Patent application number | Description | Published |
20100109099 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF - A semiconductor device including a semiconductor substrate, an interface layer formed on the semiconductor substrate including at least 1×10 | 05-06-2010 |
20120243336 | NONVOLATILE PROGRAMMABLE LOGIC SWITCH - An aspect of the present embodiment, there is provided a nonvolatile programmable logic switch including a first memory cell transistor, a second memory cell transistor, a pass transistor and a first substrate electrode applying a substrate voltage to the pass transistor, wherein a writing voltage is applied to the first wiring, a first voltage is applied to one of a second wiring and a third wiring and a second voltage which is lower than the first voltage is applied to the other of the second wiring and the third wiring, and the first substrate voltage which is higher than the second voltage and lower than the first voltage is applied to a well of the pass transistor, when data is written into the first memory cell transistor or the second memory cell transistor. | 09-27-2012 |
20130228736 | MEMORY DEVICE - According to one embodiment, a memory device includes a first electrode, a second electrode, and a variable resistance film. The variable resistance film is connected between the first electrode and the second electrode. The first electrode includes a metal contained in a matrix made of a conductive material. A cohesive energy of the metal is lower than a cohesive energy of the conductive material. A concentration of the metal at a central portion of the first electrode in a width direction thereof is higher than concentrations of the metal in two end portions of the first electrode in the width direction. | 09-05-2013 |
Patent application number | Description | Published |
20080230804 | SEMICONDUCTOR DEVICE AND FABRICATION METHOD OF SAME - A semiconductor device having an electrode with reduced electrical contact resistance even where either electrons or holes are majority carriers is disclosed. This device has an n-type diffusion layer and a p-type diffusion layer in a top surface of a semiconductor substrate. The device also has first and second metal wires patterned to overlie the n-type and p-type diffusion layers, respectively, with a dielectric layer interposed therebetween, a first contact electrode for electrical connection between the n-type diffusion layer and the first metal wire, and a second contact electrode for connection between the p-type diffusion layer and the second metal wire. The first contact electrode's portion in contact with the n-type diffusion layer and the second contact electrode's portion contacted with the p-type diffusion layer are each formed of a first conductor that contains a metal and a second conductor containing a rare earth metal. | 09-25-2008 |
20080315183 | SEMICONDUCTOR DEVICE WITH CARBON NANOTUBE CHANNEL AND MANUFACTURING METHOD THEREOF - A high-performance semiconductor device having a channel region structured from a carbon nanotube (CNT) for reducing or minimizing a drain leakage current is provided. This semiconductor device includes, in addition to the CNT-formed channel region, a gate electrode formed to overlie the channel region with a gate insulation film sandwiched therebetween, and a pair of source and drain regions interposing the channel region therebetween. The source and drain regions have portions in contact with the channel region, which portions are made of a specific semiconductor material that is wider in energy band gap than the channel region. | 12-25-2008 |
20090008726 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE - A method of manufacturing a semiconductor device reducing interface resistance of n-type and p-type MISFETs are provided. According to the method, a gate dielectric film and a gate electrode of the n-type MISFET are formed on a first semiconductor region, a gate dielectric film and a gate electrode of the p-type MISFET are formed on a second semiconductor region, an n-type diffusion layer is formed by ion implantation of As into the first semiconductor region, a first silicide layer is formed by first heat treatment after a first metal containing Ni is deposited on the n-type diffusion layer, the first silicide layer is made thicker by second heat treatment after a second metal containing Ni is deposited on the first silicide layer and second semiconductor region, and third heat treatment is provided after formation of a second silicide layer and ion implantation of B or Mg into the second silicide layer. | 01-08-2009 |
20090134388 | SEMICONDUCTOR DEVICE AND FABRICATION METHOD OF SAME - A semiconductor device having a metal insulator semiconductor field effect transistor (MISFET) with interface resistance-reduced source/drain electrodes is disclosed. This device includes a p-type MISFET formed on a semiconductor substrate. The p-MISFET has a channel region in the substrate, a gate insulating film on the channel region, a gate electrode on the gate insulating film, and a pair of laterally spaced-apart source and drain electrodes on both sides of the channel region. These source/drain electrodes are each formed of a nickel (Ni)-containing silicide layer. The p-MISFET further includes an interface layer which is formed on the substrate side of an interface between the substrate and each source/drain electrode. This interface layer contains magnesium (Mg), calcium (Ca) or barium (Ba) therein. A fabrication method of the semiconductor device is also disclosed. | 05-28-2009 |
20090152652 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE AND THE SEMICONDUCTOR DEVICE - Described herein is a method of manufacturing a semiconductor device realizing higher performance by reducing contact resistance of an electrode. In the method, a gate insulating film, a gate electrode are formed on a semiconductor substrate. A first metal is deposited substrate, and a metal semiconductor compound layer is formed on the surface of the semiconductor substrate by making the first metal and the semiconductor substrate react each other by a first heat treatment. Ions having a mass equal to or larger than atomic weight of Si are implanted into the metal semiconductor compound layer. A second metal is deposited on the metal semiconductor compound layer. An interface layer is formed by making the second metal segregated at an interface between the metal semiconductor compound layer and the semiconductor substrate by diffusing the second metal through the metal semiconductor compound layer by a second heat treatment. | 06-18-2009 |
20100051906 | SEMICONDUCTOR DEVICE - A semiconductor device for correcting an input signal and outputting a corrected signal are provided. The semiconductor device includes a semiconductor layer, a plurality of first conductors formed on one of faces of the semiconductor layer and serving as input terminals to which a signal is input, second conductors of the number larger than that of the first conductors at density higher than that of the first conductors, formed on the other face of the semiconductor layer, a high impurity concentration region provided on the semiconductor layer side of an interface between the second conductor and the semiconductor layer, an insulating layer formed on the other face, and a plurality of third conductors formed on the insulating layer and serving as output terminals for outputting the processed signal. | 03-04-2010 |
20120077341 | SEMICONDUCTOR DEVICE MANUFACTURING METHOD - In a semiconductor device manufacturing method according to an exemplary embodiment, a sulfur-containing film containing sulfur is deposited on an n-type semiconductor, a first metal film containing a first metal is deposited on the sulfur-containing film, a heat treatment is performed to form a metal semiconductor compound film by reacting the n-type semiconductor and the sulfur-containing film, and to introduce sulfur to an interface between the n-type semiconductor and the metal semiconductor compound film being formed. | 03-29-2012 |
Patent application number | Description | Published |
20120080739 | NONVOLATILE PROGRAMMABLE LOGIC SWITCH - A nonvolatile programmable logic switch according to an embodiment includes: a memory cell transistor including: a first source region and a first drain region of a second conductivity type formed at a distance from each other in a first semiconductor region of a first conductivity type; a first insulating film, a charge storage film, a second insulating film, and a control gate stacked in this order and formed on the first semiconductor region between the first source region and the first drain region; a pass transistor including: a second source region and a second drain region of a second conductivity type formed at a distance from each other in a second semiconductor region of the first conductivity type; a third insulating film, a gate electrode stacked in this order and formed on the second semiconductor region between the second source region and the second drain region, the gate electrode being electrically connected to the first drain region; and an electrode for applying a substrate bias to the first and second semiconductor regions. | 04-05-2012 |
20120117354 | STORAGE DEVICE IN WHICH FORWARDING-FUNCTION-EQUIPPED MEMORY NODES ARE MUTUALLY CONNECTED AND DATA PROCESSING METHOD - According to one embodiment, a storage device includes a plurality of memory nodes. Each of memory nodes includes a plurality of input ports, a plurality of output ports, a selector, a packet controller and a memory. The selector outputs a packet input to the input port to one of the output ports. The packet controller controls the selector. The memory stores data. The memory nodes are mutually connected at the input ports and the output ports. The memory node has an address that is determined by its physical position. The packet controller switches the output port that outputs the packet based on information including at least a destination address of the packet and an address of the memory node having the packet controller when receiving a packet that is not addressed to the memory node having the packet controller. | 05-10-2012 |
20130037776 | VARIABLE RESISTANCE MEMORY - A variable resistance memory according to an embodiment includes: a first wiring; a second wiring intersecting with the first wiring; a first electrode provided in an intersection region between the first wiring and the second wiring, the first electrode being connected to the first wiring; a second electrode connected to the second wiring, the second electrode facing to the first electrode; a variable resistance layer provided between the first electrode and the second electrode; and one of a first insulating layer and a first semiconductor layer formed at side portions of the second electrode. The one of the first insulating layer and the first semiconductor layer, and the second electrode form voids at the side portions of the second electrode. | 02-14-2013 |
20130077397 | SEMICONDUCTOR DEVICE - A semiconductor device according to an embodiment includes: a first transistor including a gate connected to a first interconnection, a first source, and a first drain, one of the first source and the first drain being connected to a second interconnection; and a second transistor including a gate structure, a second source, and a second drain, one of the second source and second drain being connected to a third interconnection and the other of the second source and second drain being connected to a fourth interconnection. The gate structure includes a gate insulation film, a gate electrode, and a threshold-modulating film provided between the gate insulation film and the gate electrode to modulate a threshold voltage, the other of the first source and first drain of the first transistor is connected to the gate electrode. | 03-28-2013 |
20150263117 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF - A semiconductor device according to an embodiment comprises: a gate insulating film formed on a semiconductor substrate; a semiconductor layer formed on the gate insulating film; and a first metal layer formed to be electrically connected to the semiconductor layer. 1×10 | 09-17-2015 |
Patent application number | Description | Published |
20120155020 | APPARATUS AND SYSTEM FOR IMPROVED THERMAL RADIATION FOR A MOBILE COMPUTING DEVICE AND CASE - Embodiments of an apparatus and system are described for a thermally radiating mobile computing device and case. An apparatus may comprise, for example, a thermally radiating case for a mobile computing device having a first portion arranged to receive the mobile computing device, a thermally conductive coupling arranged to removably couple the case to one or more internal heat generating components of the mobile computing device, and a second portion thermally coupled to the first portion and the thermally conductive coupling, the second portion comprising one or more thermally conductive materials arranged to radiate thermal energy away from the one or more heat generating components. Other embodiments are described and claimed. | 06-21-2012 |
20140092542 | ELECTRONIC DEVICE HAVING PASSIVE COOLING - An electronic device is provided that includes a base having a top portion and a bottom portion. The bottom portion may include a first bottom part and a second bottom part. The first bottom part may form a first plane, and the second bottom part may form a second plane, the second plane being non-planar with the first plane. The second bottom part may include an input opening. The top portion of the base may include an output opening. The input opening and the output opening may allow air to flow from behind the electronic device to over the base. | 04-03-2014 |
20140092544 | ELECTRONIC DEVICE HAVING PASSIVE COOLING - An electronic device is provided that includes a base having a first side and a second side, and a lid having a first side and a second side. The electronic device may also include a heat exchanger provided at the base. The heat exchanger may have a first surface exposed to outside the base. | 04-03-2014 |
20140185240 | HEAT EXCHANGER ASSEMBLY FOR ELECTRONIC DEVICE - In one embodiment a heat exchanger assembly comprises at least one heat pipe and a casing which is to receive a blower, the casing comprising a plurality of heat exchanging plates, wherein at least one of the heat exchanging plates comprises at least one tongue which is to cover a portion of an exterior surface of the at least one heat pipe. Other embodiments may be described. | 07-03-2014 |
20150245699 | APPARATUS AND METHOD FOR KEEPING MOBILE DEVICES WARM IN COLD CLIMATES - An apparatus and method for keeping mobile devices warm in cold climates are disclosed. A particular embodiment includes: a frame structure wherein a first portion of the frame structure being in proximity to the body of a user to receive body heat from the user, the frame structure including a second portion to support electronic components of the apparatus; and a thermal conduit thermally coupled between the first and second portions of the frame structure, the thermal conduit transferring body heat received at the first portion to the electronic components of the apparatus at the second portion. | 09-03-2015 |
Patent application number | Description | Published |
20130234088 | Semiconductor device - According to an embodiment, a semiconductor device includes first and second memristors. The first memristor includes a first electrode made of a first material, a second electrode made of a second material, and a first resistive switching film arranged between the first and second electrodes. The first resistive switching film is connected to both the first and second electrodes. The second memristor includes a third electrode made of a third material, a fourth electrode made of the second material, and a second resistive switching film arranged between the third and fourth electrodes. The second resistive switching film is connected to both the third and fourth electrodes. The work function of the first material is smaller than that of the second material. The work function of the third material is larger than that of the second material. | 09-12-2013 |
20130346825 | ERROR CORRECTION DEVICE, ERROR CORRECTION METHOD AND COMPUTER PROGRAM PRODUCT - According to an embodiment, an error correction device includes first calculators, second calculators, estimators, and an inverter. Each first calculator calculates a first message representing a probability that 1-bit data that is input in a corresponding variable node is 1, Each second calculator calculates a second message representing a probability that a value of the data input to the variable node is 1 for each of two or more variable nodes connected to the check node by using the first, messages of the variable nodes connected to the check node. Each estimator estimates a true value of the data input to the variable node to generate an estimated value by using the first and second messages. The inverter inverts the estimated value associated with at least one of the variable nodes with a probability higher than 0 and lower than 1. | 12-26-2013 |
20140025865 | SEMICONDUCTOR MEMORY DEVICE - According to an embodiment, a semiconductor memory device includes a controller and a second storage unit. The controller is configured to control a write process of writing data into a first storage unit in which data supplied from a host device are stored or a read process of reading the data stored in the first storage in response to a request from the host device. The second storage unit is temporarily used in the write process or the read process. The second storage unit includes a nonvolatile third storage unit having an area for storing a duplicate of the data to be written by the write process; and a nonvolatile fourth storage unit having a work area for the write process or the read process and having a higher read/write speed than the third storage unit. | 01-23-2014 |
Patent application number | Description | Published |
20130250656 | RESISTANCE-VARIABLE MEMORY DEVICE - A memory device includes a first electrode, a second electrode, a third electrode, a first variable resistance layer between the first electrode and the third electrode, and a second variable resistance layer between the second electrode and the third electrode. The first, second, and third electrodes, and the first and second variable resistance layers are formed of materials that cause the first variable resistance layer to transition from a high resistance state to a low resistance state when a voltage is applied across the first and second electrodes and maintain the high resistance state when the voltage is cut off, and cause the second variable resistance layer to transition from a high resistance state to a low resistance state when the voltage is applied across the first and second electrodes and transition from the high resistance state to the low resistance state when the voltage is cut off. | 09-26-2013 |
20140070160 | NONVOLATILE MEMORY DEVICE - According to one embodiment, a nonvolatile memory device includes a first electrode, a second electrode, a variable resistance layer. The variable resistance layer is provided between the first electrode and the second electrode. The variable resistance layer contains impurity of a nonmetallic element. The impurity is at least one selected from the group consisting of S, Se, Te, F, Cl, Br, and I. | 03-13-2014 |
Patent application number | Description | Published |
20160085626 | DECODING DEVICE, DECODING METHOD, AND MEMORY SYSTEM - According to an embodiment, a decoding device includes a check node processor, and a converter. The probability acquirer is configured to acquire. The check node processor is configured to perform check node processing during in a decoding operation of encoded data. A probability value for each bit of the encoded data is treated as an initial variable node in the check node processing. The converter is configured to convert, into bit values, updated values of the probability values based on the check node processing. The check node processor includes a check node circuit having a topology corresponding to a two-state trellis diagram representing the check node processing. The check node circuit includes conducting wires each corresponding to an edge of the two-state trellis diagram and includes switch units which are arranged on the conducting wires and switching of which is controlled according to a predetermined probability. | 03-24-2016 |
20160085627 | Memory System, Error Correction Device, and Error Correction Method - According to an embodiment, a memory system includes a memory and a computation unit. Into the memory, data are written. The memory stores therein multiple check matrices. Each of the check matrices is associated with the number of errors in the written data. The computation unit is configured to perform a first error correction on the written data by selectively using, from among the check matrices, a check matrix associated with the number of errors recognized in the written data. | 03-24-2016 |