Patent application number | Description | Published |
20090184094 | LASER ASSEMBLY WITH ELECTRONIC MASKING SYSTEM - The invention concerns a laser assembly for processing or joining work pieces by means of electromagnetic radiation, with a laser source that emits a laser beam, and an electronic masking system for the work pieces that succeeds the laser source. The masking system images the passing laser beam on the work pieces in a pattern that is randomly selectable. As masking system, a phase modulation array with preferably a common pixel size >4 μm is used, and also a laser source with a high beam quality of the laser beam that together permit the sharp imaging of patterns with a line width <2 mm on the work pieces. | 07-23-2009 |
20090304372 | ELECTRICAL RESISTANCE HEATING ELEMENT FOR A HEATING DEVICE FOR HEATING A FLOWING GASEOUS MEDIUM - An electrical resistance heating element for a heating device, with at least one flow canal through which the gaseous medium is able to flow from a canal inlet side to a canal outlet side of the resistance heating element, and with at least one heating resistor that extends essentially in the direction of the flow canal, with the medium flowing past the heating resistor and being heated in the process. The heating resistor is rod-shaped and produced from an electrically conductive ceramic material. The electrical resistance heating element is intended for installation in a heating tube into which air, for example, is blown at one end. The heated flow of air exits from the other end of the heating tube. | 12-10-2009 |
20100268372 | METHOD AND WELDING DEVICE FOR CONNECTING SHEETS OF MATERIAL - The invention relates to a method for connecting material webs disposed with overlapping edges, wherein an automatic welding machine having a driven chassis and a drive unit disposed thereon and a welding unit is guided along the overlap zone of the material webs to be connected, such that the carried welding unit connects the edges to be connected to one another. The invention further relates to an automatic welding machine for performing the method. The invention proposes that a temporary guide marking moving along with the chassis be generated along the edge of the overlapping material web by means of a marking unit disposed on the chassis, said guide marking always extending parallel to the edge and prescribing the path of the automatic welding machine on the overlapping material web and that the guide marking be detected by means of a sensor device during the movement of the automatic welding machine, wherein a control signal is generated for a display unit and/or the drive unit and the chassis is movable along the guide marking by means of the control signal. | 10-21-2010 |
Patent application number | Description | Published |
20090125263 | High Resolution Time Measurement in a FPGA - Various techniques are described for high resolution time measurement using a programmable device, such as an FPGA. The timing may be triggered by any event, depending on the applications of use. Once triggering has occurred, a START pulse begins propagating through the FPGA. The pulse is able to propagate through the FPGA in a staggered manner traversing multiple FPGA columns to maximize the amount of time delay that may be achieved while minimizing the overall array size, and thus minimizing the resource utilization, of the FPGA. The FPGA timing delay is calibrated by measuring for the linear and non-linear differences in delay time of each unit circuit forming the staggered delay line path for the timing circuit. The FPGA is able to achieve nanosecond and sub-nanosecond time resolutions and thus may be used in applications such as various time of flight systems. | 05-14-2009 |
20110255380 | High Resolution Time Measurement in a FPGA - Various techniques are described for high resolution time measurement using a programmable device, such as an FPGA. The timing may be triggered by any event, depending on the applications of use. Once triggering has occurred, a START pulse begins propagating through the FPGA. The pulse is able to propagate through the FPGA in a staggered manner traversing multiple FPGA columns to maximize the amount of time delay that may be achieved while minimizing the overall array size, and thus minimizing the resource utilization, of the FPGA. The FPGA timing delay is calibrated by measuring for the linear and non-linear differences in delay time of each unit circuit forming the staggered delay line path for the timing circuit. The FPGA is able to achieve nanosecond and sub-nanosecond time resolutions and thus may be used in applications such as various time of flight systems. | 10-20-2011 |
20120145892 | AUXILIARY FREQUENCY PARAMETRIC EXCITATION OF QUADRUPOLE MASS SPECTROMETERS - The apparatus introduces a second adjustable resonant point in a QMS at a frequency that is close to a multiple of the fundamental frequency by adjusting driving point impedance characteristics of the QMS. The apparatus measures the first and second resonant point of the QMS to account for changes in the operational characteristics of the QMS. | 06-14-2012 |