Top Inventors for class "Optics: measuring and testing" |
Rank | Inventor's name | Country | City/State | Last publication | # of patent apps in this class |
1 | Robert E. Bridges | US | Kennett Square, PA | Jul 13, 2017 / 20170199025 - LENGTH ARTIFACT AND METHOD OF MEASUREMENT | 47 |
2 | Yuta Urano | JP | Yokohama | Apr 28, 2016 / 20160116421 - DEFECT INSPECTING METHOD AND DEFECT INSPECTING APPARATUS | 43 |
3 | Glen A. Sanders | US | Scottsdale, AZ | Sep 17, 2020 / 20200295740 - SYSTEM AND METHOD FOR NARROW BAND NEGATIVE FEEDBACK CONTROL | 38 |
4 | Zhiyong Li | US | Redwood City, CA | Dec 17, 2015 / 20150362486 - CHEMICAL-ANALYSIS DEVICE INTEGRATED WITH METALLIC-NANOFINGER DEVICE FOR CHEMICAL SENSING | 32 |
5 | Akira Hamamatsu | JP | Yokohama | Apr 28, 2016 / 20160116421 - DEFECT INSPECTING METHOD AND DEFECT INSPECTING APPARATUS | 32 |
6 | Tiequn Qiu | US | Glendale, AZ | Feb 18, 2016 / 20160047655 - RESONANT FIBER OPTIC GYROSCOPE WITH POLARIZING CRYSTAL WAVEGUIDE COUPLER | 31 |
7 | Toshiyuki Nakao | JP | Yokohama | Apr 28, 2016 / 20160116421 - DEFECT INSPECTING METHOD AND DEFECT INSPECTING APPARATUS | 31 |
8 | Sachio Uto | JP | Yokohama | Oct 17, 2013 / 20130269126 - APPARATUS AND METHOD FOR INSPECTING DEFECT IN OBJECT SURFACE | 30 |
9 | Zhiyong Li | US | Foster City, CA | Dec 27, 2018 / 20180373675 - MEMRISTOR CROSSBAR ARRAY FOR PERFORMING A FOURIER TRANSFORMATION | 29 |
10 | Katsumi Shibayama | JP | Hamamatsu-Shi | Dec 02, 2021 / 20210372854 - OPTICAL DETECTION DEVICE HAVING ADHESIVE MEMBER | 28 |
11 | Shigeru Matsui | JP | Hitachinaka | Jul 03, 2014 / 20140185041 - LIGHT SOURCE DEVICE, SURFACE INSPECTING APPARATUS USING THE DEVICE, AND METHOD FOR CALIBRATING SURFACE INSPECTING APPARATUS USING THE DEVICE | 28 |
12 | Wolfgang Holzapfel | DE | Obing | Jun 17, 2021 / 20210181492 - DEVICE AND METHOD FOR COUPLING LIGHT OF DIFFERENT WAVELENGTHS INTO A WAVEGUIDE | 28 |
13 | Michel J.f. Digonnet | US | Palo Alto, CA | Nov 19, 2015 / 20150330848 - OPTICAL DEVICE UTILIZING FIBER BRAGG GRATING AND NARROWBAND LIGHT WITH NON-BRAGG WAVELENGTH | 28 |
14 | Guillermo J. Tearney | US | Cambridge, MA | Dec 30, 2021 / 20210401414 - APPARATUS, METHOD AND COMPUTER-ACCESSIBLE MEDIUM FOR OBTAINING TISSUE SAMPLES | 27 |
15 | Shunji Maeda | JP | Yokohama | Dec 26, 2013 / 20130343632 - DEFECT INSPECTION METHOD AND APPARATUS | 27 |
16 | Lee K. Strandjord | US | Tonka Bay, MN | Dec 16, 2021 / 20210389128 - SYSTEMS AND METHODS TO REDUCE DIFFERENTIAL HARMONICS OF RESONANCE TRACKING MODULATION IN A RESONANT FIBER OPTIC GYROSCOPE | 27 |
17 | Wei Wu | US | Palo Alto, CA | Sep 08, 2022 / 20220280801 - BRAIN STIMULATION TREATMENT IN DEPRESSION | 26 |
18 | Robert P. Freese | US | Pittsboro, NC | Jan 06, 2022 / 20220003652 - IN SITU EVALUATION OF FILTER PARAMETERS WITH OPTICOANALYTICAL DEVICES | 25 |
19 | Takahiro Jingu | JP | Takasaki | Dec 05, 2013 / 20130321798 - DEFECT INSPECTION METHOD, LOW LIGHT DETECTING METHOD AND LOW LIGHT DETECTOR | 24 |
20 | Arie Jeffrey Den Boef | NL | Waalre | Sep 22, 2022 / 20220299751 - METROLOGY DEVICE AND PHASE MODULATOR APPARATUS THEREFOR | 24 |
21 | Shih-Yuan Wang | US | Palo Alto, CA | Aug 04, 2022 / 20220246775 - MICROSTRUCTURE ENHANCED ABSORPTION PHOTOSENSITIVE DEVICES | 24 |
22 | Yoshimasa Oshima | JP | Yokohama | Jul 10, 2014 / 20140192353 - INSPECTION APPARATUS | 24 |
23 | Alexandre M. Bratkovski | US | Mountain View, CA | Aug 27, 2015 / 20150241355 - APPARATUS FOR PERFORMING SPECTROSCOPY HAVING A PARABOLIC REFLECTOR AND SERS ELEMENTS | 24 |
24 | Dale C. Flanders | US | Lexington, MA | Sep 24, 2015 / 20150265181 - WIRELESS SENSOR WIRE SYSTEM | 24 |
25 | Patrick J. Treado | US | Pittsburgh, PA | Sep 01, 2022 / 20220277535 - SYSTEMS AND METHODS OF COVERT IDENTIFICATION | 22 |
26 | Min Hu | US | Sunnyvale, CA | Jun 25, 2015 / 20150177151 - FABRICATING AN APPARATUS FOR USE IN A SENSING APPLICATION | 21 |
27 | Matthew Nelson | US | Harrison City, PA | Jun 17, 2021 / 20210182634 - APPARATUS AND METHODS FOR MULTI-TARGET DETECTION | 20 |
28 | Wayne D. Jung | US | Morton Grove, IL | Apr 02, 2015 / 20150092191 - Systems and Methods for Measuring Spectra of Skin and Other Objects and Materials and Making Predictions Based Thereon | 20 |
29 | Toshihiko Nakata | JP | Hiratsuka | Oct 02, 2014 / 20140298548 - SCANNING PROBE MICROSCOPE | 19 |
30 | Yukihiro Shibata | JP | Fujisawa | Jan 09, 2014 / 20140009755 - DEFECT INSPECTION METHOD AND DEVICE USING SAME | 19 |
31 | Huei Pei Kuo | US | Cupertino, CA | Apr 14, 2016 / 20160103074 - SCATTERING SPECTROSCOPY NANO SENSOR | 19 |
32 | Daniel Kandel | IL | Aseret | Jan 03, 2019 / 20190004438 - DEVICE METROLOGY TARGETS AND METHODS | 18 |
33 | Bartley C. Johnson | US | North Andover, MA | Jan 28, 2016 / 20160025478 - Real Time FPGA Resampling for Swept Source Optical Coherence Tomography | 18 |
34 | Toshifumi Honda | JP | Yokohama | Jan 09, 2014 / 20140009755 - DEFECT INSPECTION METHOD AND DEVICE USING SAME | 17 |
35 | Brett Eugene Bouma | US | Quincy, MA | May 18, 2017 / 20170135584 - SYSTEMS, DEVICES, METHODS, APPARATUS AND COMPUTER-ACCESSIBLE MEDIA FOR PROVIDING OPTICAL IMAGING OF STRUCTURES AND COMPOSITIONS | 17 |
36 | Kenneth Steffey | US | Longwood, FL | Nov 11, 2021 / 20210349215 - METHOD OF OPERATING A COORDINATE MEASUREMENT DEVICE | 17 |
37 | Russell W. Jung | US | Morton Grove, IL | Apr 02, 2015 / 20150092191 - Systems and Methods for Measuring Spectra of Skin and Other Objects and Materials and Making Predictions Based Thereon | 17 |
38 | Alan R. Loudermilk | US | Chicago, IL | Dec 17, 2015 / 20150362551 - Methods for Making Contact Device for Making Connection to an Electronic Circuit Device and Methods of Using the Same | 17 |
39 | David A. Fattal | US | Mountain View, CA | Dec 31, 2020 / 20200409172 - HORIZONTAL PARALLAX MULTIVIEW DISPLAY AND METHOD HAVING SLANTED MULTIBEAM COLUMNS | 16 |
40 | Yasuhiro Yoshitake | JP | Yokohama | Mar 07, 2013 / 20130058558 - DEFECT INSPECTION SYSTEM | 16 |
41 | Reinhard Becker | DE | Ludwigsburg | Dec 23, 2021 / 20210396882 - USING A TWO-DIMENSIONAL SCANNER TO SPEED REGISTRATION OF THREE-DIMENSIONAL SCAN DATA | 16 |
42 | Torsten Gogolla | LI | Schaan | Jun 07, 2018 / 20180156917 - Device for Optically Measuring the Distance from a Reflective Target Object | 16 |
43 | Peter J. De Groot | US | Middletown, CT | Feb 18, 2016 / 20160047712 - OPTICAL EVALUATION OF LENSES AND LENS MOLDS | 15 |
44 | Katsumi Shibayama | JP | Shizuoka | Sep 15, 2011 / 20110222289 - OPTICAL ELEMENT, LASER BEAM OSCILLATION DEVICE AND LASER BEAM AMPLIFYING DEVICE | 15 |
45 | Leslie L. Deck | US | Middletown, CT | Apr 10, 2014 / 20140098375 - POSITION MONITORING SYSTEM WITH REDUCED NOISE | 15 |
46 | Rainer Nebosis | DE | Munich | Sep 03, 2015 / 20150248749 - METHOD AND SYSTEM FOR OPTICAL COHERENCE TOMOGRAPHY | 15 |
47 | David M. Tung | US | Livermore, CA | May 19, 2016 / 20160139060 - Surface Feature Manager | 15 |
48 | Fung Suong Ou | US | Palo Alto, CA | Jun 25, 2015 / 20150177151 - FABRICATING AN APPARATUS FOR USE IN A SENSING APPLICATION | 15 |
49 | Eric L. Buckland | US | Hickory, NC | Jul 07, 2022 / 20220215584 - Apparatus for Calibrating Retinal Imaging Systems and Related Methods | 14 |
50 | Jan Liesener | US | Middletown, CT | Apr 14, 2016 / 20160102999 - INTERFEROMETRIC ENCODER SYSTEMS | 14 |
51 | Riki Ogawa | JP | Kanagawa | Nov 19, 2015 / 20150332452 - INSPECTION METHOD, TEMPLATE SUBSTRATE, AND FOCUS OFFSET METHOD | 14 |
52 | Yoshiyuki Kuramoto | JP | Utsunomiya-Shi | Sep 10, 2015 / 20150253128 - MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND METHOD OF MANUFACTURING ARTICLE | 14 |
53 | Canon Kabushiki Kaisha | JP | Tokyo | Aug 29, 2013 / 20130223630 - COMMUNICATION APPARATUS, CONTROL METHOD THEREOF, AND STORAGE MEDIUM | 14 |
54 | Tomohiro Yamada | JP | Yokohama-Shi | Jun 15, 2017 / 20170164844 - INFORMATION OBTAINING APPARATUS, IMAGE CAPTURING APPARATUS, AND METHOD FOR OBTAINING INFORMATION | 14 |
55 | Mark E. Kuznetsov | US | Lexington, MA | Jan 28, 2016 / 20160025478 - Real Time FPGA Resampling for Swept Source Optical Coherence Tomography | 14 |
56 | Nozomu Hirokubo | JP | Fujimi | Aug 20, 2020 / 20200264425 - Optical Filter Device, Optical Module, And Electronic Apparatus | 14 |
57 | Mehdi Vaez-Iravani | US | Los Gatos, CA | Mar 31, 2022 / 20220099546 - METHOD AND APPARATUS FOR DETECTION OF PARTICLE SIZE IN A FLUID | 14 |
58 | Michael L. Myrick | US | Irmo, SC | Nov 08, 2012 / 20120279281 - THERMAL SELECTIVITY MULTIVARIATE OPTICAL COMPUTING | 14 |
59 | Peter De Groot | US | Middletown, CT | May 09, 2013 / 20130114061 - DOUBLE PASS INTERFEROMETRIC ENCODER SYSTEM | 14 |
60 | Cyrus Bamji | US | Fremont, CA | Oct 08, 2015 / 20150288955 - TIME-OF-FLIGHT PHASE-OFFSET CALIBRATION | 14 |
61 | Ulrich Wegmann | DE | Koenigsbronn | Nov 27, 2014 / 20140347654 - SYSTEM FOR MEASURING THE IMAGE QUALITY OF AN OPTICAL IMAGING SYSTEM | 14 |
62 | Shou-Shan Fan | CN | Beijing | Aug 18, 2022 / 20220260829 - METHOD FOR DESIGNING NONSYMMETRIC FREEFORM SURFACE OPTICAL SYSTEM | 14 |
63 | Martin Ossig | DE | Tamm | Jul 28, 2022 / 20220236048 - HANDHELD THREE-DIMENSIONAL COORDINATE MEASURING DEVICE OPERATIVELY COUPLED TO A MOBILE COMPUTING DEVICE | 14 |
64 | Masahiro Watanabe | JP | Yokohama | Mar 10, 2016 / 20160069816 - DEFECT DETECTION METHOD AND DEFECT DETECTION DEVICE AND DEFECT OBSERVATION DEVICE PROVIDED WITH SAME | 14 |
65 | David Ludwig | US | Irvine, CA | Jul 02, 2015 / 20150185079 - Hyper-Spectral and Hyper-Spatial Search, Track and Recognition Sensor | 14 |
66 | Hidetoshi Nishiyama | JP | Hitachinaka | Oct 17, 2013 / 20130271754 - INSPECTION APPARATUS | 13 |
67 | Eric Peter Goodwin | US | Tucson, AZ | Jan 28, 2016 / 20160025480 - INTERFEROMETRIC LEVEL SENSOR | 13 |
68 | John Maier | US | Pittsburgh, PA | Jan 16, 2014 / 20140016116 - System and method for raman-based chronic exposure detection | 13 |
69 | Walid A. Atia | US | Lexington, MA | Jul 03, 2014 / 20140185054 - System and Method for Stabilizing Mode Locked Swept Laser for OCT Medical Imaging | 13 |
70 | Xavier Colonna De Lega | US | Middlefield, CT | Feb 18, 2016 / 20160047712 - OPTICAL EVALUATION OF LENSES AND LENS MOLDS | 13 |
71 | Kla-Tencor Corporation | US | | Oct 23, 2014 / 20140313516 - Reducing Registration Error of Front and Back Wafer Surfaces Utilizing a See-Through Calibration Wafer | 13 |
72 | Lawrence B. Brown | US | Cochranville, PA | Jan 26, 2017 / 20170023352 - LASER-BASED COORDINATE MEASURING DEVICE AND LASER-BASED METHOD FOR MEASURING COORDINATES | 13 |
73 | John Fielden | US | Los Altos, CA | Aug 25, 2022 / 20220268710 - CONTINUOUS DEGENERATE ELLIPTICAL RETARDER FOR SENSITIVE PARTICLE DETECTION | 13 |
74 | Amnon Manassen | IL | Haifa | Sep 22, 2022 / 20220299308 - OVERLAY METROLOGY USING SPECTROSCOPIC PHASE | 13 |
75 | David L. Perkins | US | Irmo, SC | Nov 08, 2012 / 20120279281 - THERMAL SELECTIVITY MULTIVARIATE OPTICAL COMPUTING | 13 |
76 | Kai-Li Jiang | CN | Beijing | Oct 28, 2021 / 20210336564 - NANOFIBER ACTUATOR AND METHOD FOR MAKING THE SAME | 13 |
77 | Jingjing Li | US | Palo Alto, CA | Jul 09, 2015 / 20150192782 - OPTICAL DEVICES BASED ON NON-PERIODIC SUB-WAVELENGTH GRATINGS | 13 |
78 | Martin M. Liphardt | US | Lincoln, NE | Aug 04, 2022 / 20220244169 - Reflectometer, spectrophotometer, ellipsometer and polarimeter systems including a wavelength modifier | 12 |
79 | Bernd Schmidtke | DE | Leonberg | Jan 07, 2016 / 20160003944 - Distance Measuring Device | 12 |
80 | Moshe Finarov | IL | Rehovot | Apr 21, 2016 / 20160109225 - METHOD AND SYSTEM FOR MEASURING PATTERNED STRUCTURES | 12 |
81 | Maurits Van Der Schaar | NL | Eindhoven | Aug 18, 2022 / 20220260929 - IMPROVEMENTS IN METROLOGY TARGETS | 12 |
82 | Patrick Treado | US | Pittsburgh, PA | Oct 15, 2015 / 20150294076 - SYSTEM AND METHOD FOR SERUM BASED CANCER DETECTION | 12 |
83 | Roger Stettner | US | Santa Barbara, CA | Apr 14, 2016 / 20160103224 - AUTOMATIC RANGE CORRECTED FLASH LADAR CAMERA | 12 |
84 | Adam Wax | US | Chapel Hill, NC | Mar 05, 2015 / 20150062591 - APPARATUSES, SYSTEMS, AND METHODS FOR LOW-COHERENCE INTERFEROMETRY (LCI) | 12 |
85 | Takahiro Jingu | JP | Tokyo | Aug 20, 2020 / 20200266027 - Charged Particle Beam Device | 12 |
86 | Kevin J. Knopp | US | Newburyport, MA | Feb 05, 2015 / 20150036135 - OPTICAL SCANNING | 12 |
87 | Minoru Yoshida | JP | Yokohama | Jul 12, 2012 / 20120176602 - APPARATUS AND METHOD FOR INSPECTING PATTERN | 12 |
88 | Toshifumi Honda | JP | Tokyo | Sep 15, 2022 / 20220291140 - DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD | 12 |
89 | Joseph A. Izatt | US | Raleigh, NC | May 18, 2017 / 20170140544 - SEGMENTATION AND IDENTIFICATION OF LAYERED STRUCTURES IN IMAGES | 12 |
90 | R. Stanley Williams | US | Portola Valley, CA | Dec 27, 2018 / 20180373675 - MEMRISTOR CROSSBAR ARRAY FOR PERFORMING A FOURIER TRANSFORMATION | 12 |
91 | Takafumi Yokino | JP | Hamamatsu-Shi | Jan 14, 2021 / 20210010863 - SPECTROSCOPE | 11 |
92 | Minori Noguchi | JP | Joso | Oct 17, 2013 / 20130269126 - APPARATUS AND METHOD FOR INSPECTING DEFECT IN OBJECT SURFACE | 11 |
93 | Changhuei Yang | US | Pasadena, CA | Jun 25, 2015 / 20150173593 - ROTATIONAL SCANNING ENDOSCOPE | 11 |
94 | Akira Sano | JP | Shiojiri | Mar 24, 2016 / 20160085065 - VARIABLE WAVELENGTH INTERFERENCE FILTER, OPTICAL MODULE, AND OPTICAL ANALYSIS DEVICE | 11 |
95 | Jin U. Kang | US | Ellicott City, MD | Apr 14, 2016 / 20160100906 - INTERFEROMETRIC FORCE SENSOR FOR SURGICAL INSTRUMENTS | 11 |
96 | Alfred Feitisch | US | Los Gatos, CA | Sep 12, 2019 / 20190277691 - SPECTROMETER WITH ACTIVE BEAM STEERING | 11 |
97 | Kenji Imura | JP | Toyohashi-Shi | Dec 05, 2013 / 20130321802 - SPECTRAL CHARACTERISTIC MEASURING DEVICE, METHOD FOR CORRECTING SPECTRAL CHARACTERISTIC MEASURING DEVICE AND PROGRAM | 11 |
98 | Elizabeth A. Dakin | US | Great Falls, VA | Jul 02, 2015 / 20150185246 - Laser Doppler Velocimeter With Intelligent Optical Device | 11 |
99 | Nils P. Steffensen | US | Kennett Square, PA | Apr 02, 2015 / 20150092199 - AUTOMATIC MEASUREMENT OF DIMENSIONAL DATA WITH A LASER TRACKER | 11 |
100 | Michael G. Nygaard | US | Fenton, MI | Oct 15, 2015 / 20150290683 - HIGH SPEED METHOD AND SYSTEM FOR INSPECTING A STREAM OF PARTS AT A PAIR OF INSPECTION STATIONS | 11 |