SANDISK TECHNOLOGIES INC.
|SANDISK TECHNOLOGIES INC. Patent applications|
|Patent application number||Title||Published|
|20150255481||Metal Replacement Process For Low Resistance Source Contacts In 3D NAND - A fabrication process is provided for a 3D stacked non-volatile memory device which provides a source contact to memory holes at a bottom of a stack. The stack includes alternating control gate layers and dielectric layers on a substrate, and memory holes are etched through the stack. The process avoids the need to etch through films at the bottom of the memory hole. Instead, a path is formed from the bottom of the memory hole to the top of the stack. The path includes a horizontal portion using a voided trench in a substrate dielectric, and a passageway etched in the stack. The memory films, a channel material and a dielectric material are deposited throughout the interior surfaces of the void and the memory holes concurrently. The path is filled with metal to form a continuous, low resistance conductive path.||09-10-2015|
|20150255166||Compensating Source Side Resistance Versus Word Line - A method and non-volatile storage system are provided in which the voltage applied to the source end of a NAND string depends on the location of the non-volatile storage element that is selected for sensing. This may be done without body-biasing the NAND string. Having the magnitude of the voltage applied to the source end of a NAND string depend on the location of the selected memory cell (without any body biasing) helps to mitigate failures that are dependent on which word line is selected during a sensing operation of one embodiment. Additionally, the magnitude of a read pass voltage may depend on either the source line voltage or the location of the selected memory cell.||09-10-2015|
|20150254384||Virtual Critical Path (VCP) System and Associated Methods - A virtual critical path (VCP) circuit is defined separate from an actual critical path circuit. The VCP operates in accordance with a special clock signal. The actual critical path circuit operates in accordance with a system clock signal. The VCP circuit has a signal timing characteristic substantially equal to that of the actual critical path circuit. The VCP circuit includes computational circuitry defined to compute an output value based on an input value, and comparison circuitry defined to compare the output value with an expected result value. A match between the output value computed by the VCP circuit and the expected result value indicates that a frequency of the special clock signal is acceptable. The VCP circuit is used to determine a maximum acceptable frequency of the special clock signal. A frequency of the system clock signal is then set to the maximum acceptable frequency of the special clock signal.||09-10-2015|
Patent applications by SANDISK TECHNOLOGIES INC.