Patent application number | Description | Published |
20100065738 | METHOD AND APPARATUS FOR ION AXIAL SPATIAL DISTRIBUTION FOCUSING - The present invention provides a mass spectrometer including an ion source for generating pre-cursor ions, ion fragmentation means for generating fragment ions from the pre-cursor ions, a reflectron for focusing the kinetic energy distribution of the ions, and an ion detector wherein the mass spectrometer also includes axial spatial distribution focusing means which in use acts on the ions after the ion fragmentation means and before the reflectron, the axial spatial distribution focusing means being operable to reduce the spatial distribution of the ions in the direction of the ion optical axis of the spectrometer. Suitably the axial spatial distribution focusing means comprising a cell with two electrodes | 03-18-2010 |
20110139973 | TOF MASS SPECTROMETER FOR STIGMATIC IMAGING AND ASSOCIATED METHOD - The present invention is concerned with improving the focusing of ions having a particular mass to charge ratio by optimising the electric field for the focusing of ions having that particular mass to charge ratio. In particular, the stigmatic focusing of ions can be improved by adjusting a voltage applied to an ion-optical lens | 06-16-2011 |
20130119248 | METHODS AND APPARATUSES FOR PRODUCING MASS SPECTRUM DATA - The present invention is concerned with methods and apparatuses for generating mass spectrum data using a mass spectrometer by subtracting noise mass spectrum data representative of noise in the mass spectrometer from signal mass spectrum data representative of the mass/charge ratio of ions in a sample material. This produces a modified signal mass spectrum data representative of the mass/charge ratio of ions in the sample material. The method includes acquiring and subtracting noise mass spectrum data representative of noise in the mass spectrometer or alternatively subtracting noise mass spectrum data from a previously acquired or pre-stored noise spectrum data. Embodiments demonstrate reduced noise and in particular reduced systematic noise compared with the originally acquired signal mass spectrum data. | 05-16-2013 |