| Patent application number | Description | Published |
|---|
| 20090306300 | Cell Made of Polymers for Spectra Measurement and Method for Producing the Same - This invention provides a cell made of polymers for spectra measurement while inhibiting a decrease in a molecular weight of resin caused by discharge treatment and having a stable hydrophilic modified surface. The hydrophilic resin cell is prepared by providing a polymeric resin cell between the two opposing electrodes, applying an electric field to a region between the above opposing electrodes under a nitrogen atmosphere with a pressure close to the atmospheric pressure to generate an electric discharge, and exposing the cell subjected to discharge treatment with a gas including oxygen. | 12-10-2009 |
| 20100009862 | BIOMOLECULE SENSOR, METHOD FOR MANUFACTURING THE SAME, BIOMOLECULE DETECTION METHOD, AND BIOMOLECULE DETECTION SYSTEM - The present invention aims to improve detecting accuracy and reproducibility of a biomolecule sensor. The biomolecule sensor of the present invention includes single probe molecules orderly aligned and fixed on grid points on the surface of a substrate. Accordingly, in the biomolecule sensor of the present invention: probe molecules for detecting a biomolecule are orderly aligned and separately fixed; blocking for preventing non-specific adsorption is applied to a region other than the region of the probe molecules for detecting a biomolecule; and fluorescence enhancement is achieved by metal microparticles. | 01-14-2010 |
| 20100064396 | SCANNING PROBE MICROSCOPE AND SAMPLE OBSERVING METHOD USING THE SAME - In a near-field scanning microscope using an aperture probe, the upper limit of the aperture formation is at most several ten nm in practice. In a near-field scanning microscope using a scatter probe, the resolution ability is limited to at most several ten nm because of the external illuminating light serving as background noise. Moreover, measurement reproducibility is seriously lowered by a damage or abrasion of a probe. Optical data and unevenness data of the surface of a sample can be measured at a nm-order resolution ability and a high reproducibility while damaging neither the probe nor the sample by fabricating a plasmon-enhanced near-field probe having a nm-order optical resolution ability by combining a nm-order cylindrical structure with nm-order microparticles and repeatedly moving the probe toward the sample and away therefrom at a low contact force at individual measurement points on the sample. | 03-11-2010 |
| 20100218287 | SCANNING PROBE MICROSCOPE AND METHOD OF OBSERVING SAMPLE USING THE SAME - In a scanning probe microscope, a nanotube and metal nano-particles are combined together to configure a plasmon-enhanced near-field probe having an optical resolution on the order of nanometers as a measuring probe in which a metal structure is embedded, and this plasmon-enhanced near-field probe is installed in a highly-efficient plasmon exciting unit to repeat approaching to and retracting from each measuring point on a sample with a low contact force, so that optical information and profile information of the surface of the sample are measured with a resolution on the order of nanometers, a high S/N ratio, and high reproducibility without damaging both of the probe and the sample. | 08-26-2010 |
| 20100325761 | Scanning Probe Microscope and Method of Observing Sample Using the Same - Optical information and topographic information of the surface of a sample are measured at a nanometer-order resolution and with high reproducibility without damaging a probe and the sample by combining a nanometer-order cylindrical structure with a nanometer-order microstructure to form a plasmon intensifying near-field probe having a nanometer-order optical resolution and by repeating approach/retreat of the probe to/from each measurement point on the sample at a low contact force. | 12-23-2010 |
| 20110300035 | AUTOANALYZER AND PIPETTING NOZZLE FOR AUTOANALYZER - There is provided a highly reliable autoanalyzer less liable to sample and reagent carry-over and capable of preventing contamination and precisely pipetting samples and reagents. Using a sample pipetting nozzle | 12-08-2011 |
| 20120020836 | PIPETTING NOZZLE FOR AUTOANALYZER, METHOD FOR PRODUCING SAME AND AUTOANALYZER USING SAME - In an autoanalyzer for analyzing samples, such as urine and blood, analytical and measured values are prevented from being affected by carry-over caused by the repeated use of a pipetting nozzle. A molecular layer for inhibiting the adsorption of biological polymers is formed by coating surfaces of the pipetting nozzle with a polyethylene glycol derivative chemisorbed thereto, thereby reducing carry-over caused by the pipetting nozzle. | 01-26-2012 |
| 20120204297 | Scanning Probe Microscope and Method of Observing Sample Using the Same - Optical information and topographic information of the surface of a sample are measured at a nanometer-order resolution and with high reproducibility without damaging a probe and the sample by combining a nanometer-order cylindrical structure with a nanometer-order microstructure to form a plasmon intensifying near-field probe having a nanometer-order optical resolution and by repeating approach/retreat of the probe to/from each measurement point on the sample at a low contact force. | 08-09-2012 |
| 20130145507 | SCANNING PROBE MICROSCOPE AND SAMPLE OBSERVING METHOD USING THE SAME - In a near-field scanning microscope using an aperture probe, the upper limit of the aperture formation is at most several ten nm in practice. In a near-field scanning microscope using a scatter probe, the resolution ability is limited to at most several ten nm because of the external illuminating light serving as background noise. Moreover, measurement reproducibility is seriously lowered by a damage or abrasion of a probe. Optical data and unevenness data of the surface of a sample can be measured at a nm-order resolution ability and a high reproducibility while damaging neither the probe nor the sample by fabricating a plasmon-enhanced near-field probe having a nm-order optical resolution ability by combining a nm-order cylindrical structure with nm-order microparticles and repeatedly moving the probe toward the sample and away therefrom at a low contact force at individual measurement points on the sample. | 06-06-2013 |
