Class / Patent application number | Description | Number of patent applications / Date published |
324762070 | Diode | 17 |
20110031993 | Curve Tracer Signal Conversion for Integrated Circuit Testing - A curve tracer signal conversion device is provided. The signal conversion device has an input connected to the curve tracer base port to accept a repeating sequence of stepped base signals. The conversion device has a signal input connected to either the curve tracer collector or emitter port, typically the collector. The conversion device has a plurality of signal outputs, where each signal output is sequentially connected to the selected (i.e. collector) curve tracer port in response to a corresponding base step signal. The signals outputs may be provided to a test fixture, for testing a multi-pin integrated circuit (IC). | 02-10-2011 |
20110133769 | INSPECTION APPARATUS AND METHOD FOR LED PACKAGE INTERFACE - An LED package interface inspection apparatus for an LED device comprises a current source, a voltage measuring unit, and a testing control unit. The testing control unit provides at least one control signal to command the current source to output at least one current for the LED device. The testing control unit also provides at least two signals to command the voltage measuring unit to measure a first forward voltage of the LED device at a first time and a second forward voltage of the LED device at a second time. The testing control unit calculates a voltage difference between the first forward voltage and the second forward voltage, and determines that the LED device is defective if the voltage difference is larger than a predetermined threshold value. | 06-09-2011 |
20110316579 | LED CHIP TESTING DEVICE - The present invention provides an LED chip testing device that measures characteristics of an LED chip. | 12-29-2011 |
20120043990 | ZENER DIODE DETECTING CIRCUIT - A circuit includes a power supply circuit and a measuring circuit. The measuring circuit includes a voltage meter, a current meter, and a connector connected to a zener diode under test. The voltage meter is connected to the connector in parallel. The current meter is configured to measure a current flowing through the zener diode. The power supply circuit is capable of providing an output voltage that becomes greater gradually. The voltage meter is capable of obtaining a breakdown voltage of the zener diode when the current flowing through the zener diode increases and a voltage across the zener diode is unchanged. | 02-23-2012 |
20120306527 | TESTING LED LIGHT SOURCES - An apparatus for testing light emitting diodes (LEDs) comprising a chamber which is configured to heat or cool LEDs inside the chamber by ambient heating or cooling of the LEDs and an optical sensing unit configured to sense light emitted by the LEDs whilst the LEDs are inside the chamber. A method for testing LEDs is also described. | 12-06-2012 |
20130162283 | LUMINANCE TEST SYSTEM FOR LEDS - A test system for Light-emitting diodes (LEDs) includes a microcontroller, a plurality of light sensors, a plurality of shielding members and a display module. Each of the plurality of light sensors is connected to the microcontroller and each of LEDs. Each of the plurality of light sensors is capable of detecting luminance of the plurality of LEDs respectively. Each of the plurality of shielding members is configured to prevent light outside of each of the plurality of shielding members from interfering with light emitted from each of the LEDs inside of each of the plurality of shielding members. The microcontroller is adapted to read light intensities sensed by the plurality of light sensors according to a predetermined sequence and send the light intensities to the display module to display the light intensities in the predetermined sequence. | 06-27-2013 |
20130300452 | INSTRUMENT FOR MEASURING LED LIGHT SOURCE - A LED light source measuring instrument includes a shell portion and a test portion. The shell portion supports the test portion. The test portion includes a carrier plate for carrying a LED light source, and provides automatic electrical connections to a bottom surface of an SMT LED light source. The test portion further includes a flexible tube and a vacuum pump, at least one air hole set in the test portion, the flexible tube connecting with the air hole and the vacuum pump, the vacuum provided by the vacuum pump holding the LED light source firmly to the under test zone of the carrier plate. | 11-14-2013 |
20140097866 | METHOD OF EVALUATING METAL CONTAMINATION IN SEMICONDUCTOR SAMPLE AND METHOD OF MANUFACTURING SEMICONDUCTOR SUBSTRATE - An aspect of the present invention relates to a method of evaluating metal contamination in a semiconductor sample by DLTS method, which includes obtaining a first DLTS spectrum by measuring a DLTS signal while varying a temperature, the DLTS signal being generated by alternatively and cyclically applying to a semiconductor junction on a semiconductor sample a reverse voltage V | 04-10-2014 |
20140152338 | ELECTRONIC DEVICE RELIABILITY MEASUREMENT SYSTEM AND METHOD - Provided is a low-cost and high-efficient system for measuring reliability of an electronic device. According to the present invention, a single input power source for applying power to an input terminal of a plurality of electronic device samples and a single output power source for applying power to an output terminal of the plurality of electronic device samples are provided. Further, an input switch having first switches of which the number corresponds to the number of the plurality of electronic device samples, the input switch being installed between the input power source and the input terminal so that the first switches are selectively switched to apply input power; and an output switch having second switches of which the number corresponds to the number of the plurality of electronic device samples, the output switch being installed between the output power source and the output terminal so that the second switches are selectively switched to apply output power are provided. | 06-05-2014 |
20140210507 | LED FAILURE DETECTION - A fault detecting circuit in a string of LEDs D | 07-31-2014 |
20150316604 | LIGHT-EMITTING DEVICE TEST SYSTEMS - Light-emitting devices, such as LEDs, are tested using a photometric unit. The photometric unit, which may be an integrating sphere, can measure flux, color, or other properties of the devices. The photometric unit may have a single port or both an inlet and outlet. Light loss through the port, inlet, or outlet can be reduced or calibrated for. These testing systems can provide increased reliability, improved throughput, and/or improved measurement accuracy. | 11-05-2015 |
20160069947 | METHOD AND APPARATUS FOR TESTING DISPLAY PANEL - A method and an apparatus for testing a display panel are provided. The apparatus comprises an interface circuit for connecting to the display panel to be tested, and a test circuit for generating a test signal to the display panel through the interface circuit in a test state for a display panel, and for generating an adjustment signal to the display panel through the interface circuit in a predetermined state for the display panel, wherein at least a portion of an afterimage signal in the display panel is reduced by the adjustment signal. | 03-10-2016 |
20160091556 | FAULT DIAGNOSIS METHOD FOR FREEWHEELING DIODES OF DUAL-SWITCH POWER CONVERTER OF SWITCHED RELUCTANCE MOTOR - A fault diagnosis method for freewheeling diodes of power converter of switched reluctance motor with two main switches per phase, in which two current sensors are arranged on a power converter with two main switches per phase, wherein, one current sensor LEM | 03-31-2016 |
20160104402 | ORGANIC LIGHT-EMITTING DISPLAY PANEL AND TEST METHOD - An organic light-emitting display panel includes a pixel unit including a plurality of pixels configured to display different colors, wherein the plurality of pixels is respectively disposed at intersections of a plurality of scan lines and a plurality of data lines; and a test unit configured to selectively apply, to a plurality of link lines connected to the data lines, a pixel test signal for detecting defects of the plurality of pixels and a link line test signal for detecting short and open states of the plurality of link lines. | 04-14-2016 |
20160109506 | SEMICONDUCTOR DEVICE WITH UPSET EVENT DETECTION AND METHOD OF MAKING - A semiconductor device includes a substrate, first electronic circuitry formed on the substrate, a first diode buried in the substrate under the first electronic circuitry, and a first fault detection circuit coupled to the first diode to detect energetic particle strikes on the first electronic circuitry. | 04-21-2016 |
20160133172 | ORGANIC LIGHT-EMITTING DISPLAY DEVICE AND METHOD OF DRIVING THE SAME - An organic light-emitting display device includes: a display panel comprising a plurality of pixels, wherein each of the plurality of pixels comprises an organic light-emitting diode (OLED) configured to emit light of one color from among a plurality of colors comprising red, green, and blue; a degradation determiner configured to determine a degree of degradation of the OLED from a value of accumulated image data that is input to each of the plurality of pixels; a current sensor configured to apply a sensing voltage to the OLED and to measure a current corresponding to the sensing voltage; and a degradation calculator configured to calculate an amount of degradation of the OLED from the current measured by the current sensor. | 05-12-2016 |
20220137120 | SYSTEM AND METHOD FOR TESTING OPTICAL RECEIVERS - Disclosed are a testing unit, system, and method for testing and predicting failure of optical receivers. The testing unit and system are configured to apply different values of current, voltage, heat stress, and illumination load on the optical receivers during testing. The test methods are designed to check dark current, photo current, forward voltage, and drift over time of these parameters. | 05-05-2022 |