Patent application number | Description | Published |
20090002051 | INPUT CIRCUIT OF SEMICONDUCTOR INTEGRATED CIRCUIT - An input circuit is disclosed. The input circuit can include a cross voltage generating block that can be configured to perform charge-sharing on a pair of input signals whose phases are opposite to each other and generate a cross voltage, and an input buffer block that can be configured to buffer the pair of input signals at a voltage level corresponding to a voltage level of the cross voltage and generate an output signal. | 01-01-2009 |
20090015307 | LOCAL SKEW DETECTING CIRCUIT FOR SEMICONDUCTOR MEMORY APPARATUS - A local skew detecting circuit for a semiconductor integrated circuit includes a reference delay block that receives a test signal and generates a reference delay signal by delaying the test signal by a predetermineddelay time, and a first timing detecting block coupled with the reference delay block, the first timing detecting block configured to receive the test signal, generate a first delay signal by delaying the test signal by the same predetermined delay time, and detect an enable timing order of the reference delay signal and the first delay signal to generate a first detection signal. | 01-15-2009 |
20090121733 | TEST CIRCUIT FOR USE IN A SEMICONDUCTOR APPARATUS - A test circuit that senses a misaligned probe during a test includes a first power control section that senses voltage levels of a plurality of sensing lines and controls power supplied to a lower circuit section provided below a part of a pad group, and a second power control section that selectively provides an internal voltage in response to a sensing result of the first power control section. | 05-14-2009 |
20100039166 | CIRCUIT FOR GENERATING NEGATIVE VOLTAGE AND A SEMICONDUCTOR MEMORY APPARATUS USING THE SAME - A circuit for generating negative voltage includes a variable period oscillator configured to generate an oscillator signal enabled in response to a detection signal and to determine a period of the oscillator signal in response to a control signal, a pump configured to perform pumping operations in response to the oscillator signal and to generate a negative voltage by the pumping operations, a negative voltage detecting unit configured to detect the level of the negative voltage to generate the detection signal, and a gate-induced drain leakage current detecting unit configured to measure the amount of a gate-induced drain leakage current to generate the control signal. | 02-18-2010 |
20100182051 | INPUT CIRCUIT OF SEMICONDUCTOR INTEGRATED CIRCUIT - An input circuit is disclosed. The input circuit can include a cross voltage generating block that can be configured to perform charge-sharing on a pair of input signals whose phases are opposite to each other and generate a cross voltage, and an input buffer block that can be configured to buffer the pair of input signals at a voltage level corresponding to a voltage level of the cross voltage and generate an output signal. | 07-22-2010 |
20110233548 | TEST CIRCUIT FOR USE IN A SEMICONDUCTOR APPARATUS - A test circuit that senses a misaligned probe during a test includes a first power control section that senses voltage levels of a plurality of sensing lines and controls power supplied to a lower circuit section provided below a part of a pad group, and a second power control section that selectively provides an internal voltage in response to a sensing result of the first power control section. | 09-29-2011 |