Patent application number | Description | Published |
20110189447 | BOARDS COMPRISING AN ARRAY OF MARKS TO FACILITATE ATTACHMENT - A board is provided that includes a pattern to facilitate attachment of the board to a frame structure. The pattern comprises a first array of marks disposed along a first imaginary line; a second array of marks disposed along a second imaginary line, said first and second imaginary lines being spaced a first predetermined distance apart; and a third array of marks disposed along a third imaginary line, said first and third imaginary lines being spaced a second predetermined distance apart. The board may be used in a variety of construction applications, where the pattern facilitates the quick attachment of the board to an underlying frame. | 08-04-2011 |
20140053474 | BOARDS COMPRISING AN ARRAY OF MARKS TO FACILITATE ATTACHMENT - A board is provided that includes a pattern to facilitate attachment of the board to a frame structure. The pattern comprises a first array of marks disposed along a first imaginary line; a second array of marks disposed along a second imaginary line, said first and second imaginary lines being spaced a first predetermined distance apart; and a third array of marks disposed along a third imaginary line, said first and third imaginary lines being spaced a second predetermined distance apart. The board may be used in a variety of construction applications, where the pattern facilitates the quick attachment of the board to an underlying frame. | 02-27-2014 |
20140318039 | BOARDS COMPRISING AN ARRAY OF MARKS TO FACILITATE ATTACHMENT - A board includes a pattern to facilitate attachment of the board to a frame structure using fasteners. The pattern comprises a first array of first marks disposed in rows spaced apart a first predetermined distance, and a second array of second marks disposed in rows spaced apart a second predetermined distance apart, with the first and second marks being different, and with the first and second distances being different. The board may be used in a variety of construction applications, with the pattern facilitating the quick attachment of the board to the underlying frame by placing the fasteners using the first markings of the first array or the second markings of the second array. | 10-30-2014 |
20150315785 | BOARDS COMPRISING AN ARRAY OF MARKS TO FACILITATE ATTACHMENT - A board includes a pattern to facilitate attachment of the board to a frame structure using fasteners. The pattern comprises a first array of first marks disposed in rows spaced apart a first predetermined distance, and a second array of second marks disposed in rows spaced apart a second predetermined distance apart, with the first and second marks being different, and with the first and second distances being different. The board may be used in a variety of construction applications, with the pattern facilitating the quick attachment of the board to the underlying frame by placing the fasteners using the first markings of the first array or the second markings of the second array. | 11-05-2015 |
Patent application number | Description | Published |
20130319071 | NANOMECHANICAL TESTING SYSTEM - An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators. | 12-05-2013 |
20130319127 | NANOMECHANICAL TESTING SYSTEM - An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators. | 12-05-2013 |
20140293293 | NANOMECHANICAL TESTING SYSTEM - An automated testing system includes systems and methods to facilitate inline production testing of samples at a micro (multiple microns) or less scale with a mechanical testing instrument. In an example, the system includes a probe changing assembly for coupling and decoupling a probe of the instrument. The probe changing assembly includes a probe change unit configured to grasp one of a plurality of probes in a probe magazine and couple one of the probes with an instrument probe receptacle. An actuator is coupled with the probe change unit, and the actuator is configured to move and align the probe change unit with the probe magazine and the instrument probe receptacle. In another example, the automated testing system includes a multiple degree of freedom stage for aligning a sample testing location with the instrument. The stage includes a sample stage and a stage actuator assembly including translational and rotational actuators. | 10-02-2014 |
20140326707 | PROBE TIP HEATING ASSEMBLY - A heating assembly configured for use in mechanical testing at a scale of microns or less. The heating assembly includes a probe tip assembly configured for coupling with a transducer of the mechanical testing system. The probe tip assembly includes a probe tip heater system having a heating element, a probe tip coupled with the probe tip heater system, and a heater socket assembly. The heater socket assembly, in one example, includes a yoke and a heater interface that form a socket within the heater socket assembly. The probe tip heater system, coupled with the probe tip, is slidably received and clamped within the socket. | 11-06-2014 |
20150185117 | ENVIRONMENTAL CONDITIONING ASSEMBLY FOR USE IN MECHANICAL TESTING AT MICRON OR NANO-SCALES - An environmental conditioning assembly for use in mechanical testing at scales of microns or less. The assembly includes an enclosure housing with an environmental cavity therein. A sample stage is positioned within the environmental cavity and includes an option sample heater. The enclosure housing includes a cavity perimeter clustered around the sample stage, and the enclosure housing isolates the environmental cavity and the sample stage from an environment exterior to the enclosure housing. In an example, an expansion and contraction linkage maintains a sample on the sample stage at a static elevation according to heating or cooling fluctuations within the environmental cavity. A testing instrument access port extends through the enclosure housing into the environmental cavity. | 07-02-2015 |