Patent application number | Description | Published |
20120254699 | DYNAMIC READ CHANNEL CALIBRATION FOR NON-VOLATILE MEMORY DEVICES - Embodiments of the invention describe a dynamic read reference voltage for use in reading data from non-volatile memory cells. In embodiments of the invention, the read reference voltage is calibrated as the non-volatile memory device is used. Embodiments of the invention may comprise of logic and or modules to read data from a plurality of non-volatile memory cells using a first read reference voltage level (e.g., an initial read reference voltage level whose value is determined by the non-volatile device manufacturer). An Error Checking and Correction (ECC) algorithm is performed to identify whether errors exist in the data as read using the first read reference voltage level. If errors in the data as read are identified, a pre-determined value is retrieved to adjust the first read reference voltage level to a second read reference voltage level. | 10-04-2012 |
20130343129 | EXTENDED SELECT GATE LIFETIME - A memory device may include two or more memory cells in an integrated circuit, at least one flash cell acting as a select gate coupled to the two or more memory cells, and an interface to accept a select gate erase command and a select gate program command during normal operation of the integrated circuit. The integrated circuit may be capable to perform operations to erase the at least one select gate in response to the select gate erase command, and program the at least one select gate in response to the select gate program command. | 12-26-2013 |
20140006847 | Defect Management in Memory Systems | 01-02-2014 |
20140047302 | CYCLING ENDURANCE EXTENDING FOR MEMORY CELLS OF A NON-VOLATILE MEMORY ARRAY - Examples are disclosed for cycling endurance extending for memory cells of a non-volatile memory array. The examples include implementing one or more endurance extending schemes based on program/erase cycle counts or a failure trigger. The one or more endurance extending schemes may include a gradual read window expansion, a gradual read window shift, an erase blank check algorithm, a dynamic soft-program or a dynamic pre-program. | 02-13-2014 |
20140164872 | ERROR CORRECTED PRE-READ FOR UPPER PAGE WRITE IN A MULTI-LEVEL CELL MEMORY - Methods, apparatuses and articles of manufacture may receive a first page of data and correct one or more errors in the first page of data to generate a page of corrected data. A program command may then be sent with a second page of data and the page of corrected data, to program a page of memory to store the second page of data. | 06-12-2014 |
20140173174 | LOWER PAGE READ FOR MULTI-LEVEL CELL MEMORY - An electronic memory or controller may use a first type of read command, addressed to a first page of memory of an electronic memory that includes information to indicate that a second page of memory of the electronic memory has not been programmed and a second type of read command, addressed to the first page of memory, that includes information to indicate that the second page of memory has been programmed. The first page of memory may include a lower page of a multi-level cell (MLC), and the second page of memory may include an upper page of the same MLC. The second page of memory is enabled during a period of time that the first type of read command is used. | 06-19-2014 |
20140281813 | DATA INTEGRITY MANAGEMENT IN MEMORY SYSTEMS - Data management logic allocates a portion such as a single plane of a respective multi-plane non-volatile memory device to store parity information for corresponding data striped across multiple planes of multiple non-volatile memory devices. According to one configuration, the data management logic as discussed herein generates parity data based on (a data stripe of) non-parity data stored in multiple planes of multiple different memory devices. The data management logic stores the parity data in the storage plane allocated to store the parity information. Additional configurations include: reserving a parity block amongst multiple non-parity data blocks to store parity data and reserving a parity page amongst multiple non-parity data pages to store parity data. | 09-18-2014 |
20150026386 | Erase Management in Memory Systems - Computer processor hardware receives notification that data stored in a region of storage cells in a non-volatile memory system stores invalid data. In response to the notification, the computer processor hardware marks the region as storing invalid data. The computer processor hardware controls the magnitude of erase dwell time (i.e., the amount of time that one or more cells are set to an erased state) associated with overwriting of the invalid data in the storage cells with replacement data. For example, to re-program respective storage cells, the data manager must erase the storage cells and then program the storage cells with replacement data. The data management logic can control the erase dwell time to be less than a threshold time value to enhance a life of the non-volatile memory system. | 01-22-2015 |
20150078088 | EXTENDED SELECT GATE LIFETIME - A flash memory device may include two or more flash memory cells organized as a NAND string in a block of flash memory cells, and flash cells, coupled to the NAND string at opposite ends, to function as select gates. The flash memory device may be capable of providing information related to a voltage threshold of the select gates to a flash controller, erasing the flash cells that function as select gates in response to a select gate erase command, and programming the flash cells that function as select gates in response to a select gate program command. A flash controller may be coupled to the flash memory device, and is capable of sending the select gate erase commend to the flash memory device if the information provided by the flash memory device indicates that the voltage threshold of at least one of the select gates is above a predetermined voltage level, and sending the select gate program command to the flash memory device if the information provided by the flash memory device indicates that the voltage threshold of at least one of the select gates is outside of a predetermined voltage range. | 03-19-2015 |