Patent application number | Description | Published |
20080206908 | Semiconductor device test structures and methods - Semiconductor device test structures and methods are disclosed. In a preferred embodiment, a test structure includes a feed line, a stress line disposed proximate the feed line, and a conductive feature disposed between the stress line and the feed line. The test structure includes a temperature adjuster proximate at least the conductive feature, and at least one feedback device coupled to the temperature adjuster and at least the conductive feature. | 08-28-2008 |
20110042671 | Semiconductor Device Test Structures and Methods - Semiconductor device test structures and methods are disclosed. In a preferred embodiment, a test structure includes a feed line, a stress line disposed proximate the feed line, and a conductive feature disposed between the stress line and the feed line. The test structure includes a temperature adjuster proximate at least the conductive feature, and at least one feedback device coupled to the temperature adjuster and at least the conductive feature. | 02-24-2011 |
20110062442 | Semiconductor Device Test Structures and Methods - Semiconductor device test structures and methods are disclosed. In a preferred embodiment, a test structure includes a feed line disposed in a first conductive material layer, and a stress line disposed in the first conductive material layer proximate the feed line yet spaced apart from the feed line. The stress line is coupled to the feed line by a conductive feature disposed in at least one second conductive material layer proximate the first conductive material layer. | 03-17-2011 |
20130026601 | Semiconductor Device and Method for Manufacturing a Semiconductor - A semiconductor device comprises a semiconductor substrate, an anorganic isolation layer on the semiconductor substrate and a metallization layer on the anorganic isolation layer. The metallization layer comprises a fuse structure. At least in an area of the fuse structure the metallization layer and the anorganic isolation layer have a common interface. | 01-31-2013 |
20140097864 | Semiconductor Device Test Structures and Methods - Semiconductor device test structures and methods are disclosed. In a preferred embodiment, a test structure includes a feed line disposed in a first conductive material layer, and a stress line disposed in the first conductive material layer proximate the feed line yet spaced apart from the feed line. The stress line is coupled to the feed line by a conductive feature disposed in at least one second conductive material layer proximate the first conductive material layer. | 04-10-2014 |
20140127895 | Semiconductor Device Comprising a Fuse Structure and a Method for Manufacturing such Semiconductor Device - A semiconductor device comprises a semiconductor substrate, an anorganic isolation layer on the semiconductor substrate and a metallization layer on the anorganic isolation layer. The metallization layer comprises a fuse structure. At least in an area of the fuse structure the metallization layer and the anorganic isolation layer have a common interface. | 05-08-2014 |
Patent application number | Description | Published |
20110138337 | LEVEL BASED DATA SUPPLY FOR REUSABLE INTERFACE COMPONENTS - A system and method for handling reusable graphical components in a dynamic environment. A configuration is buffered in a computer system. An object corresponding to a graphical component is instantiated and assigned a level within the graphical hierarchy. The object is configured based on its location in the hierarchy from the buffered configuration. The object reads its parent identifier from a level buffer based solely on its assigned level and writes its object identifier into the level buffer in association with its assigned level. | 06-09-2011 |
20130041880 | METHOD AND SYSTEM FOR GENERIC ENTERPRISE SEARCH ADAPTER QUERIES - According to some embodiments, a method and system provides receiving a request to execute a query for a business object (BO) instance for an application, the request including selection criteria; determining whether to execute the query by the application or a separate search engine, the determining based on metadata associated with the BO instance; sending the selection criteria to the search engine to execute the query in response to the determination that the query is to be executed by the search engine; receiving a result of the query execution from the search engine; and providing an output of the query result. | 02-14-2013 |
20130117710 | System and Method of Viewing Updating for Planning Item Assemblies - A system and method of displaying item lists and item views for a product assembly process. The method includes storing item data and visualization data, displaying the item data, receiving a first user input that selects a subset of the item data, receiving a second user input that selects a viewing mode, and, in response to a third user input, reading a subset of the visualization data that corresponds to the first user input and displaying the subset of the visualization data according to the viewing mode. In this manner, downloading time and display processing time is saved as compared to other systems. | 05-09-2013 |
20140033232 | FUNCTION EXECUTION FRAMEWORK DESCRIBE FUNCTIONALITY - A framework can provide describe definitions for use cases. The framework can comprise a controller layer, a wrapper layer, and a function layer. The controller layer can be configured to receive describe requests and return describe results. The wrapper layer can be configured to call describe methods of functions that implement the use cases. The function layer can comprise functions that implement the use cases. A function execution request can be received, a customized function execution sequence can be determined for the function execution request, the customized function execution sequence can be executed, and results of the execution can be returned. The customized function execution sequence can comprise an indication of execution order for a plurality of functions. | 01-30-2014 |
20140033233 | FUNCTION EXECUTION FRAMEWORK WRAPPER LAYER - A framework can provide function execution services. The framework can comprise a controller layer, a wrapper layer, and a function layer. The controller layer can be configured to process function definition requests and function execution requests, and return results. The wrapper layer can be configured to query the function layer to determine function definitions and pass function execution requests and results with the function layer. The function layer can comprise functions and/or features. A function execution request can be performed by determining a step execution sequence, executing the step execution sequence, and returning results of the execution of the step execution sequence. The step execution sequence can comprise setup steps, execute steps, and/or finalize steps. | 01-30-2014 |
20140040320 | COMPONENT FOR MASS CHANGE OF DATA - Tools and techniques for performing a mass change to data are described. Attribute values in a data set can be replaced or overwritten based on a user request. The user request can be based on user selections and inputs made via a user interface. The user can limit the attribute values that are replaced based on attribute, attribute value, and/or other designation. The user interface can facilitate user execution of the mass change by presenting lists of attribute values and/or attributes to the user for selection. The list of attribute values can be limited based on a user designation of data elements for mass change. A mass change component can be configured to control directly or indirectly the user interface or portions thereof. The mass change component can initiate the mass change of the data, based on the user selections and inputs. | 02-06-2014 |