Patent application number | Description | Published |
20090153159 | Probing Adapter for a Signal Acquisition Probe - A probing adapter has a support member receiving a probing tip assembly having probing arms. The probing tip assembly is mounted to the support member via a rotational joint having elastomeric member disposed in the probing arms with each of the probing arms having a pivot point disposed away from the rotational joint. Each of the probing arms supports a removable probing tip substrate having a probing tip at one end electrically coupled via an electrical signal conductor to an electrical connector at the other end. Substrate retention clips secure the removable probing tip substrates to the probing arms. A probing tip positioning member is mounted to the probing arms for varying the distance between the probing tips on the removable probing tip substrates. | 06-18-2009 |
20100060304 | PROBE WITH PRINTED TIP - The probe with printed tip consists of a substrate having a plurality of probe tips connected to its end edge, a plurality of test paths, each connected to one of the probe tips and extending along the substrate, and at least one of the test paths including an electrical component adjacent to the test path's probe tip. The electrical component may be a resistor. The probe tips may have a width equal to the thickness of the substrate. The probe tips may consist of a plurality of probe tip layers. The invention also includes a method of probing signals transmitted over target transmission lines on a target board. The disclosure also includes a method of manufacturing the claimed invention. | 03-11-2010 |
20110074389 | Signal Acquisition System Having Probe Cable Termination in a Signal Processing Instrument - A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable with the signal cable coupled to a signal processing instrument via an input node. The input node is coupled to an input current amplifier via input circuitry. The input circuitry provides at least one of resistive and capacitive termination of the resistive center conductor signal cable. The termination of the resistive center conductor signal cable in the signal processing instrument provides a signal acquisition system where the capacitive loading of a device under test at higher frequencies is reduced by reducing the input capacitance of the probe tip circuitry resulting in an increase in the signal acquisition system bandwidth. | 03-31-2011 |
20110074390 | Signal Acquisition System Having Reduced Probe Loading of a Device Under Test - A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth. | 03-31-2011 |
20110074391 | Signal Acquisition System Having a Compensation Digital Filter - A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system having an input amplifier with feedback loop circuitry and a compensation digital filter providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth. | 03-31-2011 |
20110074392 | Signal Acquisition System Having Reduced Probe Loading of a Device Under Test - A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system having an input amplifier with feedback loop circuitry and a shunt pole-zero pair coupled to the input circuitry providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth. | 03-31-2011 |
20110074441 | Low Capacitance Signal Acquisition System - A low capacitance signal acquisition system has a signal acquisition probe having a low capacitance input circuit coupled to a compensation amplifier in a signal processing instrument via a signal cable. The low capacitance input circuit, the signal cable and the signal processing instrument input have mismatched time constants with the compensation amplifier having feedback loop circuitry providing adjustable gain and pole-zero pairs for maintaining flatness over the low capacitance signal acquisition system frequency bandwidth. | 03-31-2011 |
20110121849 | PROBE WITH PRINTED TIP - The probe with printed tip consists of a substrate having a plurality of probe tips connected to its end edge, a plurality of test paths, each connected to one of the probe tips and extending along the substrate, and at least one of the test paths including an electrical component adjacent to the test path's probe tip. The electrical component may be a resistor. The probe tips may have a width equal to the thickness of the substrate. The probe tips may consist of a plurality of probe tip layers. The invention also includes a method of probing signals transmitted over target transmission lines on a target board. The disclosure also includes a method of manufacturing the claimed invention. | 05-26-2011 |
20120268140 | Signal Acquisition System Having a Compensation Digital Filter - A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system having an input amplifier with feedback loop circuitry and a compensation digital filter providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth. | 10-25-2012 |
20130134999 | Signal Acquisition System Having Reduced Probe Loading of a Device Under Test - A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system having an input amplifier with feedback loop circuitry and a shunt pole-zero pair coupled to the input circuitry providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth. | 05-30-2013 |
20130221985 | SIGNAL ACQUISITION SYSTEM HAVING REDUCED PROBE LOADING OF A DEVICE UNDER TEST - A signal acquisition system has a signal acquisition probe having probe tip circuitry coupled to a resistive center conductor signal cable. The resistive center conductor signal cable of the signal acquisition probe is coupled to a compensation system in a signal processing instrument via an input node and input circuitry in the signal processing instrument. The signal acquisition probe and the signal processing instrument have mismatched time constants at the input node with the compensation system providing pole-zero pairs for maintaining flatness over the signal acquisition system frequency bandwidth. | 08-29-2013 |
20140103951 | AUTOMATIC PROBE GROUND CONNECTION CHECKING TECHNIQUES - A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid. | 04-17-2014 |