Top Inventors for class "Scanning-probe techniques or apparatus; applications of scanning-probe techniques, e.g., scanning probe microscopy [spm]" |
Rank | Inventor's name | Country | City/State | Last publication | # of patent apps in this class |
1 | Roger Proksch | US | Santa Barbara, CA | Jun 15, 2017 / 20170168089 - Modular Atomic Force Microscope with Environmental Controls | 36 |
2 | Chanmin Su | US | Ventura, CA | Dec 23, 2021 / 20210396784 - Device, and Method of Manufacture, for use in Mechanically Cleaning Nanoscale Debris from a Sample Surface | 30 |
3 | Jason Cleveland | US | Ventura, CA | Jun 15, 2017 / 20170168089 - Modular Atomic Force Microscope with Environmental Controls | 24 |
4 | Masahiro Watanabe | JP | Yokohama | Mar 10, 2016 / 20160069816 - DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE AND DEFECT OBSERVATION DEVICE PROVIDED WITH SAME | 22 |
5 | Craig Prater | US | Santa Barbara, CA | Jun 08, 2017 / 20170160309 - METHOD AND APPARATUS FOR INFRARED SCATTERING SCANNING NEAR-FIELD OPTICAL MICROSCOPY WITH BACKGROUND SUPPRESSION | 18 |
6 | Stephen Jesse | US | Knoxville, TN | Jan 28, 2016 / 20160025773 - ELECTROCHEMICAL FORCE MICROSCOPY | 18 |
7 | Andrew Humphris | GB | Oxfordshire | Jan 15, 2015 / 20150020244 - BEAM SCANNING SYSTEM | 16 |
8 | Shuiqing Hu | US | Santa Barbara, CA | Dec 23, 2021 / 20210396784 - Device, and Method of Manufacture, for use in Mechanically Cleaning Nanoscale Debris from a Sample Surface | 16 |
9 | Takeshi Fukuma | JP | Ishikawa | Feb 18, 2016 / 20160047841 - SIGNAL DETECTION CIRCUIT AND SCANNING PROBE MICROSCOPE | 16 |
10 | Victor B. Kley | US | Berkeley, CA | Mar 20, 2014 / 20140082776 - Fluid Delivery for Scanning Probe Microscopy | 14 |
11 | Sergei V. Kalinin | US | Knoxville, TN | Jan 28, 2016 / 20160025773 - ELECTROCHEMICAL FORCE MICROSCOPY | 14 |
12 | Huiwen Liu | US | Eden Prairie, MN | May 19, 2016 / 20160138154 - METHODS OF FORMING LAYERS | 14 |
13 | Roger C. Callahan | US | Goleta, CA | Dec 31, 2015 / 20150377920 - Variable Density Scanning | 12 |
14 | Lin Zhou | US | Eagan, MN | Jan 28, 2016 / 20160025772 - ATOMIC FORCE MICROSCOPY OF SCANNING AND IMAGE PROCESSING | 12 |
15 | Yan Hu | US | Ventura, CA | Sep 18, 2014 / 20140283229 - Method and Apparatus of Operating a Scanning Probe Microscope | 12 |
16 | Toshihiko Nakata | JP | Hiratsuka | Oct 02, 2014 / 20140298548 - SCANNING PROBE MICROSCOPE | 12 |
17 | Nobuaki Sakai | JP | Hachioji-Shi | Jan 28, 2016 / 20160025770 - SCANNING PROBE MICROSCOPE AND SCANNING PROBE MICROSCOPY | 12 |
18 | Chad A. Mirkin | US | Wilmette, IL | Sep 15, 2022 / 20220288181 - ANTIVIRAL VACCINES USING SPHERICAL NUCLEIC ACIDS | 12 |
19 | Peter Gunderson | US | Ellsworth, WI | Jan 22, 2015 / 20150020379 - PROCESS TO INHIBIT SLIDER CONTAMINATION DURING PROCESSING | 12 |
20 | Detlef Knebel | DE | Berlin | Dec 08, 2011 / 20110302676 - Method and Device for Examining a Sample with a Probe Microscope | 10 |
21 | Takashi Inoue | JP | Yokohama | Jun 06, 2013 / 20130145507 - SCANNING PROBE MICROSCOPE AND SAMPLE OBSERVING METHOD USING THE SAME | 10 |
22 | Masato Iyoki | JP | Chiba-Shi | Aug 12, 2010 / 20100205697 - APPROACH METHOD FOR PROBE AND SAMPLE IN SCANNING PROBE MICROSCOPE | 10 |
23 | Toshio Ando | JP | Ishikawa | Apr 21, 2011 / 20110093989 - SCANNER DEVICE FOR SCANNING PROBE MICROSCOPE | 10 |
24 | Roger B. Proksch | US | Santa Barbara, CA | Dec 31, 2015 / 20150377920 - Variable Density Scanning | 10 |
25 | Mario Viani | US | Santa Barbara, CA | Jun 15, 2017 / 20170168089 - Modular Atomic Force Microscope with Environmental Controls | 10 |
26 | Kevin Kjoller | US | Santa Barbara, CA | Feb 05, 2015 / 20150034826 - Nanoscale infrared spectroscopy with multi-frequency atomic force microscopy | 10 |
27 | Makoto Okai | JP | Tokorozawa | Aug 09, 2012 / 20120204297 - Scanning Probe Microscope and Method of Observing Sample Using the Same | 10 |
28 | Vladimir A. Ukraintsev | US | Allen, TX | Dec 29, 2016 / 20160377675 - OPTICAL NANOPROBING OF INTEGRATED CIRCUITS | 8 |
29 | Christopher Ryan Moon | US | Cupertino, CA | May 29, 2014 / 20140150139 - METHOD OF CONTROLLING FREQUENCY MODULATED-ATOMIC FORCE MICROSCOPE | 8 |
30 | Xing Liao | US | Evanston, IL | Oct 29, 2015 / 20150309073 - MULTIFUNCTIONAL GRAPHENE COATED SCANNING TIPS | 8 |
31 | Marko Loparic | CH | Basel | Jun 30, 2016 / 20160187375 - SAMPLE HOLDER FOR AN ATOMIC FORCE MICROSCOPE | 8 |
32 | Joseph S. Fragala | US | San Jose, CA | Nov 22, 2012 / 20120297509 - MASSIVELY PARALLEL LITHOGRAPHY WITH TWO-DIMENSIONAL PEN ARRAYS | 8 |
33 | Dale Egbert | US | Deephaven, MN | Jan 28, 2016 / 20160025772 - ATOMIC FORCE MICROSCOPY OF SCANNING AND IMAGE PROCESSING | 8 |
34 | Torsten Jähnke | DE | Berlin | Aug 04, 2022 / 20220244287 - Arrangement Having a Measuring Apparatus for a Scanning Probe Microscope, Scanning Probe Microscope, and Method for Operating | 8 |
35 | Masatsugu Shigeno | JP | Chiba-Shi | Sep 27, 2012 / 20120246768 - METHOD OF MEASURING VIBRATION CHARACTERISTICS OF CANTILEVER | 8 |
36 | Dan Bocek | US | Goleta, CA | Apr 23, 2015 / 20150113687 - Fully Digitally Controller for Cantilever-Based Instruments | 8 |
37 | Ji Ma | US | Thousand Oaks, CA | Jul 16, 2015 / 20150198630 - Closed Loop Controller and Method for Fast Scanning Probe Microscopy | 8 |
38 | Mark C. Reuter | US | Montrose, NY | Mar 27, 2014 / 20140082920 - HIGH ASPECT RATIO SAMPLE HOLDER | 8 |
39 | Guy M. Cohen | US | Mohegan Lake, NY | Apr 28, 2016 / 20160118248 - CRYSTAL FORMATION ON NON-LATTICE MATCHED SUBSTRATES | 8 |
40 | Maarten Rutgers | US | Los Angeles, CA | Jun 15, 2017 / 20170168089 - Modular Atomic Force Microscope with Environmental Controls | 8 |
41 | Stephen C. Minne | US | Santa Barbara, CA | Feb 04, 2016 / 20160033547 - Method and Apparatus of Physical Property Measurement Using a Probe-Based Nano-Localized Light Source | 8 |
42 | Motoyuki Hirooka | JP | Hitachi | Jun 06, 2013 / 20130145507 - SCANNING PROBE MICROSCOPE AND SAMPLE OBSERVING METHOD USING THE SAME | 8 |
43 | Clint Callahan | US | Santa Barbara, CA | Apr 23, 2015 / 20150113687 - Fully Digitally Controller for Cantilever-Based Instruments | 6 |
44 | Takayuki Uchihashi | JP | Ishikawa | Jan 28, 2010 / 20100024082 - ATOMIC FORCE MICROSCOPE | 6 |
45 | Marija Plodinec | CH | Basel | Dec 24, 2015 / 20150369838 - METHOD AND DEVICE FOR CONTROLLING A SCANNING PROBE MICROSCOPE | 6 |
46 | Toshihiko Nakata | JP | Tokyo | Dec 31, 2015 / 20150377922 - SCANNING PROBE MICROSCOPE AND SAMPLE OBSERVATION METHOD USING SAME | 6 |
47 | Yonmook Park | KR | Suwon-Si | Feb 07, 2013 / 20130033670 - HEAT TREATMENT APPARATUS AND METHOD FOR LCD CELLS | 6 |
48 | Ivo W. Rangelow | DE | Baunatal | Mar 03, 2011 / 20110055985 - DEVICE AND METHOD FOR AN ATOMIC FORCE MICROSCOPE FOR THE STUDY AND MODIFICATION OF SURFACE PROPERTIES | 6 |
49 | Sergiy Pryadkin | US | Plano, TX | Oct 22, 2015 / 20150301078 - SYSTEM AND METHOD FOR NON-CONTACT MICROSCOPY FOR THREE-DIMENSIONAL PRE-CHARACTERIZATION OF A SAMPLE FOR FAST AND NON-DESTRUCTIVE ON SAMPLE NAVIGATION DURING NANOPROBING | 6 |
50 | Torsten Jähnke | DE | Berlin | Oct 14, 2010 / 20100263098 - METHOD AND APPARATUS FOR THE COMBINED ANALYSIS OF A SAMPLE WITH OBJECTS TO BE ANALYZED | 6 |
51 | Albert K. Henning | US | Palo Alto, CA | Sep 01, 2022 / 20220278461 - SOLAR ANTENNA ARRAY FABRICATION | 6 |
52 | Abu Sebastian | CH | Adliswil | Sep 15, 2022 / 20220293174 - RESISTIVE MEMORY DEVICE FOR MATRIX-VECTOR MULTIPLICATIONS | 6 |
53 | Torsten Müller | DE | Berlin | Dec 06, 2012 / 20120305398 - METHODS AND DEVICES FOR SEPARATING PARTICLES IN A LIQUID FLOW | 6 |
54 | Stefan B. Kaemmer | US | Santa Barbara, CA | Feb 04, 2016 / 20160033547 - Method and Apparatus of Physical Property Measurement Using a Probe-Based Nano-Localized Light Source | 6 |
55 | Yoshitsugu Uekusa | JP | Tachikawa-Shi | Jun 04, 2015 / 20150153385 - SCANNING MECHANISM AND SCANNING PROBE MICROSCOPE | 6 |
56 | Olav Solgaard | US | Stanford, CA | Sep 15, 2022 / 20220291500 - High Contrast Spatial Light Modulator | 6 |
57 | Todd Day | US | Santa Barbara, CA | Apr 23, 2015 / 20150113687 - Fully Digitally Controller for Cantilever-Based Instruments | 6 |
58 | Jian Shi | US | Ventura, CA | Jul 16, 2015 / 20150198630 - Closed Loop Controller and Method for Fast Scanning Probe Microscopy | 6 |
59 | Motoyuki Hirooka | JP | Kumagaya | Aug 09, 2012 / 20120204297 - Scanning Probe Microscope and Method of Observing Sample Using the Same | 6 |
60 | Maha M. Khayyat | US | Chappaqua, NY | Nov 05, 2015 / 20150318352 - NANOSCALE CHEMICAL TEMPLATING WITH OXYGEN REACTIVE MATERIALS | 6 |
61 | Takanori Maeda | JP | Saitama | Oct 27, 2011 / 20110260062 - INFRARED SENSOR AND INFRARED SENSOR MANUFACTURING METHOD | 6 |
62 | Stanislav Polonsky | US | Putnam Valley, NY | Apr 14, 2016 / 20160102351 - Flow Cell Array and Uses Thereof | 6 |
63 | Louise R. Giam | US | Chicago, IL | Jul 07, 2011 / 20110165341 - BLOCK COPOLYMER-ASSISTED NANOLITHOGRAPHY | 6 |
64 | Bernd W. Gotsmann | CH | Horgen | Jul 13, 2017 / 20170199082 - SENSORS FOR DETECTING INCIDENT SIGNALS HAVING DISTURBANCE ELEMENTS | 6 |
65 | Sang-Il Park | KR | Seongnam-City | Nov 10, 2011 / 20110277192 - SCANNING PROBE MICROSCOPE WITH DRIFT COMPENSATION | 6 |
66 | Sungho Jin | US | San Diego, CA | Sep 22, 2022 / 20220299467 - METHODS OF FABRICATING NANOSCALE STRUCTURES USABLE IN MOLECULAR SENSORS AND OTHER DEVICES | 6 |
67 | Torsten Müller | DE | Berlin | Dec 06, 2012 / 20120305398 - METHODS AND DEVICES FOR SEPARATING PARTICLES IN A LIQUID FLOW | 6 |
68 | Bede Pittenger | US | Santa Barbara, CA | Apr 21, 2016 / 20160109477 - Method and Apparatus of Tuning a Scanning Probe Microscope | 6 |
69 | Ali Passian | US | Knoxville, TN | Jan 16, 2014 / 20140020141 - MODE-SYNTHESIZING ATOMIC FORCE MICROSCOPY AND MODE-SYNTHESIZING SENSING | 6 |
70 | Hideki Kawakatsu | JP | Tokyo | Mar 03, 2011 / 20110055983 - DYNAMIC MODE AFM APPARATUS | 6 |
71 | Brent A. Wacaser | US | Garrison, NY | Nov 05, 2015 / 20150318352 - NANOSCALE CHEMICAL TEMPLATING WITH OXYGEN REACTIVE MATERIALS | 6 |
72 | Venkat K. Balagurusamy | US | Suffern, NY | Oct 21, 2021 / 20210326900 - ARTIFICIAL INTELLIGENCE FOR ROBUST DRUG DILUTION DETECTION | 6 |
73 | Jörg Rychen | CH | Zurich | Dec 01, 2011 / 20110296564 - SCANNING PROBE MICROSCOPE WITH CURRENT CONTROLLED ACTUATOR | 6 |
74 | Hitoshi Asakawa | JP | Ishikawa | Sep 25, 2014 / 20140289910 - SEALED AFM CELL | 6 |
75 | Sang Han Chung | KR | Seoul | Jun 30, 2016 / 20160187373 - Head Limiting Movement Range Of Laser Spot And Atomic Force Microscope Having The Same | 6 |
76 | William P. King | US | Champaign, IL | Nov 18, 2021 / 20210354139 - MICROFLUIDIC DIAGNOSTIC DEVICE WITH A THREE-DIMENSIONAL (3D) FLOW ARCHITECTURE | 6 |
77 | Henry Mittel | US | San Ramon, CA | Mar 12, 2015 / 20150074859 - Low Drift Scanning Probe Microscope | 6 |
78 | David Catto | GB | Norfolk | Feb 14, 2013 / 20130042375 - CONTROL SYSTEM FOR A SCANNING PROBE MICROSCOPE | 6 |
79 | Manish J. Butte | US | Stanford, CA | Mar 03, 2016 / 20160058377 - Methods of Testing for Allergen Sensitivity | 6 |
80 | Toshihiko Nakata | JP | Yokohama | Jun 06, 2013 / 20130145507 - SCANNING PROBE MICROSCOPE AND SAMPLE OBSERVING METHOD USING THE SAME | 6 |
81 | Jae Wan Hong | KR | Seoul | Dec 31, 2020 / 20200412634 - NETWORK FORENSIC SYSTEM AND METHOD | 6 |
82 | Masafumi Watanabe | JP | Chiba-Shi | Mar 07, 2013 / 20130061357 - METHOD OF DETERMINING A SPRING CONSTANT OF A CANTILEVER AND SCANNING PROBE MICROSCOPE USING THE METHOD | 6 |
83 | Mike Berkmyre | US | Allen, TX | Oct 22, 2015 / 20150301078 - SYSTEM AND METHOD FOR NON-CONTACT MICROSCOPY FOR THREE-DIMENSIONAL PRE-CHARACTERIZATION OF A SAMPLE FOR FAST AND NON-DESTRUCTIVE ON SAMPLE NAVIGATION DURING NANOPROBING | 6 |
84 | Markus B. Raschke | US | Boulder, CO | Feb 04, 2016 / 20160033547 - Method and Apparatus of Physical Property Measurement Using a Probe-Based Nano-Localized Light Source | 6 |
85 | Friedrich B. Prinz | US | Woodside, CA | Dec 10, 2015 / 20150357534 - Atomic Layer Deposition (ALD) of TiO2 using (Tetrakis(dimethylamino)titanium) TDMAT as an Encapsulation and/or Barrier Layer for ALD PbS | 6 |
86 | Masahiro Watanabe | JP | Tokyo | Aug 25, 2022 / 20220268929 - Distance Measurement System and Distance Measurement Method | 6 |
87 | John Sanders | US | Coppell, TX | Oct 22, 2015 / 20150301078 - SYSTEM AND METHOD FOR NON-CONTACT MICROSCOPY FOR THREE-DIMENSIONAL PRE-CHARACTERIZATION OF A SAMPLE FOR FAST AND NON-DESTRUCTIVE ON SAMPLE NAVIGATION DURING NANOPROBING | 6 |
88 | Richard Stallcup | US | Frisco, TX | Oct 22, 2015 / 20150301078 - SYSTEM AND METHOD FOR NON-CONTACT MICROSCOPY FOR THREE-DIMENSIONAL PRE-CHARACTERIZATION OF A SAMPLE FOR FAST AND NON-DESTRUCTIVE ON SAMPLE NAVIGATION DURING NANOPROBING | 6 |
89 | Byung I. Kim | US | Boise, ID | Nov 21, 2013 / 20130312142 - SYSTEM AND METHOD FOR HIGH-SPEED ATOMIC FORCE MICROSCOPY | 6 |
90 | Thomas George Thundat | US | Knoxville, TN | Jan 16, 2014 / 20140020141 - MODE-SYNTHESIZING ATOMIC FORCE MICROSCOPY AND MODE-SYNTHESIZING SENSING | 6 |
91 | Naoya Watanabe | JP | Chiba-Shi | May 27, 2010 / 20100132075 - Self displacement sensing cantilever and scanning probe microscope | 6 |
92 | Laurene Tetard | US | Knoxville, TN | Jan 16, 2014 / 20140020141 - MODE-SYNTHESIZING ATOMIC FORCE MICROSCOPY AND MODE-SYNTHESIZING SENSING | 6 |
93 | Nghi Phan | US | Santa Barbara, CA | Nov 01, 2012 / 20120278957 - Scanning probe microscope with compact scanner | 6 |
94 | Takenori Hirose | JP | Tokyo | Aug 18, 2022 / 20220260611 - CANTILEVER, SCANNING PROBE MICROSCOPE, AND MEASUREMENT METHOD USING SCANNING PROBE MICROSCOPE | 6 |
95 | Carl Masser | US | Santa Barbara, CA | Nov 01, 2012 / 20120278957 - Scanning probe microscope with compact scanner | 4 |
96 | Teruaki Tokutomi | JP | Kamisato-Machi | Apr 03, 2014 / 20140096293 - METHOD AND APPARATUS FOR INSPECTING THERMAL ASSIST TYPE MAGNETIC HEAD | 4 |
97 | Fang-Yi Liao | TW | Taichung City | Jan 17, 2013 / 20130019353 - THERMAL PROBEAANM LIU; Bernard HaoChihAACI Tainan CityAACO TWAAGP LIU; Bernard HaoChih Tainan City TWAANM Liao; Fang-YiAACI Taichung CityAACO TWAAGP Liao; Fang-Yi Taichung City TWAANM Chen; Jian-HongAACI Nantou CountyAACO TWAAGP Chen; Jian-Hong Nantou County TW | 4 |
98 | Weijie Wang | US | Thousand Oaks, CA | Dec 23, 2021 / 20210396784 - Device, and Method of Manufacture, for use in Mechanically Cleaning Nanoscale Debris from a Sample Surface | 4 |
99 | Thomas Sulzbach | DE | Weisendorf | Sep 27, 2012 / 20120242189 - MICRO-MECHANICAL COMPONENT WITH CANTILEVER INTEGRATED ELECTRICAL FUNCTIONAL ELEMENT | 4 |
100 | Eui-Sup Lee | KR | Daejeon | Oct 29, 2015 / 20150309072 - Computer-Aided Simulation Method For Atomic-Resolution Scanning Seebeck Microscope (SSM) Images | 4 |