Patent application number | Description | Published |
20130135003 | Test Connector, Transmission Wire, Test System and Using Method - The present invention discloses a test connector, a transmission wire, a test system, and a using method. A test connector for a low voltage differential signal transmission wire comprises a signal wire interface matching with the low voltage differential signal transmission wire, and a PCB interface matching with a PCB plate to be tested, and the signal wire interface is electrically connected with the PCB interface. In the present invention, the test connector is inserted or pulled instead of a low voltage differential signal transmission (LVDS) connection; when damaged, only the test connector needs to be replaced, and the service life of the low voltage differential signal transmission (LVDS) wire is extended greatly. Because the cost of the test connector is only less than 10% of that of the LVDS wire, loss cost can be reduced. | 05-30-2013 |
20130135559 | Backlight Module and LCD Device - The present invention discloses a backlight module and an LCD device, comprising: a backplane and an LGP; the edge(s) of the LGP is provided with lug boss(es), each lug boss is provided with a positioning hole, and the backplane is provided with rivet(s) for matching with the positioning hole; a buffer structure is arranged between the rivet and the wall of the positioning hole. In the present invention, because the edge(s) of the LGP is provided with lug boss(es), each lug boss is provided with a positioning hole, the arrangement of the positioning hole does not influence the light guide area of the LGP; meanwhile, because a layer of buffer structure is arranged between the positioning hole and the rivet, the rupture of the part with concentrated stress in the positioning hole during collision is avoided. In addition, when the LGP is expanded with heat, the buffer structure can also avoid the extrusion damage caused by direct extrusion between the LGP and the rivet; when the LGP is contracted with cold, the gap between the LGP and the rivet is increased so that shake is easily caused. The gap between the LGP and the rivet is automatically filled by a buffer part through the elastic regulation of the buffer part. Thus, the shake collision of the LGP is avoided. | 05-30-2013 |
20130265069 | Liquid Crystal Panel, Liquid Crystal Module, and Method Of Determining Reason Behind Bad Display - The present invention discloses a liquid crystal panel, which, in shorting bar area, connects scan signal line to scan signal test point through a first switch, connects data signal line to data signal test point through a first unidirectional circuit or a second switch, and connects common electrode to common electrode test point through conductive wire. The present invention also discloses a liquid crystal module and a method of determining reason behind bad display for liquid crystal module. With the method, the liquid crystal panel of the present invention can realize to spare the cutting of test leads of shorting bar area and cutting facility used in cell process. | 10-10-2013 |
20130271168 | WIRING STRUCTURE OF WIRING AREA ON LIQUID CRYSTAL DISPLAYING PANEL AND TESTING METHOD OF LIQUID CRYSTAL DISPLAYING PANEL - A wiring structure of a wiring area on a liquid crystal displaying panel includes a number of wiring lines connected to one end of a corresponding data line and corresponding scan line on the wiring area, at least one signal testing point, a number of first testing lines connected between the wiring lines and the signal testing point, a number of second testing lines connected between the signal testing point and the other end of the corresponding data line and the corresponding scan line, and a switch controlling circuit connected to the second testing lines. After the testing lines are disconnected from the wiring lines in the previous process, the testing signal still can be transmitted through the other end of the corresponding data line or the scan line, to implement the image test of the liquid crystal displaying panel. | 10-17-2013 |
20130273776 | Conversion Adaptor and LCD Inspection System - The present invention publishes a conversion adaptor used for LCD panel inspection. The conversion adaptor comprises in order: a first connector plug, an adaptor main body, and a second connector plug; wherein, the first connector plug is used to connect to the connector of a test signal source, and the second connector plug is used to connect to the connector of a connecting cable to an LCD device. The present invention also includes an LCD inspection system. By adding a conversion adaptor, the present invention prevents damage done to the test signal source caused by frequent plugging and unplugging of LVDS cables from its external connector. | 10-17-2013 |
20140043036 | DETECTION CIRCUIT AND DETECTION METHOD - The present disclosure provides a detection circuit and a detection method. The detection circuit used for detecting an electrostatic discharge (ESD) protective device that is inversely soldered, the ESD protective device includes a first diode, a second diode, and a third diode; the cathodes of the first diode, the second diode and the third diode are mutually connected, and an anode of the third diode is coupled to a ground terminal of the circuit by a divider resistor. The detection circuit includes a comparator. The comparator is configured with a first input end connected to the reference voltage and a second input end coupled to the anode of the third diode, and an output end of the comparator is coupled to a warning device. | 02-13-2014 |
20140043040 | Apparatus and method for detecting the abnormal soldering of an electrostatic discharge protection chip - The present invention provides an apparatus for detecting the abnormal soldering of an electrostatic discharge protection chip, comprising a connector, which is used for pluggable connection with a signal input terminal connector of an application specific integrated circuit chip (ASIC) of a liquid crystal display; a detecting circuit, which is set on the connector, used to detect if the electrostatic discharge protection chip is properly soldered on the ASIC and prompt when the abnormal soldering of the electrostatic discharge protection chip is detected. Accordingly, the present invention also provides a method for detecting the abnormal soldering of an electrostatic discharge protection chip. According to the present invention, the abnormal soldering of an electrostatic discharge protection chip can be detected quickly with high accuracy, which can save the cost of manpower and resources, as well as to reduce the loss resulted from the defective rate of the finished product assembly. | 02-13-2014 |
20140168594 | LIQUID CRYSTAL DISPLAY - The present disclosure provides a liquid crystal display, including at least one repairing line, a short circuit bar area, a number of data line pads, a number of testing lines for connecting short circuit bars on the short circuit bar area and the data line pads, a wiring area, a displaying area, and a number of data lines passing through the wiring area and the displaying area; first ends of the data lines being electrically connected to the data line pads and second ends of the data lines extending to be located under the displaying area; the repairing line comprising a first portion isolably intersecting with the testing lines, a second portion isolably intersecting with the second ends of the data lines, and a third portion connecting the first portion and the second portion in the repairing of a disconnected line. | 06-19-2014 |