Patent application number | Description | Published |
20080296751 | Semiconductor package - A semiconductor package is revealed, primarily comprising a substrate, a chip disposed on the substrate, and an encapsulant to encapsulate the chip. The substrate has a plurality of dimples formed in its top surface thereof without penetrating through the substrate and located at a non-wiring region outside a chip mounting region. Therefore, without changing the appearance of the semiconductor package, the diffusion path of moisture and the adhesive strength between the encapsulant and the substrate can be increased to achieve functions of anti-humidity and anti-delamination. | 12-04-2008 |
20090039490 | Mounting assembly of semiconductor packages prevent soldering defects caused by substrate warpage - A mounting assembly of semiconductor packages is revealed, primarily comprising at least a semiconductor package having a plurality of external terminals, a package carrier, and solder paste. The solder paste joints the external terminals to the package carrier. According to the distance to a central line on a substrate of the semiconductor package, the external terminals are divided into at least two different groups. In one of the embodiment, different groups of the external terminals are bumps with non-equal heights to achieve a uniform standoff plane to compensate the warpage of the substrate. The predicted substrate warpage can be compensated without causing any soldering defects. In another embodiment, a plurality of compensating bumps are selectively disposed on one group of the external terminals with larger stacking gaps. | 02-12-2009 |
20090045523 | Semiconductor package-on-package (POP) device avoiding crack at solder joints of micro contacts during package stacking - A stacked semiconductor device primarily comprises semiconductor packages with a plurality of micro contacts and solder paste to soldering the micro contacts. Each semiconductor package comprises a substrate and a chip disposed on the substrate. The micro contacts of the bottom semiconductor package are a plurality of top bumps located on the upper surface of the substrate. The micro contacts of the top semiconductor package are a plurality of bottom bumps located on the lower surface of the substrate. The bottom bumps are aligned with the top bumps and are electrically connected each other by the solder paste. Therefore, the top bumps and the bottom bumps have the same soldering shapes and dimensions for evenly soldering to avoid breakages of the micro bumps during stacking. | 02-19-2009 |
20090091026 | Stackable semiconductor package having plural pillars per pad - A stackable semiconductor package is revealed, primarily comprising a chip carrier, a chip, and a plurality of bottom bump sets. The chip carrier has a plurality of stacking pads disposed on the top surface and a plurality of bump pads on the bottom surface. The chip is disposed on and electrically connected to the chip carrier. The bottom bump sets are disposed on the corresponding bump pads and each consists of a plurality of conductive pillars. Solder-filling gaps are formed between the adjacent conductive pillars for filling and holding solder paste so that the soldering area can be increase and the anchoring effect can be enhanced due to complicated the soldering interfaces to achieve higher soldering reliability and less cracks at the soldering interfaces. | 04-09-2009 |
20090127678 | Stacked assembly of semiconductor packages with fastening lead-cut ends of leadframe - A stacked assembly of semiconductor packages primarily comprises a plurality of stacked semiconductor packages. Each semiconductor package includes an encapsulant, at least a chip, and a plurality of external leads of a leadframe, where the external leads are exposed and extended from a plurality of sides of the encapsulant. Each external lead of an upper semiconductor package has a U-shaped cut end when package singulation. The U-shaped cut ends are configured for locking to the soldered portion of a corresponding external lead of a lower semiconductor package where the U-shaped cut ends and the soldered portions by soldering materials. Therefore, the stacked assembly has a larger soldering area and stronger lead reliability to enhance the soldering points to against the effects of impacts, thermal shocks, and thermal cycles. | 05-21-2009 |
20090127687 | POP (package-on-package) semiconductor device - A semiconductor device having package-on-package (POP) configuration, primarily comprises a plurality of vertically stacked semiconductor packages and a plurality of electrical connecting components such as solder paste to electrically connect the external terminals of the semiconductor packages such as external leads of leadframes. Each semiconductor package has an encapsulant to encapsulate at least a chip where the encapsulant is movable with respect to the electrical connecting components to absorb the stresses between the vertically stacked semiconductor packages. In one embodiment, a stress-releasing layer is interposed between the vertically stacked semiconductor packages. | 05-21-2009 |
20090278256 | SEMICONDUCTOR PACKAGE ENHANCING VARIATION OF MOVABILITY AT BALL TERMINALS - A semiconductor package with enhanced mobility of ball terminals is revealed. A chip is attached to the substrate by a die-attaching material where the substrate has at least a stepwise depression on the covered surface to make the substrate thickness be stepwise decreased from a central line of the die-attaching area toward two opposing sides of the substrate. The die-attaching material is filled in the stepwise depression. Therefore, the thickness of the die-attaching material under cross-sectional corner(s) of the chip becomes thicker so that a row of the ball terminals away from the central line of the die-attaching area can have greater mobility without changing the appearance, dimensions, thicknesses of the semiconductor package, nor the placing plane of the ball terminals. Accordingly, the row of ball terminals located adjacent the edges or corners of the semiconductor package can withstand larger stresses without ball cracks nor ball drop. The stepwise depression can accommodate the die-attaching material to control bleeding contaminations. | 11-12-2009 |
20090302441 | COL (CHIP-ON-LEAD) MULTI-CHIP PACKAGE - A Chip-On-Lead (COL) multi-chip package is revealed, primarily comprising a plurality of leads, a first chip disposed on the first leads, one or more second chips stacked on the first chip, and an encapsulant. The leads have a plurality of internal leads encapsulated inside the encapsulant where the internal leads are fully formed on a downset plane toward and parallel to a bottom surface of the encapsulant. The height between the internal leads to a top surface of the encapsulant is three times or more greater than the height between the internal leads and the bottom surface. Since the number and the thickness of the second chips is under controlled, tile thickness between the top surface of the encapsulant and the most adjacent one of the second chips is about the same as the one between the internal leads and the bottom surface of the encapsulant. Therefore, the internal leads of the leads without downset bends in the encapsulant can balance the upper and lower mold flows and carry more chips without shifting nor tilting. | 12-10-2009 |
20100122454 | METHOD FOR FORMING AN ISOLATED INNER LEAD FROM A LEADFRAME - A method for forming an isolated inner lead from a leadframe is revealed. The leadframe primarily comprises a plurality of leads, the isolated inner lead, and an external lead. Each lead has an inner portion having a finger. The isolated inner lead having two fingers is completely formed inside a molding area and is made of the same metal leadframe as the leads. One finger of the isolated inner lead and the fingers of the leads are linearly arranged. The other finger of the isolated inner lead is adjacent to a finger of the external lead. At least one of the inner portions divides the isolated inner lead from the external lead. The isolated inner lead is integrally connected to an adjacent one of the inner portions by a connecting block. A tape-attaching step is performed to mechanically connect the isolated inner lead where two insulating tapes are attached in a manner that the connecting block can be removed. Therefore, the isolated inner lead is electrically isolated from the leads and can be mechanically fixed to replace extra redistributing components during semiconductor packaging processes. | 05-20-2010 |
20100261315 | WAFER LEVEL PACKAGING METHOD - A wafer level packaging method is revealed. Firstly, a wafer with a plurality of bumps disposed on a surface is provided. Placing a dielectric tape on a mold plate is followed. Then, the wafer is laminated with the mold plate to make the dielectric tape be compliantly bonded to the surface of the wafer and to make the bumps be embedded in the dielectric tape. After removing the mold plate, flattening the dielectric tape to form a plurality of exposed surfaces of the bumps wherein the exposed surfaces and the flattened surface of the dielectric tape are coplanar. Therefore, the exposed surfaces of the bumps can be regarded as effective alignment points for easy pattern recognition of the wafer level packaged wafers during singulation process. | 10-14-2010 |
20110133324 | MULTI-CHIP STACKED PACKAGE AND ITS MOTHER CHIP TO SAVE INTERPOSER - A multi-chip stacked package and its mother chip to save an interposer are revealed. The mother chip is a two-layer structure consisting of a semiconductor layer and an organic layer where a redistribution layer is embedded into the organic layer with a plurality of first terminals and a plurality of second terminals disposed on the redistribution layer and exposed from the organic layer. The mother chip is flip-chip mounted on the substrate. The active surface of the daughter chip is in contact with the organic layer with the bonding pads of the daughter chip bonded to the first terminals. Furthermore, a plurality of electrically connecting components electrically connect the second terminals to the substrate. In the multi-chip stacked package, the interposer can be eliminated with a thinner overall package thickness as well as controlled package warpage. | 06-09-2011 |
20110169157 | SUBSTRATE AND FLIP CHIP PACKAGE WITH GRADATIONAL PAD PITCHES - A flip-chip packaging substrate with gradational pad pitches for flip-chip jointing a bumped chip and a flip chip package utilizing the substrate are revealed. A plurality of connecting pads with non-equal pitches are disposed in an array on the substrate for jointing a plurality of equal-pitch bumps of a bumped chip. The pitches of the connecting pads are numbered according to the distance from a central line through a defined central point. When the defined pitch numbers increase by one, a substrate CTE compensation value is subtracted from the distance from the corresponding connecting pads to the center point so that the connecting pads are able to accurately align to the equal-pitch bumps during reflowing processes. Therefore, the expansion distance from the connecting pads of the substrate to the central point is equal to the expansion distance from the bumps of the bumped chip to the central point to avoid alignment shift between the bumps and the corresponding connecting pads due to CTE mismatch. | 07-14-2011 |