Patent application number | Description | Published |
20100327841 | SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE - The present invention provides a technique for reducing current consumption in a reference voltage forming circuit without a significant increase in area while suppressing considerable degradative difference in reference voltage accuracy between a normal operation mode and a standby mode. In the standby mode, by using a clock signal fed from an oscillator circuit, the frequency-division control circuit produces an enable signal VREFON for determining ON/OFF states of the reference voltage generator circuit, the reference voltage forming circuit, and the capacitance charging regulator, and also produces a sampling/holding signal CHOLDSW for performing control so that a holding capacitor CH in a holding capacitance circuit is charged during an ON period of the reference voltage generator circuit, the reference voltage forming circuit, and the capacitance charging regulator, and so that any paths other than a leak current path are made unavailable to the holding capacitor CH during an OFF period thereof. Current consumption can be reduced significantly by intermittently turning ON/OFF the reference voltage generator circuit, the reference voltage forming circuit, and the capacitance charging regulator, each of which would otherwise consume a relatively large amount of current for operation thereof. | 12-30-2010 |
20120161889 | CRYSTAL OSCILLATION DEVICE AND SEMICONDUCTOR DEVICE - A wiring pattern for oscillation input signal and a wiring pattern for oscillation output signal are provided on a printed circuit board, and a wiring pattern for ground power source voltage is arranged in a region therebetween. A quartz crystal unit is connected between the wiring pattern for oscillation input signal and the wiring pattern for oscillation output signal and one ends of capacitors serving as load capacitors thereof are connected to the wiring pattern for ground power source voltage. Further, a wiring pattern for VSS is arranged so as to enclose these wiring patterns, and a wiring pattern for VSS is arranged also in a lower layer in addition thereto. By this means, reduction of a parasitic capacitance between an XIN node and an XOUT node, improvement in noise tolerance of these nodes and others can be achieved. | 06-28-2012 |
20120265473 | SEMICONDUCTOR DEVICE AND DATA GENERATION METHOD - Improvement in the accuracy of a temperature sensor is aimed at, suppressing the number of the test temperature in a test process. The semiconductor device comprises a coefficient calculation unit which calculates up to the N-th order coefficient (N is an integer equal to or greater than one) of a correction function as an N-th order approximation of a characteristic function indicating correspondence relation of temperature data measured by a temperature sensor unit and temperature, based on N+1 pieces of the temperature data including a theoretical value at a predetermined temperature in the characteristic function and N measured values of the temperature data measured by the temperature sensor unit at N points of temperature; and a correction operation unit which generates data including information on temperature, by performing calculation using the correction function to which the coefficients calculated are applied, based on temperature data measured by the temperature sensor unit. | 10-18-2012 |
20130328615 | SEMICONDUCTOR DEV ICE HAVING VOLTAGE GENERATION CIRCUIT - The present invention provides a voltage generation circuit which outputs high-precision output voltage in a wide temperature range. A semiconductor device has a voltage generation circuit. The voltage generation circuit has a reference voltage generation circuit which outputs reference voltage, and a plurality of correction circuits for generating a correction current and making it fed back to the reference voltage generation circuit. The correction circuits generate sub correction currents which monotonously increase from predetermined temperature which varies among the correction circuits toward a low-temperature side or a high-temperature side. The correction current is sum of a plurality of sub correction currents. | 12-12-2013 |
20140015504 | VOLTAGE GENERATING CIRCUIT - A voltage generating circuit, in which the influence of offset of an amplifier on an output voltage is reduced, has first and second bipolar transistors (Q | 01-16-2014 |
20140035689 | SEMICONDUCTOR DEVICE AND CONTROL METHOD THEREOF - The present invention provides a semiconductor device including a first terminal and a second terminal respectively coupled to both ends of a crystal resonator, an inverter circuit having an input coupled to the first terminal and an output coupled to the second terminal, a feedback resistor which couples between the first terminal and the second terminal, a variable capacitor coupled to at least one of the first and second terminals, and a control circuit. The control circuit performs control to increase both of the drive capability of the inverter circuit and the capacitance value of the variable capacitor in a second mode rather than a first mode. | 02-06-2014 |
20140232476 | Crystal Oscillation Device and Semiconductor Device - A wiring pattern for oscillation input signal and a wiring pattern for oscillation output signal are provided on a printed circuit board, and a wiring pattern for ground power source voltage is arranged in a region therebetween. A quartz crystal unit is connected between the wiring pattern for oscillation input signal and the wiring pattern for oscillation output signal and one ends of capacitors serving as load capacitors thereof are connected to the wiring pattern for ground power source voltage. Further, a wiring pattern for VSS is arranged so as to enclose these wiring patterns, and a wiring pattern for VSS is arranged also in a lower layer in addition thereto. By this means, reduction of a parasitic capacitance between an XIN node and an XOUT node, improvement in noise tolerance of these nodes and others can be achieved. | 08-21-2014 |
20150035588 | SEMICONDUCTOR DEVICE HAVING VOLTAGE GENERATION CIRCUIT - The present invention provides a voltage generation circuit which outputs high-precision output voltage in a wide temperature range. A semiconductor device has a voltage generation circuit. The voltage generation circuit has a reference voltage generation circuit which outputs reference voltage, and a plurality of correction circuits for generating a correction current and making it fed back to the reference voltage generation circuit. The correction circuits generate sub correction currents which monotonously increase from predetermined temperature which varies among the correction circuits toward a low-temperature side or a high-temperature side. The correction current is sum of a plurality of sub correction currents. | 02-05-2015 |