrate (S) on which are provided four conducting pads (P | 04-19-2012 |
| 20120187966 | High Current Precision Resistance Measurement System - A resistance testing apparatus makes use of a modular design for cascaded, parallel, bipolar current sources to obviate the need for electromechanical or pneumatic switching systems. | 07-26-2012 |
| 20130249574 | CHEMICAL/ BIOLOGICAL SENSORS EMPLOYING FUNCTIONALIZED NANOSWITCH ARRAY - Sensor devices disclosed herein allow multiple analytes or organisms to be individually tagged and selectively detected. When a binding event occurs one or more nanoswitches close and the corresponding array resistance value produces a voltage imbalance in the Wheatstone Bridge. The voltage detected by the voltage meter will then exhibit unique value change corresponding to the particular nanoswitche(s) in the array that are closed due to a binding event. Similarly the same functionalization chemistry can be used on all nanoswitches so that the voltage detected by the voltage meter corresponds to concentration levels of the target analyte. Multiple functionalization chemistries on each switch can also be used to improve selectivity for more complex analytes. In some disclosed embodiments, the Wheatstone bridge voltage is tied to a predetermined resistance change rather than to smaller resistance changes that would occur from functionalization of one leg of a nanowire Wheatstone bridge. | 09-26-2013 |
| 20130257465 | Reading Device in Wired Communication With a Probe Having an Embedded Memory Device - A monitoring system including a reading device electrically connected to a probe via a wired interface. The probe has a physiological sensor/transducer configured as a Wheatstone resistive bridge balancing circuit. Integrated within the housing of the probe to prohibit separation during use by a user is a memory device arranged in parallel with the sensor. Communication between the reading device and the probe occurs via a wired interface utilizing a same number of electrical wires between the reading device and the Wheatstone as would be required without the memory device. Control circuitry selects between one of two modes for accessing either data detected by the sensor or the memory device. | 10-03-2013 |
| 20150293155 | MEASUREMENT CIRCUIT - A measurement circuit for a sensor, the measurement circuit includes at least one detection branch including at least a first series of at least one dipole and a second series of at least one dipole, the series being connected in parallel and connected at their inputs to a common input terminal, each series of dipole being connected to a distinct output terminal, and an electronic circuit including a bias circuit configured to apply a bias current to the detection branch from the input terminal, and a read circuit configured to impose on each output terminal the same potential referred to as the “reference potential”; the electronic circuit including a determination circuit for determining variations in impedances of each series of dipole of the detection branch on the basis of the current applied to each output terminal by the read circuit so as to keep the potentials equal. | 10-15-2015 |
| 20150331016 | SYSTEMS AND METHODS THAT ALLOW FOR SIMULTANEOUS SENSOR AND SIGNAL CONDITIONING CIRCUIT PERFORMANCE TESTING - A sensor system with performance compensation testing capability includes a sensor device, a resistance bridge, a signal conditioning circuit, a first test connector, and a second test connector. The resistance bridge circuit is disposed on the sensor device and includes an excitation terminal, a circuit common terminal, and two output terminals, and is configured, upon being energized, to supply a bridge output voltage across the two output terminals. The signal conditioning circuit is electrically coupled to the excitation terminal, the circuit common terminal, and the two output terminals, and is configured to supply a sensor output signal representative of bridge output voltage. The first test connector is electrically coupled to one of the two output terminals and is configured to be coupled to an impedance test device. The second test connector is electrically coupled to the circuit common terminal and is configured to be coupled to the impedance test device. | 11-19-2015 |
| 20160195890 | CONSTANT-CURRENT CIRCUIT AND SENSOR DEVICE HAVING THIS | 07-07-2016 |
