Chesna
Anthony Chesna, Saugus, MA US
Patent application number | Description | Published |
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20140056678 | DUAL SCARA ARM - A substrate transport apparatus having a drive section and a scara arm operably connected to the drive section to move the scara arm. The scara arm has an upper arm and at least one forearm. The forearm is movably mounted to the upper arm and capable of holding a substrate thereon. The upper arm is substantially rigid and is adjustable for changing a predetermined dimension of the upper arm. | 02-27-2014 |
20140144715 | MAGNET ROBOT CRAWLER - A magnetic robot includes a chassis and at least one track assembly associated with the chassis. The track assembly has a linear series of non-circulating magnet modules displaceably mounted with respect to the chassis. A driven track circulates about the magnet modules and travels on guide portions of the magnet modules. | 05-29-2014 |
20160001829 | MAGNET ROBOT CRAWLER - A magnetic robot includes a chassis and at least one track assembly associated with the chassis. The track assembly has a linear series of non-circulating magnet modules displaceably mounted with respect to the chassis. A driven track circulates about the magnet modules and travels on guide portions of the magnet modules. | 01-07-2016 |
Jacob W. Chesna, Alden, NY US
Patent application number | Description | Published |
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20160123725 | METHODS OF DETERMINING THE SHAPE OF A SESSILE DROP - In one aspect, methods of determining the shape of a sessile drop are described herein. In some embodiments, a method described herein comprises measuring a first shape parameter of a sessile drop to obtain a first shape parameter value, measuring a second shape parameter of the drop to obtain a second shape parameter value, and using the first and second shape parameter values to calculate a third shape parameter value of a third shape parameter of the drop. | 05-05-2016 |
Michael Chesna, Saugus, MA US
Patent application number | Description | Published |
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20130202089 | Convertible Scan Panel for X-Ray Inspection - An x-ray inspection system using backscatter of an x-ray beam emitted through a scan panel contiguous with, but of a material distinct from, an enclosure that contains an x-ray source by which the x-ray beam is generated. The scan panel is contoured in such a manner as to be visibly blended with a shape characterizing the enclosure. In some embodiments, the beam traverses multiple scan panels, where one or more of the scan panels may be selected for beam filtration properties. The scan panel may be disposed interior to a sliding door, and may be structured to serve as a scatter shield. | 08-08-2013 |