Patent application number | Description | Published |
20090003090 | Impedance adjusting circuit and semiconductor memory device having the same - An impedance adjusting circuit includes: a calibration circuit configured to generate a first calibration code and a second calibration code for determining termination resistance; a transmission line circuit configured to transfer the first calibration code during a first section and to transfer the second calibration code during a second section; and a termination resistor circuit adapted to match an impedance with a resistance determined by receiving the first and second calibration codes. | 01-01-2009 |
20090052260 | SEMICONDUCTOR MEMORY DEVICE - A semiconductor memory device having read and write operations includes a discrimination signal generating unit for generating a discrimination signal during the write operation; and a selective delay unit for receiving and selectively delaying a command-group signal in response to the discrimination signal. | 02-26-2009 |
20090059681 | SEMICONDUCTOR MEMORY DEVICE - Semiconductor memory device includes a detection circuit configured to detect a voltage level of an external power supply voltage and a core voltage generation circuit configured to vary a voltage level of the core voltage according to an output signal of the detection circuit to generate a uniform core voltage. | 03-05-2009 |
20090115480 | Clock control circuit and data alignment circuit including the same - A clock control circuit can prevent a malfunction that occurs when a rising strobe signal and a falling strobe signal change in pulse width and thus overlap each other. The clock control circuit which includes a first clock control unit configured to receive a rising strobe signal and a falling strobe signal and output an adjusted rising strobe signal, an enable pulse width of which does not overlap an enable pulse width of the falling strobe signal. | 05-07-2009 |
20090172479 | SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR TESTING THE SAME - A semiconductor memory device includes an alignment unit configured to align data received from the outside, a plurality of data input/output lines corresponding to the aligned data, respectively and a realignment unit configured to change correspondence between the data and the data input/output lines in response to one or more change signals in a test mode. A method for testing the semiconductor memory device includes inputting data in series using a testing apparatus, aligning the serial data in parallel, and realigning the parallel data in response to one or more change signals. | 07-02-2009 |
20090273364 | CALIBRATION CIRCUIT, SEMICONDUCTOR MEMORY DEVICE INCLUDING THE SAME, AND OPERATING METHOD OF THE CALIBRATION CIRCUIT - Calibration circuit, semiconductor memory device including the same, and operation method of the calibration circuit includes a calibration unit configured to generate a calibration code for controlling a termination resistance value, a calibration control unit configured to count a clock and allow the calibration unit to be enabled during a predetermined clock and a clock control unit configured to selectively supply the clock to the calibration control unit according to an operation mode of a semiconductor device employing the calibration circuit. | 11-05-2009 |
20100329050 | SEMICONDUCTOR MEMORY DEVICE - A semiconductor memory device having read and write operations includes a discrimination signal generating unit for generating a discrimination signal during the write operation; and a selective delay unit for receiving and selectively delaying a command-group signal in response to the discrimination signal. | 12-30-2010 |
20110234288 | INTERNAL VOLTAGE GENERATING CIRCUIT FOR PREVENTING VOLTAGE DROP OF INTERNAL VOLTAGE - An internal voltage generating circuit is utilized to perform a TDBI (Test During Burn-in) operation for a semiconductor device. The internal voltage generating circuit produces an internal voltage at a high voltage level, as an internal voltage, in not only a standby section but also in an active section in response to a test operation signal activated in a test operation. Accordingly, dropping of the internal voltage in the standby section of the test operation and failure due to open or short circuiting are prevented. As a result, reliability of the semiconductor chip, by preventing the generation of latch-up caused by breakdown of internal circuits, is assured. | 09-29-2011 |
20120044773 | SEMICONDUCTOR MEMORY DEVICE - A semiconductor memory device having read and write operations includes a discrimination signal generating unit for generating a discrimination signal during the write operation and a selective delay unit for receiving and selectively delaying a command-group signal in response to the discrimination signal. | 02-23-2012 |