Patent application number | Description | Published |
20090195343 | Planar inductor - A planar inductor ( | 08-06-2009 |
20100224958 | RF-IC PACKAGING METHOD AND CIRCUITS OBTAINED THEREBY - Typically, chips nowadays comprise a number of circuits as well as a number of inductors, often RF-inductors. These IC inductors are essential to realize the voltage controlled oscillators needed in the many fully integrated transceiver chips, serving a multitude of wireless communication protocols, that are provided to the market today. The present invention relates to an RF-IC packaging method, which virtually eliminates the long-range electromagnetic crosstalk between inductors and transmission lines of different parts of the circuitry. | 09-09-2010 |
20110006872 | MAGNETIC SHIELD LAYOUT, SEMICONDUCTOR DEVICE AND APPLICATION - Magnetic shield layout ( | 01-13-2011 |
20110024835 | HIGH FREQUENCY FIELD-EFFECT TRANSISTOR - The invention relates to a field-effect transistor having a higher efficiency than the known field-effect transistors, in particular at higher operating frequencies. This is achieved by electrically connecting sources of a plurality of main current paths by means of a strap line (SL) being inductively coupled to a gate line (Gtl) and/or a drain line (Drnl) for forming an additional RF-return current path parallel to the RF-return current path in a semiconductor body (SB). The invention further relates to a field-effect transistor package, a power amplifier, a multi-stage power amplifier and a base station comprising such a field-effect transistor. | 02-03-2011 |
20110050383 | PLANAR INDUCTIVE UNIT AND AN ELECTRONIC DEVICE COMPRISING A PLANAR INDUCTIVE UNIT - A planar inductive unit having at least one operating frequency is provided. The inductive unit comprises at least one inductor winding ( | 03-03-2011 |
20110128111 | PLANAR, MONOLITHICALLY INTEGRATED COIL - The present invention provides a means to integrate planar coils on silicon, while providing a high inductance. This high inductance is achieved through a special back- and front sided shielding of a material. In many applications, high-value inductors are a necessity. In particular, this holds for applications in power management. In these applications, the inductors are at least 5 of the order of 1 μH, and must have an equivalent series resistance of less than 0.1 Ω. For this reason, those inductors are always bulky components, of a typical size of 2×2×1 mm 3, which make a fully integrated solution impossible. On the other hand, integrated inductors, which can monolithically be integrated, do exist. However, these inductors suffer either from low inductance values, or 10 very-high DC resistance values. | 06-02-2011 |
20110148558 | INDUCTOR - An inductor includes a conductive track forming at least three inductor turns. The conductive track has a plurality of track sections. The inductor also includes at least two groups of crossing points, each crossing point comprising a location at which the conductive track crosses over itself. The crossing points of each group collectively reverse the order of at least some of the track sections in the inductor, such that inner track sections of the conductive track cross over to become respective outer track sections, and such that outer track sections of the conductive track cross over to become respective inner track sections. | 06-23-2011 |
20110151803 | Fringe Capacitor Circuit - Capacitive circuits are implemented with desirable quality factors in various implementations. According to an example embodiment, a fringe capacitor includes two capacitive circuits (e.g., plates), respectively having a plurality of capacitive fingers extending from an end structure, and respectively having a connecting pin that is adjacent the connecting pin of the other capacitive circuit, on a common side fringe capacitor. The capacitive fingers are arranged in stacked layers, with vias connecting the fingers in different layers back to the connecting pins. | 06-23-2011 |
20120044034 | SYMMETRICAL INDUCTOR - A symmetrical inductor having at least one inductor turn. Each inductor turn has a plurality of separate conductive paths having substantially equal inductance. The inductor also comprises a plurality of crossing points. At each crossing point, some of the conductive paths within a given inductor turn cross over each other to change the order in which they appear within the inductor turn. | 02-23-2012 |
20120132969 | COMPENSATION NETWORK FOR RF TRANSISTOR - A compensation network for a radiofrequency transistor is disclosed. The compensation network comprises first and second bonding bars for coupling to a first terminal of the RF transistor and a compensation capacitor respectively; one or more bond wires coupling the first and second bonding bars together; and a compensation capacitor formed from a first set of conductive elements coupled to the second bonding bar, the first set of conductive elements interdigitating with a second set of conductive elements coupled to a second terminal of the RF transistor. | 05-31-2012 |
20130321116 | INTEGRATED CIRCUIT BASED TRANSFORMER - An integrated circuit based transformer, comprising: a primary winding located in a winding layer, the primary winding having two primary terminals at a first side of the transformer; a secondary winding located in a winding layer, the secondary winding having two secondary terminals at a second side of the transformer, the first and second sides located at different sides of the transformer; and a reference bar located in a reference bar layer, the reference bar having a primary reference bar terminal at the first side of the transformer, and having a secondary reference bar terminal at the second side of the transformer. The reference bar is configured to provide a direct electrical connection between the first reference bar terminal and the second reference bar terminal. | 12-05-2013 |
Patent application number | Description | Published |
20090200464 | TEM WITH ABERRATION CORRECTOR AND PHASE PLATE - The invention relates to a TEM with a corrector ( | 08-13-2009 |
20090302217 | Hybrid Phase Plate - The invention relates to a hybrid phase plate for use in a TEM. The phase plate according to the invention resembles a Boersch phase plate in which a Zernike phase plate is mounted. As a result the phase plate according to the invention resembles a Boersch phase plate for electrons scattered to such an extent that they pass outside the central structure ( | 12-10-2009 |
20100072366 | METHOD FOR CORRECTING DISTORTIONS IN A PARTICLE-OPTICAL APPARATUS - The invention relates to a method for correcting distortions introduced by the projection system ( | 03-25-2010 |
20110278451 | Simultaneous Electron Detection - The invention provides multiple detectors that detect electrons that have passed through a sample. The detectors preferably detect electrons after the electrons have been passed through a prism that separates electrons according to their energies. Electrons in different energy ranges are then detected by different detectors, with preferably at least one of the detectors measuring the energy lost by the electrons as they pass through the sample. One embodiment of the invention provides EELS on core-loss electrons while simultaneously providing a bright-field STEM signal from low-loss electrons. | 11-17-2011 |
20110315876 | Blocking Member for Use in the Diffraction Plane of a TEM - The invention relates to a blocking member to be placed in the diffraction plane of a TEM. It resembles the knife edge used for single sideband imaging, but blocks only electrons deflected over a small angle. As a result the Contrast Transfer Function of the TEM according to this invention will equal that of a single sideband microscope at low frequencies and that of a normal microscope for high frequencies. Preferable the highest frequency blocked by the blocking member is such that a microscope without the blocking member would show a CTF of 0.5. | 12-29-2011 |
20120012747 | Contrast for Scanning Confocal Electron Microscope - A scanning confocal transmission electron microscope includes a descan deflector and a corrector below the sample. The microscope uses a detector that is preferably significantly larger than the resolution of the microscope and is positioned in the real image plane, which provides improved contrast, particularly for light elements. | 01-19-2012 |
20120199756 | Method for Centering an Optical Element in a TEM Comprising a Contrast Enhancing Element - A method for adjusting or aligning one or more optical elements in a Transmission Electron Microscope (TEM) is disclosed. The TEM is equipped with an objective lens for guiding a beam of electrons to a sample, a diffraction plane in which at least a beam of unscattered electrons is focused and a structure to enhance the Contrast Transfer Function (CTF) which is situated in the diffraction plane or an image thereof. | 08-09-2012 |
20130062520 | Distortion Free Stigmation of a TEM - A charged particle apparatus is equipped with a third stigmator positioned between the objective lens and a detector system, as a result of which a third degree of freedom is created for reducing the linear distortion. | 03-14-2013 |
20140007307 | METHOD OF PREPARING AND IMAGING A LAMELLA IN A PARTICLE-OPTICAL APPARATUS | 01-02-2014 |
20140061464 | Method of Investigating and Correcting Aberrations in a Charged-Particle Lens System - A system of investigating aberrations in a charged-particle lens system, which lens system has an object space comprising an object plane and an image space comprising an image plane, includes:
| 03-06-2014 |
20150041647 | METHOD OF USING AN ENVIRONMENTAL TRANSMISSION ELECTRON MICROSCOPE - An environmental transmission electron microscope (ETEM) suffers from gas-induced resolution deterioration. Inventors conclude that the deterioration is due to ionization of gas in the sample chamber of the ETEM, and propose to use an electric field in the sample chamber to remove the ionized gas, thereby diminishing the gas-induced resolution deterioration. The electric field need not be a strong field, and can be caused by, for example, biasing the sample with respect to the sample chamber. A bias voltage of 100 V applied via voltage source is sufficient for a marked improvement the gas-induced resolution deterioration. Alternatively an electric field perpendicular to the optical axis can be used, for example by placing an electrically biased wire or gauze off-axis in the sample chamber. | 02-12-2015 |