Patent application number | Description | Published |
20120253221 | STIMULATORY EFFECT ESTIMATION DEVICE, SLEEP DEPTH ESTIMATION DEVICE, STIMULATORY EFFECT ESTIMATION METHOD, AND VEHICLE CONTROL DEVICE - A stimulatory effect estimation device includes a stimulus generator | 10-04-2012 |
20130231579 | SLEEP STATE ESTIMATION DEVICE - Since a change in a heart beat is dominated by the autonomic nerve which originates in the brain stem, it is difficult for an object person to control the heart beat at his or her own will. Therefore, frequency analysis, such as fine fluctuation analysis, is needed in order to estimate the body motion of the object person and is not suitable for instant processing. In contrast, according to this embodiment, an arithmetic unit | 09-05-2013 |
20150038865 | SLEEP QUALITY ESTIMATION DEVICE, SLEEP QUALITY ESTIMATION METHOD AND PROGRAM FOR SLEEP QUALITY ESTIMATION - In a sleep quality estimation device, a respiration sensor detects the respiratory waveform of a subject. A sleep stage estimation unit estimates the sleep stage of the subject during sleep based on the respiratory waveform detected by the respiration sensor. In a sleep rhythm model database, models associated with the appearance probability of δ-wave for the sleep stage during sleep are recorded. A sleep quality estimation unit estimates the appearance time of δ-wave of the subject during sleep based on the sleep stage of the subject estimated by the sleep stage estimation unit and the models associated with the appearance probability of δ-wave for the sleep stage recorded in the sleep rhythm model database, and estimates the sleep quality of the subject based on the appearance time of δ-wave. | 02-05-2015 |
Patent application number | Description | Published |
20140131590 | CHARGED PARTICLE BEAM APPARATUS - In recent years, a range of users for a charged particle beam apparatus such as a scanning electron microscope has been broadened. All users want to learn a manual adjustment technology, but it is very difficult to adjust all parameters for observation to have an appropriate value. Therefore, a beginner is unlikely to sufficiently show a performance of an apparatus. This disclosure aims to provide the charged particle beam apparatus including a parameter adjustment practice function for allowing any user to easily learn the manual adjustment technology. | 05-15-2014 |
20150074523 | CHARGED PARTICLE BEAM APPARATUS, SPECIMEN OBSERVATION SYSTEM AND OPERATION PROGRAM - Skills of a novice user operating a charged particle beam apparatus can be improved. Provided are an image display device which displays operation items of an electron microscope on an operation screen, a storage device which stores information of assist buttons which display image state information acquired via a detector of the electron microscope such that the information of assist buttons is correspondent to image quality of the image thus acquired as well as to observation conditions composed of a combination of parameter setting values of the electron microscope, an operation program which analyzes the image quality of the image acquired via the detector, acquires the information of the assist buttons based on analytical results of the image quality of the image as well as current observation conditions, and makes the assist buttons be displayed on the predetermined part of the operation screen. | 03-12-2015 |
20150144804 | Charged Particle Beam Apparatus - In many cases, the charged particle beam apparatus is used basically for observation at a magnification of 10,000 times or higher. It is thus difficult to recognize how the orientation of a sample seen with the naked eye corresponds to the origination of the sample appearing on an acquired image. This makes it difficult intuitively to grasp the tilt direction and other details of the sample. An object of this invention is to provide a charged particle beam apparatus allowing the orientation and the tilted state of the sample to be grasped intuitively. The apparatus includes: a charged particle beam source that emits a charged particle beam; a charged particle beam optical system that irradiates the sample with the charged particle beam; a platform on which the sample is placed; a stage capable of moving the platform at least in a tilt direction; a display unit that displays a tilted state of the platform by use of a simulated image of the platform; an operation input unit that allows a user to designate the position and direction of the sample for observation; and a control unit that controls the amount of movement of the stage based on a signal input from the operation input unit. | 05-28-2015 |