Patent application number | Description | Published |
20100129074 | IN-BAND OPTICAL SIGNAL TO NOISE RATIO DETERMINATION METHOD AND SYSTEM - There is provided a method for determining the in-band noise in agile multichannel Dense Wavelength Division Multiplexing (DWDM) optical systems, where the interchannel noise is not representative of the in-band noise in the optical channel. The method relies on the analysis of two observations of the same input optical signal. In the two observations, the linear relationship between the optical signal contribution and the optical noise contribution (i.e. the observed OSNR) is different, which allows the discrimination of the signal and noise contributions in the input optical signal. In a first approach, the two observations are provided by polarization analysis of the input optical signal. In a second, the input optical signal is obtained using two different integration widths. | 05-27-2010 |
20110091206 | IN-BAND OPTICAL NOISE MEASUREMENT USING DIFFERENTIAL POLARIZATION RESPONSE - A method comprises: acquiring, for a number nSOP of varied State-Of-Polarization analysis conditions of the input optical signal, nSOP polarization-analyzed optical spectrum traces; mathematically discriminating said signal contribution from said noise contribution within said optical signal bandwidth using said polarization-analyzed optical spectrum traces, said mathematically discriminating comprising: obtaining a differential polarization response that is related to the optical spectrum of said signal contribution by a constant of proportionality; estimating the constant of proportionality of a differential polarization response to the optical spectrum of said signal contribution; estimating the optical spectrum of said noise contribution from said input optical signal, within said optical signal bandwidth using said constant of proportionality and said differential polarization response; and determining said in-band noise parameter on said input optical signal from the mathematically discriminated noise contribution. | 04-21-2011 |
20120201533 | Reference-Based In-Band OSNR Measurement on Polarization-Multiplexed Signals - There is provided a method for determining an in-band noise parameter, such as the Optical Signal-to-Noise Ratio (OSNR), on an optical signal-under-test (SUT) propagating along an optical communication link and comprising a data-carrying signal contribution of any arbitrary degree of polarization and a noise contribution. A spectral shape trace of signal contribution in the SUT is estimated using a reference optical spectrum trace of a reference signal which comprises a signal contribution that is spectrally representative of the signal contribution of the SUT and a noise contribution which is at least approximately known. The signal contribution is mathematically discriminated from said noise contribution in the SUT using the spectral shape trace and the test optical spectrum trace. The in-band noise parameter is then determined at least from the mathematically discriminated noise contribution. | 08-09-2012 |
20130163987 | METHOD AND SYSTEM FOR DETERMINING IN-BAND OPTICAL NOISE - There is provided a method for determining the in-band noise in agile multichannel Dense Wavelength Division Multiplexing (DWDM) optical systems, where the interchannel noise is not representative of the in-band noise in the optical channel. The method relies on the analysis of two observations of the same input optical signal. In the two observations, the linear relationship between the optical signal contribution and the optical noise contribution (e.g. the observed OSNR) is different, which allows the discrimination of the signal and noise contributions in the input optical signal. In a first approach, the two observations are provided by polarization analysis of the input optical signal. In a second, the input optical signal is obtained using two different integration widths. | 06-27-2013 |
20130330071 | CHARACTERIZATION OF NON-ASE NOISE ON OPTICAL SIGNALS - There is provided a method for determining a noise parameter characterizing an optical Signal-Under-Test (SUT) having a signal contribution, an Amplified Spontaneous Emission (ASE) noise contribution and a non-ASE optical noise contribution, such as a carrier-leakage contribution or a depolarized-signal contribution, within an optical-signal bandwidth. The method comprises acquiring optical spectrum trace(s) of the SUT, discriminating at least the non-ASE optical noise contribution from the ASE-noise contribution using the optical spectrum trace(s) and/or a trace obtained from the optical spectrum trace(s); and determining the noise parameter using discriminated non-ASE optical noise contribution and/or the discriminated ASE-noise contribution. | 12-12-2013 |
20140086574 | CHARACTERIZATION OF LINEAR CROSSTALK ON MULTIPLEXED OPTICAL SIGNALS - There is provided a method of determining at least one linear-crosstalk-related parameter of an optical signal-under-test having, within an optical channel bandwidth, at least a data-carrying signal contribution and a wavelength-dependent linear-crosstalk contribution arising from a data-carrying signal contribution of an adjacent optical signal associated with an adjacent channel to the optical signal-under-test, the method comprising: acquiring at least one optical spectrum trace encompassing a quasi-continuum of closely-spaced wavelengths over a spectral range extending to at least part of both the signal under test and the adjacent optical signal; and estimating said linear-crosstalk contribution using at least spectral properties of said at least one optical spectrum trace; wherein one of said at least one linear-crosstalk-related parameter is the linear-crosstalk contribution and is determined from said estimating. | 03-27-2014 |
20140328586 | SIGNAL DEFORMATION MEASUREMENT ON POLARIZATION-MULTIPLEXED SIGNALS - There is provided a method and an apparatus for determining quality parameters on a polarization-multiplexed optical signal based on an analysis of the power spectral density of the Signal-Under-Test (SUT). The method is predicated upon knowledge of the spectral shape of the signal in the absence of significant noise or spectral deformation. This knowledge is provided by a reference optical spectrum trace. Based on this knowledge and under the assumption that ASE noise level is approximately constant in wavelength over a given spectral range, the spectral deformation of the signal contribution of the SUT may be estimated using a comparison of the spectral variations of the optical spectrum trace of the SUT with that of the reference optical spectrum trace. | 11-06-2014 |
20160127074 | IN-BAND NOISE AND/OR SPECTRAL DEFORMATION MEASUREMENT ON POLARIZATION-MULTIPLEXED SIGNALS - There is provided a method to discriminate NLE-induced signal deformation from ASE-noise on polarization multiplexed signals, in order to measure the OSNR under NLE conditions and/or characterize the NLE-induced signal deformation. In accordance with one aspect, the method is based on the acquisition of optical spectrum traces when the (data-carrying) optical communication signal is partially or completely extinguished (ASE-noise only), as well as with a live optical communication signal. Comparing traces acquired with different conditions and/or at different dates allows discrimination of the signal contribution, the ASE-noise contribution and the NLE-induced deformations on the SUT. | 05-05-2016 |