Andberg
John Andberg, Santa Cruz, CA US
Patent application number | Description | Published |
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20110089966 | APPARATUS AND SYSTEMS FOR PROCESSING SIGNALS BETWEEN A TESTER AND A PLURALITY OF DEVICES UNDER TEST - Apparatus is for processing signals between a tester and devices under test. In one embodiment, the apparatus includes at least one multichip module. Each multichip module has a plurality of micro-electromechanical switches between a set of connectors to the tester and a set of connectors to devices under test. At least one driver is provided to operate each of the micro-electromechanical switches. Other embodiments are also disclosed. | 04-21-2011 |
20130285690 | STIFFENER PLATE FOR A PROBECARD AND METHOD - A microelectronic contactor assembly can include a probe head having microelectronic contactors for contacting terminals of semiconductor devices to test the semiconductor devices. A stiffener assembly can provide mechanical support to microelectronic contactors and for connecting a probe card assembly to a prober machine. A stiffener assembly may include a main body and a plurality of mounting points, wherein at least one of the mounting points is flexibly connected to the main body by one or more laterally extending beams that has a section modulus normal to the lateral direction significantly greater than in the lateral direction. The stiffener assembly allows for differential thermal expansion of various components of the microelectronic contactor assembly while minimizing accompanying dimensional distortion that could interfere with contacting the terminals of semiconductor devices. | 10-31-2013 |
John W. Andberg, Santa Cruz, CA US
Patent application number | Description | Published |
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20100134134 | TEST ELECTRONICS TO DEVICE UNDER TEST INTERFACES, AND METHODS AND APPARATUS USING SAME - In one embodiment, a test system has a set of test electronics for testing a device under test (DUT). The test system also has at least one test electronics to DUT interface having a zero insertion force (ZIF) connector. Each ZIF connector has a ZIF connector to DUT clamping mechanism configured to i) apply a first orthogonal force to a probe card that interfaces with a DUT, by pressing the ZIF connector against the probe card, and simultaneously ii) exert at least one second orthogonal force on the probe card, the at least one second orthogonal force being opposite in direction to the first orthogonal force. | 06-03-2010 |
20130135002 | TEST ELECTRONICS TO DEVICE UNDER TEST INTERFACES, AND METHODS AND APPARATUS USING SAME - In one embodiment, an interface includes a plurality of test electronics to DUT interfaces. Each test electronics to DUT interface has at least one test electronics interface, at least one DUT interface, and an electrical coupling between the at least one test electronics interface and the at least one DUT interface. First and second subsets of the DUT interfaces are respectively positioned along the perimeters of first and second concentric shapes. | 05-30-2013 |
20140070828 | METHOD AND APPARATUS FOR MASSIVELY PARALLEL MULTI-WAFER TEST - Disclosed herein is a cost effective, efficient, massively parallel multi-wafer test cell. Additionally, this test cell can be used for both single-touchdown and multiple-touchdown applications. The invention uses a novel “split-cartridge” design, combined with a method for aligning wafers when they are separated from the probe card assembly, to create a cost effective, efficient multi-wafer test cell. A “probe-card stops” design may be used within the cartridge to simplify the overall cartridge design and operation. | 03-13-2014 |
John William Andberg, Santa Cruz, CA US
Patent application number | Description | Published |
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20090255098 | CLAMP WITH A NON-LINEAR BIASING MEMBER - In an embodiment, there is disclosed a clamp, having a housing; a latch member extending from within the housing, and the latch member translatable along a displacement axis; an actuator mounted to the housing and operatively associated with the latch member to translate the latch member along the displacement axis; and a nonlinear biasing member operatively associated with the latch member and the housing, and the nonlinear biasing member positioned to bias the latch member toward a retracted position. Other embodiments are also disclosed. | 10-15-2009 |