Patent application number | Description | Published |
20110093989 | SCANNER DEVICE FOR SCANNING PROBE MICROSCOPE - A scanner device is provided which enables high-frequency scanning and can increase the speed of a scanning probe microscope. A scanner device ( | 04-21-2011 |
20120030845 | SCANNING PROBE MICROSCOPE - An atomic force microscope (AFM) ( | 02-02-2012 |
20120151637 | SCANNING TYPE PROBE MICROSCOPE - The present invention provides a fast-operating and stable scanning probe microscope configured to detect the interaction between a probe and a sample to avoid generation of a harmonic component. An oscillation circuit ( | 06-14-2012 |
20120192320 | CANTILEVER EXCITATION DEVICE AND SCANNING PROBE MICROSCOPE - Provided is a cantilever excitation device capable of preventing complication of resonance characteristics by a simple configuration. A cantilever excitation device ( | 07-26-2012 |
20130232648 | IN-LIQUID POTENTIAL MEASUREMENT DEVICE AND ATOMIC FORCE MICROSCOPE - To measure surface potentials in a liquid, the in-liquid potential measurement device according to the present invention includes: a cantilever having a probe at its free end; a displacement measurement unit that measures a voltage corresponding to a displacement of a tip of the cantilever; an AC source that applies an AC voltage between the probe and the sample; and a signal detection unit. A frequency of the AC voltage is 10 kHz or higher. The signal detection unit detects, from the voltage measured by the displacement measurement unit, an amplitude of a frequency component having the same frequency as that of the AC voltage, an amplitude of a frequency component having double frequency of that of the AC voltage, and a frequency component having the same phase as that of the frequency of the AC voltage. | 09-05-2013 |
20140223614 | POTENTIAL MEASUREMENT DEVICE AND ATOMIC FORCE MICROSCOPE - A device includes: an electrode; a displacement measurement unit outputting voltage corresponding to electrostatic force between the electrode and a sample; a first power supply applying a first voltage between the electrode and sample; a second power supply adding, to the first voltage, a second voltage having a different frequency than the first voltage, and applying the added voltage; and a signal detection unit outputting a particular frequency component's magnitude contained in the displacement measurement unit's output, in which the signal detection unit extracts, from the output by the displacement measurement unit, and outputs, to a potential calculation unit, magnitude and phase of a frequency component of a frequency identical to the frequency of the first voltage, and magnitude of a frequency component of a frequency identical to a frequency equivalent to a difference between the frequencies of the first and second voltages, to measure the sample's surface potential. | 08-07-2014 |
20140289910 | SEALED AFM CELL - Provided is a sealed AFM cell in which measurement accuracy does not decrease and the types of observation liquids are not limited. A sealed AFM cell according to the present invention includes: a cantilever including a probe; a sample holder for fixing the sample; a scanner for moving the sample holder; a lid part which holds the cantilever so as to position the probe near a measurement surface of the sample; and a main body part which is a component for holding the scanner and positioned opposite the lid part with the sample in between, in which the lid part and the main body part are joined via a sealing liquid to seal the observation liquid inside a space formed by the lid part, the main body part, and the sealing liquid, the sealing liquid being different from the observation liquid and not in contact with the observation liquid. | 09-25-2014 |
20160047841 | SIGNAL DETECTION CIRCUIT AND SCANNING PROBE MICROSCOPE - A signal detection circuit includes: a VCO that generates a reference signal; a complex signal generation circuit that generates a complex signal from an input signal and the reference signal; a vector operation circuit that calculates an argument of the complex signal by performing a vector operation; and a subtracting phase comparator that compares the argument with a phase of the reference signal by calculating a difference between the argument and the phase of the reference signal, wherein the complex signal generation circuit includes: a multiplication circuit that multiplies the input signal by the reference signal; and an HPF that removes a DC component from a signal output from the multiplication circuit. | 02-18-2016 |