Patent application number | Description | Published |
20100073516 | IMAGE CAPTURING APPARATUS, CONTROL METHOD THEREOF, AND PROGRAM - An image capturing apparatus including: an image sensor generating an image signal; a photographing control section performing a photographing operation in which an exposure of the image sensor is divided into a plurality of exposures in accordance with a predetermined exposure time; an addition section adding sequentially the image signals obtained at each exposure; an amplification ratio calculation section calculating an amplification ratio of the added image signal on the basis of the predetermined exposure time; an amplification section amplifying the added image signal by using the amplification ratio to compensate for insufficient exposure for the predetermined exposure time; and a display control section displaying information related to the amplified image signal; wherein the photographing control section ends the photographing operation when instructed by a user, and determines that the amplified image signal is a captured image obtained by performing the photographing operation with the predetermined exposure time. | 03-25-2010 |
20100079616 | IMAGING APPARATUS, CONTROL METHOD THEREOF, AND PROGRAM - An imaging apparatus includes: an imaging device generating an image signal on a subject image; a shooting control mechanism dividing an exposure to be made to the imaging device in an exposure period into a plurality of times of exposures; an adding mechanism adding individual image signals obtained by the plurality of divided exposures in sequence to generate a sum image signal; an amplification control mechanism amplifying the sum image signal using a predetermined amplification factor in a first period in the exposure period to generate an amplified image signal; and a display control mechanism displaying, on a display section, the amplified image based on the amplified image signal in the first period, and displaying, on a display section, an image based on the sum image signal in a period other than the first period in the exposure period. | 04-01-2010 |
20100191769 | IMAGE SEARCH SYSTEM, IMAGE SEARCH METHOD, AND STORAGE MEDIUM - An image search system includes a first calculation section that calculates a first similarity score of each registered image with respect to an input image on the basis of image features of the registered and the input image, a second calculation section that calculates a second similarity score of each registered image with respect to the input image on the basis of text features of the registered and the input image, a candidate extraction section that extracts one or more candidate images on the basis of the first and the second similarity scores of each registered image, a third calculation section that calculates a third similarity score of each candidate image on the basis of projection waveforms of the input image and the candidate image, and a search section that determines one or more registered images similar to the input image on the basis of the third similarity score. | 07-29-2010 |
20110062457 | SEMICONDUCTOR LIGHT EMITTING DEVICE, METHOD OF MANUFACTURING THE SAME, IMAGE DISPLAY DEVICE, AND ELECTRONIC APPARATUS - A semiconductor light emitting device including an active layer, a compound semiconductor layer on the active layer, a contact layer on the compound semiconductor layer, and an electrode on the contact layer, where the contact layer is substantially the same size as the electrode. | 03-17-2011 |
20110293202 | SPOUT MEMBER AND PACKAGING BAG UTILIZING SAME - It is aimed to provide a spout member and a packaging bag using the spout member which have excellent handling property and hygiene management performance at the time of supplying water or the like from the outside before and during use such as administration of water and medicine, in which a closure means for freely opening and closing an aperture formed by cutting off parts of peripheral portions of sealed film pieces is protected from a contained content at the time of storage or transportation and which have excellent protecting property even when an inner pressure acts in the packaging bag, excellent contamination preventing property until a spout is opened and excellent contamination preventing property and handling property after opening. | 12-01-2011 |
20130105836 | LIGHT EMITTING ELEMENT, METHOD OF MANUFACTURING THE SAME, AND LIGHT EMITTING DEVICE | 05-02-2013 |
20130285080 | SEMICONDUCTOR LIGHT EMITTING DEVICE, METHOD OF MANUFACTURING THE SAME, IMAGE DISPLAY DEVICE, AND ELECTRONIC APPARATUS - A semiconductor light emitting device including an active layer, a compound semiconductor layer on the active layer, a contact layer on the compound semiconductor layer, and an electrode on the contact layer, where the contact layer is substantially the same size as the electrode. | 10-31-2013 |
20140361321 | LIGHT-EMITTING ELEMENT WAFER, LIGHT EMITTING ELEMENT, ELECTRONIC APPARATUS, AND METHOD OF PRODUCING LIGHT-EMITTING ELEMENT WAFER - A light-emitting element wafer includes a supporting substrate, a luminescent layer that is formed of a semiconductor and has a first surface and a second surface, the first surface including a first electrode, the second surface including a second electrode, the second surface being arranged between the supporting substrate and the first surface, a junction layer that joins luminescent layer to the supporting substrate and is arranged between the supporting substrate and the second surface, a first inorganic film formed on the first surface, a second inorganic film formed between the junction layer and the second surface, an isolation trench portion that isolates elements and is formed to have a depth such that the isolation trench portion extends from the first inorganic film to the supporting substrate, and a third inorganic film that connects the first inorganic film and the second inorganic film. | 12-11-2014 |
Patent application number | Description | Published |
20090096476 | Method of inspecting semiconductor circuit having logic circuit as inspection circuit - A semiconductor circuit includes an inspection circuit for inspecting terminal open of the semiconductor circuit. The semiconductor circuit has a plurality of input terminals. The semiconductor circuit includes an input circuit portion connected to the plurality of input terminals. The inspection circuit includes a logic circuit, supplied with a plurality of input signals from the input circuit portion, for performing a predetermined logic operation to the plurality of input signals to produce a logic operation result. Whereby the semiconductor circuit enables to decide the presence or absence of the terminal open on the basis of the logic operation result. | 04-16-2009 |
20110121294 | Semiconductor device - A semiconductor device includes a plurality of first data input/output terminals, a plurality of second data input/output terminals, a first semiconductor chip, and a second semiconductor chip. The first semiconductor chip includes a plurality of first data input/output pads connected with the first data input/output terminals, a first test circuit, and a first memory portion. The first test circuit generates a first test result in response to a data output from the first memory portion at a test operation. The second semiconductor chip includes a plurality of second data input/output pads connected with the second data input/output terminals, a second and a third test circuits, and a second memory portion. The second test circuit generates a second test result in response to a data output from the second memory portion, and the third test circuit generates a third test result in response to the second test result and the first test result input from the first test circuit of the first semiconductor chip and outputs the third test result from a specified second data input/output terminal. | 05-26-2011 |
20140151703 | SEMICONDUCTOR DEVICE - A semiconductor device includes at least two semiconductor chips each including a plurality of data input/output pads, a data memory portion structured so as to read/write data through the plurality of data input/output pads, a test result input/output pad, and a test circuit for controlling a first test mode that decides data read from the data memory portion and outputs the decision from the test result input/output pad and a second test mode that decides data read from the data memory portion, inputs test result of another semiconductor chip from the test result input/output pad and outputs a synthesized test result of the test result of the chip itself and the test result of the other semiconductor chip from a specified part of the plurality of data input/output pads, and a plurality of data input/output terminals each connected with different data input/output pads. | 06-05-2014 |