| Class / Patent application number | Description | Number of patent applications / Date published |
|---|
| 257168000 | With means to increase breakdown voltage | 7 |
| 20100038676 | Semiconductor Devices with a Field Shaping Region - A semiconductor device includes a semiconductor region having a pn junction and a field shaping region located adjacent the pn junction to increase the reverse breakdown voltage of the device. The field shaping region is coupled via capacitive voltage coupling regions to substantially the same voltages as are applied to the pn junction. When a reverse voltage is applied across the pn junction and the device is non-conducting, a capacitive electric field is present in a part of the field shaping region which extends beyond a limit of the pn junction depletion region which would exist in the absence of the field shaping region. The electric field in the field shaping region inducing a stretched electric field limited to a correspondingly stretched pn junction depletion region in the semiconductor region. | 02-18-2010 |
| 20120098031 | DUAL-DIRECTIONAL SILICON CONTROLLED RECTIFIER - A Dual-directional Silicon Controlled Rectifier (DSCR) includes a substrate of a first conductivity type, a buried layer formed on the substrate and of a second conductivity type, a first well and a second well formed on the buried layer and of the first conductivity type, a third well formed between the first well and the second well and of the second conductivity type, and a doped region formed between a first semiconductor region and a third semiconductor region and of the second conductivity type. The doped region includes a part of the third well. The DSCR may regulate a breakdown voltage of a junction thereof. Therefore, when an I/O voltage of an Integrated Circuit (IC) is much higher than a working voltage, a false action may not occur. | 04-26-2012 |
| 20160141358 | APPARATUS AND METHODS FOR TRANSCEIVER INTERFACE OVERVOLTAGE CLAMPING - Apparatus and methods for transceiver interface overvoltage clamping are provided. In certain configurations, an interface device includes a first p-type well region and a second p-type well region in an n-type isolation structure. Additionally, the clamp device includes a first p-type active region and a first n-type active region in the first p-type well region and electrically connected to a first terminal of the clamp device. Furthermore, the clamp device includes a second p-type active region and a second n-type active region in the second p-type well region and electrically connected to a second terminal of the clamp device. The n-type isolation structure is in a p-type region of a semiconductor substrate, and electrically isolates the first and second p-type well regions from the p-type substrate region. The clamp device further includes a blocking voltage tuning structure positioned between the first and second n-type active regions. | 05-19-2016 |
| 257170000 | Surface feature (e.g., guard ring, groove, mesa, etc.) | 4 |
| 20100078677 | SEMICONDUCTOR DEVICE - A semiconductor device comprises a semiconductor substrate having a first semiconductor region of a first semiconductor type, a second semiconductor region of a second conductivity type extended in the first semiconductor region, and a mesa area forming a slope along an outer circumference of the semiconductor substrate; a first electrode provided on a first principal surface of the semiconductor substrate; and a second electrode provided on a second principal surface of the semiconductor substrate that is opposed to the first principal surface; wherein the second semiconductor region comprises a main region provided in the semiconductor substrate while being brought into contact with the first electrode, the main region including an annular portion and diffused portions arranged in a spread manner in an area surrounded by the annular portion; and wherein a portion of the first semiconductor region is interposed between the diffused portions and between the diffused portions and the annular portion; and the diffused portions are composed of a small pitch region and a large pitch region having a larger pitch than that of the small pitch region. | 04-01-2010 |
| 20120286327 | OVERVOLTAGE AND/OR ELECTROSTATIC DISCHARGE PROTECTION DEVICE - An overvoltage protection device in combination with a filter, the overvoltage protection device having a first node for connection to a node to be protected, a second node for connection to a discharge node; and a control node; and wherein the filter comprises at least one of: (a) a capacitor connected between the first node and the discharge node; (b) a capacitor connected between the control node and the discharge node; or (c) an inductor in series connection with the first node. | 11-15-2012 |
| 20130099280 | OVERVOLTAGE AND/OR ELECTROSTATIC DISCHARGE PROTECTION DEVICE - An overvoltage protection devices operable to provide protection against overvoltage events of positive and negative polarity, comprising: an N P N semiconductor structure defining: a first N-type region; a first P-type region; and a second N-type region; wherein one of the first or second N-type regions is connected to a terminal, conductor or node that is to be protected against an overvoltage event, and the other one of the first or second N-type regions is connected to a reference, and wherein a field plate is in electrical contact with the first P-type region, and the field plate overlaps with but is isolated from portions of the first and second N type regions. | 04-25-2013 |
| 20150318347 | Semiconductor Device with a Field Ring Edge Termination Structure and a Separation Trench Arranged Between Different Field Rings - A semiconductor device has a semiconductor body with bottom and top sides and a lateral surface. An active semiconductor region is formed in the semiconductor body and an edge region surrounds the active semiconductor region. A first semiconductor zone of a first conduction type is formed in the edge region. An edge termination structure having at least N field limiting structures is formed in the edge region. Each of the field limiting structures has a field ring and a separation trench formed in the semiconductor body, where N is at least 1. Each of the field rings has a second conduction type, forms a pn-junction with the first semiconductor zone and surrounds the active semiconductor region. For each of the field limiting structures, the separation trench of that field limiting structure is arranged between the field ring of that field limiting structure and the active semiconductor region. | 11-05-2015 |
