Patent application number | Description | Published |
20120019973 | METHOD AND APPARATUS FOR GROUNDING A COMPOSITE AIRCRAFT STRUCTURE - Method and apparatus for installing a grounding fastener in a composite aircraft structure includes structure and/or function for (i) drilling a hole in the composite aircraft structure, the hole dimensioned to provide a clearance fit with respect to the composite structure and the grounding fastener; (ii) coating the grounding fastener with a conductive fluid; (iii) inserting the grounding fastener into the hole such that the grounding fastener is in electrical contact with conductive fibers within the composite structure; (iv) securing the grounding fastener to the composite structure; and (v) attaching a conductive device to the grounding fastener such that the conductive device is in electrical contact with the grounding fastener. | 01-26-2012 |
20120292441 | SYSTEM AND METHOD FOR REDUCING THE NOISE OF PUSHER TYPE AIRCRAFT PROPELLERS - A system and method for reducing the noise penalty of a pusher propeller, allowing an aircraft to retain its advantages for UAV configurations, while allowing acoustic performance similar to that of a tractor propeller by reducing, or eliminating, propeller noise emissions. The system and method provide an airfoil-shaped flight surface with (i) a scoop configured to route boundary layer air and associated wake from said flight surface, and (ii) a suction device configured to provide a suction pressure, wherein the scoop routes boundary layer air from the flight surface to the suction device via an opening in the flight surface. | 11-22-2012 |
20120319706 | CAPACITANCE-BASED SYSTEM HEALTH MONITORING SYSTEM, APPARATUS AND METHOD FOR LAYERED STRUCTURE - The present disclosure endeavors to provide an SHM system and method using a conductive material (e.g., CNT) to measure changes in a layered structure. Change in capacitance of a layered structure may be measured over time thereby indicating a change in the structural integrity of the material. The SHM system may be embedded with, or within, the layered structure such that the system is effectively part of the material. Alternatively, it may be external to the layered structure such that the system is a separate device used to measure the capacitance. The SHM system may also localize any changes in a layered structure by using, for example, strips or panels of conductive material on opposite sides of the layered structure being measured. Damage within overlapping portions of the conductive material provides localization capability where varying the size of the strips or panels may be use to vary the sensitivity and resolution of both the locations and size of the defect. | 12-20-2012 |