Patent application number | Description | Published |
20120230143 | STATIC MEMORY WITH SEGMENTED CLEAR - Described embodiments provide a static memory system with multiple memory cell that, in response to a reset signal, simultaneously resets or clears a segment of the memory cells in the memory. Clearing the entire memory or a portion thereof is accomplished by sequencing though a subset of address bits while asserting the reset signal. | 09-13-2012 |
20130322190 | Memory Device Having Control Circuitry for Write Tracking Using Feedback-Based Controller - A memory device includes a memory array comprising a plurality of memory cells, and control circuitry coupled to the memory array. The control circuitry comprises at least one dummy memory cell, a feedback-based controller having inputs coupled to respective internal nodes of the dummy memory cell, and write signal generation circuitry coupled to the feedback-based controller and configured to provide one or more write signals for controlling writing of data to portions of the memory array. The feedback-based controller generates a reset signal for application to a reset input of the write signal generation circuitry at least in part as a function of a logic level transition delay of a selected one of the first and second internal nodes of the dummy memory cell. | 12-05-2013 |
20130322193 | MEMORY HAVING SELF-TIMED EDGE-DETECTION WRITE TRACKING - A memory includes a self-timed column imitating a bitline loading, a self-timed row imitating a self-timed word-line, a self-timed bitcell performing a dummy write in a write cycle, a writer driver coupled to the self-timed bitcell for an actual write, and an edge detection circuit coupled to the self-timed bitcell for tracking a write cycle time. | 12-05-2013 |
20140071783 | MEMORY DEVICE WITH CLOCK GENERATION BASED ON SEGMENTED ADDRESS CHANGE DETECTION - A memory device comprises a memory array and associated control circuitry. The control circuitry comprises a clock generator configured to generate a clock signal for controlling timing of at least one of a read operation and a write operation directed to the memory array. The clock generator comprises a plurality of sets of address change detection circuits. The sets are configured to generate respective output signals as a function of respective subsets of address bits of an address signal identifying an address in the memory array. The clock generator further comprises logic circuitry coupled to the sets of address change detection circuits and configured to receive the respective output signals therefrom and to generate the clock signal as a function of said output signals. | 03-13-2014 |
20140185366 | PRE-CHARGE TRACKING OF GLOBAL READ LINES IN HIGH SPEED SRAM - In embodiments of the invention, a memory circuit includes a static random access memory (SRAM), rows of M sense amplifiers, a global read precharge tracking control circuit controlling a precharge of global read lines, a sense amplifier output tracking circuit generating a reset sense amplifier signal for the sense amplifier control circuits, and a read delay circuit generating a trigger signal for the global read precharge tracking control circuit and the sense amplifier output tracking circuit and performing a fixed delay tracking of a read operation in a read cycle. A dummy global read line is coupled to the global read precharge tracking control circuit and returns from a half way to the top of the SRAM forming a tracking dummy global read line that determines a completion of the precharge of the global read lines before the sense amplifiers start discharging the global read lines in the read cycle. | 07-03-2014 |
20140204660 | MEMORY HAVING SENSE AMPLIFIER FOR OUTPUT TRACKING BY CONTROLLED FEEDBACK LATCH - In described embodiments, a memory circuit includes a static random access memory (SRAM) including N banks of memory cells, rows of M sense amplifiers, a controlled feedback latch storing a previous state of input data in a read cycle, a pull down select block coupled to the controlled feedback latch and the dummy sense amplifier, a dummy output latch coupled to the pull-down select block to store the read data, and a SRAM reset generation circuit coupled to the sense amplifier control circuits and the controlled feedback latch. The dummy output latch is a latch that is the same as a sense amplifier latch used in the local input/output circuit, thereby, no margin is involved between a reset of the sense amplifiers and the read data latched at the dummy output latch in the read cycle. | 07-24-2014 |
20140241028 | TWO-BIT READ-ONLY MEMORY CELL - A read-only memory (ROM) cell has first and second transistors connected in series between a true bit line and a voltage reference (e.g., ground), and third and fourth transistors connected in series between a complement bit line and the voltage reference. The gates of the first and third transistors are connected to a first word line, and the gates of the second and fourth transistors are connected to a second word line. The ROM cell is programmed to store any possible combination of two bits of information by appropriately (i) connecting the node between the first and second transistors to either the true bit line, the complement bit line, or the voltage reference and (ii) connecting the node between the third and fourth transistors to either the true bit line, the complement bit line, or the voltage reference. | 08-28-2014 |
20160064054 | Double Pumped Memory Techniques - A memory device and method of operating a memory device are provided. The memory device comprises global control circuitry configured to receive a clock signal for the memory device and the memory device is configured to perform a double memory access in response to a single edge of the clock signal. A first internal clock pulse for a first access of the double memory access and a second internal clock pulse for a second access of the double memory access are generated in response to the single edge of the clock signal. The global control circuitry generates a comparison signal in dependence on a comparison between a first bank indicated by the first access and a second bank indicated by the second access, and local bank control circuitry of the second bank is configured to generate the second internal clock pulse in dependence on the comparison signal. | 03-03-2016 |