Patents - stay tuned to the technology

Inventors list

Assignees list

Classification tree browser

Top 100 Inventors

Top 100 Assignees


Yukutake

Hideaki Yukutake, Saitama JP

Patent application numberDescriptionPublished
20110213111METHOD FOR PRODUCING POLYMER NANOCOMPOSITE, AND FLAME-RETARDANT POLYMER NANOCOMPOSITE FORMED BY THE PRODUCTION METHOD - A method for producing a polymer nanocomposite, includes: after expanding an interlayer space of a layered inorganic compound using an organic onium salt, immobilizing a radical polymerization initiator having a group represented by formula (1) on an interlayer surface of the layered inorganic compound via a covalent bond; and carrying out surface-initiated radical polymerization in a monomer from the immobilized radical polymerization initiator. Preferably, in the radical polymerization initiator having the group represented by the general formula (1), at least one of X1 to X3 in the formula is a chlorine atom, or R1 in the formula is a C1-25 alkylene group or a C2-25 alkenylene group optionally interrupted by an oxygen atom or an ester group and optionally substituted by a phenyl group:09-01-2011

Hiroaki Yukutake, Kanagawa JP

Patent application numberDescriptionPublished
20140342614CONNECTOR - A connector is provided to sufficiently absorb the displacements of a plurality of connection objects with respect to a substrate even when the plurality of connection objects are connected. Two movable housings are formed by separate members that can move relative to each other, thereby absorbing the displacements of two mating connectors connected to the respective movable housings by each of the respective movable housings. This can sufficiently absorb the displacements of the mating connectors relative to a substrate.11-20-2014

Seigoh Yukutake, Hitachinaka JP

Patent application numberDescriptionPublished
20110227626LEVEL SHIFT CIRCUIT AND POWER CONVERSION UNIT - In a level shift circuit, when a power-source voltage variation dV/dt of a high voltage side occurs and influences on a logic level of a circuit, the passing through of a malfunction signal is masked and prevented in the first and second logic circuits, by a signal from a time-constant generation circuit or a portion where a power voltage variation occurs in advance, by utilizing the fact that this variation occurs both at a set side and a reset side. When the power source voltage variation dV/dt is generated at a high voltage side, sufficient allowance in the timing of this masking prevents an erroneous signal from being transmitted to a flip-flop, and a control signal is transmitted from a low voltage side circuit not giving malfunction to a high voltage side circuit, even when there is a production variation in each element in semiconductor processes.09-22-2011

Sotaro Yukutake, Bunkyo-Ku JP

Patent application numberDescriptionPublished
20130009193METHOD OF FABRICATING LIGHT RECEIVING ELEMENT AND APPARATUS FOR FABRICATING LIGHT RECEIVING ELEMENT - A method of fabricating a light receiving element includes depositing a material for one of a P-type semiconductor, an N--type semiconductor, and electrodes, while applying a reverse bias voltage and irradiating light of a desired wavelength longer than an absorption wavelength of the material. The deposition has a non-adiabatic flow of, at a portion where a local shape to enable generation of near field light is formed on a surface of the deposited material with the irradiation light, absorbing the irradiation light through a non-adiabatic process with the near field light, thereby generating electrons, and canceling generation of a local electric field based on the voltage, and a particle adsorbing flow of, at a portion where the shape is not formed, causing the portion where the local electric field is generated to sequentially adsorb particles forming the material, and shifting to the non-adiabatic flow when the shape is formed.01-10-2013

Toru Yukutake, Otsu-Shi JP

Patent application numberDescriptionPublished
20150085276METHOD FOR INSPECTING LENGTH-MEASURABLE PRODUCT, AND INSPECTION DEVICE - The method for inspecting a length-measurable product includes manufacturing the length-measurable product 03-26-2015
Website © 2015 Advameg, Inc.