| Class / Patent application number | Description | Number of patent applications / Date published |
|---|
| 250443100 | With heat transfer or temperature-indication means | 7 |
| 20080290290 | HEATING STAGE FOR A MICRO-SAMPLE - The present invention achieves a heating stage for a micro-sample, capable of efficient heating and accurate observation of the micro-sample. A micro-sample mount is a heating portion in coil form and is fixed at both ends to a base for the heating stage for the micro-sample. The base can be divided into two members at a base cut line, and the mount is fixed at one end to the first member and is fixed at the other end to the second member. A sample subjected to micro-sampling is mounted on the mount. The base is removed from the tip of a holder, and is mounted on a stage for the sample stage. A current is fed to the micro-sample mount through the members to thereby apply heat to a micro-sample for observation. | 11-27-2008 |
| 20090218510 | SPECIMEN STAGE - An object of the present invention is to provide a specimen stage which is simple in structure, and which suppresses a positional shift due to a friction heat caused by a brake or the like. One aspect to achieve the object provides a specimen stage including: a thrust portion thrust by a thrusting member; and a slide surface thrust by the thrust portion. When the specimen stage stops, the specimen stage performs a control in a way that a part of the slide surface in contact with the thrust portion, and/or a portion adjacent to the part or the thrust portion is heated. By heating the part of the slide surface or the like in this manner, a temperature gradient can be suppressed as described above (see FIG. | 09-03-2009 |
| 20120097863 | ION MICROSCOPE - Provided are a large-current and highly stable gas field ionization ion source, and a high-resolution ion microscope with a large focal depth. | 04-26-2012 |
| 20120292528 | MICRO ELECTRO-MECHANICAL HEATER - A sub-micron scale property testing apparatus including a test subject holder and heating assembly. The assembly includes a holder base configured to couple with a sub-micron mechanical testing instrument and electro-mechanical transducer assembly. The assembly further includes a test subject stage coupled with the holder base. The test subject stage is thermally isolated from the holder base. The test subject stage includes a stage subject surface configured to receive a test subject, and a stage plate bracing the stage subject surface. The stage plate is under the stage subject surface. The test subject stage further includes a heating element adjacent to the stage subject surface, the heating element is configured to generate heat at the stage subject surface. | 11-22-2012 |
| 20130009073 | TRANSMISSION ELECTRON MICROSCOPE MICRO-GRID - A transmission electron microscope (TEM) micro-grid includes a grid and a heater including at least one carbon nanotube film structure located on the grid. The micro-grid with the at least one carbon nanotube film structure prevents a floating of the sample located on the micro-grid to increase the quality of TEM images. | 01-10-2013 |
| 20150340199 | Specimen Cryo Holder and Dewar - In view of that in an existing specimen cryo holder a change in the orientation of a specimen would lead to tilting of a dewar together with the specimen and hence to bubbling of a cooling source contained in the dewar, provided is a specimen cryo holder ( | 11-26-2015 |
| 20150371814 | Charged Particle Radiation Apparatus - The present invention provides a high-throughput scanning electron microscope in which a wafer ( | 12-24-2015 |
