Patent application number | Description | Published |
20080218177 | CONTACT INSERT FOR A MICROCIRCUIT TEST SOCKET - A system for testing a microcircuit having a center ground (CG) terminal has an insert for electrically connecting the CG terminal to a ground contact on a load board. The insert is held within a housing by compression and frictional interaction between a resilient projection carried by the insert and a slot in a wall of an aperture holding the insert. | 09-11-2008 |
20080297142 | CONTACT INSERT FOR A MICROCIRCUIT TEST SOCKET - A system for testing a microcircuit having a center ground (CG) terminal has an insert for electrically connecting the CG terminal with a ground contact on a load board. The insert is held within a housing having an aperture that includes at least one shelf facing toward the load board. The shelf interacts with a resilient projection on the insert to distort the projection. The projection's resilient distortion generates continual force pressing the insert against the load board. The continual force limits migration of debris created by the testing operations into the interface between the insert and the load board. | 12-04-2008 |
20090302878 | Test Contact System For Testing Integrated Circuits With Packages Having An Array Of Signal and Power Contacts - A test fixture ( | 12-10-2009 |
20100231251 | Electrically Conductive Pins For Microcircuit Tester - The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bottom contact plate facing the load board, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The top and bottom pins contact each other at an interface that is inclined with respect to the membrane surface normal. When compressed longitudinally, the pins translate toward each other by sliding along the interface. The sliding is largely longitudinal, with a small and desirable lateral component determined by the inclination of the interface. | 09-16-2010 |
20120062261 | Electrically Conductive Pins For Microcircuit Tester - The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bottom contact plate facing the load board, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The top and bottom pins contact each other at an interface that is inclined with respect to the membrane surface normal. When compressed longitudinally, the pins translate toward each other by sliding along the interface. | 03-15-2012 |
20120176151 | Test Contact System For Testing Integrated Circuits With Packages Having An Array Of Signal and Power Contacts - A test fixture ( | 07-12-2012 |
20130154678 | Electrically Conductive Pins For Microcircuit Tester - The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bottom contact plate facing the load board including a rocker base protrusion, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The top and bottom pins contact each other at an interface that is inclined with respect to the membrane surface normal. When compressed longitudinally, the pins translate toward each other by sliding along the interface. The sliding is largely longitudinal, with a small and desirable lateral component determined by the inclination of the interface. | 06-20-2013 |
20130271176 | Electrically Conductive Pins For Microcircuit Tester - The terminals of a device under test are temporarily electrically connected to corresponding contact pads on a load board by a series of electrically conductive pin pairs. The pin pairs are held in place by an interposer membrane that includes a top contact plate facing the device under test, a bottom contact plate facing the load board, and a vertically resilient, non-conductive member between the top and bottom contact plates. Each pin pair includes a top and bottom pin, which extend beyond the top and bottom contact plates, respectively, toward the device under test and the load board, respectively. The top and bottom pins contact each other at an interface that is inclined with respect to the membrane surface normal. When compressed longitudinally, the pins translate toward each other by sliding along the interface. The sliding is largely longitudinal, with a small and desirable lateral component determined by the inclination of the interface. | 10-17-2013 |